AU2002236492A1 - Self teaching robot - Google Patents

Self teaching robot

Info

Publication number
AU2002236492A1
AU2002236492A1 AU2002236492A AU3649202A AU2002236492A1 AU 2002236492 A1 AU2002236492 A1 AU 2002236492A1 AU 2002236492 A AU2002236492 A AU 2002236492A AU 3649202 A AU3649202 A AU 3649202A AU 2002236492 A1 AU2002236492 A1 AU 2002236492A1
Authority
AU
Australia
Prior art keywords
teaching robot
self teaching
self
robot
teaching
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
AU2002236492A
Inventor
Graham L. Hine
Roger G. Hine
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Asyst Technologies Inc
Original Assignee
ASYST TECHNOLOGIES
Asyst Technologies Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by ASYST TECHNOLOGIES, Asyst Technologies Inc filed Critical ASYST TECHNOLOGIES
Publication of AU2002236492A1 publication Critical patent/AU2002236492A1/en
Abandoned legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67242Apparatus for monitoring, sorting or marking
    • H01L21/67259Position monitoring, e.g. misposition detection or presence detection
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/68Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for positioning, orientation or alignment
    • H01L21/681Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for positioning, orientation or alignment using optical controlling means
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/683Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
    • H01L21/687Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
    • H01L21/68707Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a robot blade, or gripped by a gripper for conveyance

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Robotics (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
  • Manipulator (AREA)
AU2002236492A 2000-12-04 2001-11-28 Self teaching robot Abandoned AU2002236492A1 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US09/729,463 US6591160B2 (en) 2000-12-04 2000-12-04 Self teaching robot
US09/729,463 2000-12-04
PCT/US2001/044393 WO2002047115A2 (en) 2000-12-04 2001-11-28 Self teaching robot

Publications (1)

Publication Number Publication Date
AU2002236492A1 true AU2002236492A1 (en) 2002-06-18

Family

ID=24931146

Family Applications (1)

Application Number Title Priority Date Filing Date
AU2002236492A Abandoned AU2002236492A1 (en) 2000-12-04 2001-11-28 Self teaching robot

Country Status (5)

Country Link
US (1) US6591160B2 (en)
JP (1) JP4163950B2 (en)
AU (1) AU2002236492A1 (en)
TW (1) TW508289B (en)
WO (1) WO2002047115A2 (en)

Families Citing this family (83)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6244121B1 (en) * 1998-03-06 2001-06-12 Applied Materials, Inc. Sensor device for non-intrusive diagnosis of a semiconductor processing system
SE9900123L (en) * 1999-01-15 2000-07-16 Abb Ab Method for robot
US6887026B1 (en) * 2000-12-22 2005-05-03 Infineon Technologie Sc300 Gmbh & Co. Kg Semiconductor product container and system for handling a semiconductor product container
KR100383260B1 (en) * 2001-03-08 2003-05-09 삼성전자주식회사 Reticle Sending Apparatus with Fork Arm having Reticle Position Sensing Ability
JP3694808B2 (en) * 2001-04-13 2005-09-14 株式会社安川電機 Wafer transfer robot teaching method and teaching plate
US6678583B2 (en) * 2001-08-06 2004-01-13 Seminet, Inc. Robotic storage buffer system for substrate carrier pods
JP3832292B2 (en) * 2001-08-31 2006-10-11 株式会社ダイフク Load storage equipment
KR100763096B1 (en) * 2001-09-07 2007-10-04 가부시키가이샤 야스카와덴키 Wafer position teaching method and teaching jig
US20030053892A1 (en) * 2001-09-17 2003-03-20 Taiwan Semiconductor Manufacturing Co., Ltd. Loadport equipped with automatic height adjustment means and method for operating
US7289230B2 (en) 2002-02-06 2007-10-30 Cyberoptics Semiconductors, Inc. Wireless substrate-like sensor
US7233841B2 (en) * 2002-04-19 2007-06-19 Applied Materials, Inc. Vision system
US7085622B2 (en) 2002-04-19 2006-08-01 Applied Material, Inc. Vision system
US6825485B1 (en) * 2002-05-08 2004-11-30 Storage Technology Corporation System and method for aligning a robot device in a data storage library
US7039499B1 (en) * 2002-08-02 2006-05-02 Seminet Inc. Robotic storage buffer system for substrate carrier pods
US6795786B2 (en) * 2002-12-31 2004-09-21 Intel Corporation Robotic sensor calibration system
US7397539B2 (en) * 2003-03-31 2008-07-08 Asml Netherlands, B.V. Transfer apparatus for transferring an object, lithographic apparatus employing such a transfer apparatus, and method of use thereof
SG125948A1 (en) * 2003-03-31 2006-10-30 Asml Netherlands Bv Supporting structure for use in a lithographic apparatus
KR101015778B1 (en) * 2003-06-03 2011-02-22 도쿄엘렉트론가부시키가이샤 Substrate processing apparatus and method for adjusting a substrate transfer position
JP4137711B2 (en) * 2003-06-16 2008-08-20 東京エレクトロン株式会社 Substrate processing apparatus and substrate transfer means positioning method
US6934606B1 (en) * 2003-06-20 2005-08-23 Novellus Systems, Inc. Automatic calibration of a wafer-handling robot
US20050113976A1 (en) * 2003-11-10 2005-05-26 Blueshift Technologies, Inc. Software controller for handling system
US20070269297A1 (en) 2003-11-10 2007-11-22 Meulen Peter V D Semiconductor wafer handling and transport
US10086511B2 (en) 2003-11-10 2018-10-02 Brooks Automation, Inc. Semiconductor manufacturing systems
US7458763B2 (en) 2003-11-10 2008-12-02 Blueshift Technologies, Inc. Mid-entry load lock for semiconductor handling system
KR100577582B1 (en) * 2004-06-09 2006-05-08 삼성전자주식회사 Spinner for manufacturing semiconductor device and method for preventing wafer teaching badness at the same
JP4775584B2 (en) * 2004-06-25 2011-09-21 株式会社安川電機 Positioner and composite curl cord
US20060047363A1 (en) * 2004-08-31 2006-03-02 Farrelly Philip J Machine vision system for lab workcells
US8000837B2 (en) 2004-10-05 2011-08-16 J&L Group International, Llc Programmable load forming system, components thereof, and methods of use
JP5336184B2 (en) * 2005-07-11 2013-11-06 ブルックス オートメーション インコーポレイテッド Automatic alignment board transfer device
US7933685B1 (en) * 2006-01-10 2011-04-26 National Semiconductor Corporation System and method for calibrating a wafer handling robot and a wafer cassette
US20070271638A1 (en) * 2006-05-03 2007-11-22 Data I/O Corporation Auto-teaching system
WO2008051544A1 (en) * 2006-10-23 2008-05-02 Cyberoptics Semiconductor, Inc. Improved calibration of a substrate handling robot
US8260461B2 (en) * 2007-08-30 2012-09-04 Applied Materials, Inc. Method and system for robot calibrations with a camera
US8224607B2 (en) * 2007-08-30 2012-07-17 Applied Materials, Inc. Method and apparatus for robot calibrations with a calibrating device
US8588958B2 (en) * 2007-09-04 2013-11-19 Musashi Engineering, Inc. Moving program making-out program and device
JP4863985B2 (en) * 2007-12-20 2012-01-25 大日本スクリーン製造株式会社 Substrate processing equipment
SG186664A1 (en) * 2007-12-27 2013-01-30 Lam Res Corp Systems and methods for dynamic alignment beamcalibration
KR101579990B1 (en) * 2007-12-27 2015-12-23 램 리써치 코포레이션 Systems and methods for calibrating end effector alignment using at least a light source
KR101571180B1 (en) * 2007-12-27 2015-11-23 램 리써치 코포레이션 Arrangements and methods for determining positions and offsets
SG187402A1 (en) * 2007-12-27 2013-02-28 Lam Res Corp Systems and methods for calibrating end effector alignment in a plasma processing system
CA2711294C (en) * 2008-01-10 2016-03-08 Parata Systems, Llc System and method for calibrating an automated materials handling system
NL1036673A1 (en) * 2008-04-09 2009-10-12 Asml Holding Nv Robot Position Calibration Tool (RPCT).
US8242730B2 (en) * 2008-06-10 2012-08-14 Nichols Michael J Automated robot teach tool and method of use
CN101625528B (en) * 2008-07-08 2010-09-29 中芯国际集成电路制造(上海)有限公司 Mask clamp
US8886354B2 (en) * 2009-01-11 2014-11-11 Applied Materials, Inc. Methods, systems and apparatus for rapid exchange of work material
DE102009016811A1 (en) * 2009-04-09 2010-10-14 Aes Motomation Gmbh Method for automatically measuring and teaching positional positions of objects within a substrate processing system by means of sensor carriers and associated sensor carriers
WO2010119846A1 (en) * 2009-04-13 2010-10-21 平田機工株式会社 Substrate carrier measuring jig, collision preventing jig, and collision preventing method using the collision preventing jig
US8676537B2 (en) * 2009-08-07 2014-03-18 Taiwan Semiconductor Manufacturing Company, Ltd. Portable wireless sensor
US8459922B2 (en) 2009-11-13 2013-06-11 Brooks Automation, Inc. Manipulator auto-teach and position correction system
KR101064084B1 (en) 2010-03-25 2011-09-08 엘지이노텍 주식회사 Light emitting device package and fabrication method thereof
CN101907577B (en) * 2010-07-13 2012-01-04 友达光电股份有限公司 Cartridge correcting system and method thereof
JP5849403B2 (en) * 2011-02-15 2016-01-27 セイコーエプソン株式会社 Robot controller, robot, and robot system
US9233377B2 (en) 2011-04-13 2016-01-12 Siemens Healthcare Diagnostics Inc. Method, system, and apparatus for aligning the angle of a polar coordinate system device to the axis of an end-effector
US20170028557A1 (en) 2015-07-28 2017-02-02 Comprehensive Engineering Solutions, Inc. Robotic navigation system and method
DE102012200220A1 (en) * 2011-06-20 2012-12-20 Semilev Gmbh Method for calibrating an active magnetic bearing robot
US8646404B2 (en) * 2011-09-26 2014-02-11 Todd E. Hendricks, SR. Modular system with platformed robot, booth, and fluid delivery system for tire spraying
US20130173039A1 (en) * 2012-01-04 2013-07-04 Seagate Technology Llc Methods and devices for determining a teaching point location using pressure measurements
US20130269615A1 (en) * 2012-04-16 2013-10-17 Asm Ip Holding B.V. Vertical wafer boat
JP6114060B2 (en) * 2013-02-27 2017-04-12 東京エレクトロン株式会社 Substrate transport apparatus, substrate delivery position confirmation method, and substrate processing system
SG2013025770A (en) 2013-04-05 2014-11-27 Sigenic Pte Ltd Apparatus and method for detecting position drift in a machine operation using a robot arm
US10203683B2 (en) 2013-07-16 2019-02-12 Seagate Technology Llc Coordinating end effector and vision controls
US10780586B2 (en) 2013-08-09 2020-09-22 Nidec Sankyo Corporation Horizontal articulated robot with bevel gears
JP6374156B2 (en) * 2013-08-09 2018-08-15 日本電産サンキョー株式会社 Horizontal articulated robot and method of manufacturing horizontal articulated robot
JP6309220B2 (en) * 2013-08-12 2018-04-11 株式会社ダイヘン Transport system
US9666465B2 (en) * 2013-12-12 2017-05-30 Seagate Technology Llc Positioning apparatus
US9658316B2 (en) * 2013-12-30 2017-05-23 Taiwan Semiconductor Manufacturing Co., Ltd. Device and method for positioning and calibrating a wafer transportation apparatus
WO2016077387A1 (en) 2014-11-10 2016-05-19 Brooks Automation, Inc. Tool auto-teach method and apparatus
US10730180B2 (en) * 2015-05-29 2020-08-04 Abb Schweiz Ag User interface for a teleoperated robot
US20170028549A1 (en) * 2015-07-28 2017-02-02 Comprehensive Engineering Solutions, Inc. Robotic navigation system and method
US9966290B2 (en) 2015-07-30 2018-05-08 Lam Research Corporation System and method for wafer alignment and centering with CCD camera and robot
JP6444940B2 (en) * 2016-05-17 2018-12-26 ファナック株式会社 Workpiece holding system
JP6741538B2 (en) * 2016-09-28 2020-08-19 川崎重工業株式会社 Robot, robot control device, and robot position teaching method
JP6685213B2 (en) * 2016-09-29 2020-04-22 株式会社Screenホールディングス Substrate aligning device, substrate processing device, substrate arranging device, substrate aligning method, substrate processing method and substrate arranging method
TWI617995B (en) * 2016-11-04 2018-03-11 廣明光電股份有限公司 Method for checking the vision position of a robot
US10861723B2 (en) * 2017-08-08 2020-12-08 Taiwan Semiconductor Manufacturing Co., Ltd. EFEM robot auto teaching methodology
US10020216B1 (en) * 2017-09-08 2018-07-10 Kawasaki Jukogyo Kabushiki Kaisha Robot diagnosing method
JP7187147B2 (en) * 2017-12-12 2022-12-12 東京エレクトロン株式会社 Transfer device teaching method and substrate processing system
JP7049909B2 (en) * 2018-05-11 2022-04-07 川崎重工業株式会社 Optical axis misalignment detection method for board transfer robot and board holding hand
US11756840B2 (en) * 2018-09-20 2023-09-12 Taiwan Semiconductor Manufacturing Co., Ltd. Reflectance measurement system and method thereof
EP3921123A4 (en) 2019-02-08 2022-10-26 Yaskawa America, Inc. Through-beam auto teaching
US11524410B2 (en) 2020-06-12 2022-12-13 Hexagon Metrology, Inc. Robotic alignment method for workpiece measuring systems
US11676845B2 (en) 2020-06-30 2023-06-13 Brooks Automation Us, Llc Automated teach apparatus for robotic systems and method therefor
WO2023213864A1 (en) 2022-05-04 2023-11-09 F. Hoffmann-La Roche Ag Slide imaging apparatus

Family Cites Families (28)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6016673B2 (en) * 1978-12-25 1985-04-26 川崎重工業株式会社 Object recognition device in servo system
US6163946A (en) * 1981-05-11 2000-12-26 Great Lakes Intellectual Property Vision target based assembly
JPS6132113A (en) 1984-07-23 1986-02-14 Seiko Instr & Electronics Ltd Robot control system
US5579444A (en) 1987-08-28 1996-11-26 Axiom Bildverarbeitungssysteme Gmbh Adaptive vision-based controller
JP2512099B2 (en) 1988-08-24 1996-07-03 松下電器産業株式会社 Robot motion teaching method and control device
US4945493A (en) 1988-09-26 1990-07-31 Ford Motor Company Method and system for correcting a robot path
US5297238A (en) 1991-08-30 1994-03-22 Cimetrix Incorporated Robot end-effector terminal control frame (TCF) calibration method and device
US5737441A (en) * 1991-12-12 1998-04-07 Nikon Corporation Aligning method and apparatus
JPH0615589A (en) 1992-07-03 1994-01-25 Daihen Corp Industrial robot control device
DE69431875T2 (en) 1993-04-22 2003-05-28 Image Guided Technologies Inc ARRANGEMENT FOR DETERMINING THE MUTUAL POSITION OF BODIES
US6225012B1 (en) 1994-02-22 2001-05-01 Nikon Corporation Method for positioning substrate
US5802201A (en) * 1996-02-09 1998-09-01 The Trustees Of Columbia University In The City Of New York Robot system with vision apparatus and transparent grippers
JP3211655B2 (en) * 1996-03-19 2001-09-25 トヨタ自動車株式会社 Molding method and molding apparatus
US6318951B1 (en) * 1999-07-09 2001-11-20 Semitool, Inc. Robots for microelectronic workpiece handling
SG88824A1 (en) * 1996-11-28 2002-05-21 Nikon Corp Projection exposure method
US5988971A (en) * 1997-07-09 1999-11-23 Ade Optical Systems Corporation Wafer transfer robot
US6522386B1 (en) * 1997-07-24 2003-02-18 Nikon Corporation Exposure apparatus having projection optical system with aberration correction element
JPH1154407A (en) 1997-08-05 1999-02-26 Nikon Corp Method of registration
US6157873A (en) 1998-04-09 2000-12-05 Motoman, Inc. Robot programming system and method
US6425865B1 (en) 1998-06-12 2002-07-30 The University Of British Columbia Robotically assisted medical ultrasound
US6447668B1 (en) * 1998-07-09 2002-09-10 Acm Research, Inc. Methods and apparatus for end-point detection
IL125337A0 (en) * 1998-07-14 1999-03-12 Nova Measuring Instr Ltd Method and apparatus for lithography monitoring and process control
US6490369B1 (en) * 1999-07-06 2002-12-03 Fanuc Robotics North America Method of viewing and identifying a part for a robot manipulator
US6460369B2 (en) * 1999-11-03 2002-10-08 Applied Materials, Inc. Consecutive deposition system
TWI223734B (en) * 1999-12-21 2004-11-11 Asml Netherlands Bv Crash prevention in positioning apparatus for use in lithographic projection apparatus
KR100621100B1 (en) * 2000-02-11 2006-09-07 삼성전자주식회사 method and system for teaching welding robot
US6516244B1 (en) * 2000-08-25 2003-02-04 Wafermasters, Inc. Wafer alignment system and method
US6466841B2 (en) * 2001-02-14 2002-10-15 Xerox Corporation Apparatus and method for determining a reference position for an industrial robot

Also Published As

Publication number Publication date
JP2004536443A (en) 2004-12-02
WO2002047115A3 (en) 2003-05-15
TW508289B (en) 2002-11-01
US6591160B2 (en) 2003-07-08
US20020068992A1 (en) 2002-06-06
JP4163950B2 (en) 2008-10-08
WO2002047115A2 (en) 2002-06-13

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