BR112016015961A2 - Métodos e sistemas de comunicação de canal de retorno de memória de acesso aleatório dinâmica (dram) - Google Patents

Métodos e sistemas de comunicação de canal de retorno de memória de acesso aleatório dinâmica (dram)

Info

Publication number
BR112016015961A2
BR112016015961A2 BR112016015961A BR112016015961A BR112016015961A2 BR 112016015961 A2 BR112016015961 A2 BR 112016015961A2 BR 112016015961 A BR112016015961 A BR 112016015961A BR 112016015961 A BR112016015961 A BR 112016015961A BR 112016015961 A2 BR112016015961 A2 BR 112016015961A2
Authority
BR
Brazil
Prior art keywords
dram
systems
random access
access memory
dynamic random
Prior art date
Application number
BR112016015961A
Other languages
English (en)
Portuguese (pt)
Inventor
Ian West David
Joseph Brunolli Michael
Tamio Chun Dexter
Srinivas Vaishnav
Original Assignee
Qualcomm Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Qualcomm Inc filed Critical Qualcomm Inc
Publication of BR112016015961A2 publication Critical patent/BR112016015961A2/pt

Links

Classifications

    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C7/00Arrangements for writing information into, or reading information out from, a digital store
    • G11C7/10Input/output [I/O] data interface arrangements, e.g. I/O data control circuits, I/O data buffers
    • G11C7/1051Data output circuits, e.g. read-out amplifiers, data output buffers, data output registers, data output level conversion circuits
    • G11C7/1063Control signal output circuits, e.g. status or busy flags, feedback command signals
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00Error detection; Error correction; Monitoring
    • G06F11/07Responding to the occurrence of a fault, e.g. fault tolerance
    • G06F11/08Error detection or correction by redundancy in data representation, e.g. by using checking codes
    • G06F11/10Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's
    • G06F11/1004Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's to protect a block of data words, e.g. CRC or checksum
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00Error detection; Error correction; Monitoring
    • G06F11/07Responding to the occurrence of a fault, e.g. fault tolerance
    • G06F11/08Error detection or correction by redundancy in data representation, e.g. by using checking codes
    • G06F11/10Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's
    • G06F11/1008Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices
    • G06F11/1048Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices using arrangements adapted for a specific error detection or correction feature
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F12/00Accessing, addressing or allocating within memory systems or architectures
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C11/00Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/34Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
    • G11C11/40Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
    • G11C11/401Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
    • G11C11/406Management or control of the refreshing or charge-regeneration cycles
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C11/00Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/34Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
    • G11C11/40Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
    • G11C11/401Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
    • G11C11/406Management or control of the refreshing or charge-regeneration cycles
    • G11C11/40611External triggering or timing of internal or partially internal refresh operations, e.g. auto-refresh or CAS-before-RAS triggered refresh
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C11/00Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/34Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
    • G11C11/40Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
    • G11C11/401Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
    • G11C11/4063Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing
    • G11C11/407Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing for memory cells of the field-effect type
    • G11C11/4076Timing circuits

Landscapes

  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Computer Hardware Design (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Quality & Reliability (AREA)
  • Computer Security & Cryptography (AREA)
  • Dram (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
  • Transceivers (AREA)
  • Detection And Correction Of Errors (AREA)
BR112016015961A 2014-01-09 2015-01-08 Métodos e sistemas de comunicação de canal de retorno de memória de acesso aleatório dinâmica (dram) BR112016015961A2 (pt)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US201461925299P 2014-01-09 2014-01-09
US14/591,056 US9881656B2 (en) 2014-01-09 2015-01-07 Dynamic random access memory (DRAM) backchannel communication systems and methods
PCT/US2015/010583 WO2015105948A1 (en) 2014-01-09 2015-01-08 Dynamic random access memory (dram) backchannel communication systems and methods

Publications (1)

Publication Number Publication Date
BR112016015961A2 true BR112016015961A2 (pt) 2017-08-08

Family

ID=53495711

Family Applications (1)

Application Number Title Priority Date Filing Date
BR112016015961A BR112016015961A2 (pt) 2014-01-09 2015-01-08 Métodos e sistemas de comunicação de canal de retorno de memória de acesso aleatório dinâmica (dram)

Country Status (10)

Country Link
US (2) US9881656B2 (https=)
EP (1) EP3092568A1 (https=)
JP (1) JP2017503303A (https=)
KR (1) KR20160106096A (https=)
CN (1) CN105917312B (https=)
AR (1) AR099040A1 (https=)
BR (1) BR112016015961A2 (https=)
CA (1) CA2932653A1 (https=)
TW (1) TW201543498A (https=)
WO (1) WO2015105948A1 (https=)

Families Citing this family (10)

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US9881656B2 (en) 2014-01-09 2018-01-30 Qualcomm Incorporated Dynamic random access memory (DRAM) backchannel communication systems and methods
US9728245B2 (en) 2015-02-28 2017-08-08 Intel Corporation Precharging and refreshing banks in memory device with bank group architecture
US10783950B2 (en) * 2015-09-02 2020-09-22 Nvidia Corporation Memory management systems and methods using a management communication bus
KR20190087893A (ko) 2018-01-17 2019-07-25 삼성전자주식회사 클럭을 공유하는 반도체 패키지 및 전자 시스템
US11036578B2 (en) 2018-04-12 2021-06-15 Samsung Electronics Co., Ltd. Semiconductor memory devices and memory systems including the same
CN110729006B (zh) * 2018-07-16 2022-07-05 超威半导体(上海)有限公司 存储器控制器中的刷新方案
US10747613B2 (en) * 2018-09-07 2020-08-18 Toshiba Memory Corporation Pooled frontline ECC decoders in memory systems
CN114556431B (zh) * 2019-10-29 2025-05-27 Oppo广东移动通信有限公司 增强现实的3d重建
US11392299B2 (en) 2019-12-20 2022-07-19 Micron Technology, Inc. Multi-purpose signaling for a memory system
US11360695B2 (en) 2020-09-16 2022-06-14 Micron Technology, Inc. Apparatus with combinational access mechanism and methods for operating the same

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JPS57150227A (en) * 1981-03-12 1982-09-17 Nec Corp Buffer circuit
CA2074307C (en) 1991-07-29 1995-12-12 Leslie J. Sell Rope guide
JPH065069A (ja) * 1992-06-18 1994-01-14 Nec Corp ダイナミック・ランダム・アクセス・メモリ
JP3376960B2 (ja) * 1999-06-01 2003-02-17 日本電気株式会社 半導体記憶装置およびそれを用いたシステム
JP4069078B2 (ja) * 2004-01-07 2008-03-26 松下電器産業株式会社 Dram制御装置およびdram制御方法
US7627804B2 (en) 2006-06-30 2009-12-01 Intel Corporation Memory device with speculative commands to memory core
US7937641B2 (en) 2006-12-21 2011-05-03 Smart Modular Technologies, Inc. Memory modules with error detection and correction
KR101308047B1 (ko) 2007-02-08 2013-09-12 삼성전자주식회사 메모리 시스템, 이 시스템을 위한 메모리, 및 이 메모리를위한 명령 디코딩 방법
US8132074B2 (en) 2007-11-19 2012-03-06 Intel Corporation Reliability, availability, and serviceability solutions for memory technology
US9158616B2 (en) 2009-12-09 2015-10-13 Intel Corporation Method and system for error management in a memory device
US8392650B2 (en) * 2010-04-01 2013-03-05 Intel Corporation Fast exit from self-refresh state of a memory device
US9432298B1 (en) * 2011-12-09 2016-08-30 P4tents1, LLC System, method, and computer program product for improving memory systems
KR101873526B1 (ko) 2011-06-09 2018-07-02 삼성전자주식회사 에러 정정회로를 구비한 온 칩 데이터 스크러빙 장치 및 방법
KR101253199B1 (ko) * 2011-07-25 2013-04-10 엘지전자 주식회사 조명 장치
KR101962874B1 (ko) * 2012-04-24 2019-03-27 삼성전자주식회사 메모리 장치, 메모리 컨트롤러, 메모리 시스템 및 이의 동작 방법
US9881656B2 (en) 2014-01-09 2018-01-30 Qualcomm Incorporated Dynamic random access memory (DRAM) backchannel communication systems and methods

Also Published As

Publication number Publication date
CA2932653A1 (en) 2015-07-16
CN105917312B (zh) 2019-03-08
EP3092568A1 (en) 2016-11-16
US20180114553A1 (en) 2018-04-26
JP2017503303A (ja) 2017-01-26
US9881656B2 (en) 2018-01-30
TW201543498A (zh) 2015-11-16
AR099040A1 (es) 2016-06-22
KR20160106096A (ko) 2016-09-09
US20150194197A1 (en) 2015-07-09
CN105917312A (zh) 2016-08-31
WO2015105948A1 (en) 2015-07-16
US10224081B2 (en) 2019-03-05

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Legal Events

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B08F Application dismissed because of non-payment of annual fees [chapter 8.6 patent gazette]

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B08K Patent lapsed as no evidence of payment of the annual fee has been furnished to inpi [chapter 8.11 patent gazette]

Free format text: EM VIRTUDE DO ARQUIVAMENTO PUBLICADO NA RPI 2548 DE 05-11-2019 E CONSIDERANDO AUSENCIA DE MANIFESTACAO DENTRO DOS PRAZOS LEGAIS, INFORMO QUE CABE SER MANTIDO O ARQUIVAMENTO DO PEDIDO DE PATENTE, CONFORME O DISPOSTO NO ARTIGO 12, DA RESOLUCAO 113/2013.