AU2011306522B2 - An apparatus and method for inspecting matter - Google Patents

An apparatus and method for inspecting matter Download PDF

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Publication number
AU2011306522B2
AU2011306522B2 AU2011306522A AU2011306522A AU2011306522B2 AU 2011306522 B2 AU2011306522 B2 AU 2011306522B2 AU 2011306522 A AU2011306522 A AU 2011306522A AU 2011306522 A AU2011306522 A AU 2011306522A AU 2011306522 B2 AU2011306522 B2 AU 2011306522B2
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AU
Australia
Prior art keywords
radiation
matter
detection device
stop element
scanning device
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AU2011306522A
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English (en)
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AU2011306522A1 (en
Inventor
Martin Kermit
Arne Klokkerud
Ole Onsrud
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Tomra Sorting AS
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Tomra Sorting AS
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Publication date
Application filed by Tomra Sorting AS filed Critical Tomra Sorting AS
Publication of AU2011306522A1 publication Critical patent/AU2011306522A1/en
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Publication of AU2011306522B2 publication Critical patent/AU2011306522B2/en
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47Scattering, i.e. diffuse reflection
    • G01N21/4738Diffuse reflection, e.g. also for testing fluids, fibrous materials
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/27Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration
    • G01N21/274Calibration, base line adjustment, drift correction
    • G01N21/278Constitution of standards
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47Scattering, i.e. diffuse reflection
    • G01N21/4785Standardising light scatter apparatus; Standards therefor
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47Scattering, i.e. diffuse reflection
    • G01N21/49Scattering, i.e. diffuse reflection within a body or fluid
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B26/00Optical devices or arrangements for the control of light using movable or deformable optical elements
    • G02B26/08Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light
    • G02B26/10Scanning systems
    • G02B26/12Scanning systems using multifaceted mirrors
    • G02B26/124Details of the optical system between the light source and the polygonal mirror
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/85Investigating moving fluids or granular solids

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Optics & Photonics (AREA)
  • Engineering & Computer Science (AREA)
  • Mathematical Physics (AREA)
  • Theoretical Computer Science (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
AU2011306522A 2010-09-24 2011-09-19 An apparatus and method for inspecting matter Active AU2011306522B2 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
NO20101332 2010-09-24
NO20101332A NO336546B1 (no) 2010-09-24 2010-09-24 Apparat og fremgangsmåte for inspeksjon av materie
PCT/NO2011/000260 WO2012039622A1 (en) 2010-09-24 2011-09-19 An apparatus and method for inspecting matter

Publications (2)

Publication Number Publication Date
AU2011306522A1 AU2011306522A1 (en) 2013-04-04
AU2011306522B2 true AU2011306522B2 (en) 2015-01-29

Family

ID=44720090

Family Applications (1)

Application Number Title Priority Date Filing Date
AU2011306522A Active AU2011306522B2 (en) 2010-09-24 2011-09-19 An apparatus and method for inspecting matter

Country Status (11)

Country Link
US (1) US8902416B2 (enExample)
EP (1) EP2619552B1 (enExample)
JP (1) JP5860882B2 (enExample)
CN (1) CN103180717B (enExample)
AU (1) AU2011306522B2 (enExample)
CA (1) CA2811877C (enExample)
DK (1) DK2619552T3 (enExample)
ES (1) ES2749466T3 (enExample)
NO (1) NO336546B1 (enExample)
PL (1) PL2619552T3 (enExample)
WO (1) WO2012039622A1 (enExample)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6335499B2 (ja) * 2013-12-13 2018-05-30 株式会社イシダ 光学検査装置
US10363582B2 (en) 2016-01-15 2019-07-30 Key Technology, Inc. Method and apparatus for sorting
US9266148B2 (en) 2014-06-27 2016-02-23 Key Technology, Inc. Method and apparatus for sorting
KR101674062B1 (ko) * 2015-11-09 2016-11-08 주식회사 오토시스 광 스캐너
US10195647B2 (en) 2016-01-15 2019-02-05 Key Technology, Inc Method and apparatus for sorting
KR20180126491A (ko) * 2016-03-30 2018-11-27 가부시키가이샤 니콘 빔 주사 장치 및 패턴 묘화 장치
JP6724663B2 (ja) * 2016-09-01 2020-07-15 船井電機株式会社 スキャナミラー
CN110763689B (zh) * 2019-11-14 2020-07-31 上海精测半导体技术有限公司 一种表面检测装置及方法
DE102020214216A1 (de) * 2020-11-12 2022-05-12 Robert Bosch Gesellschaft mit beschränkter Haftung Lidar-Sensor
DE102021202234A1 (de) * 2021-03-09 2022-09-15 Robert Bosch Gesellschaft mit beschränkter Haftung LiDAR-System zur Entfernungsbestimmung von Objekten

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE4207760A1 (de) * 1992-03-11 1993-09-16 Rodenstock Instr Vorrichtung zur beobachtung des auges und insbesondere des augenhintergrundes
US20100128221A1 (en) * 2006-05-31 2010-05-27 Indiana University Research And Technology Corporation Laser scanning digital camera with pupil periphery illumination and potential for multiply scattered light imaging

Family Cites Families (26)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1305192A (enExample) 1969-05-19 1973-01-31
US4283147A (en) * 1979-06-14 1981-08-11 Dreyfus-Pellman Electro-optical scanning system
AU563981B2 (en) * 1983-03-23 1987-07-30 Sphere Investments Ltd. Ore sorting
GB8424084D0 (en) * 1984-09-24 1984-10-31 Sira Ltd Inspection apparatus
JPH0690149B2 (ja) 1986-01-31 1994-11-14 東洋ガラス株式会社 透光度検査装置
JPH0343707A (ja) * 1989-07-11 1991-02-25 Canon Inc 走査光学装置
JPH0469547A (ja) * 1990-07-10 1992-03-04 Fujitsu Ltd 物体表面情報検知装置及び物体表面情報検知方法
US5241329A (en) * 1990-12-14 1993-08-31 Xerox Corporation Multiple resolution ros
AU2575792A (en) 1991-10-01 1993-05-03 Oseney Limited Scattered/transmitted light information system
JP2511391B2 (ja) * 1991-12-04 1996-06-26 シーメンス アクチエンゲゼルシヤフト 光学式間隔センサ
JPH0634557A (ja) * 1992-07-13 1994-02-08 Asahi Optical Co Ltd レーザ光学系、及びレーザビームを用いた被検面の表面状態の読取方法
US5559627A (en) * 1994-12-19 1996-09-24 Xerox Corporation Optics for passive facet tracking
US5546201A (en) 1994-12-20 1996-08-13 Xerox Corporation Double bounce passive facet tracking with a reflective diffraction grating on a flat facet
JPH09311109A (ja) 1996-05-22 1997-12-02 Matsushita Electric Ind Co Ltd 光を使用した欠陥検査方法、およびその装置
JP2000505906A (ja) * 1996-12-24 2000-05-16 コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ 光学式検査装置及びこの検査装置が設けられているリソグラフィ装置
BE1011076A3 (nl) * 1997-03-28 1999-04-06 Ruymen Marc Werkwijze en inrichting voor het detecteren van onregelmatigheden in een produkt.
US5945685A (en) * 1997-11-19 1999-08-31 International Business Machines Corporation Glass substrate inspection tool having a telecentric lens assembly
US6438396B1 (en) * 1998-11-05 2002-08-20 Cytometrics, Inc. Method and apparatus for providing high contrast imaging
EP1105715B1 (de) * 1999-05-14 2016-12-07 Krieg, Gunther, Prof.Dr.Ing. Verfahren und vorrichtung zur detektion und unterscheidung zwischen kontaminationen und gutstoffen sowie zwischen verschiedenen farben in feststoffpartikeln
JP4499341B2 (ja) * 2002-05-09 2010-07-07 ソニー株式会社 生体認証装置及び生体認証方法
GB0409691D0 (en) * 2004-04-30 2004-06-02 Titech Visionsort As Apparatus and method
US7768629B2 (en) * 2006-05-12 2010-08-03 Voith Patent Gmbh Device and process for optical distance measurement
US7474389B2 (en) * 2006-12-19 2009-01-06 Dean Greenberg Cargo dimensional and weight analyzing system
BE1017898A3 (nl) * 2007-12-14 2009-10-06 Technology & Design B V B A Sorteerapparaat en werkwijze voor het sorteren van producten.
CN101498663B (zh) * 2008-02-01 2011-08-31 凯迈(洛阳)测控有限公司 一种大气散射信号量测量装置及测量方法
CN102033308B (zh) * 2010-10-22 2012-08-29 浙江大学 一种超高分辨率的光学显微成像方法及装置

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE4207760A1 (de) * 1992-03-11 1993-09-16 Rodenstock Instr Vorrichtung zur beobachtung des auges und insbesondere des augenhintergrundes
US20100128221A1 (en) * 2006-05-31 2010-05-27 Indiana University Research And Technology Corporation Laser scanning digital camera with pupil periphery illumination and potential for multiply scattered light imaging

Also Published As

Publication number Publication date
US8902416B2 (en) 2014-12-02
JP2013537976A (ja) 2013-10-07
EP2619552A1 (en) 2013-07-31
WO2012039622A1 (en) 2012-03-29
CA2811877C (en) 2019-08-13
AU2011306522A1 (en) 2013-04-04
ES2749466T3 (es) 2020-03-20
NO336546B1 (no) 2015-09-21
CA2811877A1 (en) 2012-03-29
NO20101332A1 (no) 2012-03-26
CN103180717A (zh) 2013-06-26
PL2619552T3 (pl) 2020-05-18
CN103180717B (zh) 2015-08-12
JP5860882B2 (ja) 2016-02-16
EP2619552B1 (en) 2019-07-17
US20130222806A1 (en) 2013-08-29
WO2012039622A8 (en) 2012-04-26
DK2619552T3 (da) 2019-10-21

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