BR0006785A - Transistor sic nmosfet para uso como interruptor de força e método para sua fabricação - Google Patents
Transistor sic nmosfet para uso como interruptor de força e método para sua fabricaçãoInfo
- Publication number
- BR0006785A BR0006785A BR0006785-7A BR0006785A BR0006785A BR 0006785 A BR0006785 A BR 0006785A BR 0006785 A BR0006785 A BR 0006785A BR 0006785 A BR0006785 A BR 0006785A
- Authority
- BR
- Brazil
- Prior art keywords
- mosfet
- silicon carbide
- sic
- manufacture
- power switch
- Prior art date
Links
- 238000000034 method Methods 0.000 title abstract 4
- 238000004519 manufacturing process Methods 0.000 title abstract 3
- HBMJWWWQQXIZIP-UHFFFAOYSA-N silicon carbide Chemical compound [Si+]#[C-] HBMJWWWQQXIZIP-UHFFFAOYSA-N 0.000 abstract 4
- 229910010271 silicon carbide Inorganic materials 0.000 abstract 4
- 239000004065 semiconductor Substances 0.000 abstract 3
- 239000000758 substrate Substances 0.000 abstract 2
- 230000005669 field effect Effects 0.000 abstract 1
- 229910044991 metal oxide Inorganic materials 0.000 abstract 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices adapted for rectifying, amplifying, oscillating or switching, or capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. PN junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/66007—Multistep manufacturing processes
- H01L29/66053—Multistep manufacturing processes of devices having a semiconductor body comprising crystalline silicon carbide
- H01L29/66068—Multistep manufacturing processes of devices having a semiconductor body comprising crystalline silicon carbide the devices being controllable only by the electric current supplied or the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched, e.g. three-terminal devices
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
- H01L21/77—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate
- H01L21/78—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices
- H01L21/82—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices to produce devices, e.g. integrated circuits, each consisting of a plurality of components
- H01L21/8258—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices to produce devices, e.g. integrated circuits, each consisting of a plurality of components the substrate being a semiconductor, using a combination of technologies covered by H01L21/8206, H01L21/8213, H01L21/822, H01L21/8252, H01L21/8254 or H01L21/8256
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier
- H01L27/04—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier the substrate being a semiconductor body
- H01L27/06—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier the substrate being a semiconductor body including a plurality of individual components in a non-repetitive configuration
- H01L27/0688—Integrated circuits having a three-dimensional layout
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices adapted for rectifying, amplifying, oscillating or switching, or capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. PN junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/02—Semiconductor bodies ; Multistep manufacturing processes therefor
- H01L29/12—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by the materials of which they are formed
- H01L29/16—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by the materials of which they are formed including, apart from doping materials or other impurities, only elements of Group IV of the Periodic System
- H01L29/1608—Silicon carbide
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices adapted for rectifying, amplifying, oscillating or switching, or capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. PN junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
- H01L29/76—Unipolar devices, e.g. field effect transistors
- H01L29/772—Field effect transistors
- H01L29/78—Field effect transistors with field effect produced by an insulated gate
Landscapes
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Manufacturing & Machinery (AREA)
- Ceramic Engineering (AREA)
- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Insulated Gate Type Field-Effect Transistor (AREA)
- Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
- Thin Film Transistor (AREA)
- Electrodes Of Semiconductors (AREA)
Abstract
<B>TRANSISTOR SIC NMOSFET PARA USO COMO INTERRUPTOR DE FORçA E MéTODO PARA SUA FABRICAçãO<D> Transistor de efeito de campo de semicondutor de óxido metálico lateral (MOSFET) formado sobre o substrato de uma pastilha semicondutora, método para sua fabricação e dispositivo semicondutor incorporando o MOSFET ou o método. Numa modalidade, o MOSFET inclui uma camada de carbureto de silício localizada sobre ou dentro do substrato, uma porta formada sobre a camada de carbureto de silício. O MOSFET inclui, ainda, regiões de fonte e dreno localizadas na camada de carbureto de silício e em contato com a porta, sendo que a camada de carbureto de silício aumenta a tensão de ruptura do MOSFET.
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US09/448,856 US6903373B1 (en) | 1999-11-23 | 1999-11-23 | SiC MOSFET for use as a power switch and a method of manufacturing the same |
Publications (1)
Publication Number | Publication Date |
---|---|
BR0006785A true BR0006785A (pt) | 2001-09-04 |
Family
ID=23781925
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
BR0006785-7A BR0006785A (pt) | 1999-11-23 | 2000-11-13 | Transistor sic nmosfet para uso como interruptor de força e método para sua fabricação |
Country Status (7)
Country | Link |
---|---|
US (1) | US6903373B1 (pt) |
EP (1) | EP1104028B1 (pt) |
JP (1) | JP3955434B2 (pt) |
KR (1) | KR100774112B1 (pt) |
CN (1) | CN1297258A (pt) |
BR (1) | BR0006785A (pt) |
DE (1) | DE60043646D1 (pt) |
Families Citing this family (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR2837322B1 (fr) * | 2002-03-14 | 2005-02-04 | Commissariat Energie Atomique | DIODE SCHOTTKY DE PUISSANCE A SUBSTRAT SiCOI, ET PROCEDE DE REALISATION D'UN TELLE DIODE |
US7391133B1 (en) * | 2002-09-28 | 2008-06-24 | Hennessy Michael J | Hybrid switch |
CN1302558C (zh) * | 2003-03-06 | 2007-02-28 | 北京大学 | 一种场效应晶体管 |
US7598134B2 (en) | 2004-07-28 | 2009-10-06 | Micron Technology, Inc. | Memory device forming methods |
US7598576B2 (en) | 2005-06-29 | 2009-10-06 | Cree, Inc. | Environmentally robust passivation structures for high-voltage silicon carbide semiconductor devices |
US8114693B1 (en) * | 2007-09-18 | 2012-02-14 | Partial Assignment University of Central Florida | Method of fabricating solid state gas dissociating device by laser doping |
JP6278591B2 (ja) * | 2012-11-13 | 2018-02-14 | 株式会社Sumco | 半導体エピタキシャルウェーハの製造方法、半導体エピタキシャルウェーハ、および固体撮像素子の製造方法 |
US9257407B2 (en) * | 2013-10-28 | 2016-02-09 | Qualcomm Incorporated | Heterogeneous channel material integration into wafer |
US10060966B2 (en) * | 2015-03-24 | 2018-08-28 | Intel Corporation | Method and apparatus for enhancing guardbands using “in-situ” silicon measurements |
US10243039B2 (en) | 2016-03-22 | 2019-03-26 | General Electric Company | Super-junction semiconductor power devices with fast switching capability |
JP6889048B2 (ja) * | 2017-06-30 | 2021-06-18 | 株式会社日立製作所 | 炭化ケイ素半導体装置およびその製造方法 |
Family Cites Families (20)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4441146A (en) | 1982-02-04 | 1984-04-03 | Vicor Corporation | Optimal resetting of the transformer's core in single ended forward converters |
JPS6414949A (en) * | 1987-07-08 | 1989-01-19 | Nec Corp | Semiconductor device and manufacture of the same |
JPH067594B2 (ja) * | 1987-11-20 | 1994-01-26 | 富士通株式会社 | 半導体基板の製造方法 |
US5135885A (en) | 1989-03-27 | 1992-08-04 | Sharp Corporation | Method of manufacturing silicon carbide fets |
JPH0766971B2 (ja) | 1989-06-07 | 1995-07-19 | シャープ株式会社 | 炭化珪素半導体装置 |
JP2542448B2 (ja) * | 1990-05-24 | 1996-10-09 | シャープ株式会社 | 電界効果トランジスタおよびその製造方法 |
US5173846A (en) | 1991-03-13 | 1992-12-22 | Astec International Ltd. | Zero voltage switching power converter |
JPH0529621A (ja) * | 1991-07-19 | 1993-02-05 | Rohm Co Ltd | 炭化珪素薄膜回路素子とその製造方法 |
JP3058954B2 (ja) * | 1991-09-24 | 2000-07-04 | ローム株式会社 | 絶縁層の上に成長層を有する半導体装置の製造方法 |
WO1993024987A1 (en) | 1992-06-02 | 1993-12-09 | Astec International Limited | Dual active clamp power converter |
US6344663B1 (en) | 1992-06-05 | 2002-02-05 | Cree, Inc. | Silicon carbide CMOS devices |
US5303138A (en) | 1993-04-29 | 1994-04-12 | At&T Bell Laboratories | Low loss synchronous rectifier for application to clamped-mode power converters |
JPH07254706A (ja) * | 1993-11-29 | 1995-10-03 | Texas Instr Inc <Ti> | 高電圧デバイス構造およびその製造方法 |
US5489792A (en) * | 1994-04-07 | 1996-02-06 | Regents Of The University Of California | Silicon-on-insulator transistors having improved current characteristics and reduced electrostatic discharge susceptibility |
US5672889A (en) * | 1995-03-15 | 1997-09-30 | General Electric Company | Vertical channel silicon carbide metal-oxide-semiconductor field effect transistor with self-aligned gate for microwave and power applications, and method of making |
US5661312A (en) * | 1995-03-30 | 1997-08-26 | Motorola | Silicon carbide MOSFET |
JP3724026B2 (ja) * | 1995-04-24 | 2005-12-07 | 株式会社デンソー | 車両用同期発電装置及びその励磁制御方法 |
US5574295A (en) | 1995-08-09 | 1996-11-12 | Kulite Semiconductor Products | Dielectrically isolated SiC mosfet |
DE19612692C1 (de) | 1996-03-29 | 1997-11-20 | Siemens Ag | Verfahren zum Erzeugen einer Oxidschicht auf Siliciumcarbid und Verwendung des Verfahrens |
SE9700215L (sv) | 1997-01-27 | 1998-02-18 | Abb Research Ltd | Förfarande för framställning av ett halvledarskikt av SiC av 3C-polytypen ovanpå ett halvledarsubstratskikt utnyttjas wafer-bindningstekniken |
-
1999
- 1999-11-23 US US09/448,856 patent/US6903373B1/en not_active Expired - Lifetime
-
2000
- 2000-11-13 DE DE60043646T patent/DE60043646D1/de not_active Expired - Lifetime
- 2000-11-13 EP EP00310082A patent/EP1104028B1/en not_active Expired - Lifetime
- 2000-11-13 BR BR0006785-7A patent/BR0006785A/pt not_active Application Discontinuation
- 2000-11-22 CN CN00130957A patent/CN1297258A/zh active Pending
- 2000-11-22 JP JP2000355235A patent/JP3955434B2/ja not_active Expired - Fee Related
- 2000-11-23 KR KR1020000070032A patent/KR100774112B1/ko not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
JP2001196584A (ja) | 2001-07-19 |
KR20010051900A (ko) | 2001-06-25 |
US6903373B1 (en) | 2005-06-07 |
EP1104028A3 (en) | 2001-08-22 |
KR100774112B1 (ko) | 2007-11-07 |
DE60043646D1 (de) | 2010-02-25 |
EP1104028A2 (en) | 2001-05-30 |
CN1297258A (zh) | 2001-05-30 |
EP1104028B1 (en) | 2010-01-06 |
JP3955434B2 (ja) | 2007-08-08 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
B11A | Dismissal acc. art.33 of ipl - examination not requested within 36 months of filing | ||
B11Y | Definitive dismissal acc. article 33 of ipl - extension of time limit for request of examination expired |