BR112013027644A2 - método de medição de conformação - Google Patents

método de medição de conformação

Info

Publication number
BR112013027644A2
BR112013027644A2 BR112013027644A BR112013027644A BR112013027644A2 BR 112013027644 A2 BR112013027644 A2 BR 112013027644A2 BR 112013027644 A BR112013027644 A BR 112013027644A BR 112013027644 A BR112013027644 A BR 112013027644A BR 112013027644 A2 BR112013027644 A2 BR 112013027644A2
Authority
BR
Brazil
Prior art keywords
conformation
measurement method
measurement
conformation measurement
Prior art date
Application number
BR112013027644A
Other languages
English (en)
Portuguese (pt)
Inventor
Yamamoto Hideaki
Kiryu Hidetake
Oishi Hiroshi
Kura Kenji
Yamasaki Kenjiro
Original Assignee
Mitsubishi Heavy Ind Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Heavy Ind Ltd filed Critical Mitsubishi Heavy Ind Ltd
Publication of BR112013027644A2 publication Critical patent/BR112013027644A2/pt

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
    • G01B21/20—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring contours or curvatures, e.g. determining profile
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T1/00—General purpose image data processing
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T17/00—Three dimensional [3D] modelling, e.g. data description of 3D objects
    • G06T17/20—Finite element generation, e.g. wire-frame surface description, tesselation

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Graphics (AREA)
  • Geometry (AREA)
  • Software Systems (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
  • Processing Or Creating Images (AREA)
  • Image Processing (AREA)
BR112013027644A 2011-06-02 2012-02-24 método de medição de conformação BR112013027644A2 (pt)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2011124119 2011-06-02
JP2011190325A JP5022508B1 (ja) 2011-06-02 2011-09-01 形状計測方法
PCT/JP2012/054511 WO2012164987A1 (ja) 2011-06-02 2012-02-24 形状計測方法

Publications (1)

Publication Number Publication Date
BR112013027644A2 true BR112013027644A2 (pt) 2017-02-14

Family

ID=46980524

Family Applications (1)

Application Number Title Priority Date Filing Date
BR112013027644A BR112013027644A2 (pt) 2011-06-02 2012-02-24 método de medição de conformação

Country Status (8)

Country Link
JP (1) JP5022508B1 (ko)
KR (1) KR101497260B1 (ko)
CN (1) CN103534554A (ko)
BR (1) BR112013027644A2 (ko)
MX (1) MX2013012660A (ko)
RU (1) RU2013148563A (ko)
TW (1) TWI451282B (ko)
WO (1) WO2012164987A1 (ko)

Families Citing this family (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2014089104A (ja) * 2012-10-30 2014-05-15 Mitsubishi Electric Corp 体積推定装置、体積推定システム、体積推定方法および体積推定プログラム
JPWO2016035181A1 (ja) 2014-09-03 2017-06-22 株式会社ニコン 撮像装置、情報処理装置、及び撮像システム
JP6590653B2 (ja) * 2014-11-19 2019-10-16 首都高技術株式会社 点群データ利用システム
KR101676656B1 (ko) * 2014-12-22 2016-11-16 현대모비스 주식회사 장애물 검출 장치 및 장애물 검출 방법
EP3428877A4 (en) 2016-03-09 2019-10-30 Nikon Corporation DETECTION DEVICE, INFORMATION PROCESSING DEVICE, METHOD, PROGRAM, AND DETECTION SYSTEM
JP6790526B2 (ja) 2016-07-08 2020-11-25 富士通株式会社 ファセット化処理プログラム、ファセット抽出プログラム、ファセット化処理方法、ファセット抽出方法および情報処理装置
JP6747116B2 (ja) * 2016-07-08 2020-08-26 富士通株式会社 ボクセル化処理プログラム、ボクセル化処理方法および情報処理装置
JP6354054B1 (ja) * 2017-07-03 2018-07-11 国際航業株式会社 撮影支援装置、及び撮影方法
CN108895980A (zh) * 2018-05-23 2018-11-27 江苏理工学院 一种圆锥孔轮廓的检测装置及其检测方法
CN108801174A (zh) * 2018-05-25 2018-11-13 江苏理工学院 一种用于测量非圆内孔轮廓的检测装置及其检测方法
JP2019049572A (ja) * 2018-12-26 2019-03-28 株式会社ニコン 撮像装置、情報処理装置、及び撮像システム
JP2020149672A (ja) * 2019-03-11 2020-09-17 株式会社ミツトヨ 測定結果表示装置及びプログラム
JP6708917B1 (ja) * 2020-02-05 2020-06-10 リンクウィズ株式会社 形状検出方法、形状検出システム、プログラム
JP6713700B1 (ja) * 2020-03-09 2020-06-24 リンクウィズ株式会社 情報処理方法、情報処理システム、プログラム
CN112767549B (zh) * 2020-12-29 2023-09-01 湖北中南鹏力海洋探测系统工程有限公司 一种高频地波雷达海态数据的等高面生成方法
DE102021110650A1 (de) * 2021-04-26 2022-10-27 Oechsler Ag Verfahren zum zellkonformen Teilen einer Gitterstruktur
TWI817487B (zh) * 2021-05-13 2023-10-01 日商芝浦機械股份有限公司 檢測工具的形狀的裝置及檢測工具的形狀的方法

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH03240170A (ja) * 1990-02-16 1991-10-25 Hitachi Ltd 三次元物体表面の再構成方法
JP3054301B2 (ja) * 1993-11-30 2000-06-19 キヤノン株式会社 画像処理方法及び装置
JP3483276B2 (ja) * 1993-09-17 2004-01-06 キヤノン株式会社 ３次元画像表示方法及び装置
US5969725A (en) * 1995-03-17 1999-10-19 Canon Kabushiki Kaisha Unification of three-dimensional image data having plural surface shapes
JP3658038B2 (ja) * 1995-04-20 2005-06-08 キヤノン株式会社 ３次元形状データ統合方法及びその装置と３次元画像処理方法
JP3647779B2 (ja) * 2000-08-15 2005-05-18 株式会社ソニー・コンピュータエンタテインメント 図形データ生成方法、図形生成装置及びその構成品
JP2003345840A (ja) * 2002-05-24 2003-12-05 Honda Motor Co Ltd 三次元モデル作成方法
JP2007523402A (ja) * 2004-01-13 2007-08-16 コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ 内部個別要素を用いるメッシュモデル
KR20070092006A (ko) * 2006-03-08 2007-09-12 포스앤핏 주식회사 3차원 영상 처리 방법 및 이를 구현할 수 있는 프로그램이수록된 기록매체
TWI315042B (en) * 2006-11-21 2009-09-21 Jing Jing Fan Method of three-dimensional digital human model construction from two photos and obtaining anthropometry information
US20080303810A1 (en) * 2007-06-07 2008-12-11 Seockhoon Bae System and method for calculating loft surfaces using 3d scan data
JP4727689B2 (ja) * 2008-04-28 2011-07-20 三菱重工業株式会社 ワーク計測装置、衝突防止装置および工作機械
CN101510225B (zh) * 2009-03-26 2011-03-30 山东理工大学 产品stl模型布尔运算方法

Also Published As

Publication number Publication date
KR101497260B1 (ko) 2015-02-27
JP5022508B1 (ja) 2012-09-12
KR20130137695A (ko) 2013-12-17
TW201250509A (en) 2012-12-16
WO2012164987A1 (ja) 2012-12-06
CN103534554A (zh) 2014-01-22
RU2013148563A (ru) 2015-07-20
JP2013011579A (ja) 2013-01-17
TWI451282B (zh) 2014-09-01
MX2013012660A (es) 2013-12-02

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Legal Events

Date Code Title Description
B08F Application fees: application dismissed [chapter 8.6 patent gazette]
B08K Patent lapsed as no evidence of payment of the annual fee has been furnished to inpi [chapter 8.11 patent gazette]