AR099040A1 - Sistemas y métodos de comunicación de canal de retorno de la memoria dinámica de acceso aleatorio (dram) - Google Patents

Sistemas y métodos de comunicación de canal de retorno de la memoria dinámica de acceso aleatorio (dram)

Info

Publication number
AR099040A1
AR099040A1 ARP150100030A ARP150100030A AR099040A1 AR 099040 A1 AR099040 A1 AR 099040A1 AR P150100030 A ARP150100030 A AR P150100030A AR P150100030 A ARP150100030 A AR P150100030A AR 099040 A1 AR099040 A1 AR 099040A1
Authority
AR
Argentina
Prior art keywords
dram
systems
methods
dynamic
return channel
Prior art date
Application number
ARP150100030A
Other languages
English (en)
Spanish (es)
Original Assignee
Qualcomm Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Qualcomm Inc filed Critical Qualcomm Inc
Publication of AR099040A1 publication Critical patent/AR099040A1/es

Links

Classifications

    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00Error detection; Error correction; Monitoring
    • G06F11/07Responding to the occurrence of a fault, e.g. fault tolerance
    • G06F11/08Error detection or correction by redundancy in data representation, e.g. by using checking codes
    • G06F11/10Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's
    • G06F11/1004Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's to protect a block of data words, e.g. CRC or checksum
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00Error detection; Error correction; Monitoring
    • G06F11/07Responding to the occurrence of a fault, e.g. fault tolerance
    • G06F11/08Error detection or correction by redundancy in data representation, e.g. by using checking codes
    • G06F11/10Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's
    • G06F11/1008Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices
    • G06F11/1048Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices using arrangements adapted for a specific error detection or correction feature
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F12/00Accessing, addressing or allocating within memory systems or architectures
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C11/00Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/34Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
    • G11C11/40Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
    • G11C11/401Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
    • G11C11/406Management or control of the refreshing or charge-regeneration cycles
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C11/00Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/34Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
    • G11C11/40Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
    • G11C11/401Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
    • G11C11/406Management or control of the refreshing or charge-regeneration cycles
    • G11C11/40611External triggering or timing of internal or partially internal refresh operations, e.g. auto-refresh or CAS-before-RAS triggered refresh
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C11/00Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/34Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
    • G11C11/40Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
    • G11C11/401Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
    • G11C11/4063Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing
    • G11C11/407Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing for memory cells of the field-effect type
    • G11C11/4076Timing circuits
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C7/00Arrangements for writing information into, or reading information out from, a digital store
    • G11C7/10Input/output [I/O] data interface arrangements, e.g. I/O data control circuits, I/O data buffers
    • G11C7/1051Data output circuits, e.g. read-out amplifiers, data output buffers, data output registers, data output level conversion circuits
    • G11C7/1063Control signal output circuits, e.g. status or busy flags, feedback command signals

Landscapes

  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Computer Hardware Design (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Quality & Reliability (AREA)
  • Computer Security & Cryptography (AREA)
  • Dram (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
  • Transceivers (AREA)
  • Detection And Correction Of Errors (AREA)
ARP150100030A 2014-01-09 2015-01-07 Sistemas y métodos de comunicación de canal de retorno de la memoria dinámica de acceso aleatorio (dram) AR099040A1 (es)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US201461925299P 2014-01-09 2014-01-09

Publications (1)

Publication Number Publication Date
AR099040A1 true AR099040A1 (es) 2016-06-22

Family

ID=53495711

Family Applications (1)

Application Number Title Priority Date Filing Date
ARP150100030A AR099040A1 (es) 2014-01-09 2015-01-07 Sistemas y métodos de comunicación de canal de retorno de la memoria dinámica de acceso aleatorio (dram)

Country Status (10)

Country Link
US (2) US9881656B2 (https=)
EP (1) EP3092568A1 (https=)
JP (1) JP2017503303A (https=)
KR (1) KR20160106096A (https=)
CN (1) CN105917312B (https=)
AR (1) AR099040A1 (https=)
BR (1) BR112016015961A2 (https=)
CA (1) CA2932653A1 (https=)
TW (1) TW201543498A (https=)
WO (1) WO2015105948A1 (https=)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9881656B2 (en) 2014-01-09 2018-01-30 Qualcomm Incorporated Dynamic random access memory (DRAM) backchannel communication systems and methods
US9728245B2 (en) 2015-02-28 2017-08-08 Intel Corporation Precharging and refreshing banks in memory device with bank group architecture
US10783950B2 (en) * 2015-09-02 2020-09-22 Nvidia Corporation Memory management systems and methods using a management communication bus
KR20190087893A (ko) 2018-01-17 2019-07-25 삼성전자주식회사 클럭을 공유하는 반도체 패키지 및 전자 시스템
US11036578B2 (en) 2018-04-12 2021-06-15 Samsung Electronics Co., Ltd. Semiconductor memory devices and memory systems including the same
CN110729006B (zh) * 2018-07-16 2022-07-05 超威半导体(上海)有限公司 存储器控制器中的刷新方案
US10747613B2 (en) * 2018-09-07 2020-08-18 Toshiba Memory Corporation Pooled frontline ECC decoders in memory systems
CN114556431B (zh) * 2019-10-29 2025-05-27 Oppo广东移动通信有限公司 增强现实的3d重建
US11392299B2 (en) 2019-12-20 2022-07-19 Micron Technology, Inc. Multi-purpose signaling for a memory system
US11360695B2 (en) 2020-09-16 2022-06-14 Micron Technology, Inc. Apparatus with combinational access mechanism and methods for operating the same

Family Cites Families (16)

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JPS57150227A (en) * 1981-03-12 1982-09-17 Nec Corp Buffer circuit
CA2074307C (en) 1991-07-29 1995-12-12 Leslie J. Sell Rope guide
JPH065069A (ja) * 1992-06-18 1994-01-14 Nec Corp ダイナミック・ランダム・アクセス・メモリ
JP3376960B2 (ja) * 1999-06-01 2003-02-17 日本電気株式会社 半導体記憶装置およびそれを用いたシステム
JP4069078B2 (ja) * 2004-01-07 2008-03-26 松下電器産業株式会社 Dram制御装置およびdram制御方法
US7627804B2 (en) 2006-06-30 2009-12-01 Intel Corporation Memory device with speculative commands to memory core
US7937641B2 (en) 2006-12-21 2011-05-03 Smart Modular Technologies, Inc. Memory modules with error detection and correction
KR101308047B1 (ko) 2007-02-08 2013-09-12 삼성전자주식회사 메모리 시스템, 이 시스템을 위한 메모리, 및 이 메모리를위한 명령 디코딩 방법
US8132074B2 (en) 2007-11-19 2012-03-06 Intel Corporation Reliability, availability, and serviceability solutions for memory technology
US9158616B2 (en) 2009-12-09 2015-10-13 Intel Corporation Method and system for error management in a memory device
US8392650B2 (en) * 2010-04-01 2013-03-05 Intel Corporation Fast exit from self-refresh state of a memory device
US9432298B1 (en) * 2011-12-09 2016-08-30 P4tents1, LLC System, method, and computer program product for improving memory systems
KR101873526B1 (ko) 2011-06-09 2018-07-02 삼성전자주식회사 에러 정정회로를 구비한 온 칩 데이터 스크러빙 장치 및 방법
KR101253199B1 (ko) * 2011-07-25 2013-04-10 엘지전자 주식회사 조명 장치
KR101962874B1 (ko) * 2012-04-24 2019-03-27 삼성전자주식회사 메모리 장치, 메모리 컨트롤러, 메모리 시스템 및 이의 동작 방법
US9881656B2 (en) 2014-01-09 2018-01-30 Qualcomm Incorporated Dynamic random access memory (DRAM) backchannel communication systems and methods

Also Published As

Publication number Publication date
CA2932653A1 (en) 2015-07-16
CN105917312B (zh) 2019-03-08
EP3092568A1 (en) 2016-11-16
US20180114553A1 (en) 2018-04-26
JP2017503303A (ja) 2017-01-26
US9881656B2 (en) 2018-01-30
TW201543498A (zh) 2015-11-16
BR112016015961A2 (pt) 2017-08-08
KR20160106096A (ko) 2016-09-09
US20150194197A1 (en) 2015-07-09
CN105917312A (zh) 2016-08-31
WO2015105948A1 (en) 2015-07-16
US10224081B2 (en) 2019-03-05

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