AU2001292902A1 - Imager with adjustable resolution - Google Patents

Imager with adjustable resolution

Info

Publication number
AU2001292902A1
AU2001292902A1 AU2001292902A AU9290201A AU2001292902A1 AU 2001292902 A1 AU2001292902 A1 AU 2001292902A1 AU 2001292902 A AU2001292902 A AU 2001292902A AU 9290201 A AU9290201 A AU 9290201A AU 2001292902 A1 AU2001292902 A1 AU 2001292902A1
Authority
AU
Australia
Prior art keywords
imager
adjustable resolution
resolution
adjustable
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
AU2001292902A
Other languages
English (en)
Inventor
Markus Loose
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Teledyne Scientific and Imaging LLC
Original Assignee
Innovative Technology Licensing LLC
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Innovative Technology Licensing LLC filed Critical Innovative Technology Licensing LLC
Publication of AU2001292902A1 publication Critical patent/AU2001292902A1/en
Abandoned legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/14Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
    • H01L27/144Devices controlled by radiation
    • H01L27/146Imager structures
    • H01L27/14601Structural or functional details thereof
    • H01L27/14609Pixel-elements with integrated switching, control, storage or amplification elements
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/14Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
    • H01L27/144Devices controlled by radiation
    • H01L27/146Imager structures
    • H01L27/14643Photodiode arrays; MOS imagers
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/40Extracting pixel data from image sensors by controlling scanning circuits, e.g. by modifying the number of pixels sampled or to be sampled
    • H04N25/42Extracting pixel data from image sensors by controlling scanning circuits, e.g. by modifying the number of pixels sampled or to be sampled by switching between different modes of operation using different resolutions or aspect ratios, e.g. switching between interlaced and non-interlaced mode
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/40Extracting pixel data from image sensors by controlling scanning circuits, e.g. by modifying the number of pixels sampled or to be sampled
    • H04N25/46Extracting pixel data from image sensors by controlling scanning circuits, e.g. by modifying the number of pixels sampled or to be sampled by combining or binning pixels

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Power Engineering (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Electromagnetism (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
  • Solid State Image Pick-Up Elements (AREA)
AU2001292902A 2000-09-27 2001-09-20 Imager with adjustable resolution Abandoned AU2001292902A1 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US09671409 2000-09-27
US09/671,409 US6759641B1 (en) 2000-09-27 2000-09-27 Imager with adjustable resolution
PCT/US2001/029543 WO2002028095A2 (en) 2000-09-27 2001-09-20 Imager with adjustable resolution

Publications (1)

Publication Number Publication Date
AU2001292902A1 true AU2001292902A1 (en) 2002-04-08

Family

ID=24694404

Family Applications (1)

Application Number Title Priority Date Filing Date
AU2001292902A Abandoned AU2001292902A1 (en) 2000-09-27 2001-09-20 Imager with adjustable resolution

Country Status (6)

Country Link
US (1) US6759641B1 (zh)
EP (1) EP1320993B1 (zh)
JP (1) JP4112974B2 (zh)
AU (1) AU2001292902A1 (zh)
TW (1) TW535415B (zh)
WO (1) WO2002028095A2 (zh)

Families Citing this family (32)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6781627B1 (en) * 1999-06-24 2004-08-24 Olympus Optical Co., Ltd. Solid state imaging device and electric charge detecting apparatus used for the same
JP3658278B2 (ja) * 2000-05-16 2005-06-08 キヤノン株式会社 固体撮像装置およびそれを用いた固体撮像システム
DE10147808A1 (de) * 2001-09-27 2003-04-10 Conti Temic Microelectronic Bildaufnehmer, insbesondere zur dreidimensionalen Erfassung von Objekten oder Szenen
JP4047028B2 (ja) * 2002-02-21 2008-02-13 セイコーインスツル株式会社 イメージセンサー
US20040113151A1 (en) * 2002-10-11 2004-06-17 Kabushiki Kaisha Toshiba CMOS image sensor
US6878918B2 (en) * 2003-01-09 2005-04-12 Dialdg Semiconductor Gmbh APS pixel with reset noise suppression and programmable binning capability
JP4279562B2 (ja) * 2003-01-17 2009-06-17 富士フイルム株式会社 固体撮像装置の制御方法
JP4071157B2 (ja) * 2003-05-27 2008-04-02 セイコーインスツル株式会社 イメージセンサー
US7105793B2 (en) * 2003-07-02 2006-09-12 Micron Technology, Inc. CMOS pixels for ALC and CDS and methods of forming the same
US7542085B2 (en) * 2003-11-26 2009-06-02 Aptina Imaging Corporation Image sensor with a capacitive storage node linked to transfer gate
US7332703B2 (en) * 2004-03-22 2008-02-19 Micron Technology, Inc. Imaging structure including a pixel with multiple signal readout circuits and methods of operation for imaging structure
US20060033826A1 (en) * 2004-08-12 2006-02-16 Xinqiao Liu Imaging array having variable pixel size
JP4971586B2 (ja) 2004-09-01 2012-07-11 キヤノン株式会社 固体撮像装置
US7459667B1 (en) * 2004-09-07 2008-12-02 Sensata Technologies, Inc. Active pixel image sensor with common gate amplifier mode
KR100680469B1 (ko) 2005-01-31 2007-02-08 매그나칩 반도체 유한회사 인접한 화소들 사이의 센싱노드들이 공유된 씨모스 이미지센서
US7705900B2 (en) * 2005-06-01 2010-04-27 Eastman Kodak Company CMOS image sensor pixel with selectable binning and conversion gain
DE102005049228B4 (de) * 2005-10-14 2014-03-27 Siemens Aktiengesellschaft Detektor mit einem Array von Photodioden
JP4808557B2 (ja) 2006-07-04 2011-11-02 浜松ホトニクス株式会社 固体撮像装置
US7635836B2 (en) * 2007-02-21 2009-12-22 Intersil Americas Inc. Configurable photo detector circuit
US7495228B1 (en) 2008-03-31 2009-02-24 General Electric Company Dual function detector device
EP2154879A1 (en) * 2008-08-13 2010-02-17 Thomson Licensing CMOS image sensor with selectable hard-wired binning
US8217358B2 (en) * 2009-12-14 2012-07-10 General Electric Company System and method of eliminating image artifacts
US8357889B2 (en) * 2010-01-21 2013-01-22 Intersil Americas Inc. Circuits, systems and methods for vertical and horizontal light beam alignment
FR2959320B1 (fr) * 2010-04-26 2013-01-04 Trixell Detecteur de rayonnement electromagnetique a selection de gamme de gain
FR2979485B1 (fr) 2011-08-26 2016-09-09 E2V Semiconductors Capteur d'image a regroupement de pixels
JP5755111B2 (ja) * 2011-11-14 2015-07-29 キヤノン株式会社 撮像装置の駆動方法
US8809913B2 (en) * 2012-11-07 2014-08-19 Semiconductor Components Industries, Llc Pixel architecture and method
US8928776B2 (en) * 2012-11-21 2015-01-06 International Business Machines Corporation Camera resolution modification based on intended printing location
JP6176062B2 (ja) * 2013-11-06 2017-08-09 ソニー株式会社 固体撮像装置およびその駆動方法、並びに電子機器
JP6785429B2 (ja) * 2015-12-03 2020-11-18 パナソニックIpマネジメント株式会社 撮像装置
WO2019195244A1 (en) * 2018-04-02 2019-10-10 Rensselaer Polytechnic Institute Cross-connect switch architecture
CN112082661B (zh) * 2020-07-27 2021-09-14 上海集成电路研发中心有限公司 一种基于像元合并的红外探测器结构及其合并方法

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2636800A1 (fr) * 1988-09-16 1990-03-23 Thomson Csf Procede de lecture de cellules photosensibles du type comportant deux diodes montees en serie avec des sens de conduction opposes
US5262871A (en) * 1989-11-13 1993-11-16 Rutgers, The State University Multiple resolution image sensor
GB2289983B (en) * 1994-06-01 1996-10-16 Simage Oy Imaging devices,systems and methods
US5574275A (en) * 1995-03-23 1996-11-12 Northrop Grumman Corporation Adjustable resolution optical sensor
JP3031606B2 (ja) 1995-08-02 2000-04-10 キヤノン株式会社 固体撮像装置と画像撮像装置
JP3838665B2 (ja) * 1995-08-11 2006-10-25 株式会社 東芝 Mos型固体撮像装置
US6249618B1 (en) * 1998-12-18 2001-06-19 Syscan, Inc. Circuit architecture and method for switching sensor resolution
JP2000324406A (ja) * 1999-05-07 2000-11-24 Canon Inc 光電変換装置及びそれを用いた画像読み取りシステム

Also Published As

Publication number Publication date
JP2004511137A (ja) 2004-04-08
WO2002028095A3 (en) 2002-06-06
JP4112974B2 (ja) 2008-07-02
EP1320993B1 (en) 2009-03-11
EP1320993A2 (en) 2003-06-25
TW535415B (en) 2003-06-01
US6759641B1 (en) 2004-07-06
WO2002028095A2 (en) 2002-04-04

Similar Documents

Publication Publication Date Title
AU2001292902A1 (en) Imager with adjustable resolution
AU2001243710A1 (en) Imaging stretcher
AU2001227849A1 (en) Ultrasonic imager
AU3604401A (en) Photoelectric device
AU2002253784A1 (en) Hyperspectral imaging calibration device
AU4082801A (en) Imaging apparatus
AU2001270701A1 (en) High spatial resolution infrared ellipsometer
AU2001287168A1 (en) Fingerprint imaging device
AU2002219202A1 (en) Image sensor device comprising central locking
AU2001252162A1 (en) One-dimensional calibration standard
AU7220801A (en) Adjustable tripod assembly
AUPQ724700A0 (en) Printing using secure pickup
AU2002221381A1 (en) Imaging device
AU2001242020A1 (en) Imaging system
AU2001278597A1 (en) Sensor device
AU2001289647A1 (en) Adjustable pedal
AU2000268695A1 (en) Imaging apparatus
EP1180737A3 (de) Verstell-Vorrichtung
AU2001261647A1 (en) Fingerprint imaging device
AU2489700A (en) Variable resolution imaging system
AU2001275802A1 (en) Radiation sensor
AU1791501A (en) Imaging sexual response
TW490106U (en) Scanning device with dual resolution
AU2001267838A1 (en) Image forming device
AU2001293823A1 (en) Sensor device