AU2005315602A1 - Method and device for analysing visual properties of a surface - Google Patents

Method and device for analysing visual properties of a surface Download PDF

Info

Publication number
AU2005315602A1
AU2005315602A1 AU2005315602A AU2005315602A AU2005315602A1 AU 2005315602 A1 AU2005315602 A1 AU 2005315602A1 AU 2005315602 A AU2005315602 A AU 2005315602A AU 2005315602 A AU2005315602 A AU 2005315602A AU 2005315602 A1 AU2005315602 A1 AU 2005315602A1
Authority
AU
Australia
Prior art keywords
cavity
light
sample
glints
image
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
AU2005315602A
Other languages
English (en)
Inventor
Swie Lan Njo
Ivo Bernardus Nicolaas Van Der Lans
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Akzo Nobel Coatings International BV
Original Assignee
Akzo Nobel Coatings International BV
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Akzo Nobel Coatings International BV filed Critical Akzo Nobel Coatings International BV
Publication of AU2005315602A1 publication Critical patent/AU2005315602A1/en
Abandoned legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00Photometry, e.g. photographic exposure meter
    • G01J1/48Photometry, e.g. photographic exposure meter using chemical effects
    • G01J1/52Photometry, e.g. photographic exposure meter using chemical effects using photographic effects
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00Photometry, e.g. photographic exposure meter
    • G01J1/02Details
    • G01J1/04Optical or mechanical part supplementary adjustable parts
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00Photometry, e.g. photographic exposure meter
    • G01J1/02Details
    • G01J1/08Arrangements of light sources specially adapted for photometry standard sources, also using luminescent or radioactive material
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/8806Specially adapted optical and illumination features
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00Photometry, e.g. photographic exposure meter
    • G01J1/02Details
    • G01J1/0214Constructional arrangements for removing stray light
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00Photometry, e.g. photographic exposure meter
    • G01J1/02Details
    • G01J1/0223Sample holders for photometry

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Microscoopes, Condenser (AREA)
  • Image Input (AREA)
  • Image Processing (AREA)
  • Length Measuring Devices By Optical Means (AREA)
AU2005315602A 2004-12-14 2005-12-13 Method and device for analysing visual properties of a surface Abandoned AU2005315602A1 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
EP04078382.1 2004-12-14
EP04078382 2004-12-14
PCT/EP2005/056760 WO2006064010A1 (en) 2004-12-14 2005-12-13 Method and device for analysing visual properties of a surface

Publications (1)

Publication Number Publication Date
AU2005315602A1 true AU2005315602A1 (en) 2006-06-22

Family

ID=34928732

Family Applications (1)

Application Number Title Priority Date Filing Date
AU2005315602A Abandoned AU2005315602A1 (en) 2004-12-14 2005-12-13 Method and device for analysing visual properties of a surface

Country Status (9)

Country Link
US (1) US20070273885A1 (enExample)
EP (1) EP1831655A1 (enExample)
JP (1) JP2008523521A (enExample)
KR (1) KR20070085589A (enExample)
CN (1) CN101076712A (enExample)
AU (1) AU2005315602A1 (enExample)
BR (1) BRPI0519038A2 (enExample)
RU (1) RU2007126795A (enExample)
WO (1) WO2006064010A1 (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US12148146B2 (en) 2019-09-19 2024-11-19 Ppg Industries Ohio, Inc. Systems and methods for mapping coatings to a spatial appearance space

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2462121A (en) * 2008-07-25 2010-01-27 Diamond Trading Company Ltd Gemstone Viewer
JP2019184537A (ja) * 2018-04-17 2019-10-24 日本ペイント・オートモーティブコーティングス株式会社 外観評価装置及び外観評価方法
JP7632472B2 (ja) * 2020-09-25 2025-02-19 コニカミノルタ株式会社 光学特性測定装置及び光学特性測定方法
KR102890328B1 (ko) 2021-11-12 2025-11-24 포항공과대학교 산학협력단 다중감각미디어시스템에서 질감모션효과를 제공하는 방법 및 모션효과렌더링장치

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE4032327A1 (de) * 1990-10-11 1992-04-16 Abos Automation Bildverarbeitu Verfahren und vorrichtung zur automatisierten ueberwachung der herstellung von halbleiterbauteilen
US5365084A (en) * 1991-02-20 1994-11-15 Pressco Technology, Inc. Video inspection system employing multiple spectrum LED illumination
DE4413832C2 (de) * 1994-04-20 2000-05-31 Siemens Ag Vorrichtungen zur Kontrolle von Halbleiterscheiben
US6034769A (en) * 1997-06-27 2000-03-07 Yufa; Aleksandr L. Method and device for counting and measuring particles
US6207946B1 (en) * 1998-09-03 2001-03-27 Semiconductor Technologies & Instruments, Inc. Adaptive lighting system and method for machine vision apparatus
JP3626387B2 (ja) * 2000-02-04 2005-03-09 関西ペイント株式会社 コンピュータ調色装置及びこの装置を用いた塗料の調色方法
DE10106032B4 (de) * 2000-02-25 2006-11-16 Laser-Laboratorium Göttingen eV Vorrichtung zur homogenen Ausleuchtung einer kleinen Fläche mit einer Ulbricht'schen Kugel
WO2003030524A2 (en) 2001-10-04 2003-04-10 Digieye Plc. A method of predicting reflectance functions
EP1516284A2 (en) * 2002-06-21 2005-03-23 Pressco Technology, Inc. Patterned illumination method and apparatus for machine vision systems

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US12148146B2 (en) 2019-09-19 2024-11-19 Ppg Industries Ohio, Inc. Systems and methods for mapping coatings to a spatial appearance space

Also Published As

Publication number Publication date
WO2006064010A1 (en) 2006-06-22
BRPI0519038A2 (pt) 2008-12-23
KR20070085589A (ko) 2007-08-27
JP2008523521A (ja) 2008-07-03
EP1831655A1 (en) 2007-09-12
RU2007126795A (ru) 2009-01-27
US20070273885A1 (en) 2007-11-29
CN101076712A (zh) 2007-11-21

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Legal Events

Date Code Title Description
MK4 Application lapsed section 142(2)(d) - no continuation fee paid for the application