JP2008523521A - 表面の外観特性の解析方法および解析装置 - Google Patents

表面の外観特性の解析方法および解析装置 Download PDF

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Publication number
JP2008523521A
JP2008523521A JP2007546048A JP2007546048A JP2008523521A JP 2008523521 A JP2008523521 A JP 2008523521A JP 2007546048 A JP2007546048 A JP 2007546048A JP 2007546048 A JP2007546048 A JP 2007546048A JP 2008523521 A JP2008523521 A JP 2008523521A
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Japan
Prior art keywords
cavity
sample
wall
image
light
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JP2007546048A
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English (en)
Japanese (ja)
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JP2008523521A5 (enExample
Inventor
ラン ニョ，スウィー
デル ランス，イヴォ ベルナルドゥス ニコラース ファン
Original Assignee
アクゾ ノーベル コーティングス インターナショナル ビー ヴィ
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Application filed by アクゾ ノーベル コーティングス インターナショナル ビー ヴィ filed Critical アクゾ ノーベル コーティングス インターナショナル ビー ヴィ
Publication of JP2008523521A publication Critical patent/JP2008523521A/ja
Publication of JP2008523521A5 publication Critical patent/JP2008523521A5/ja
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/48—Photometry, e.g. photographic exposure meter using chemical effects
    • G01J1/52—Photometry, e.g. photographic exposure meter using chemical effects using photographic effects
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/02—Details
    • G01J1/04—Optical or mechanical part supplementary adjustable parts
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/02—Details
    • G01J1/08—Arrangements of light sources specially adapted for photometry standard sources, also using luminescent or radioactive material
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/02—Details
    • G01J1/0214—Constructional arrangements for removing stray light
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/02—Details
    • G01J1/0223—Sample holders for photometry

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Microscoopes, Condenser (AREA)
  • Image Input (AREA)
  • Image Processing (AREA)
  • Length Measuring Devices By Optical Means (AREA)
JP2007546048A 2004-12-14 2005-12-13 表面の外観特性の解析方法および解析装置 Withdrawn JP2008523521A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
EP04078382 2004-12-14
PCT/EP2005/056760 WO2006064010A1 (en) 2004-12-14 2005-12-13 Method and device for analysing visual properties of a surface

Publications (2)

Publication Number Publication Date
JP2008523521A true JP2008523521A (ja) 2008-07-03
JP2008523521A5 JP2008523521A5 (enExample) 2009-01-29

Family

ID=34928732

Family Applications (1)

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JP2007546048A Withdrawn JP2008523521A (ja) 2004-12-14 2005-12-13 表面の外観特性の解析方法および解析装置

Country Status (9)

Country Link
US (1) US20070273885A1 (enExample)
EP (1) EP1831655A1 (enExample)
JP (1) JP2008523521A (enExample)
KR (1) KR20070085589A (enExample)
CN (1) CN101076712A (enExample)
AU (1) AU2005315602A1 (enExample)
BR (1) BRPI0519038A2 (enExample)
RU (1) RU2007126795A (enExample)
WO (1) WO2006064010A1 (enExample)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2019184537A (ja) * 2018-04-17 2019-10-24 日本ペイント・オートモーティブコーティングス株式会社 外観評価装置及び外観評価方法
JPWO2022065038A1 (enExample) * 2020-09-25 2022-03-31
US12148146B2 (en) 2019-09-19 2024-11-19 Ppg Industries Ohio, Inc. Systems and methods for mapping coatings to a spatial appearance space

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2462121A (en) * 2008-07-25 2010-01-27 Diamond Trading Company Ltd Gemstone Viewer
KR102890328B1 (ko) 2021-11-12 2025-11-24 포항공과대학교 산학협력단 다중감각미디어시스템에서 질감모션효과를 제공하는 방법 및 모션효과렌더링장치

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE4032327A1 (de) * 1990-10-11 1992-04-16 Abos Automation Bildverarbeitu Verfahren und vorrichtung zur automatisierten ueberwachung der herstellung von halbleiterbauteilen
US5365084A (en) * 1991-02-20 1994-11-15 Pressco Technology, Inc. Video inspection system employing multiple spectrum LED illumination
DE4413832C2 (de) * 1994-04-20 2000-05-31 Siemens Ag Vorrichtungen zur Kontrolle von Halbleiterscheiben
US6034769A (en) * 1997-06-27 2000-03-07 Yufa; Aleksandr L. Method and device for counting and measuring particles
US6207946B1 (en) * 1998-09-03 2001-03-27 Semiconductor Technologies & Instruments, Inc. Adaptive lighting system and method for machine vision apparatus
JP3626387B2 (ja) * 2000-02-04 2005-03-09 関西ペイント株式会社 コンピュータ調色装置及びこの装置を用いた塗料の調色方法
DE10106032B4 (de) * 2000-02-25 2006-11-16 Laser-Laboratorium Göttingen eV Vorrichtung zur homogenen Ausleuchtung einer kleinen Fläche mit einer Ulbricht'schen Kugel
WO2003030524A2 (en) 2001-10-04 2003-04-10 Digieye Plc. A method of predicting reflectance functions
EP1516284A2 (en) * 2002-06-21 2005-03-23 Pressco Technology, Inc. Patterned illumination method and apparatus for machine vision systems

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2019184537A (ja) * 2018-04-17 2019-10-24 日本ペイント・オートモーティブコーティングス株式会社 外観評価装置及び外観評価方法
US12148146B2 (en) 2019-09-19 2024-11-19 Ppg Industries Ohio, Inc. Systems and methods for mapping coatings to a spatial appearance space
JPWO2022065038A1 (enExample) * 2020-09-25 2022-03-31
WO2022065038A1 (ja) * 2020-09-25 2022-03-31 コニカミノルタ株式会社 光学特性測定装置及び光学特性測定方法
JP7632472B2 (ja) 2020-09-25 2025-02-19 コニカミノルタ株式会社 光学特性測定装置及び光学特性測定方法

Also Published As

Publication number Publication date
WO2006064010A1 (en) 2006-06-22
AU2005315602A1 (en) 2006-06-22
BRPI0519038A2 (pt) 2008-12-23
KR20070085589A (ko) 2007-08-27
EP1831655A1 (en) 2007-09-12
RU2007126795A (ru) 2009-01-27
US20070273885A1 (en) 2007-11-29
CN101076712A (zh) 2007-11-21

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