BRPI0519038A2 - mÉtodo e dispositivo para anÁlise de propriedades visuais de uma superfÍcie - Google Patents

mÉtodo e dispositivo para anÁlise de propriedades visuais de uma superfÍcie

Info

Publication number
BRPI0519038A2
BRPI0519038A2 BRPI0519038-0A BRPI0519038A BRPI0519038A2 BR PI0519038 A2 BRPI0519038 A2 BR PI0519038A2 BR PI0519038 A BRPI0519038 A BR PI0519038A BR PI0519038 A2 BRPI0519038 A2 BR PI0519038A2
Authority
BR
Brazil
Prior art keywords
sample
cavity
image
illumination
light
Prior art date
Application number
BRPI0519038-0A
Other languages
English (en)
Inventor
Swie Lan Njo
Der Lans Ivo Bernardus Nicolaas Van
Original Assignee
Akzo Nobel Coatings Int Bv
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Akzo Nobel Coatings Int Bv filed Critical Akzo Nobel Coatings Int Bv
Publication of BRPI0519038A2 publication Critical patent/BRPI0519038A2/pt

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00Photometry, e.g. photographic exposure meter
    • G01J1/48Photometry, e.g. photographic exposure meter using chemical effects
    • G01J1/52Photometry, e.g. photographic exposure meter using chemical effects using photographic effects
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00Photometry, e.g. photographic exposure meter
    • G01J1/02Details
    • G01J1/04Optical or mechanical part supplementary adjustable parts
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00Photometry, e.g. photographic exposure meter
    • G01J1/02Details
    • G01J1/08Arrangements of light sources specially adapted for photometry standard sources, also using luminescent or radioactive material
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/8806Specially adapted optical and illumination features
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00Photometry, e.g. photographic exposure meter
    • G01J1/02Details
    • G01J1/0214Constructional arrangements for removing stray light
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00Photometry, e.g. photographic exposure meter
    • G01J1/02Details
    • G01J1/0223Sample holders for photometry

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Image Input (AREA)
  • Image Processing (AREA)
  • Microscoopes, Condenser (AREA)

Abstract

MÉTODO E DISPOSITIVO PARA ANÁLISE DE PROPRIEDADES VISUAIS DE UMA SUPERFÍCIE. A presente invenção refere-se a um método para imagem de uma amostra por meio de um dispositivo tendo uma cavidade com paredes internas e uma abertura de amostra, o dispositivo ainda compreendendo um meio de iluminação para a iluminação da cavidade e um dispositivo de formação de imagem digital direcionado da cavidade para a abertura de amostra, o método compreendendo as seguintes etapas: - apresentar uma amostra á cavidade por meio de uma abertura de amostra; - iluminar a cavidade; - ativar o dispositivo de formação de imagem para registrar uma imagem da amostra; - comunicar os dados de imagem registrada a uma unidade de processamento de dados programada com software de análise de imagem para analisar a imagem registrada, caracterizado pelo fato de que a parede interna da cavidade absorve luz e pelo fato de que pelo menos uma parte do meio de iluminação é formada pelas fontes de ponto de luz uniformemente distribuídas sobre pelo menos uma parte da parede interna da cavidade, e uma seleção das fontes de ponto de luz é ativada dependente do grau desejado de direcionalidade de luz.
BRPI0519038-0A 2004-12-14 2005-12-13 mÉtodo e dispositivo para anÁlise de propriedades visuais de uma superfÍcie BRPI0519038A2 (pt)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
EP04078382 2004-12-14
PCT/EP2005/056760 WO2006064010A1 (en) 2004-12-14 2005-12-13 Method and device for analysing visual properties of a surface

Publications (1)

Publication Number Publication Date
BRPI0519038A2 true BRPI0519038A2 (pt) 2008-12-23

Family

ID=34928732

Family Applications (1)

Application Number Title Priority Date Filing Date
BRPI0519038-0A BRPI0519038A2 (pt) 2004-12-14 2005-12-13 mÉtodo e dispositivo para anÁlise de propriedades visuais de uma superfÍcie

Country Status (9)

Country Link
US (1) US20070273885A1 (pt)
EP (1) EP1831655A1 (pt)
JP (1) JP2008523521A (pt)
KR (1) KR20070085589A (pt)
CN (1) CN101076712A (pt)
AU (1) AU2005315602A1 (pt)
BR (1) BRPI0519038A2 (pt)
RU (1) RU2007126795A (pt)
WO (1) WO2006064010A1 (pt)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2462121A (en) * 2008-07-25 2010-01-27 Diamond Trading Company Ltd Gemstone Viewer
JP2019184537A (ja) * 2018-04-17 2019-10-24 日本ペイント・オートモーティブコーティングス株式会社 外観評価装置及び外観評価方法
WO2022065038A1 (ja) * 2020-09-25 2022-03-31 コニカミノルタ株式会社 光学特性測定装置及び光学特性測定方法

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE4032327A1 (de) * 1990-10-11 1992-04-16 Abos Automation Bildverarbeitu Verfahren und vorrichtung zur automatisierten ueberwachung der herstellung von halbleiterbauteilen
US5365084A (en) * 1991-02-20 1994-11-15 Pressco Technology, Inc. Video inspection system employing multiple spectrum LED illumination
DE4413832C2 (de) * 1994-04-20 2000-05-31 Siemens Ag Vorrichtungen zur Kontrolle von Halbleiterscheiben
US6034769A (en) * 1997-06-27 2000-03-07 Yufa; Aleksandr L. Method and device for counting and measuring particles
US6207946B1 (en) * 1998-09-03 2001-03-27 Semiconductor Technologies & Instruments, Inc. Adaptive lighting system and method for machine vision apparatus
JP3626387B2 (ja) 2000-02-04 2005-03-09 関西ペイント株式会社 コンピュータ調色装置及びこの装置を用いた塗料の調色方法
DE10106032B4 (de) * 2000-02-25 2006-11-16 Laser-Laboratorium Göttingen eV Vorrichtung zur homogenen Ausleuchtung einer kleinen Fläche mit einer Ulbricht'schen Kugel
WO2003030524A2 (en) 2001-10-04 2003-04-10 Digieye Plc. A method of predicting reflectance functions
US8598557B2 (en) * 2002-06-21 2013-12-03 Pressco Technology Inc. Method and apparatus for providing patterned illumination fields for machine vision systems

Also Published As

Publication number Publication date
US20070273885A1 (en) 2007-11-29
WO2006064010A1 (en) 2006-06-22
RU2007126795A (ru) 2009-01-27
CN101076712A (zh) 2007-11-21
KR20070085589A (ko) 2007-08-27
EP1831655A1 (en) 2007-09-12
AU2005315602A1 (en) 2006-06-22
JP2008523521A (ja) 2008-07-03

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Legal Events

Date Code Title Description
B08F Application dismissed because of non-payment of annual fees [chapter 8.6 patent gazette]

Free format text: REFERENTE AS 5A E 6A ANUIDADES.

B08K Patent lapsed as no evidence of payment of the annual fee has been furnished to inpi [chapter 8.11 patent gazette]

Free format text: REFERENTE AO DESPACHO 8.6 PUBLICADO NA RPI 2160 DE 29/05/2012.