BE631568A - - Google Patents

Info

Publication number
BE631568A
BE631568A BE631568DA BE631568A BE 631568 A BE631568 A BE 631568A BE 631568D A BE631568D A BE 631568DA BE 631568 A BE631568 A BE 631568A
Authority
BE
Belgium
Application number
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Publication of BE631568A publication Critical patent/BE631568A/xx

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/08—Measuring arrangements characterised by the use of optical techniques for measuring diameters
    • C—CHEMISTRY; METALLURGY
    • C30—CRYSTAL GROWTH
    • C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B13/00—Single-crystal growth by zone-melting; Refining by zone-melting
    • C30B13/28—Controlling or regulating
    • C30B13/30—Stabilisation or shape controlling of the molten zone, e.g. by concentrators, by electromagnetic fields; Controlling the section of the crystal
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/022—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by means of tv-camera scanning

Landscapes

  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Engineering & Computer Science (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Materials Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Crystals, And After-Treatments Of Crystals (AREA)
  • Length Measuring Devices By Optical Means (AREA)
BE631568D 1962-04-27 BE631568A (pt)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DES79197A DE1231671B (de) 1962-04-27 1962-04-27 Vorrichtung zur Steuerung des Durchmessers der Erstarrungsfront der Schmelzzone beimZonenschmelzen eines Halbleiterstabes

Publications (1)

Publication Number Publication Date
BE631568A true BE631568A (pt)

Family

ID=7508016

Family Applications (1)

Application Number Title Priority Date Filing Date
BE631568D BE631568A (pt) 1962-04-27

Country Status (5)

Country Link
US (1) US3243509A (pt)
BE (1) BE631568A (pt)
CH (1) CH411803A (pt)
DE (1) DE1231671B (pt)
GB (1) GB986943A (pt)

Families Citing this family (24)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3321575A (en) * 1964-02-11 1967-05-23 Jolew Corp Television inspection apparatus adapted for measurement and comparison purposes
DE2012438B2 (de) * 1969-03-17 1976-09-30 Daido Seiko KX., Nagoya, Aichi (Japan) Verfahren zur steuerung des schmelzvorgangs in einem stahl herstellenden lichtbogenofens
US3621130A (en) * 1969-11-21 1971-11-16 Nasa System for quantizing graphic displays
DE2222852A1 (de) * 1971-05-11 1973-12-13 Image Analysing Computers Ltd Feldbeleuchtung fuer die bildanalyse
DD110182A5 (pt) * 1972-09-28 1974-12-12
DE2332968C3 (de) * 1973-06-28 1981-12-10 Siemens AG, 1000 Berlin und 8000 München Vorrichtung zur Steuerung des durchmessers eines Halbleiterstabes
DE2250721C3 (de) * 1972-10-16 1978-05-18 Siemens Ag, 1000 Berlin Und 8000 Muenchen Vorrichtung zum tiegellosen Zonenschmelzen eines Halbleiterstabes mit einer die Schmelzzone überwachenden Fernsehkamera
US4080172A (en) * 1975-12-29 1978-03-21 Monsanto Company Zone refiner automatic control
US4135204A (en) * 1977-06-09 1979-01-16 Chesebrough-Pond's Inc. Automatic glass blowing apparatus and method
DE2731250C2 (de) * 1977-07-11 1986-04-17 Siemens AG, 1000 Berlin und 8000 München Verfahren zur Regelung des Stabquerschnittes beim tiegellosen Zonenschmelzen eines Halbleiterstabes
US4272781A (en) * 1978-09-08 1981-06-09 Tokyo Shibaura Denki Kabushiki Kaisha Nondestructive examining apparatus
DE2923240A1 (de) * 1979-06-08 1980-12-18 Leybold Heraeus Gmbh & Co Kg Messverfahren und messanordnung fuer den durchmesser von einkristallen beim tiegelziehen
US4297893A (en) * 1980-02-27 1981-11-03 Johns-Manville Corporation Method and apparatus for measuring flow characteristics of moving fluid stream
US4445185A (en) * 1980-05-08 1984-04-24 Chesebrough-Pond's Inc. Video inspection system
US4344146A (en) * 1980-05-08 1982-08-10 Chesebrough-Pond's Inc. Video inspection system
US4866230A (en) * 1987-04-27 1989-09-12 Shin-Etu Handotai Company, Limited Method of and apparatus for controlling floating zone of semiconductor rod
JPS63269003A (ja) * 1987-04-27 1988-11-07 Shin Etsu Handotai Co Ltd 晶出界面位置検出装置
JPS63307186A (ja) * 1987-06-05 1988-12-14 Shin Etsu Handotai Co Ltd 晶出結晶径制御装置
JPH0651599B2 (ja) * 1987-12-05 1994-07-06 信越半導体株式会社 浮遊帯域制御方法
US6064429A (en) * 1997-08-18 2000-05-16 Mcdonnell Douglas Corporation Foreign object video detection and alert system and method
US7171033B2 (en) * 2001-03-28 2007-01-30 The Boeing Company System and method for identifying defects in a composite structure
US6871684B2 (en) 2002-08-13 2005-03-29 The Boeing Company System for identifying defects in a composite structure
US7424902B2 (en) 2004-11-24 2008-09-16 The Boeing Company In-process vision detection of flaw and FOD characteristics
US20060108048A1 (en) * 2004-11-24 2006-05-25 The Boeing Company In-process vision detection of flaws and fod by back field illumination

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2674915A (en) * 1950-01-07 1954-04-13 Gen Electric Noncontacting width gauge
AT194444B (de) * 1953-02-26 1958-01-10 Siemens Ag Verfahren und Einrichtung zur Behandlung einer längserstreckten Halbleiterkristallanordnung
DE1092576B (de) * 1957-11-15 1960-11-10 Siemens Ag Stromzufuehrung fuer die bewegliche Heizspule einer tiegelfreien Zonenziehvorrichtung im Innern eines Gefaesses
DE1094238B (de) * 1959-03-09 1960-12-08 Licentia Gmbh Verfahren zum Konstanthalten der Breite der Schmelzzone beim tiegelfreien Zonenschmelzen
US3021386A (en) * 1960-03-30 1962-02-13 Gen Electric Boiler port viewing system

Also Published As

Publication number Publication date
DE1231671B (de) 1967-01-05
GB986943A (en) 1965-03-24
CH411803A (de) 1966-04-30
US3243509A (en) 1966-03-29

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