BR112018006093A2 - aritmética do foco automático de detecção de fase - Google Patents

aritmética do foco automático de detecção de fase

Info

Publication number
BR112018006093A2
BR112018006093A2 BR112018006093A BR112018006093A BR112018006093A2 BR 112018006093 A2 BR112018006093 A2 BR 112018006093A2 BR 112018006093 A BR112018006093 A BR 112018006093A BR 112018006093 A BR112018006093 A BR 112018006093A BR 112018006093 A2 BR112018006093 A2 BR 112018006093A2
Authority
BR
Brazil
Prior art keywords
value
phase detection
phase
detection pixel
arithmetic
Prior art date
Application number
BR112018006093A
Other languages
English (en)
Inventor
Lee Jisoo
Galor Gluskin Micha
Manuel Velarde Ruben
Original Assignee
Qualcomm Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Qualcomm Inc filed Critical Qualcomm Inc
Publication of BR112018006093A2 publication Critical patent/BR112018006093A2/pt

Links

Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B7/00—Mountings, adjusting means, or light-tight connections, for optical elements
    • G02B7/28—Systems for automatic generation of focusing signals
    • G02B7/285—Systems for automatic generation of focusing signals including two or more different focus detection devices, e.g. both an active and a passive focus detecting device
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B7/00—Mountings, adjusting means, or light-tight connections, for optical elements
    • G02B7/28—Systems for automatic generation of focusing signals
    • G02B7/34—Systems for automatic generation of focusing signals using different areas in a pupil plane
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B7/00—Mountings, adjusting means, or light-tight connections, for optical elements
    • G02B7/28—Systems for automatic generation of focusing signals
    • G02B7/36—Systems for automatic generation of focusing signals using image sharpness techniques, e.g. image processing techniques for generating autofocus signals
    • G02B7/365—Systems for automatic generation of focusing signals using image sharpness techniques, e.g. image processing techniques for generating autofocus signals by analysis of the spatial frequency components of the image
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
    • H01L27/144—Devices controlled by radiation
    • H01L27/146—Imager structures
    • H01L27/14601—Structural or functional details thereof
    • H01L27/1462—Coatings
    • H01L27/14621—Colour filter arrangements
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
    • H01L27/144—Devices controlled by radiation
    • H01L27/146—Imager structures
    • H01L27/14601—Structural or functional details thereof
    • H01L27/14625—Optical elements or arrangements associated with the device
    • H01L27/14627—Microlenses
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
    • H04N23/60—Control of cameras or camera modules
    • H04N23/67—Focus control based on electronic image sensor signals
    • H04N23/672—Focus control based on electronic image sensor signals based on the phase difference signals
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
    • H04N23/80—Camera processing pipelines; Components thereof
    • H04N23/84—Camera processing pipelines; Components thereof for processing colour signals
    • H04N23/843—Demosaicing, e.g. interpolating colour pixel values
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/10—Circuitry of solid-state image sensors [SSIS]; Control thereof for transforming different wavelengths into image signals
    • H04N25/11—Arrangement of colour filter arrays [CFA]; Filter mosaics
    • H04N25/13—Arrangement of colour filter arrays [CFA]; Filter mosaics characterised by the spectral characteristics of the filter elements
    • H04N25/134—Arrangement of colour filter arrays [CFA]; Filter mosaics characterised by the spectral characteristics of the filter elements based on three different wavelength filter elements
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70—SSIS architectures; Circuits associated therewith
    • H04N25/703—SSIS architectures incorporating pixels for producing signals other than image signals
    • H04N25/704—Pixels specially adapted for focusing, e.g. phase difference pixel sets
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70—SSIS architectures; Circuits associated therewith
    • H04N25/703—SSIS architectures incorporating pixels for producing signals other than image signals
    • H04N25/708—Pixels for edge detection
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
    • H04N23/10—Cameras or camera modules comprising electronic image sensors; Control thereof for generating image signals from different wavelengths
    • H04N23/11—Cameras or camera modules comprising electronic image sensors; Control thereof for generating image signals from different wavelengths for generating image signals from visible and infrared light wavelengths

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Power Engineering (AREA)
  • Optics & Photonics (AREA)
  • Electromagnetism (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Focusing (AREA)
  • Studio Devices (AREA)
  • Automatic Focus Adjustment (AREA)
  • Quality & Reliability (AREA)
  • Theoretical Computer Science (AREA)

Abstract

certos aspectos referem-se aos sistemas e técnicas para usar pixels de imagem (ou seja, pixels de detecção de não-fase) além de pixels de detecção de fase para calcular informações de foco automático. os valores de pixel de geração de imagem podem ser usados para interpolar um valor em um local de pixel de detecção de fase. o valor interpolado e um valor recebido do pixel de detecção de diferença de fase pode ser usado para obter um valor de pixel de detecção de fase virtual. o valor interpolado, valor recebido do pixel de detecção de diferença de fase, e o valor do pixel de detecção de fase virtual podem ser usados para obter um sinal de detecção de diferença de fase indicando uma direção de deslocamento (direção de desfocagem) e um valor de deslocamento (quantidade de desfocagem) do foco da imagem.
BR112018006093A 2015-09-25 2016-08-24 aritmética do foco automático de detecção de fase BR112018006093A2 (pt)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US14/865,629 US9804357B2 (en) 2015-09-25 2015-09-25 Phase detection autofocus using masked and unmasked photodiodes
PCT/US2016/048414 WO2017052923A1 (en) 2015-09-25 2016-08-24 Phase detection autofocus arithmetic

Publications (1)

Publication Number Publication Date
BR112018006093A2 true BR112018006093A2 (pt) 2019-03-19

Family

ID=56940359

Family Applications (1)

Application Number Title Priority Date Filing Date
BR112018006093A BR112018006093A2 (pt) 2015-09-25 2016-08-24 aritmética do foco automático de detecção de fase

Country Status (7)

Country Link
US (1) US9804357B2 (pt)
EP (1) EP3354009B1 (pt)
JP (1) JP2018535443A (pt)
KR (2) KR20180056754A (pt)
CN (1) CN108141527B (pt)
BR (1) BR112018006093A2 (pt)
WO (1) WO2017052923A1 (pt)

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Also Published As

Publication number Publication date
CN108141527B (zh) 2020-08-07
WO2017052923A1 (en) 2017-03-30
KR20180059842A (ko) 2018-06-05
KR20180056754A (ko) 2018-05-29
US20170090149A1 (en) 2017-03-30
EP3354009B1 (en) 2019-09-18
CN108141527A (zh) 2018-06-08
JP2018535443A (ja) 2018-11-29
US9804357B2 (en) 2017-10-31
EP3354009A1 (en) 2018-08-01

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