BR112012023274B1 - Dispositivo de análise de uma superfície transparente de um substrato e processo de análise de uma superfície transparente ou especular de um substrato - Google Patents
Dispositivo de análise de uma superfície transparente de um substrato e processo de análise de uma superfície transparente ou especular de um substrato Download PDFInfo
- Publication number
- BR112012023274B1 BR112012023274B1 BR112012023274-6A BR112012023274A BR112012023274B1 BR 112012023274 B1 BR112012023274 B1 BR 112012023274B1 BR 112012023274 A BR112012023274 A BR 112012023274A BR 112012023274 B1 BR112012023274 B1 BR 112012023274B1
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- Brazil
- Prior art keywords
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- pixel
- Prior art date
Links
- 239000000758 substrate Substances 0.000 title claims abstract description 104
- 238000000034 method Methods 0.000 title claims abstract description 32
- 230000008569 process Effects 0.000 title claims abstract description 20
- 238000004458 analytical method Methods 0.000 title description 13
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- 238000010252 digital analysis Methods 0.000 claims abstract description 5
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- 238000011282 treatment Methods 0.000 claims description 20
- 230000000694 effects Effects 0.000 claims description 13
- 238000005259 measurement Methods 0.000 claims description 12
- 239000011521 glass Substances 0.000 claims description 11
- 238000005286 illumination Methods 0.000 claims description 2
- 238000013507 mapping Methods 0.000 claims 1
- 238000010191 image analysis Methods 0.000 abstract 1
- 238000004364 calculation method Methods 0.000 description 10
- 238000004519 manufacturing process Methods 0.000 description 7
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- 239000005357 flat glass Substances 0.000 description 1
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Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N21/958—Inspecting transparent materials or objects, e.g. windscreens
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
- G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
- G01N21/896—Optical defects in or on transparent materials, e.g. distortion, surface flaws in conveyed flat sheet or rod
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N2021/9513—Liquid crystal panels
Landscapes
- Analytical Chemistry (AREA)
- Immunology (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- General Health & Medical Sciences (AREA)
- Biochemistry (AREA)
- Pathology (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Textile Engineering (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Length Measuring Devices By Optical Means (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| FR1052477A FR2958404B1 (fr) | 2010-04-01 | 2010-04-01 | Procede et dispositif d'analyse de la qualite optique d'un substrat transparent |
| FR1052477 | 2010-04-01 | ||
| PCT/FR2011/050675 WO2011121219A1 (fr) | 2010-04-01 | 2011-03-28 | Procede et dispositif d'analyse de la qualite optique d'un substrat transparent |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| BR112012023274A2 BR112012023274A2 (pt) | 2016-05-17 |
| BR112012023274B1 true BR112012023274B1 (pt) | 2020-05-26 |
Family
ID=42666144
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| BR112012023274-6A BR112012023274B1 (pt) | 2010-04-01 | 2011-03-28 | Dispositivo de análise de uma superfície transparente de um substrato e processo de análise de uma superfície transparente ou especular de um substrato |
Country Status (13)
| Country | Link |
|---|---|
| US (1) | US8736688B2 (https=) |
| EP (1) | EP2553439B1 (https=) |
| JP (1) | JP2013524192A (https=) |
| KR (2) | KR20180018829A (https=) |
| CN (1) | CN103097879B (https=) |
| BR (1) | BR112012023274B1 (https=) |
| EA (1) | EA026441B1 (https=) |
| ES (1) | ES2751989T3 (https=) |
| FR (1) | FR2958404B1 (https=) |
| MX (1) | MX2012010900A (https=) |
| PL (1) | PL2553439T3 (https=) |
| PT (1) | PT2553439T (https=) |
| WO (1) | WO2011121219A1 (https=) |
Families Citing this family (18)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE102011109793B4 (de) * | 2011-08-08 | 2014-12-04 | Grenzbach Maschinenbau Gmbh | Verfahren und Vorrichtung zur sicheren Detektion von Materialfehlern in transparenten Werkstoffen |
| FR2983583B1 (fr) * | 2011-12-02 | 2013-11-15 | Saint Gobain | Dispositif d'analyse des defauts d'aspect d'un substrat transparent |
| US9007454B2 (en) * | 2012-10-31 | 2015-04-14 | The Aerospace Corporation | Optimized illumination for imaging |
| CN103454287A (zh) * | 2013-09-05 | 2013-12-18 | 深圳市维图视技术有限公司 | 一种玻璃管缺陷视觉检测方法及其装置 |
| CN103472072A (zh) * | 2013-09-09 | 2013-12-25 | 深圳市维图视技术有限公司 | 一种新的玻璃管缺陷视觉检测方法及其装置 |
| CN105764860B (zh) | 2013-11-25 | 2019-01-11 | 康宁股份有限公司 | 用于确定基本上圆柱形镜面反射表面的形状的方法 |
| NL2014399A (en) * | 2014-04-24 | 2015-11-02 | Asml Holding Nv | Compact two-sided reticle inspection system. |
| JP6559225B2 (ja) * | 2014-08-08 | 2019-08-14 | ヘレーウス クオーツ ノース アメリカ エルエルシーＨｅｒａｅｕｓ Ｑｕａｒｔｚ Ｎｏｒｔｈ Ａｍｅｒｉｃａ ＬＬＣ | 光ファイバ母材の幾何学的特性を求めるための方法及び装置 |
| US20160178535A1 (en) * | 2014-12-17 | 2016-06-23 | Xerox Corporation | Inspection Device And Method |
| WO2018133945A1 (en) * | 2017-01-20 | 2018-07-26 | Hp Indigo B.V. | Identifying linear defects |
| IT201700075428A1 (it) * | 2017-07-05 | 2019-01-05 | Antares Vision S R L | Dispositivo di ispezione di contenitori particolarmente per il rilevamento di difetti lineari |
| KR102358582B1 (ko) * | 2017-08-23 | 2022-02-04 | 삼성전자 주식회사 | 휴대 단말의 커버 글래스의 광학적 특성을 확인하는 검사 장치 및 커버 글래의 광학적 특성의 확인 방법 |
| FR3085205B1 (fr) * | 2018-08-22 | 2020-07-24 | Livbag Sas | Dispositif et methode de controle de verre de protection de soudeuse laser |
| EP3640630B1 (en) * | 2018-10-18 | 2026-03-11 | Infineon Technologies AG | Embedded wafer inspection |
| WO2020187994A1 (en) * | 2019-03-19 | 2020-09-24 | Central Glass Co., Ltd. | Optical pattern for information acquisition system |
| CN111107257A (zh) * | 2020-01-20 | 2020-05-05 | 成都德图福思科技有限公司 | 针对透明介质表面刻蚀或浮雕图案进行高对比度成像的方法 |
| EP3875893A1 (en) * | 2020-03-02 | 2021-09-08 | Trifid Automation, s.r.o. | Method and device for contactless measurement of geometric objects |
| FR3151094B1 (fr) * | 2023-07-10 | 2025-07-18 | Sas Woodoo | Procede d’evaluation de la clarte d’un materiau, notamment non-homogene |
Family Cites Families (16)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS61176839A (ja) * | 1985-01-31 | 1986-08-08 | Kanebo Ltd | 透明または半透明の板状体の欠点検査装置 |
| US5175601A (en) * | 1991-10-15 | 1992-12-29 | Electro-Optical Information Systems | High-speed 3-D surface measurement surface inspection and reverse-CAD system |
| JP2795595B2 (ja) * | 1992-06-26 | 1998-09-10 | セントラル硝子株式会社 | 透明板状体の欠点検出方法 |
| JPH10111252A (ja) * | 1996-10-02 | 1998-04-28 | Asahi Glass Co Ltd | ガラス板の欠点検出装置 |
| US6509967B1 (en) | 1996-10-18 | 2003-01-21 | Innomess Gelsellschaft Fur Messtechnik Mbh | Method for detecting optical errors in large surface panels |
| US6208412B1 (en) | 1999-06-14 | 2001-03-27 | Visteon Global Technologies, Inc. | Method and apparatus for determining optical quality |
| JP4633245B2 (ja) * | 2000-11-06 | 2011-02-16 | 住友化学株式会社 | 表面検査装置及び表面検査方法 |
| DE10301941B4 (de) * | 2003-01-20 | 2005-11-17 | Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. | Kamera und Verfahren zur optischen Aufnahme eines Schirms |
| KR100615576B1 (ko) * | 2003-02-06 | 2006-08-25 | 주식회사 고영테크놀러지 | 3차원형상 측정장치 |
| US7369253B2 (en) * | 2004-10-13 | 2008-05-06 | Akrometrix, Llc | Systems and methods for measuring sample surface flatness of continuously moving samples |
| US20060092276A1 (en) * | 2004-10-28 | 2006-05-04 | Ariglio James A | Inspection system and method for identifying surface and body defects in a glass sheet |
| FR2898969B1 (fr) * | 2006-03-24 | 2008-10-24 | Peugeot Citroen Automobiles Sa | Procede et installation de controle de la qualite de pieces |
| US8736677B2 (en) * | 2008-08-07 | 2014-05-27 | Kde Corporation | Inspection system |
| NL2003263A (en) * | 2008-08-20 | 2010-03-10 | Asml Holding Nv | Particle detection on an object surface. |
| FR2936605B1 (fr) | 2008-10-01 | 2014-10-31 | Saint Gobain | Dispositif d'analyse de la surface d'un substrat |
| CN101592621A (zh) * | 2009-05-18 | 2009-12-02 | 济南佳美视觉技术有限公司 | 一种使用折射栅格光源检验玻璃瓶表面缺陷及内部缺陷的自动光学检验设备 |
-
2010
- 2010-04-01 FR FR1052477A patent/FR2958404B1/fr not_active Expired - Fee Related
-
2011
- 2011-03-28 KR KR1020187003691A patent/KR20180018829A/ko not_active Ceased
- 2011-03-28 US US13/637,318 patent/US8736688B2/en active Active
- 2011-03-28 ES ES11717302T patent/ES2751989T3/es active Active
- 2011-03-28 MX MX2012010900A patent/MX2012010900A/es active IP Right Grant
- 2011-03-28 EP EP11717302.1A patent/EP2553439B1/fr active Active
- 2011-03-28 BR BR112012023274-6A patent/BR112012023274B1/pt not_active IP Right Cessation
- 2011-03-28 EA EA201290998A patent/EA026441B1/ru not_active IP Right Cessation
- 2011-03-28 CN CN201180017405.0A patent/CN103097879B/zh not_active Expired - Fee Related
- 2011-03-28 JP JP2013501904A patent/JP2013524192A/ja active Pending
- 2011-03-28 PL PL11717302T patent/PL2553439T3/pl unknown
- 2011-03-28 KR KR1020127025532A patent/KR20130014528A/ko not_active Ceased
- 2011-03-28 WO PCT/FR2011/050675 patent/WO2011121219A1/fr not_active Ceased
- 2011-03-28 PT PT117173021T patent/PT2553439T/pt unknown
Also Published As
| Publication number | Publication date |
|---|---|
| WO2011121219A1 (fr) | 2011-10-06 |
| PT2553439T (pt) | 2019-11-22 |
| US8736688B2 (en) | 2014-05-27 |
| EA201290998A1 (ru) | 2013-03-29 |
| FR2958404A1 (fr) | 2011-10-07 |
| EA026441B1 (ru) | 2017-04-28 |
| KR20180018829A (ko) | 2018-02-21 |
| EP2553439B1 (fr) | 2019-08-14 |
| KR20130014528A (ko) | 2013-02-07 |
| ES2751989T3 (es) | 2020-04-02 |
| US20130010175A1 (en) | 2013-01-10 |
| CN103097879A (zh) | 2013-05-08 |
| EP2553439A1 (fr) | 2013-02-06 |
| FR2958404B1 (fr) | 2012-04-27 |
| BR112012023274A2 (pt) | 2016-05-17 |
| PL2553439T3 (pl) | 2020-02-28 |
| CN103097879B (zh) | 2017-01-18 |
| MX2012010900A (es) | 2012-11-06 |
| JP2013524192A (ja) | 2013-06-17 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| B06F | Objections, documents and/or translations needed after an examination request according [chapter 6.6 patent gazette] | ||
| B06U | Preliminary requirement: requests with searches performed by other patent offices: procedure suspended [chapter 6.21 patent gazette] | ||
| B09A | Decision: intention to grant [chapter 9.1 patent gazette] | ||
| B16A | Patent or certificate of addition of invention granted [chapter 16.1 patent gazette] |
Free format text: PRAZO DE VALIDADE: 20 (VINTE) ANOS CONTADOS A PARTIR DE 28/03/2011, OBSERVADAS AS CONDICOES LEGAIS. |
|
| B21F | Lapse acc. art. 78, item iv - on non-payment of the annual fees in time |
Free format text: REFERENTE A 13A ANUIDADE. |
|
| B24J | Lapse because of non-payment of annual fees (definitively: art 78 iv lpi, resolution 113/2013 art. 12) |
Free format text: EM VIRTUDE DA EXTINCAO PUBLICADA NA RPI 2768 DE 23-01-2024 E CONSIDERANDO AUSENCIA DE MANIFESTACAO DENTRO DOS PRAZOS LEGAIS, INFORMO QUE CABE SER MANTIDA A EXTINCAO DA PATENTE E SEUS CERTIFICADOS, CONFORME O DISPOSTO NO ARTIGO 12, DA RESOLUCAO 113/2013. |