BR112014012354A8 - dispositivo de medição de distribuição de potencial de superfície e método de medição de distribuição de potencial de superfície - Google Patents

dispositivo de medição de distribuição de potencial de superfície e método de medição de distribuição de potencial de superfície

Info

Publication number
BR112014012354A8
BR112014012354A8 BR112014012354A BR112014012354A BR112014012354A8 BR 112014012354 A8 BR112014012354 A8 BR 112014012354A8 BR 112014012354 A BR112014012354 A BR 112014012354A BR 112014012354 A BR112014012354 A BR 112014012354A BR 112014012354 A8 BR112014012354 A8 BR 112014012354A8
Authority
BR
Brazil
Prior art keywords
surface potential
distribution measuring
potential distribution
measuring device
voltage
Prior art date
Application number
BR112014012354A
Other languages
English (en)
Portuguese (pt)
Other versions
BR112014012354A2 (pt
Inventor
kumada Akiko
Ikeda Hisatoshi
Hidaka Kunihiko
Yamada Shinichiro
Yoshimitsu Tetsuo
Tsuboi Yuichi
Original Assignee
Univ Tokyo
Toshiba Mitsubishi Elec Ind
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Univ Tokyo, Toshiba Mitsubishi Elec Ind filed Critical Univ Tokyo
Publication of BR112014012354A2 publication Critical patent/BR112014012354A2/pt
Publication of BR112014012354A8 publication Critical patent/BR112014012354A8/pt

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/12—Measuring electrostatic fields or voltage-potential
    • G01R29/14—Measuring field distribution
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
    • G01R15/14—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks
    • G01R15/24—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using light-modulating devices
    • G01R15/241—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using light-modulating devices using electro-optical modulators, e.g. electro-absorption
    • G01R15/242—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using light-modulating devices using electro-optical modulators, e.g. electro-absorption based on the Pockels effect, i.e. linear electro-optic effect
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/12—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing
    • G01R31/1227—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing of components, parts or materials
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/34—Testing dynamo-electric machines

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Circuit Breakers, Generators, And Electric Motors (AREA)
  • Measurement Of Current Or Voltage (AREA)
  • Insulation, Fastening Of Motor, Generator Windings (AREA)
  • Measuring Instrument Details And Bridges, And Automatic Balancing Devices (AREA)
BR112014012354A 2011-11-25 2012-11-21 dispositivo de medição de distribuição de potencial de superfície e método de medição de distribuição de potencial de superfície BR112014012354A8 (pt)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2011258147A JP6192890B2 (ja) 2011-11-25 2011-11-25 表面電位分布計測装置および表面電位分布計測方法
PCT/JP2012/007467 WO2013076975A1 (ja) 2011-11-25 2012-11-21 表面電位分布計測装置および表面電位分布計測方法

Publications (2)

Publication Number Publication Date
BR112014012354A2 BR112014012354A2 (pt) 2017-06-13
BR112014012354A8 true BR112014012354A8 (pt) 2017-06-20

Family

ID=48469440

Family Applications (1)

Application Number Title Priority Date Filing Date
BR112014012354A BR112014012354A8 (pt) 2011-11-25 2012-11-21 dispositivo de medição de distribuição de potencial de superfície e método de medição de distribuição de potencial de superfície

Country Status (7)

Country Link
US (1) US9702915B2 (https=)
EP (1) EP2784526B1 (https=)
JP (1) JP6192890B2 (https=)
CN (1) CN104024874B (https=)
BR (1) BR112014012354A8 (https=)
CA (1) CA2856201C (https=)
WO (1) WO2013076975A1 (https=)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9647454B2 (en) 2011-08-31 2017-05-09 Aclara Technologies Llc Methods and apparatus for determining conditions of power lines
EP2815479B1 (en) 2012-02-14 2017-01-04 Tollgrade Communications, Inc. Power line management system
US9714968B2 (en) * 2013-03-19 2017-07-25 Toshiba Mitsubishi-Electric Industrial Systems Corporation Surface potential distribution measuring device
WO2015153539A2 (en) * 2014-03-31 2015-10-08 Tollgrade Communication, Inc. Optical voltage sensing for underground medium voltage wires
BR112016027835B1 (pt) * 2014-06-06 2022-01-25 Toshiba Mitsubishi-Electric Industrial Systems Corporation Aparelho de medição de distribuição de potencial de superfície tridimensional
US10203355B2 (en) 2014-08-29 2019-02-12 Aclara Technologies Llc Power extraction for a medium voltage sensor using a capacitive voltage divider
EP3415933B1 (en) 2016-02-08 2024-08-07 TMEIC Corporation Three-dimensional surface potential distribution measurement system
CN107884632B (zh) * 2017-10-18 2020-10-20 中国电力科学研究院 一种任意分裂直流线路导线表面电场的计算方法及系统
CN109709408B (zh) * 2019-03-08 2024-05-10 广东省职业病防治院 空间直流电场测量设备
CN111721994B (zh) * 2020-06-19 2022-09-06 贵州江源电力建设有限公司 一种分布式高压输电线路的电压检测系统
CN116718915A (zh) * 2023-08-10 2023-09-08 西门子电机(中国)有限公司 电机槽口电场强度检测方法、装置、电子设备和存储介质

Family Cites Families (23)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0067683B1 (en) * 1981-06-12 1986-08-20 Kabushiki Kaisha Meidensha Electric field detector
DK4787A (da) * 1986-01-06 1987-07-07 Rank Taylor Hobson Ltd Apparat og fremgangsmaade til maaling ved anvendelse af polariseret modulation af en udsendt straale
DE3740468A1 (de) * 1987-11-28 1989-06-08 Kernforschungsz Karlsruhe Vorrichtung zur beruehrungslosen messung statischer und/oder zeitlich veraenderlicher elektrischer felder
CN1038277C (zh) * 1987-12-28 1998-05-06 佳能公司 成象设备
JP2733609B2 (ja) * 1988-10-29 1998-03-30 キヤノン株式会社 転写装置
US4937457A (en) * 1989-02-10 1990-06-26 Slm Instruments, Inc. Picosecond multi-harmonic fourier fluorometer
DE69010053T2 (de) * 1989-04-12 1994-10-13 Hamamatsu Photonics Kk Methode und Vorrichtung zum Nachweis einer Spannung.
DE69206654T2 (de) * 1991-03-26 1996-07-11 Hamamatsu Photonics Kk Optischer Spannungsdetektor
FI915818A0 (fi) 1991-12-11 1991-12-11 Imatran Voima Oy Optisk rf-givare foer maetning av spaenning och elfaelt.
JPH05196672A (ja) * 1992-01-21 1993-08-06 Sharp Corp 電位計の校正方法及び異常検知方法
JP3264450B2 (ja) * 1992-03-04 2002-03-11 株式会社リコー 感光体表面の電界測定方法及びその装置
JPH06342017A (ja) * 1993-05-28 1994-12-13 Ricoh Co Ltd 電界強度測定装置
JPH07181211A (ja) * 1993-12-24 1995-07-21 Ricoh Co Ltd 表面電位計測装置
US6057677A (en) 1996-04-24 2000-05-02 Fujitsu Limited Electrooptic voltage waveform measuring method and apparatus
CN2289357Y (zh) * 1997-03-14 1998-08-26 武汉大学 X射线静电扫描仪
EP1229337A1 (de) * 2001-02-06 2002-08-07 Abb Research Ltd. Verfahren zur temparaturkompensierten elektro-optischen Messung einer elektrischen Spannung
WO2003010762A1 (en) * 2001-07-20 2003-02-06 Discovision Associates Photonics data storage system using a polypeptide material and method for making same
KR100467599B1 (ko) * 2002-07-24 2005-01-24 삼성전자주식회사 표면전위 측정기를 구비하는 화상 형성 장치 및 이를이용한 현상 전압 제어 방법
CA2829445C (en) * 2005-06-20 2016-05-03 Nippon Telegraph And Telephone Corporation Electrooptic device
DE102005061716A1 (de) * 2005-12-22 2007-07-05 BME Meßgeräte Entwicklung KG Pockelszellen-Ansteuerschaltung zur schnellen Variation der Pulsamplitude von kurzen oder ultrakurzen Laserpulsen
US7929579B2 (en) * 2006-08-02 2011-04-19 Cynosure, Inc. Picosecond laser apparatus and methods for its operation and use
JP2009274104A (ja) * 2008-05-15 2009-11-26 Fujitsu Component Ltd 座標検出装置の製造装置
JP5072916B2 (ja) * 2009-07-16 2012-11-14 株式会社日立製作所 回転電機の固定子コイルの非線形抵抗測定方法、および、非線形抵抗測定装置

Also Published As

Publication number Publication date
EP2784526A1 (en) 2014-10-01
US20140300368A1 (en) 2014-10-09
JP2013113637A (ja) 2013-06-10
CA2856201C (en) 2018-08-14
CA2856201A1 (en) 2013-05-30
CN104024874B (zh) 2017-03-29
EP2784526B1 (en) 2022-08-17
BR112014012354A2 (pt) 2017-06-13
JP6192890B2 (ja) 2017-09-06
EP2784526A4 (en) 2015-07-22
CN104024874A (zh) 2014-09-03
WO2013076975A1 (ja) 2013-05-30
US9702915B2 (en) 2017-07-11

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Legal Events

Date Code Title Description
B06F Objections, documents and/or translations needed after an examination request according [chapter 6.6 patent gazette]
B06U Preliminary requirement: requests with searches performed by other patent offices: procedure suspended [chapter 6.21 patent gazette]
B07A Application suspended after technical examination (opinion) [chapter 7.1 patent gazette]
B350 Update of information on the portal [chapter 15.35 patent gazette]
B09B Patent application refused [chapter 9.2 patent gazette]
B12B Appeal against refusal [chapter 12.2 patent gazette]