BE631568A - - Google Patents

Info

Publication number
BE631568A
BE631568A BE631568DA BE631568A BE 631568 A BE631568 A BE 631568A BE 631568D A BE631568D A BE 631568DA BE 631568 A BE631568 A BE 631568A
Authority
BE
Belgium
Application number
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Publication of BE631568A publication Critical patent/BE631568A/xx

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/08—Measuring arrangements characterised by the use of optical techniques for measuring diameters
    • C—CHEMISTRY; METALLURGY
    • C30—CRYSTAL GROWTH
    • C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B13/00—Single-crystal growth by zone-melting; Refining by zone-melting
    • C30B13/28—Controlling or regulating
    • C30B13/30—Stabilisation or shape controlling of the molten zone, e.g. by concentrators, by electromagnetic fields; Controlling the section of the crystal
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/022—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by means of tv-camera scanning

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Electromagnetism (AREA)
  • Engineering & Computer Science (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Materials Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Crystals, And After-Treatments Of Crystals (AREA)
BE631568D 1962-04-27 BE631568A (pl)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DES79197A DE1231671B (de) 1962-04-27 1962-04-27 Vorrichtung zur Steuerung des Durchmessers der Erstarrungsfront der Schmelzzone beimZonenschmelzen eines Halbleiterstabes

Publications (1)

Publication Number Publication Date
BE631568A true BE631568A (pl)

Family

ID=7508016

Family Applications (1)

Application Number Title Priority Date Filing Date
BE631568D BE631568A (pl) 1962-04-27

Country Status (5)

Country Link
US (1) US3243509A (pl)
BE (1) BE631568A (pl)
CH (1) CH411803A (pl)
DE (1) DE1231671B (pl)
GB (1) GB986943A (pl)

Families Citing this family (24)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3321575A (en) * 1964-02-11 1967-05-23 Jolew Corp Television inspection apparatus adapted for measurement and comparison purposes
DE2012438B2 (de) * 1969-03-17 1976-09-30 Daido Seiko KX., Nagoya, Aichi (Japan) Verfahren zur steuerung des schmelzvorgangs in einem stahl herstellenden lichtbogenofens
US3621130A (en) * 1969-11-21 1971-11-16 Nasa System for quantizing graphic displays
FR2139434A5 (pl) * 1971-05-11 1973-01-05 Image Analysing Computers Ltd
DE2332968C3 (de) * 1973-06-28 1981-12-10 Siemens AG, 1000 Berlin und 8000 München Vorrichtung zur Steuerung des durchmessers eines Halbleiterstabes
DD110182A5 (pl) * 1972-09-28 1974-12-12
DE2250721C3 (de) * 1972-10-16 1978-05-18 Siemens Ag, 1000 Berlin Und 8000 Muenchen Vorrichtung zum tiegellosen Zonenschmelzen eines Halbleiterstabes mit einer die Schmelzzone überwachenden Fernsehkamera
US4080172A (en) * 1975-12-29 1978-03-21 Monsanto Company Zone refiner automatic control
US4135204A (en) * 1977-06-09 1979-01-16 Chesebrough-Pond's Inc. Automatic glass blowing apparatus and method
DE2731250C2 (de) * 1977-07-11 1986-04-17 Siemens AG, 1000 Berlin und 8000 München Verfahren zur Regelung des Stabquerschnittes beim tiegellosen Zonenschmelzen eines Halbleiterstabes
US4272781A (en) * 1978-09-08 1981-06-09 Tokyo Shibaura Denki Kabushiki Kaisha Nondestructive examining apparatus
DE2923240A1 (de) * 1979-06-08 1980-12-18 Leybold Heraeus Gmbh & Co Kg Messverfahren und messanordnung fuer den durchmesser von einkristallen beim tiegelziehen
US4297893A (en) * 1980-02-27 1981-11-03 Johns-Manville Corporation Method and apparatus for measuring flow characteristics of moving fluid stream
US4445185A (en) * 1980-05-08 1984-04-24 Chesebrough-Pond's Inc. Video inspection system
US4344146A (en) * 1980-05-08 1982-08-10 Chesebrough-Pond's Inc. Video inspection system
JPS63269003A (ja) * 1987-04-27 1988-11-07 Shin Etsu Handotai Co Ltd 晶出界面位置検出装置
US4866230A (en) * 1987-04-27 1989-09-12 Shin-Etu Handotai Company, Limited Method of and apparatus for controlling floating zone of semiconductor rod
JPS63307186A (ja) * 1987-06-05 1988-12-14 Shin Etsu Handotai Co Ltd 晶出結晶径制御装置
JPH0651599B2 (ja) * 1987-12-05 1994-07-06 信越半導体株式会社 浮遊帯域制御方法
US6064429A (en) * 1997-08-18 2000-05-16 Mcdonnell Douglas Corporation Foreign object video detection and alert system and method
US7171033B2 (en) * 2001-03-28 2007-01-30 The Boeing Company System and method for identifying defects in a composite structure
US6871684B2 (en) 2002-08-13 2005-03-29 The Boeing Company System for identifying defects in a composite structure
US7424902B2 (en) 2004-11-24 2008-09-16 The Boeing Company In-process vision detection of flaw and FOD characteristics
US20060108048A1 (en) * 2004-11-24 2006-05-25 The Boeing Company In-process vision detection of flaws and fod by back field illumination

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2674915A (en) * 1950-01-07 1954-04-13 Gen Electric Noncontacting width gauge
AT194444B (de) * 1953-02-26 1958-01-10 Siemens Ag Verfahren und Einrichtung zur Behandlung einer längserstreckten Halbleiterkristallanordnung
DE1092576B (de) * 1957-11-15 1960-11-10 Siemens Ag Stromzufuehrung fuer die bewegliche Heizspule einer tiegelfreien Zonenziehvorrichtung im Innern eines Gefaesses
DE1094238B (de) * 1959-03-09 1960-12-08 Licentia Gmbh Verfahren zum Konstanthalten der Breite der Schmelzzone beim tiegelfreien Zonenschmelzen
US3021386A (en) * 1960-03-30 1962-02-13 Gen Electric Boiler port viewing system

Also Published As

Publication number Publication date
DE1231671B (de) 1967-01-05
GB986943A (en) 1965-03-24
US3243509A (en) 1966-03-29
CH411803A (de) 1966-04-30

Similar Documents

Publication Publication Date Title
BE616548R (pl)
BE559145A (pl)
BE613190A (pl)
BE613862A (pl)
BE613529A (pl)
BE613335A (pl)
BE615521A (pl)
BE634954A (pl)
BE633643A (pl)
BE613298A (pl)
BE632606A (pl)
BE632116A (pl)
BE630414A (pl)
BE630154A (pl)
BE553896A (pl)
BE613108A (pl)
BE612926A (pl)
BE612847A (pl)
BE612464A (pl)
BE612311A (pl)
BE612190A (pl)
BE609543A (pl)
BE629975A (pl)
BE628597A (pl)
BE628133A (pl)