BR112012017098A2 - sistema de microscopia óptico para depleção por emissão estimulada (sted) de um objeto associado, subunidade óptica e método para realizar microscopia óptico para depleção por emissão estimulada (sted) de um objeto - Google Patents

sistema de microscopia óptico para depleção por emissão estimulada (sted) de um objeto associado, subunidade óptica e método para realizar microscopia óptico para depleção por emissão estimulada (sted) de um objeto

Info

Publication number
BR112012017098A2
BR112012017098A2 BR112012017098A BR112012017098A BR112012017098A2 BR 112012017098 A2 BR112012017098 A2 BR 112012017098A2 BR 112012017098 A BR112012017098 A BR 112012017098A BR 112012017098 A BR112012017098 A BR 112012017098A BR 112012017098 A2 BR112012017098 A2 BR 112012017098A2
Authority
BR
Brazil
Prior art keywords
sted
emission depletion
optical microscopy
optical
subunit
Prior art date
Application number
BR112012017098A
Other languages
English (en)
Other versions
BR112012017098A8 (pt
Inventor
Bernardus Hendrikus Wilhelmus Hendriks
Gert T Hooft
Jeroen Jan Lambertus
Original Assignee
Koninkl Philips Electronics Nv
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Family has litigation
First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=43769285&utm_source=google_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=BR112012017098(A2) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.
Application filed by Koninkl Philips Electronics Nv filed Critical Koninkl Philips Electronics Nv
Publication of BR112012017098A2 publication Critical patent/BR112012017098A2/pt
Publication of BR112012017098A8 publication Critical patent/BR112012017098A8/pt

Links

Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0052—Optical details of the image generation
    • G02B21/0076—Optical details of the image generation arrangements using fluorescence or luminescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G01N21/645—Specially adapted constructive features of fluorimeters
    • G01N21/6456—Spatial resolved fluorescence measurements; Imaging
    • G01N21/6458—Fluorescence microscopy
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0032—Optical details of illumination, e.g. light-sources, pinholes, beam splitters, slits, fibers

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Optics & Photonics (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Microscoopes, Condenser (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Endoscopes (AREA)
BR112012017098A 2010-01-15 2011-01-13 Sistema de microscopia óptico para depleção por emissão estimulada (sted) de um objeto associado, subunidade óptica e método para realizar microscopia óptica com depleção por emissão estimulada (sted) de um objeto BR112012017098A8 (pt)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US29536910P 2010-01-15 2010-01-15
PCT/IB2011/050154 WO2011086519A1 (en) 2010-01-15 2011-01-13 A stimulated emission depletion (sted) microscopy system

Publications (2)

Publication Number Publication Date
BR112012017098A2 true BR112012017098A2 (pt) 2016-04-12
BR112012017098A8 BR112012017098A8 (pt) 2017-11-07

Family

ID=43769285

Family Applications (1)

Application Number Title Priority Date Filing Date
BR112012017098A BR112012017098A8 (pt) 2010-01-15 2011-01-13 Sistema de microscopia óptico para depleção por emissão estimulada (sted) de um objeto associado, subunidade óptica e método para realizar microscopia óptica com depleção por emissão estimulada (sted) de um objeto

Country Status (7)

Country Link
US (1) US10725275B2 (pt)
EP (1) EP2524259B2 (pt)
JP (1) JP5766210B2 (pt)
CN (1) CN102713719B (pt)
BR (1) BR112012017098A8 (pt)
RU (1) RU2550575C2 (pt)
WO (1) WO2011086519A1 (pt)

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Publication number Priority date Publication date Assignee Title
JP5766210B2 (ja) 2010-01-15 2015-08-19 コーニンクレッカ フィリップス エヌ ヴェ 誘導放出抑制顕微鏡システム
FR2966258B1 (fr) 2010-10-15 2013-05-03 Bioaxial Système de microscopie de superresolution de fluorescence et méthode pour des applications biologiques
GB201121514D0 (en) * 2011-12-14 2012-01-25 Univ Dundee Improvements in and relating to three dimensional stimulated emission depletion microscopy
JP6335160B2 (ja) 2012-04-13 2018-05-30 バイオアキシアル エスエーエス 光学測定方法および光学測定装置
FR2989472B1 (fr) 2012-04-13 2015-09-25 Bioaxial Procede et dispositif optique
EP2657747A1 (en) * 2012-04-24 2013-10-30 Deutsches Krebsforschungszentrum 4Pi STED fluorescence light microscope with high three-dimensional spatial resolution
GB201217171D0 (en) * 2012-08-23 2012-11-07 Isis Innovation Stimulated emission depletion microscopy
JP2014182239A (ja) * 2013-03-19 2014-09-29 Olympus Corp 超解像顕微鏡
JP6234105B2 (ja) * 2013-08-05 2017-11-22 オリンパス株式会社 超解像顕微鏡
CN103543135B (zh) * 2013-10-18 2016-06-01 浙江大学 一种基于荧光寿命分布的纳米精度光斑对准方法和装置
CN103901629A (zh) * 2014-04-23 2014-07-02 中国科学院光电技术研究所 一种实现远场超分辨成像的方法和装置
US10921255B2 (en) 2014-12-09 2021-02-16 Bioaxial Sas Optical measuring device and process
EP3365721B1 (en) * 2015-10-19 2022-04-27 Deutsches Krebsforschungszentrum Chromatic phase plate
CN106645064B (zh) * 2016-12-13 2019-10-18 华南师范大学 一种受激辐射损耗方法、超分辨成像方法及显微成像装置
DE202017100426U1 (de) * 2017-01-26 2017-02-07 Abberior Instruments Gmbh Vorrichtung zum Aufrüsten eines einen Kameraanschluss aufweisenden Lichtmikroskops zu einem STED- Mikroskop
JP6253830B2 (ja) * 2017-05-17 2017-12-27 オリンパス株式会社 超解像顕微鏡
DE102017122413A1 (de) 2017-09-27 2019-03-28 Abberior Instruments Gmbh Vorrichtung für das selektive Formen von Phasenfronten eines Lichtstrahls und deren Verwendung
EP3686643A1 (en) * 2019-01-25 2020-07-29 Hochschule Für Angewandte Wissenschaften München Pulse shaping for stimulated emission depletion microscopy
WO2020198487A1 (en) 2019-03-26 2020-10-01 The Johns Hopkins University Background-suppressed sted nanoscope
CN111579486B (zh) * 2020-06-04 2021-02-26 深圳大学 基于低功率受激发射损耗的超分辨成像方法及成像系统
DE102021101164B4 (de) 2021-01-20 2024-06-27 Xolo Gmbh Verfahren und Vorrichtung zum Herstellen eines dreidimensionalen Objekts in einem optisch reaktiven Ausgangsmaterial
CN116067935B (zh) * 2023-04-06 2023-07-11 北京攸维医疗科技有限公司 一种单光束光路的超分辨成像方法与装置

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DE10154699B4 (de) * 2001-11-09 2004-04-08 MAX-PLANCK-Gesellschaft zur Förderung der Wissenschaften e.V. Verfahren und Vorrichtung zum räumlich eng begrenzten Anregen eines optischen Übergangs
JP2003344777A (ja) 2002-05-24 2003-12-03 Japan Science & Technology Corp 光ファイバ顕微鏡および内視鏡
JP4334835B2 (ja) * 2002-08-28 2009-09-30 独立行政法人科学技術振興機構 顕微鏡
US8057963B2 (en) * 2004-06-10 2011-11-15 Lsi Corporation Maskless vortex phase shift optical direct write lithography
DE102005013116B4 (de) * 2005-03-18 2022-05-25 Leica Microsystems Cms Gmbh Phasenfilter und ein Mikroskop
DE102007025688A1 (de) * 2007-06-01 2008-12-11 MAX-PLANCK-Gesellschaft zur Förderung der Wissenschaften e.V. Wellenlängen- oder polarisationssensitiver optischer Aufbau und dessen Verwendung
WO2009087527A1 (en) * 2008-01-04 2009-07-16 Koninklijke Philips Electronics N.V. An optical probe
DE112009000171A5 (de) 2008-02-12 2011-02-10 Dodt, Hans-Ulrich, Prof. Dr. Vorrichtung zum optischen Abbilden einer Probe
DE102008019957B4 (de) * 2008-04-21 2015-04-30 MAX-PLANCK-Gesellschaft zur Förderung der Wissenschaften e.V. Verfahren zum Bestrahlen einer Probe mit Licht und Fluoreszenzlichtmikroskop mit einer Beleuchtungseinheit zum Bestrahlen einer Probe mit Licht
DE202009007250U1 (de) * 2009-05-20 2009-11-26 Deutsches Krebsforschungszentrum Stiftung des öffentlichen Rechts Feldveränderungsmittel zur Erzeugung komplementärer Lichtintensitätsmuster
JP5766210B2 (ja) 2010-01-15 2015-08-19 コーニンクレッカ フィリップス エヌ ヴェ 誘導放出抑制顕微鏡システム

Also Published As

Publication number Publication date
BR112012017098A8 (pt) 2017-11-07
US20140145093A1 (en) 2014-05-29
RU2550575C2 (ru) 2015-05-10
JP2013517523A (ja) 2013-05-16
EP2524259A1 (en) 2012-11-21
US10725275B2 (en) 2020-07-28
JP5766210B2 (ja) 2015-08-19
EP2524259B1 (en) 2018-10-31
CN102713719B (zh) 2016-03-23
WO2011086519A1 (en) 2011-07-21
RU2012134749A (ru) 2014-02-20
CN102713719A (zh) 2012-10-03
EP2524259B2 (en) 2021-08-18

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Legal Events

Date Code Title Description
B25D Requested change of name of applicant approved

Owner name: KONINKLIJKE PHILIPS N.V (NL)

B25G Requested change of headquarter approved

Owner name: KONINKLIJKE PHILIPS N.V (NL)

B08F Application dismissed because of non-payment of annual fees [chapter 8.6 patent gazette]
B08K Patent lapsed as no evidence of payment of the annual fee has been furnished to inpi [chapter 8.11 patent gazette]

Free format text: EM VIRTUDE DO ARQUIVAMENTO PUBLICADO NA RPI 2447 DE 28-11-2017 E CONSIDERANDO AUSENCIA DE MANIFESTACAO DENTRO DOS PRAZOS LEGAIS, INFORMO QUE CABE SER MANTIDO O ARQUIVAMENTO DO PEDIDO DE PATENTE, CONFORME O DISPOSTO NO ARTIGO 12, DA RESOLUCAO 113/2013.