AU2003244344A1 - Shearing interference measuring method and shearing interferometer, production method of projection optical system, projection optical system, and projection exposure system - Google Patents
Shearing interference measuring method and shearing interferometer, production method of projection optical system, projection optical system, and projection exposure systemInfo
- Publication number
- AU2003244344A1 AU2003244344A1 AU2003244344A AU2003244344A AU2003244344A1 AU 2003244344 A1 AU2003244344 A1 AU 2003244344A1 AU 2003244344 A AU2003244344 A AU 2003244344A AU 2003244344 A AU2003244344 A AU 2003244344A AU 2003244344 A1 AU2003244344 A1 AU 2003244344A1
- Authority
- AU
- Australia
- Prior art keywords
- optical system
- projection optical
- shearing
- projection
- interference measuring
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Abandoned
Links
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70483—Information management; Active and passive control; Testing; Wafer monitoring, e.g. pattern monitoring
- G03F7/70591—Testing optical components
- G03F7/706—Aberration measurement
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/02097—Self-interferometers
- G01B9/02098—Shearing interferometers
Applications Claiming Priority (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2002030413 | 2002-02-07 | ||
JP2002-030413 | 2002-02-07 | ||
JP2002-221765 | 2002-07-30 | ||
JP2002221765A JP2003302205A (en) | 2002-02-07 | 2002-07-30 | Shearing interference measuring method and shearing interferometer, method of manufacturing for projection optical system, and projection optical system, and projection exposure device |
PCT/JP2003/000897 WO2003067182A1 (en) | 2002-02-07 | 2003-01-30 | Shearing interference measuring method and shearing interferometer, production method of projection optical system, projection optical system, and projection exposure system |
Publications (1)
Publication Number | Publication Date |
---|---|
AU2003244344A1 true AU2003244344A1 (en) | 2003-09-02 |
Family
ID=27736453
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
AU2003244344A Abandoned AU2003244344A1 (en) | 2002-02-07 | 2003-01-30 | Shearing interference measuring method and shearing interferometer, production method of projection optical system, projection optical system, and projection exposure system |
Country Status (3)
Country | Link |
---|---|
JP (1) | JP2003302205A (en) |
AU (1) | AU2003244344A1 (en) |
WO (1) | WO2003067182A1 (en) |
Families Citing this family (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7333175B2 (en) * | 2004-09-13 | 2008-02-19 | Asml Netherlands, B.V. | Method and system for aligning a first and second marker |
JP4769448B2 (en) * | 2004-10-08 | 2011-09-07 | キヤノン株式会社 | Exposure apparatus having interferometer and device manufacturing method |
US7508488B2 (en) | 2004-10-13 | 2009-03-24 | Carl Zeiss Smt Ag | Projection exposure system and method of manufacturing a miniaturized device |
JP4731951B2 (en) * | 2005-02-28 | 2011-07-27 | キヤノン株式会社 | Interference fringe analysis method and apparatus, measurement apparatus, exposure apparatus, and device manufacturing method |
JP4904708B2 (en) * | 2005-03-23 | 2012-03-28 | 株式会社ニコン | Wavefront aberration measuring method, wavefront aberration measuring apparatus, projection exposure apparatus, and projection optical system manufacturing method |
JP2006303370A (en) | 2005-04-25 | 2006-11-02 | Canon Inc | Aligner and device manufacturing method using it |
US7518703B2 (en) * | 2005-06-28 | 2009-04-14 | Asml Netherlands B.V. | Lithographic apparatus and method |
JP5336890B2 (en) * | 2009-03-10 | 2013-11-06 | キヤノン株式会社 | Measuring apparatus, exposure apparatus, and device manufacturing method |
CN102878935B (en) * | 2012-09-25 | 2014-12-10 | 东南大学 | Device and method for measuring optical off-plane displacement field based on shearing speckle interference |
WO2014088089A1 (en) * | 2012-12-06 | 2014-06-12 | 合同会社3Dragons | Three-dimensional shape measuring device, method for acquiring hologram image, and method for measuring three-dimensional shape |
US11892292B2 (en) | 2017-06-06 | 2024-02-06 | RD Synergy Ltd. | Methods and systems of holographic interferometry |
US10725428B2 (en) * | 2017-06-06 | 2020-07-28 | RD Synergy Ltd. | Methods and systems of holographic interferometry |
WO2020089900A1 (en) | 2018-10-30 | 2020-05-07 | RD Synergy Ltd. | Methods and systems of holographic interferometry |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH05149719A (en) * | 1991-11-29 | 1993-06-15 | Toshiba Corp | Property measuring instrument |
JP3417640B2 (en) * | 1994-03-10 | 2003-06-16 | 株式会社東芝 | Phase difference measuring apparatus and method |
JP2000097664A (en) * | 1998-09-21 | 2000-04-07 | Nikon Corp | Shearing interferometer |
JP2000097622A (en) * | 1998-09-22 | 2000-04-07 | Nikon Corp | Interferometer |
JP2003014415A (en) * | 2001-06-29 | 2003-01-15 | Canon Inc | Point diffraction interferometer and aligner |
-
2002
- 2002-07-30 JP JP2002221765A patent/JP2003302205A/en active Pending
-
2003
- 2003-01-30 WO PCT/JP2003/000897 patent/WO2003067182A1/en active Application Filing
- 2003-01-30 AU AU2003244344A patent/AU2003244344A1/en not_active Abandoned
Also Published As
Publication number | Publication date |
---|---|
WO2003067182A1 (en) | 2003-08-14 |
JP2003302205A (en) | 2003-10-24 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
MK6 | Application lapsed section 142(2)(f)/reg. 8.3(3) - pct applic. not entering national phase |