BR112021009487A2 - otimização de um estágio de configuração em um processo de inspeção visual automática - Google Patents

otimização de um estágio de configuração em um processo de inspeção visual automática Download PDF

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Publication number
BR112021009487A2
BR112021009487A2 BR112021009487-3A BR112021009487A BR112021009487A2 BR 112021009487 A2 BR112021009487 A2 BR 112021009487A2 BR 112021009487 A BR112021009487 A BR 112021009487A BR 112021009487 A2 BR112021009487 A2 BR 112021009487A2
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BR
Brazil
Prior art keywords
cluster
images
image
inspection
criterion
Prior art date
Application number
BR112021009487-3A
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English (en)
Portuguese (pt)
Inventor
Yonatan HYATT
Dan Carmon
Original Assignee
Inspekto A.M.V Ltd
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Publication of BR112021009487A2 publication Critical patent/BR112021009487A2/pt

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F1/00—Details not covered by groups G06F3/00 - G06F13/00 and G06F21/00
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G06T7/001—Industrial image inspection using an image reference approach
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/9515—Objects of complex shape, e.g. examined with use of a surface follower device
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F18/00—Pattern recognition
    • G06F18/20—Analysing
    • G06F18/23—Clustering techniques
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/70—Determining position or orientation of objects or cameras
    • G06T7/73—Determining position or orientation of objects or cameras using feature-based methods
    • G06T7/74—Determining position or orientation of objects or cameras using feature-based methods involving reference images or patches
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8854—Grading and classifying of flaws
    • G01N2021/888—Marking defects
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8887—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges based on image processing techniques
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/10—Image acquisition modality
    • G06T2207/10004—Still image; Photographic image
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/20—Special algorithmic details
    • G06T2207/20081—Training; Learning
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/20—Special algorithmic details
    • G06T2207/20092—Interactive image processing based on input by user
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/20—Special algorithmic details
    • G06T2207/20212—Image combination
    • G06T2207/20216—Image averaging
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection
    • G06T2207/30164—Workpiece; Machine component

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  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Quality & Reliability (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Data Mining & Analysis (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • General Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • Analytical Chemistry (AREA)
  • Chemical & Material Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • General Engineering & Computer Science (AREA)
  • Signal Processing (AREA)
  • Bioinformatics & Cheminformatics (AREA)
  • Evolutionary Biology (AREA)
  • Evolutionary Computation (AREA)
  • Bioinformatics & Computational Biology (AREA)
  • Artificial Intelligence (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Image Processing (AREA)
  • Image Analysis (AREA)
BR112021009487-3A 2018-11-18 2019-11-18 otimização de um estágio de configuração em um processo de inspeção visual automática BR112021009487A2 (pt)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
US201862768934P 2018-11-18 2018-11-18
IL263097 2018-11-18
US62/768.934 2018-11-18
IL263097A IL263097B2 (en) 2018-11-18 2018-11-18 Optimizing a set-up stage in an automatic visual inspection process
PCT/IL2019/051260 WO2020100146A1 (en) 2018-11-18 2019-11-18 Optimizing a set-up stage in an automatic visual inspection process

Publications (1)

Publication Number Publication Date
BR112021009487A2 true BR112021009487A2 (pt) 2021-08-10

Family

ID=65910786

Family Applications (1)

Application Number Title Priority Date Filing Date
BR112021009487-3A BR112021009487A2 (pt) 2018-11-18 2019-11-18 otimização de um estágio de configuração em um processo de inspeção visual automática

Country Status (10)

Country Link
US (1) US12524866B2 (https=)
EP (1) EP3881059A4 (https=)
JP (1) JP2022507678A (https=)
KR (1) KR20210091189A (https=)
CN (1) CN113039432A (https=)
BR (1) BR112021009487A2 (https=)
CA (1) CA3117917A1 (https=)
IL (1) IL263097B2 (https=)
MX (1) MX2021005739A (https=)
WO (1) WO2020100146A1 (https=)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
IL259285B2 (en) * 2018-05-10 2023-07-01 Inspekto A M V Ltd A system and method for detecting defects on objects in an image
IL260417B (en) 2018-07-04 2021-10-31 Tinyinspektor Ltd System and method for automated visual inspection
US11816827B2 (en) 2020-02-13 2023-11-14 Inspekto A.M.V. Ltd. User interface device for autonomous machine vision inspection
JP7537095B2 (ja) * 2020-02-18 2024-08-21 株式会社リコー 情報処理装置、プログラム、情報生成方法、情報処理システム
WO2023218441A1 (en) * 2022-05-11 2023-11-16 Inspekto A.M.V. Ltd. Optimizing a reference group for visual inspection

Family Cites Families (36)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5850466A (en) 1995-02-22 1998-12-15 Cognex Corporation Golden template comparison for rotated and/or scaled images
US6947587B1 (en) 1998-04-21 2005-09-20 Hitachi, Ltd. Defect inspection method and apparatus
US6999614B1 (en) * 1999-11-29 2006-02-14 Kla-Tencor Corporation Power assisted automatic supervised classifier creation tool for semiconductor defects
CA2446259A1 (en) * 2001-05-02 2002-11-07 Teradyne, Inc. Inspection system using dynamically obtained values and related techniques
US7096207B2 (en) 2002-03-22 2006-08-22 Donglok Kim Accelerated learning in machine vision using artificially implanted defects
US7359544B2 (en) 2003-02-12 2008-04-15 Kla-Tencor Technologies Corporation Automatic supervised classifier setup tool for semiconductor defects
ATE423341T1 (de) 2003-07-24 2009-03-15 Cognitens Ltd System und verfahren zur überwachung und visualisierung der ausgabe eines produktionsprozesses
JP4608224B2 (ja) * 2004-03-22 2011-01-12 オリンパス株式会社 欠陥画像検査装置及びその方法
US7369236B1 (en) * 2006-10-31 2008-05-06 Negevtech, Ltd. Defect detection through image comparison using relative measures
JP4616864B2 (ja) 2007-06-20 2011-01-19 株式会社日立ハイテクノロジーズ 外観検査方法及びその装置および画像処理評価システム
US8646689B2 (en) 2007-12-28 2014-02-11 Cognex Corporation Deformable light pattern for machine vision system
SG164293A1 (en) * 2009-01-13 2010-09-29 Semiconductor Technologies & Instruments Pte System and method for inspecting a wafer
US8295580B2 (en) 2009-09-02 2012-10-23 Hermes Microvision Inc. Substrate and die defect inspection method
JP2011076204A (ja) 2009-09-29 2011-04-14 Toppan Printing Co Ltd 印刷物検査方法及び印刷物検査装置
JP5007750B2 (ja) * 2010-03-05 2012-08-22 オムロン株式会社 はんだ印刷状態の分析作業の支援方法およびはんだ印刷検査機
JP2011232302A (ja) * 2010-04-30 2011-11-17 Ricoh Elemex Corp 画像検査方法及び画像検査装置
US8774504B1 (en) 2011-10-26 2014-07-08 Hrl Laboratories, Llc System for three-dimensional object recognition and foreground extraction
JP5767963B2 (ja) * 2011-12-28 2015-08-26 株式会社キーエンス 外観検査装置、外観検査方法及びコンピュータプログラム
JP5865707B2 (ja) 2012-01-06 2016-02-17 株式会社キーエンス 外観検査装置、外観検査方法及びコンピュータプログラム
EP2811901B1 (en) * 2012-02-06 2016-06-08 Insightec, Ltd. Reference-library extension during imaging of moving organs
JP5956814B2 (ja) 2012-04-20 2016-07-27 株式会社キーエンス 外観検査装置、外観検査方法及びコンピュータプログラム
JP2014025763A (ja) 2012-07-25 2014-02-06 Hitachi High-Technologies Corp 欠陥検査方法、及び欠陥検査装置
US10114368B2 (en) 2013-07-22 2018-10-30 Applied Materials Israel Ltd. Closed-loop automatic defect inspection and classification
US8987010B1 (en) 2013-08-29 2015-03-24 International Business Machines Corporation Microprocessor image correction and method for the detection of potential defects
JP6217329B2 (ja) 2013-11-11 2017-10-25 株式会社リコー 検査装置、画像形成装置、検査方法およびプログラム
JP2015179073A (ja) 2014-02-26 2015-10-08 株式会社リコー 画像検査装置、画像検査システム及び画像検査プログラム
US10514685B2 (en) 2014-06-13 2019-12-24 KLA—Tencor Corp. Automatic recipe stability monitoring and reporting
JP6794737B2 (ja) * 2015-12-01 2020-12-02 株式会社リコー 情報処理装置、情報処理方法、プログラムおよび検査システム
EP3176751B1 (en) * 2015-12-01 2020-12-30 Ricoh Company, Ltd. Information processing device, information processing method, computer-readable recording medium, and inspection system
KR101688458B1 (ko) 2016-04-27 2016-12-23 디아이티 주식회사 깊은 신경망 학습 방법을 이용한 제조품용 영상 검사 장치 및 이를 이용한 제조품용 영상 검사 방법
JP6717081B2 (ja) 2016-06-30 2020-07-01 東京エレクトロン株式会社 基板の欠陥検査装置、基板欠陥検査用の感度パラメータ値の調整方法及び記憶媒体
KR102103853B1 (ko) * 2016-09-27 2020-04-24 주식회사 히타치하이테크 결함 검사 장치 및 결함 검사 방법
IL257256A (en) * 2018-01-30 2018-03-29 HYATT Yonatan System and method for establishing production line tests
US10997462B2 (en) * 2018-04-04 2021-05-04 Canon Virginia, Inc. Devices, systems, and methods for clustering reference images for non-destructive testing
IL259285B2 (en) * 2018-05-10 2023-07-01 Inspekto A M V Ltd A system and method for detecting defects on objects in an image
CN112889087B (zh) * 2018-10-15 2024-09-17 3M创新有限公司 对片材部件的自动检查的系统、处理单元和方法

Also Published As

Publication number Publication date
IL263097A (en) 2020-05-31
WO2020100146A1 (en) 2020-05-22
CN113039432A (zh) 2021-06-25
KR20210091189A (ko) 2021-07-21
EP3881059A1 (en) 2021-09-22
IL263097B2 (en) 2024-01-01
JP2022507678A (ja) 2022-01-18
US12524866B2 (en) 2026-01-13
CA3117917A1 (en) 2020-05-22
EP3881059A4 (en) 2022-05-11
US20220020136A1 (en) 2022-01-20
IL263097B1 (en) 2023-09-01
MX2021005739A (es) 2021-08-11

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B06W Patent application suspended after preliminary examination (for patents with searches from other patent authorities) chapter 6.23 patent gazette]
B08F Application dismissed because of non-payment of annual fees [chapter 8.6 patent gazette]

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B08K Patent lapsed as no evidence of payment of the annual fee has been furnished to inpi [chapter 8.11 patent gazette]

Free format text: EM VIRTUDE DO ARQUIVAMENTO PUBLICADO NA RPI 2854 DE 16-09-2025 E CONSIDERANDO AUSENCIA DE MANIFESTACAO DENTRO DOS PRAZOS LEGAIS, INFORMO QUE CABE SER MANTIDO O ARQUIVAMENTO DO PEDIDO DE PATENTE, CONFORME O DISPOSTO NO ARTIGO 12, DA RESOLUCAO 113/2013.