AU2002221142A1 - Semiconductor photocathode - Google Patents
Semiconductor photocathodeInfo
- Publication number
- AU2002221142A1 AU2002221142A1 AU2002221142A AU2114202A AU2002221142A1 AU 2002221142 A1 AU2002221142 A1 AU 2002221142A1 AU 2002221142 A AU2002221142 A AU 2002221142A AU 2114202 A AU2114202 A AU 2114202A AU 2002221142 A1 AU2002221142 A1 AU 2002221142A1
- Authority
- AU
- Australia
- Prior art keywords
- semiconductor photocathode
- photocathode
- semiconductor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Abandoned
Links
- 239000004065 semiconductor Substances 0.000 title 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/08—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof in which radiation controls flow of current through the device, e.g. photoresistors
- H01L31/09—Devices sensitive to infrared, visible or ultraviolet radiation
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J1/00—Details of electrodes, of magnetic control means, of screens, or of the mounting or spacing thereof, common to two or more basic types of discharge tubes or lamps
- H01J1/02—Main electrodes
- H01J1/34—Photo-emissive cathodes
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2201/00—Electrodes common to discharge tubes
- H01J2201/34—Photoemissive electrodes
- H01J2201/342—Cathodes
- H01J2201/3421—Composition of the emitting surface
- H01J2201/3423—Semiconductors, e.g. GaAs, NEA emitters
Landscapes
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Electromagnetism (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Common Detailed Techniques For Electron Tubes Or Discharge Tubes (AREA)
- Image-Pickup Tubes, Image-Amplification Tubes, And Storage Tubes (AREA)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2000384009A JP2002184302A (ja) | 2000-12-18 | 2000-12-18 | 半導体光電陰極 |
JP2000-384009 | 2000-12-18 | ||
PCT/JP2001/011095 WO2002050858A1 (en) | 2000-12-18 | 2001-12-18 | Semiconductor photocathode |
Publications (1)
Publication Number | Publication Date |
---|---|
AU2002221142A1 true AU2002221142A1 (en) | 2002-07-01 |
Family
ID=18851560
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
AU2002221142A Abandoned AU2002221142A1 (en) | 2000-12-18 | 2001-12-18 | Semiconductor photocathode |
Country Status (6)
Country | Link |
---|---|
US (1) | US6917058B2 (ja) |
JP (1) | JP2002184302A (ja) |
KR (1) | KR20030063435A (ja) |
CN (1) | CN1291435C (ja) |
AU (1) | AU2002221142A1 (ja) |
WO (1) | WO2002050858A1 (ja) |
Families Citing this family (46)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2002061458A1 (fr) * | 2001-01-31 | 2002-08-08 | Hamamatsu Photonics K. K. | Detecteur de faisceau electronique, microscope electronique de type a balayage, spectrometre de masse et detecteur d'ions |
JP4002167B2 (ja) * | 2002-11-14 | 2007-10-31 | 浜松ホトニクス株式会社 | 光電陰極 |
US20050195318A1 (en) * | 2003-02-07 | 2005-09-08 | Takahiro Komatsu | Organic information reading unit and information reading device using the same |
JP4096877B2 (ja) * | 2003-02-07 | 2008-06-04 | 松下電器産業株式会社 | 情報読み取り素子及びそれを用いた情報読み取り装置 |
JP2005032793A (ja) * | 2003-07-08 | 2005-02-03 | Matsushita Electric Ind Co Ltd | 有機光電変換素子 |
JP2005032852A (ja) * | 2003-07-09 | 2005-02-03 | Matsushita Electric Ind Co Ltd | 有機光電変換素子 |
WO2005096403A2 (en) * | 2004-03-31 | 2005-10-13 | Matsushita Electric Industrial Co., Ltd. | Organic photoelectric conversion element utilizing an inorganic buffer layer placed between an electrode and the active material |
JP4647955B2 (ja) * | 2004-08-17 | 2011-03-09 | 浜松ホトニクス株式会社 | 光電陰極板及び電子管 |
JP4856883B2 (ja) * | 2005-03-03 | 2012-01-18 | 富士フイルム株式会社 | 機能性素子、エレクトロクロミック素子、光学デバイス及び撮影ユニット |
JP2007080799A (ja) * | 2005-09-16 | 2007-03-29 | Hamamatsu Photonics Kk | 光電陰極及び電子管 |
JP4939033B2 (ja) * | 2005-10-31 | 2012-05-23 | 浜松ホトニクス株式会社 | 光電陰極 |
KR100809427B1 (ko) * | 2006-07-10 | 2008-03-05 | 삼성전기주식회사 | 광전 변환 소자 및 이의 제조 방법 |
JP2008135350A (ja) * | 2006-11-29 | 2008-06-12 | Hamamatsu Photonics Kk | 半導体光電陰極 |
CN101205059B (zh) * | 2006-12-20 | 2010-09-29 | 清华大学 | 碳纳米管阵列的制备方法 |
CN101205060B (zh) | 2006-12-20 | 2011-05-04 | 清华大学 | 碳纳米管阵列的制备方法 |
CN101206980B (zh) * | 2006-12-22 | 2010-04-14 | 清华大学 | 场发射阴极的制备方法 |
CN101205061B (zh) * | 2006-12-22 | 2011-03-23 | 鸿富锦精密工业(深圳)有限公司 | 碳纳米管阵列的制备方法 |
CN101206979B (zh) * | 2006-12-22 | 2010-05-19 | 清华大学 | 场发射阴极的制备方法 |
CN101209833B (zh) * | 2006-12-27 | 2010-09-29 | 清华大学 | 碳纳米管阵列的制备方法 |
CN101209832B (zh) * | 2006-12-29 | 2010-05-12 | 清华大学 | 碳纳米管阵列的制备方法 |
WO2010085478A1 (en) | 2009-01-22 | 2010-07-29 | Bae Systems Information And Electronic Systems Inc. | Corner cube enhanced photocathode |
KR101010392B1 (ko) * | 2009-01-29 | 2011-01-21 | 이상범 | 차광장치 |
US10197501B2 (en) | 2011-12-12 | 2019-02-05 | Kla-Tencor Corporation | Electron-bombarded charge-coupled device and inspection systems using EBCCD detectors |
US9496425B2 (en) | 2012-04-10 | 2016-11-15 | Kla-Tencor Corporation | Back-illuminated sensor with boron layer |
US9601299B2 (en) | 2012-08-03 | 2017-03-21 | Kla-Tencor Corporation | Photocathode including silicon substrate with boron layer |
US9426400B2 (en) | 2012-12-10 | 2016-08-23 | Kla-Tencor Corporation | Method and apparatus for high speed acquisition of moving images using pulsed illumination |
US9478402B2 (en) * | 2013-04-01 | 2016-10-25 | Kla-Tencor Corporation | Photomultiplier tube, image sensor, and an inspection system using a PMT or image sensor |
US9347890B2 (en) | 2013-12-19 | 2016-05-24 | Kla-Tencor Corporation | Low-noise sensor and an inspection system using a low-noise sensor |
US9748294B2 (en) | 2014-01-10 | 2017-08-29 | Hamamatsu Photonics K.K. | Anti-reflection layer for back-illuminated sensor |
US9410901B2 (en) | 2014-03-17 | 2016-08-09 | Kla-Tencor Corporation | Image sensor, an inspection system and a method of inspecting an article |
US9767986B2 (en) | 2014-08-29 | 2017-09-19 | Kla-Tencor Corporation | Scanning electron microscope and methods of inspecting and reviewing samples |
FR3034908B1 (fr) * | 2015-04-08 | 2017-05-05 | Photonis France | Photocathode multibande et detecteur associe |
US9860466B2 (en) | 2015-05-14 | 2018-01-02 | Kla-Tencor Corporation | Sensor with electrically controllable aperture for inspection and metrology systems |
US10748730B2 (en) | 2015-05-21 | 2020-08-18 | Kla-Tencor Corporation | Photocathode including field emitter array on a silicon substrate with boron layer |
US10462391B2 (en) | 2015-08-14 | 2019-10-29 | Kla-Tencor Corporation | Dark-field inspection using a low-noise sensor |
US10313622B2 (en) | 2016-04-06 | 2019-06-04 | Kla-Tencor Corporation | Dual-column-parallel CCD sensor and inspection systems using a sensor |
US10778925B2 (en) | 2016-04-06 | 2020-09-15 | Kla-Tencor Corporation | Multiple column per channel CCD sensor architecture for inspection and metrology |
JP6959882B2 (ja) * | 2018-02-22 | 2021-11-05 | 浜松ホトニクス株式会社 | イオン検出器 |
US11114489B2 (en) | 2018-06-18 | 2021-09-07 | Kla-Tencor Corporation | Back-illuminated sensor and a method of manufacturing a sensor |
US10615599B2 (en) | 2018-07-12 | 2020-04-07 | John Bennett | Efficient low-voltage grid for a cathode |
US10566168B1 (en) | 2018-08-10 | 2020-02-18 | John Bennett | Low voltage electron transparent pellicle |
US10943760B2 (en) | 2018-10-12 | 2021-03-09 | Kla Corporation | Electron gun and electron microscope |
US11114491B2 (en) | 2018-12-12 | 2021-09-07 | Kla Corporation | Back-illuminated sensor and a method of manufacturing a sensor |
US11417492B2 (en) | 2019-09-26 | 2022-08-16 | Kla Corporation | Light modulated electron source |
US11848350B2 (en) | 2020-04-08 | 2023-12-19 | Kla Corporation | Back-illuminated sensor and a method of manufacturing a sensor using a silicon on insulator wafer |
US20240170247A1 (en) * | 2022-11-22 | 2024-05-23 | L3Harris Technologies, Inc. | Design of lattice matched photocathodes for extended wavelengths |
Family Cites Families (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3958143A (en) * | 1973-01-15 | 1976-05-18 | Varian Associates | Long-wavelength photoemission cathode |
US5047821A (en) * | 1990-03-15 | 1991-09-10 | Intevac, Inc. | Transferred electron III-V semiconductor photocathode |
US5680007A (en) * | 1994-12-21 | 1997-10-21 | Hamamatsu Photonics K.K. | Photomultiplier having a photocathode comprised of a compound semiconductor material |
JP3122327B2 (ja) * | 1995-02-27 | 2001-01-09 | 浜松ホトニクス株式会社 | 光電子放出面の使用方法および電子管の使用方法 |
US6005257A (en) * | 1995-09-13 | 1999-12-21 | Litton Systems, Inc. | Transmission mode photocathode with multilayer active layer for night vision and method |
JPH09213206A (ja) * | 1996-02-06 | 1997-08-15 | Hamamatsu Photonics Kk | 透過型光電面、その製造方法、及びそれを用いた光電変換管 |
JP3806514B2 (ja) * | 1998-06-22 | 2006-08-09 | 浜松ホトニクス株式会社 | 光電面及びその製造方法 |
JP3806515B2 (ja) * | 1998-06-30 | 2006-08-09 | 浜松ホトニクス株式会社 | 半導体光電陰極 |
JP2000090816A (ja) * | 1998-09-11 | 2000-03-31 | Daido Steel Co Ltd | 偏極電子線発生素子 |
-
2000
- 2000-12-18 JP JP2000384009A patent/JP2002184302A/ja active Pending
-
2001
- 2001-12-18 CN CNB018208274A patent/CN1291435C/zh not_active Expired - Fee Related
- 2001-12-18 WO PCT/JP2001/011095 patent/WO2002050858A1/ja active Application Filing
- 2001-12-18 US US10/433,060 patent/US6917058B2/en not_active Expired - Lifetime
- 2001-12-18 KR KR10-2003-7008147A patent/KR20030063435A/ko not_active Application Discontinuation
- 2001-12-18 AU AU2002221142A patent/AU2002221142A1/en not_active Abandoned
Also Published As
Publication number | Publication date |
---|---|
WO2002050858A1 (en) | 2002-06-27 |
JP2002184302A (ja) | 2002-06-28 |
US6917058B2 (en) | 2005-07-12 |
US20040056279A1 (en) | 2004-03-25 |
CN1481569A (zh) | 2004-03-10 |
CN1291435C (zh) | 2006-12-20 |
KR20030063435A (ko) | 2003-07-28 |
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