AU2001272494A1 - Method and circuit for measuring a voltage or a temperature and for generating avoltage with any predeterminable temperature dependence - Google Patents

Method and circuit for measuring a voltage or a temperature and for generating avoltage with any predeterminable temperature dependence

Info

Publication number
AU2001272494A1
AU2001272494A1 AU2001272494A AU7249401A AU2001272494A1 AU 2001272494 A1 AU2001272494 A1 AU 2001272494A1 AU 2001272494 A AU2001272494 A AU 2001272494A AU 7249401 A AU7249401 A AU 7249401A AU 2001272494 A1 AU2001272494 A1 AU 2001272494A1
Authority
AU
Australia
Prior art keywords
voltage
transition
circuit
temperature
measuring
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
AU2001272494A
Inventor
Gunther Bergk
Torsten Klemm
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Braun GmbH
Original Assignee
Braun GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Braun GmbH filed Critical Braun GmbH
Publication of AU2001272494A1 publication Critical patent/AU2001272494A1/en
Abandoned legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/0084—Arrangements for measuring currents or voltages or for indicating presence or sign thereof measuring voltage only
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
    • G01K7/00—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements
    • G01K7/01—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using semiconducting elements having PN junctions

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Current Or Voltage (AREA)
  • Measuring Temperature Or Quantity Of Heat (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Secondary Cells (AREA)
  • Read Only Memory (AREA)
  • General Induction Heating (AREA)

Abstract

The invention relates to a method and a circuit for measuring a voltage and a temperature and for generating a voltage with adjustable temperature dependence. The method according to the invention comprises the following steps: determining a first measured value (M1) for a first forward voltage (U(I1,T)) of a pn-transition, through which a first current (I1) flows, of a semiconductor component; determining a second measured value (M2) for a second forward voltage (U(I2,T)) of the same pn-transition, but through which a second current (I2) flows; calculating a value, which is proportional to the voltage (U0, U(I1,T), U(I2,T)) to be measured, from the determined measured values (M1, M2) from at least one parameter (n) which characterises the pn-transition, and optionally from the desired temperature dependence. The circuit according to the invention comprises an A/D converter (W), a semiconductor component (D) with a pn-transition, and a voltage source for supplying a first and a second current (I1; I2) via the pn-transition, wherein the pn-transition is situated parallel to the input of the A/D converter (W). The output of the A/D converter is connected to an arithmetic circuit.
AU2001272494A 2000-06-21 2001-06-20 Method and circuit for measuring a voltage or a temperature and for generating avoltage with any predeterminable temperature dependence Abandoned AU2001272494A1 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
DE10029446A DE10029446A1 (en) 2000-06-21 2000-06-21 Method and circuit arrangement for measuring a voltage and / or a temperature
DE10029446 2000-06-21
PCT/EP2001/006972 WO2001098790A1 (en) 2000-06-21 2001-06-20 Method and circuit for measuring a voltage or a temperature and for generating a voltage with any predeterminable temperature dependence

Publications (1)

Publication Number Publication Date
AU2001272494A1 true AU2001272494A1 (en) 2002-01-02

Family

ID=7645796

Family Applications (1)

Application Number Title Priority Date Filing Date
AU2001272494A Abandoned AU2001272494A1 (en) 2000-06-21 2001-06-20 Method and circuit for measuring a voltage or a temperature and for generating avoltage with any predeterminable temperature dependence

Country Status (10)

Country Link
US (1) US20040041573A1 (en)
EP (1) EP1292835B1 (en)
JP (1) JP2004501376A (en)
KR (1) KR20030017531A (en)
CN (1) CN1249441C (en)
AT (1) ATE373242T1 (en)
AU (1) AU2001272494A1 (en)
DE (2) DE10029446A1 (en)
HK (1) HK1053355A1 (en)
WO (1) WO2001098790A1 (en)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE10351843B4 (en) * 2003-11-06 2013-11-21 Converteam Gmbh Method and electrical circuits for determining a temperature of a power semiconductor
CN100445712C (en) * 2005-10-24 2008-12-24 圆创科技股份有限公司 Temp. measuring circuit of corrected by translation conversion reference level
DE102008055696A1 (en) 2008-01-25 2009-07-30 Continental Teves Ag & Co. Ohg Electronic circuit device for detecting a detection element current and / or a temperature in this detection element
EP2336741B1 (en) * 2009-12-18 2016-09-07 Nxp B.V. Self-calibration circuit and method for junction temperature estimation
JP5687134B2 (en) * 2011-05-26 2015-03-18 三菱電機株式会社 Energy measurement unit
JP5786571B2 (en) * 2011-09-07 2015-09-30 富士電機株式会社 Power semiconductor device temperature measurement device
JP5744712B2 (en) * 2011-12-15 2015-07-08 サムソン エレクトロ−メカニックス カンパニーリミテッド． Power detection circuit
US10132696B2 (en) * 2014-07-11 2018-11-20 Infineon Technologies Ag Integrated temperature sensor for discrete semiconductor devices
DE102019217376A1 (en) * 2019-11-11 2021-05-12 Continental Automotive Gmbh Procedure for testing a battery sensor and battery sensor
TWI796190B (en) * 2022-03-30 2023-03-11 力晶積成電子製造股份有限公司 Voltage control circuit for adjusting reference voltage signal of memory device

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DD80952A (en) *
US3212001A (en) * 1961-08-30 1965-10-12 Western Electric Co Electrical circuit for testing the current-voltage relationship of electrical devices
US3812717A (en) * 1972-04-03 1974-05-28 Bell Telephone Labor Inc Semiconductor diode thermometry
DE2414340C3 (en) * 1974-03-25 1980-12-18 Evgenia Iosifovna Chimki Model Geb. Lifschits Method and device for quality testing for semiconductor components and integrated circuits with at least one isolated accessible PN junction
US4228684A (en) * 1979-06-04 1980-10-21 General Motors Corporation Remote temperature measuring system with semiconductor junction sensor
US4636092A (en) * 1984-06-19 1987-01-13 Hegyi Dennis J Diode thermometer
JPH05283749A (en) * 1992-03-31 1993-10-29 Clarion Co Ltd Temperature detecting device
DE4434266B4 (en) * 1994-09-24 2005-05-25 Byk Gardner Gmbh Method for taking into account the temperature dependence of optoelectronic diodes
US6008685A (en) * 1998-03-25 1999-12-28 Mosaic Design Labs, Inc. Solid state temperature measurement

Also Published As

Publication number Publication date
DE50113009D1 (en) 2007-10-25
WO2001098790A1 (en) 2001-12-27
JP2004501376A (en) 2004-01-15
US20040041573A1 (en) 2004-03-04
CN1249441C (en) 2006-04-05
HK1053355A1 (en) 2003-10-17
ATE373242T1 (en) 2007-09-15
EP1292835B1 (en) 2007-09-12
KR20030017531A (en) 2003-03-03
DE10029446A1 (en) 2002-01-03
EP1292835A1 (en) 2003-03-19
CN1426537A (en) 2003-06-25

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