AU2003282421A1 - Probe for testing flat panel display and manufacturing method thereof - Google Patents

Probe for testing flat panel display and manufacturing method thereof

Info

Publication number
AU2003282421A1
AU2003282421A1 AU2003282421A AU2003282421A AU2003282421A1 AU 2003282421 A1 AU2003282421 A1 AU 2003282421A1 AU 2003282421 A AU2003282421 A AU 2003282421A AU 2003282421 A AU2003282421 A AU 2003282421A AU 2003282421 A1 AU2003282421 A1 AU 2003282421A1
Authority
AU
Australia
Prior art keywords
probe
manufacturing
flat panel
panel display
testing flat
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
AU2003282421A
Inventor
Chul-Hwan Goo
Byung-Ho Jo
Yong-Hwi Jo
Ki-Joon Kim
Jung-Bae Lee
Oug-Ki Lee
Sung-Young Oh
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Soulbrain ENG Co Ltd
Original Assignee
Phicom Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from KR10-2002-0072990A external-priority patent/KR100474420B1/en
Priority claimed from KR10-2002-0082273A external-priority patent/KR100450310B1/en
Priority claimed from KR10-2003-0007654A external-priority patent/KR100517729B1/en
Priority claimed from KR1020030065988A external-priority patent/KR100554180B1/en
Application filed by Phicom Corp filed Critical Phicom Corp
Publication of AU2003282421A1 publication Critical patent/AU2003282421A1/en
Abandoned legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R3/00—Apparatus or processes specially adapted for the manufacture or maintenance of measuring instruments, e.g. of probe tips
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
AU2003282421A 2002-11-22 2003-11-21 Probe for testing flat panel display and manufacturing method thereof Abandoned AU2003282421A1 (en)

Applications Claiming Priority (9)

Application Number Priority Date Filing Date Title
KR10-2002-0072990 2002-11-22
KR10-2002-0072990A KR100474420B1 (en) 2002-11-22 2002-11-22 Probe sheet for testing flat pannel display, method thereby, probe assembly having it
KR10-2002-0082273A KR100450310B1 (en) 2002-12-23 2002-12-23 Method for manufacturing probe for testing flat pannel display, probe thereby, probe assembly having it
KR10-2002-0082273 2002-12-23
KR10-2003-0007654 2003-02-07
KR10-2003-0007654A KR100517729B1 (en) 2003-02-07 2003-02-07 Probe for manufacturing probe for testing flat pannel display, probe thereby, probe assembly having its
KR10-2003-0065988 2003-09-23
KR1020030065988A KR100554180B1 (en) 2003-09-23 2003-09-23 Manufacturing method of probe for testing flat panel display and probe thereby
PCT/KR2003/002524 WO2004049429A1 (en) 2002-11-22 2003-11-21 Probe for testing flat panel display and manufacturing method thereof

Publications (1)

Publication Number Publication Date
AU2003282421A1 true AU2003282421A1 (en) 2004-06-18

Family

ID=36113875

Family Applications (1)

Application Number Title Priority Date Filing Date
AU2003282421A Abandoned AU2003282421A1 (en) 2002-11-22 2003-11-21 Probe for testing flat panel display and manufacturing method thereof

Country Status (4)

Country Link
JP (1) JP4430621B2 (en)
AU (1) AU2003282421A1 (en)
TW (1) TWI242647B (en)
WO (1) WO2004049429A1 (en)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4789686B2 (en) * 2006-04-05 2011-10-12 株式会社ユニオンアロー・テクノロジー Microprobe unit using microprobe guide and staggered microprobe unit
KR100773732B1 (en) * 2006-05-09 2007-11-09 주식회사 파이컴 Probe unit and probe apparatus having the same
KR101269660B1 (en) * 2006-10-09 2013-05-30 삼성디스플레이 주식회사 Apparatus of testing panel and testing method using the same
KR101152182B1 (en) * 2010-05-04 2012-06-15 주식회사디아이 Probe film used probe block and method for manufacturing thereof
JP2012047674A (en) 2010-08-30 2012-03-08 Advantest Corp Dicing substrate for test, probe, and semiconductor wafer testing apparatus
JP5597108B2 (en) * 2010-11-29 2014-10-01 株式会社精研 Contact inspection jig
US9774121B2 (en) * 2012-12-04 2017-09-26 Japan Electronics Material Corporation Contact probe
KR101582956B1 (en) * 2013-12-30 2016-01-06 주식회사 이노글로벌 Semiconductor test socket and manufacturing method thereof
CN105093574B (en) * 2015-06-05 2018-06-08 京东方科技集团股份有限公司 Display panel monitor station
KR101757617B1 (en) * 2016-01-21 2017-07-27 주식회사 이노글로벌 By-directional electrically conductive pattern module and semiconductor test socket using the same, method for manufacturing by-directional electrically conductive pattern module
KR102280651B1 (en) * 2018-12-26 2021-07-23 주식회사 아이에스시 Connector for electrical connection and manufacturing method thereof
CN113295893B (en) * 2021-05-26 2022-08-02 深圳市索麦科技有限公司 Touch screen sensitivity detection device for tablet computer

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3095807B2 (en) * 1991-05-22 2000-10-10 東京エレクトロン株式会社 Inspection equipment for semiconductor devices
JPH05215814A (en) * 1991-05-24 1993-08-27 Tokyo Electron Yamanashi Kk Semiconductor device inspecting device
JPH06213928A (en) * 1993-01-18 1994-08-05 Tokyo Electron Ltd Manufacture of probe head
US6499216B1 (en) * 1994-07-07 2002-12-31 Tessera, Inc. Methods and structures for electronic probing arrays
JPH08211099A (en) * 1995-01-31 1996-08-20 Aica Kogyo Co Ltd Electrode holder and electrode unit for electric signal measurement, and their manufacture
DE19538792C2 (en) * 1995-10-18 2000-08-03 Ibm Contact probe arrangement for electrically connecting a test device to the circular connection surfaces of a test object
JP3592441B2 (en) * 1996-05-10 2004-11-24 日本電子材料株式会社 Vertical probe card
US5869974A (en) * 1996-04-01 1999-02-09 Micron Technology, Inc. Micromachined probe card having compliant contact members for testing semiconductor wafers
KR100471341B1 (en) * 1996-05-23 2005-07-21 제네시스 테크놀로지 가부시키가이샤 Contact Probe and Probe Device with It
SG108210A1 (en) * 1998-06-19 2005-01-28 Advantest Corp Probe contactor formed by photolithography process

Also Published As

Publication number Publication date
JP4430621B2 (en) 2010-03-10
TW200419159A (en) 2004-10-01
JP2006507512A (en) 2006-03-02
TWI242647B (en) 2005-11-01
WO2004049429A1 (en) 2004-06-10

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Legal Events

Date Code Title Description
MK6 Application lapsed section 142(2)(f)/reg. 8.3(3) - pct applic. not entering national phase