AU2457599A - Thickness measurement of fluorescing coatings - Google Patents

Thickness measurement of fluorescing coatings

Info

Publication number
AU2457599A
AU2457599A AU24575/99A AU2457599A AU2457599A AU 2457599 A AU2457599 A AU 2457599A AU 24575/99 A AU24575/99 A AU 24575/99A AU 2457599 A AU2457599 A AU 2457599A AU 2457599 A AU2457599 A AU 2457599A
Authority
AU
Australia
Prior art keywords
thickness measurement
fluorescing
coatings
fluorescing coatings
measurement
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
AU24575/99A
Other languages
English (en)
Inventor
Steven P Floeder
Lanny L. Harlau
Gregory D. Kostuch
Jack W. Lai
Arthur T. Manning
John A. Ramthun
Wenyuan Xu
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
3M Co
Original Assignee
Minnesota Mining and Manufacturing Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Minnesota Mining and Manufacturing Co filed Critical Minnesota Mining and Manufacturing Co
Publication of AU2457599A publication Critical patent/AU2457599A/en
Abandoned legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
    • G01B11/0616—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating
    • G01B11/0658—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating with measurement of emissivity or reradiation

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
AU24575/99A 1998-07-15 1999-01-14 Thickness measurement of fluorescing coatings Abandoned AU2457599A (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US09/116,009 US6252237B1 (en) 1998-07-15 1998-07-15 Low cost thickness measurement method and apparatus for thin coatings
US09116009 1998-07-15
PCT/US1999/000888 WO2000004340A1 (en) 1998-07-15 1999-01-14 Thickness measurement of fluorescing coatings

Publications (1)

Publication Number Publication Date
AU2457599A true AU2457599A (en) 2000-02-07

Family

ID=22364723

Family Applications (1)

Application Number Title Priority Date Filing Date
AU24575/99A Abandoned AU2457599A (en) 1998-07-15 1999-01-14 Thickness measurement of fluorescing coatings

Country Status (6)

Country Link
US (1) US6252237B1 (enExample)
EP (1) EP1097352B1 (enExample)
JP (1) JP2002520606A (enExample)
AU (1) AU2457599A (enExample)
DE (1) DE69924378T2 (enExample)
WO (1) WO2000004340A1 (enExample)

Families Citing this family (39)

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GB9906011D0 (en) * 1999-03-16 1999-05-12 Whiley Foils Ltd Fluorescent materials
US6962670B1 (en) 2000-08-16 2005-11-08 Eastman Chemical Company Determination of layer thickness or non-uniformity of layer thickness based on fluorophore additives
US7052483B2 (en) * 2000-12-19 2006-05-30 Animas Corporation Transcutaneous inserter for low-profile infusion sets
US6950547B2 (en) * 2001-02-12 2005-09-27 3M Innovative Properties Company Web inspection method and device
DE10217950B4 (de) * 2001-04-24 2011-01-13 Volkswagen Ag Verfahren zur Bestimmung einer Beschichtungsstärke
JP3723845B2 (ja) * 2002-03-26 2005-12-07 国立大学法人富山大学 有機エレクトロルミネッセンス素子に使用される有機薄膜の膜厚測定法および測定装置
KR101203325B1 (ko) * 2003-12-31 2012-11-20 쓰리엠 이노베이티브 프로퍼티즈 컴파니 시트-기반 물품에 대한 재고품 제어
US7187995B2 (en) * 2003-12-31 2007-03-06 3M Innovative Properties Company Maximization of yield for web-based articles
US7623699B2 (en) 2004-04-19 2009-11-24 3M Innovative Properties Company Apparatus and method for the automated marking of defects on webs of material
US20080049972A1 (en) * 2006-07-07 2008-02-28 Lockheed Martin Corporation Mail imaging system with secondary illumination/imaging window
US20080011654A1 (en) * 2006-07-07 2008-01-17 Hale Mathew S Mail processing system with radiation filtering
US20080019563A1 (en) * 2006-07-07 2008-01-24 Goodwin Mark D Mail processing system with low resolution UV imaging subsystem
US20080035866A1 (en) * 2006-07-07 2008-02-14 Lockheed Martin Corporation Mail imaging system with UV illumination interrupt
US20080012981A1 (en) * 2006-07-07 2008-01-17 Goodwin Mark D Mail processing system with dual camera assembly
US8175739B2 (en) * 2007-07-26 2012-05-08 3M Innovative Properties Company Multi-unit process spatial synchronization
US7542821B2 (en) * 2007-07-26 2009-06-02 3M Innovative Properties Company Multi-unit process spatial synchronization of image inspection systems
US7903265B2 (en) * 2008-04-04 2011-03-08 Toyota Motor Engineering & Manufacturing North America, Inc. Method for measuring coating uniformity
US7797133B2 (en) * 2008-09-10 2010-09-14 3M Innovative Properties Company Multi-roller registered repeat defect detection of a web process line
JP5399038B2 (ja) * 2008-10-29 2014-01-29 日本製紙株式会社 有機薄膜の膜厚測定方法
FR2993972B1 (fr) * 2012-07-26 2014-07-18 Inst Pierre Vernier Dispositif de determination d'un ensemble de donnees spatiales d'epaisseur d'une couche mince a la surface d'un substrat, par mesure d'emission infra-rouge
US20140171956A1 (en) 2012-12-17 2014-06-19 Abbott Medical Optics Inc. Detecting coatings on intraocular lens insertion devices and methods of manufacturing the devices
KR102224848B1 (ko) 2014-10-06 2021-03-08 삼성전자주식회사 발광 소자 패키지 제조 방법
JP6823919B2 (ja) * 2015-09-08 2021-02-03 日東電工株式会社 光学フィルムおよびその製造方法
EP3400431B1 (en) 2016-01-07 2022-03-23 Arkema, Inc. Optical method to measure the thickness of coatings deposited on substrates
US11125549B2 (en) 2016-01-07 2021-09-21 Arkema Inc. Optical intensity method to measure the thickness of coatings deposited on substrates
CN108474732B (zh) 2016-01-07 2022-04-15 阿科玛股份有限公司 测量高速移动的弯曲物体上沉积涂层厚度的不依赖于物体位置的方法
DE102018103171A1 (de) * 2017-11-23 2019-05-23 Tdk Electronics Ag Verfahren zum Bestimmen von Eigenschaften einer Beschichtung auf einer transparenten Folie, Verfahren zur Herstellung einer Kondensatorfolie und Einrichtung zum Bestimmen von Eigenschaften einer Beschichtung auf einer transparenten Folie
DE102018110931C5 (de) * 2018-05-07 2023-06-29 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Verfahren und System zum Erfassen der Oberflächenbelegung einer Beschichtung auf einer Oberfläche eines bandförmigen Prüflings
JP7196340B2 (ja) * 2019-06-08 2022-12-26 ヒューレット－パッカード デベロップメント カンパニー エル．ピー． 光学式液滴検出器のコーティング
EP4055373A1 (en) 2019-11-08 2022-09-14 3M Innovative Properties Company Ultraviolet light-based inspection for detecting coating defects in manufactured webs using fluorescing agents
CN111024469A (zh) * 2019-12-25 2020-04-17 珠海格力电工有限公司 一种测试漆包线偏心度的方法
EP3872445B1 (de) * 2020-02-25 2024-03-27 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Schichtdickenmessung durch auswertung des spektrums der fluoreszenzemission
JP7701189B2 (ja) * 2021-05-20 2025-07-01 株式会社ディスコ 保護膜の厚み測定方法
US12257590B2 (en) 2022-04-20 2025-03-25 Foreman Technologies Inc. System for detecting thickness of a coating autonomously applied to a structure
WO2023205359A2 (en) * 2022-04-20 2023-10-26 FOREMAN TECHNOLOGIES INC., dba PAINTJET System for autonomously applying paint to a target surface
WO2023230281A1 (en) * 2022-05-25 2023-11-30 FOREMAN TECHNOLOGIES INC., dba PAINTJET System for detecting thickness of a coating autonomously applied to a structure
KR102642534B1 (ko) * 2023-09-05 2024-02-29 (주)오로스 테크놀로지 다층 박막 각층의 두께 계측의 정밀도 향상을 위한 처리 장치 및 방법
CN119618088B (zh) * 2024-12-13 2025-10-31 北京航空航天大学 一种涂层厚度无损测量方法、设备、介质及产品
CN119666869B (zh) * 2025-02-19 2025-06-03 河钢数字技术股份有限公司 涂层缺陷检测方法、电子设备及存储介质

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3577885A (en) 1969-07-30 1971-05-11 Phillips Petroleum Co Paper coating composition
US4922113A (en) * 1986-07-10 1990-05-01 Minnesota Mining And Manufacturing Company Process for fluorimetric monitoring of functional coatings and compositions and fluorescent agents therefor
US5270116A (en) * 1986-07-10 1993-12-14 Minnesota Mining And Manufacturing Company Process for fluorimetric monitoring of functional coatings and compositions and fluorescent agents therefor
US4841156A (en) 1987-05-15 1989-06-20 Electronic Instrumentation And Technology, Inc. Measurement of the thickness of thin films
DE3728704A1 (de) * 1987-08-28 1989-03-09 Agfa Gevaert Ag Vorrichtung zur bestimmung der dicke von schichttraegern
US5001353A (en) 1989-01-17 1991-03-19 Sumitomo Light Metal Industries, Ltd. Method and apparatus to measure the thickness of coating films
US4956558A (en) 1989-03-16 1990-09-11 Battelle Memorial Institute System for measuring film thickness
US5281819A (en) 1991-06-06 1994-01-25 Aluminum Company Of America Apparatus for nondestructively determining coating thickness on a metal object and associated method
JP2917861B2 (ja) 1995-05-15 1999-07-12 ブリヂストンスポーツ株式会社 ゴルフボール塗膜の膜厚測定方法及び装置
JPH09304281A (ja) 1996-05-09 1997-11-28 Tokyo Electric Power Co Inc:The 油検知装置

Also Published As

Publication number Publication date
DE69924378T2 (de) 2006-03-09
EP1097352B1 (en) 2005-03-23
DE69924378D1 (de) 2005-04-28
JP2002520606A (ja) 2002-07-09
WO2000004340A1 (en) 2000-01-27
US6252237B1 (en) 2001-06-26
EP1097352A1 (en) 2001-05-09

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Legal Events

Date Code Title Description
MK6 Application lapsed section 142(2)(f)/reg. 8.3(3) - pct applic. not entering national phase