AU2001296533A1 - System and method for facilitating wafer alignment by mitigating effects of reticle rotation on overlay - Google Patents

System and method for facilitating wafer alignment by mitigating effects of reticle rotation on overlay

Info

Publication number
AU2001296533A1
AU2001296533A1 AU2001296533A AU9653301A AU2001296533A1 AU 2001296533 A1 AU2001296533 A1 AU 2001296533A1 AU 2001296533 A AU2001296533 A AU 2001296533A AU 9653301 A AU9653301 A AU 9653301A AU 2001296533 A1 AU2001296533 A1 AU 2001296533A1
Authority
AU
Australia
Prior art keywords
overlay
wafer alignment
mitigating effects
reticle rotation
facilitating wafer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
AU2001296533A
Other languages
English (en)
Inventor
Bharath Rangarajan
Michael K. Templeton
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Advanced Micro Devices Inc
Original Assignee
Advanced Micro Devices Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from US09/788,905 external-priority patent/US6552790B1/en
Application filed by Advanced Micro Devices Inc filed Critical Advanced Micro Devices Inc
Publication of AU2001296533A1 publication Critical patent/AU2001296533A1/en
Abandoned legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70—Microphotolithographic exposure; Apparatus therefor
    • G03F7/70483—Information management; Active and passive control; Testing; Wafer monitoring, e.g. pattern monitoring
    • G03F7/70605—Workpiece metrology
    • G03F7/70616—Monitoring the printed patterns
    • G03F7/70633—Overlay, i.e. relative alignment between patterns printed by separate exposures in different layers, or in the same layer in multiple exposures or stitching
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F9/00—Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically
    • G03F9/70—Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically for microlithography
    • G03F9/7003—Alignment type or strategy, e.g. leveling, global alignment
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F9/00—Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically
    • G03F9/70—Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically for microlithography
    • G03F9/7073—Alignment marks and their environment
    • G03F9/7076—Mark details, e.g. phase grating mark, temporary mark
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F9/00—Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically
    • G03F9/70—Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically for microlithography
    • G03F9/7073—Alignment marks and their environment
    • G03F9/7084—Position of mark on substrate, i.e. position in (x, y, z) of mark, e.g. buried or resist covered mark, mark on rearside, at the substrate edge, in the circuit area, latent image mark, marks in plural levels

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
AU2001296533A 2000-10-23 2001-10-02 System and method for facilitating wafer alignment by mitigating effects of reticle rotation on overlay Abandoned AU2001296533A1 (en)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
US24257400P 2000-10-23 2000-10-23
US60242574 2000-10-23
US09/788,905 US6552790B1 (en) 2001-02-20 2001-02-20 System and method for facilitating wafer alignment by mitigating effects of reticle rotation on overlay
US09788905 2001-02-20
PCT/US2001/030931 WO2002035288A1 (en) 2000-10-23 2001-10-02 System and method for facilitating wafer alignment by mitigating effects of reticle rotation on overlay

Publications (1)

Publication Number Publication Date
AU2001296533A1 true AU2001296533A1 (en) 2002-05-06

Family

ID=26935176

Family Applications (1)

Application Number Title Priority Date Filing Date
AU2001296533A Abandoned AU2001296533A1 (en) 2000-10-23 2001-10-02 System and method for facilitating wafer alignment by mitigating effects of reticle rotation on overlay

Country Status (4)

Country Link
EP (1) EP1330681B1 (de)
AU (1) AU2001296533A1 (de)
TW (1) TW508641B (de)
WO (1) WO2002035288A1 (de)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI338819B (en) 2006-06-23 2011-03-11 Ind Tech Res Inst Recticle pattern applied to mix-and-match lithography process and alignment method of thereof
CN101750899B (zh) * 2008-12-04 2011-06-22 上海华虹Nec电子有限公司 光刻版图及其测量光刻形变的方法

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4595295A (en) 1982-01-06 1986-06-17 International Business Machines Corporation Alignment system for lithographic proximity printing
JPH0616478B2 (ja) 1983-12-19 1994-03-02 株式会社ニコン 投影露光装置の位置合せ装置
US4769523A (en) 1985-03-08 1988-09-06 Nippon Kogaku K.K. Laser processing apparatus
US4662754A (en) * 1985-12-20 1987-05-05 The Perkin-Elmer Corporation Method for facilitating the alignment of a photomask with individual fields on the surfaces of a number of wafers
JP2676933B2 (ja) * 1988-09-05 1997-11-17 キヤノン株式会社 位置検出装置
US5656229A (en) 1990-02-20 1997-08-12 Nikon Corporation Method for removing a thin film layer
JPH0444307A (ja) * 1990-06-12 1992-02-14 Nec Corp 半導体装置の製造方法
US5272501A (en) 1991-08-28 1993-12-21 Nikon Corporation Projection exposure apparatus
US5699260A (en) * 1995-03-14 1997-12-16 Analog Devices, Incorporated Technique for optimizing the number of IC chips obtainable from a wafer
US6159644A (en) * 1996-03-06 2000-12-12 Hitachi, Ltd. Method of fabricating semiconductor circuit devices utilizing multiple exposures
US6269322B1 (en) * 1999-03-11 2001-07-31 Advanced Micro Devices, Inc. System and method for wafer alignment which mitigates effects of reticle rotation and magnification on overlay
US6639676B1 (en) * 1999-10-21 2003-10-28 Koninklijke Philips Electronics N.V. Method for determining rotational error portion of total misalignment error in a stepper

Also Published As

Publication number Publication date
EP1330681A1 (de) 2003-07-30
TW508641B (en) 2002-11-01
WO2002035288A1 (en) 2002-05-02
EP1330681B1 (de) 2013-09-18

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