AU1092099A - Precursors for making low dielectric constant materials with improved thermal stability - Google Patents
Precursors for making low dielectric constant materials with improved thermal stabilityInfo
- Publication number
- AU1092099A AU1092099A AU10920/99A AU1092099A AU1092099A AU 1092099 A AU1092099 A AU 1092099A AU 10920/99 A AU10920/99 A AU 10920/99A AU 1092099 A AU1092099 A AU 1092099A AU 1092099 A AU1092099 A AU 1092099A
- Authority
- AU
- Australia
- Prior art keywords
- precursors
- dielectric constant
- thermal stability
- low dielectric
- improved thermal
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Abandoned
Links
Classifications
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B05—SPRAYING OR ATOMISING IN GENERAL; APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05D—PROCESSES FOR APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05D1/00—Processes for applying liquids or other fluent materials
- B05D1/62—Plasma-deposition of organic layers
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08G—MACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
- C08G77/00—Macromolecular compounds obtained by reactions forming a linkage containing silicon with or without sulfur, nitrogen, oxygen or carbon in the main chain of the macromolecule
- C08G77/04—Polysiloxanes
- C08G77/22—Polysiloxanes containing silicon bound to organic groups containing atoms other than carbon, hydrogen and oxygen
- C08G77/24—Polysiloxanes containing silicon bound to organic groups containing atoms other than carbon, hydrogen and oxygen halogen-containing groups
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08J—WORKING-UP; GENERAL PROCESSES OF COMPOUNDING; AFTER-TREATMENT NOT COVERED BY SUBCLASSES C08B, C08C, C08F, C08G or C08H
- C08J5/00—Manufacture of articles or shaped materials containing macromolecular substances
- C08J5/18—Manufacture of films or sheets
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08L—COMPOSITIONS OF MACROMOLECULAR COMPOUNDS
- C08L83/00—Compositions of macromolecular compounds obtained by reactions forming in the main chain of the macromolecule a linkage containing silicon with or without sulfur, nitrogen, oxygen or carbon only; Compositions of derivatives of such polymers
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- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09D—COATING COMPOSITIONS, e.g. PAINTS, VARNISHES OR LACQUERS; FILLING PASTES; CHEMICAL PAINT OR INK REMOVERS; INKS; CORRECTING FLUIDS; WOODSTAINS; PASTES OR SOLIDS FOR COLOURING OR PRINTING; USE OF MATERIALS THEREFOR
- C09D4/00—Coating compositions, e.g. paints, varnishes or lacquers, based on organic non-macromolecular compounds having at least one polymerisable carbon-to-carbon unsaturated bond ; Coating compositions, based on monomers of macromolecular compounds of groups C09D183/00 - C09D183/16
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/22—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of inorganic material, other than metallic material
- C23C16/30—Deposition of compounds, mixtures or solid solutions, e.g. borides, carbides, nitrides
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/22—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of inorganic material, other than metallic material
- C23C16/30—Deposition of compounds, mixtures or solid solutions, e.g. borides, carbides, nitrides
- C23C16/40—Oxides
- C23C16/401—Oxides containing silicon
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P14/00—Formation of materials, e.g. in the shape of layers or pillars
- H10P14/60—Formation of materials, e.g. in the shape of layers or pillars of insulating materials
- H10P14/63—Formation of materials, e.g. in the shape of layers or pillars of insulating materials characterised by the formation processes
- H10P14/6326—Deposition processes
- H10P14/6328—Deposition from the gas or vapour phase
- H10P14/6334—Deposition from the gas or vapour phase using decomposition or reaction of gaseous or vapour phase compounds, i.e. chemical vapour deposition
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P14/00—Formation of materials, e.g. in the shape of layers or pillars
- H10P14/60—Formation of materials, e.g. in the shape of layers or pillars of insulating materials
- H10P14/63—Formation of materials, e.g. in the shape of layers or pillars of insulating materials characterised by the formation processes
- H10P14/6326—Deposition processes
- H10P14/6328—Deposition from the gas or vapour phase
- H10P14/6334—Deposition from the gas or vapour phase using decomposition or reaction of gaseous or vapour phase compounds, i.e. chemical vapour deposition
- H10P14/6338—Deposition from the gas or vapour phase using decomposition or reaction of gaseous or vapour phase compounds, i.e. chemical vapour deposition the reactions being activated by other means than plasma or thermal, e.g. photo-CVD
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P14/00—Formation of materials, e.g. in the shape of layers or pillars
- H10P14/60—Formation of materials, e.g. in the shape of layers or pillars of insulating materials
- H10P14/66—Formation of materials, e.g. in the shape of layers or pillars of insulating materials characterised by the type of materials
- H10P14/668—Formation of materials, e.g. in the shape of layers or pillars of insulating materials characterised by the type of materials the materials being characterised by the deposition precursor materials
- H10P14/6681—Formation of materials, e.g. in the shape of layers or pillars of insulating materials characterised by the type of materials the materials being characterised by the deposition precursor materials the precursor containing a compound comprising Si
- H10P14/6682—Formation of materials, e.g. in the shape of layers or pillars of insulating materials characterised by the type of materials the materials being characterised by the deposition precursor materials the precursor containing a compound comprising Si the compound being a silane, e.g. disilane, methylsilane or chlorosilane
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P14/00—Formation of materials, e.g. in the shape of layers or pillars
- H10P14/60—Formation of materials, e.g. in the shape of layers or pillars of insulating materials
- H10P14/66—Formation of materials, e.g. in the shape of layers or pillars of insulating materials characterised by the type of materials
- H10P14/668—Formation of materials, e.g. in the shape of layers or pillars of insulating materials characterised by the type of materials the materials being characterised by the deposition precursor materials
- H10P14/6681—Formation of materials, e.g. in the shape of layers or pillars of insulating materials characterised by the type of materials the materials being characterised by the deposition precursor materials the precursor containing a compound comprising Si
- H10P14/6684—Formation of materials, e.g. in the shape of layers or pillars of insulating materials characterised by the type of materials the materials being characterised by the deposition precursor materials the precursor containing a compound comprising Si the compound comprising silicon and oxygen
- H10P14/6686—Formation of materials, e.g. in the shape of layers or pillars of insulating materials characterised by the type of materials the materials being characterised by the deposition precursor materials the precursor containing a compound comprising Si the compound comprising silicon and oxygen the compound being a molecule comprising at least one silicon-oxygen bond and the compound having hydrogen or an organic group attached to the silicon or oxygen, e.g. a siloxane
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P14/00—Formation of materials, e.g. in the shape of layers or pillars
- H10P14/60—Formation of materials, e.g. in the shape of layers or pillars of insulating materials
- H10P14/69—Inorganic materials
- H10P14/692—Inorganic materials composed of oxides, glassy oxides or oxide-based glasses
- H10P14/6921—Inorganic materials composed of oxides, glassy oxides or oxide-based glasses containing silicon
- H10P14/6922—Inorganic materials composed of oxides, glassy oxides or oxide-based glasses containing silicon the material containing Si, O and at least one of H, N, C, F or other non-metal elements, e.g. SiOC, SiOC:H or SiONC
- H10P14/6924—Inorganic materials composed of oxides, glassy oxides or oxide-based glasses containing silicon the material containing Si, O and at least one of H, N, C, F or other non-metal elements, e.g. SiOC, SiOC:H or SiONC the material being halogen doped silicon oxides, e.g. FSG
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P14/00—Formation of materials, e.g. in the shape of layers or pillars
- H10P14/60—Formation of materials, e.g. in the shape of layers or pillars of insulating materials
- H10P14/63—Formation of materials, e.g. in the shape of layers or pillars of insulating materials characterised by the formation processes
- H10P14/6326—Deposition processes
- H10P14/6328—Deposition from the gas or vapour phase
- H10P14/6334—Deposition from the gas or vapour phase using decomposition or reaction of gaseous or vapour phase compounds, i.e. chemical vapour deposition
- H10P14/6336—Deposition from the gas or vapour phase using decomposition or reaction of gaseous or vapour phase compounds, i.e. chemical vapour deposition in the presence of a plasma [PECVD]
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P14/00—Formation of materials, e.g. in the shape of layers or pillars
- H10P14/60—Formation of materials, e.g. in the shape of layers or pillars of insulating materials
- H10P14/68—Organic materials, e.g. photoresists
- H10P14/683—Organic materials, e.g. photoresists carbon-based polymeric organic materials, e.g. polyimides, poly cyclobutene or PVC
- H10P14/687—Organic materials, e.g. photoresists carbon-based polymeric organic materials, e.g. polyimides, poly cyclobutene or PVC the materials being fluorocarbon compounds, e.g. (CHxFy) n or polytetrafluoroethylene
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P14/00—Formation of materials, e.g. in the shape of layers or pillars
- H10P14/60—Formation of materials, e.g. in the shape of layers or pillars of insulating materials
- H10P14/69—Inorganic materials
- H10P14/692—Inorganic materials composed of oxides, glassy oxides or oxide-based glasses
- H10P14/6921—Inorganic materials composed of oxides, glassy oxides or oxide-based glasses containing silicon
- H10P14/6922—Inorganic materials composed of oxides, glassy oxides or oxide-based glasses containing silicon the material containing Si, O and at least one of H, N, C, F or other non-metal elements, e.g. SiOC, SiOC:H or SiONC
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T428/00—Stock material or miscellaneous articles
- Y10T428/26—Web or sheet containing structurally defined element or component, the element or component having a specified physical dimension
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Organic Chemistry (AREA)
- Materials Engineering (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Polymers & Plastics (AREA)
- Inorganic Chemistry (AREA)
- Health & Medical Sciences (AREA)
- Metallurgy (AREA)
- Medicinal Chemistry (AREA)
- Manufacturing & Machinery (AREA)
- Mechanical Engineering (AREA)
- General Chemical & Material Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Wood Science & Technology (AREA)
- Plasma & Fusion (AREA)
- Physics & Mathematics (AREA)
- Formation Of Insulating Films (AREA)
- Chemical Vapour Deposition (AREA)
- Silicon Polymers (AREA)
- Coating By Spraying Or Casting (AREA)
- Organic Low-Molecular-Weight Compounds And Preparation Thereof (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US08/957,481 US6020458A (en) | 1997-10-24 | 1997-10-24 | Precursors for making low dielectric constant materials with improved thermal stability |
| US08957481 | 1997-10-24 | ||
| PCT/US1998/021840 WO1999021924A1 (en) | 1997-10-24 | 1998-10-15 | Precursors for making low dielectric constant materials with improved thermal stability |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| AU1092099A true AU1092099A (en) | 1999-05-17 |
Family
ID=25499624
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| AU10920/99A Abandoned AU1092099A (en) | 1997-10-24 | 1998-10-15 | Precursors for making low dielectric constant materials with improved thermal stability |
Country Status (5)
| Country | Link |
|---|---|
| US (3) | US6020458A (https=) |
| JP (1) | JP2001521045A (https=) |
| KR (1) | KR100602222B1 (https=) |
| AU (1) | AU1092099A (https=) |
| WO (1) | WO1999021924A1 (https=) |
Families Citing this family (81)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP3469761B2 (ja) * | 1997-10-30 | 2003-11-25 | 東京エレクトロン株式会社 | 半導体デバイスの製造方法 |
| TW430882B (en) * | 1997-11-20 | 2001-04-21 | Tokyo Electron Ltd | Plasma film forming method |
| TWI246633B (en) * | 1997-12-12 | 2006-01-01 | Applied Materials Inc | Method of pattern etching a low k dielectric layen |
| US6660656B2 (en) * | 1998-02-11 | 2003-12-09 | Applied Materials Inc. | Plasma processes for depositing low dielectric constant films |
| US6593247B1 (en) * | 1998-02-11 | 2003-07-15 | Applied Materials, Inc. | Method of depositing low k films using an oxidizing plasma |
| US20010031229A1 (en) * | 1998-10-20 | 2001-10-18 | Spjut Reed E. | UV-enhanced, in-line, infrared phosphorous diffusion furnace |
| US6936310B1 (en) * | 1999-04-02 | 2005-08-30 | Sharp Kabushiki Kaisha | Plasma processing method |
| US6423384B1 (en) * | 1999-06-25 | 2002-07-23 | Applied Materials, Inc. | HDP-CVD deposition of low dielectric constant amorphous carbon film |
| US6475930B1 (en) * | 2000-01-31 | 2002-11-05 | Motorola, Inc. | UV cure process and tool for low k film formation |
| EP1123991A3 (en) * | 2000-02-08 | 2002-11-13 | Asm Japan K.K. | Low dielectric constant materials and processes |
| US6573030B1 (en) | 2000-02-17 | 2003-06-03 | Applied Materials, Inc. | Method for depositing an amorphous carbon layer |
| JP2001267310A (ja) * | 2000-03-17 | 2001-09-28 | Tokyo Electron Ltd | プラズマ成膜方法及びその装置 |
| US6596343B1 (en) * | 2000-04-21 | 2003-07-22 | Applied Materials, Inc. | Method and apparatus for processing semiconductor substrates with hydroxyl radicals |
| JP2002009152A (ja) * | 2000-06-21 | 2002-01-11 | Nec Corp | 半導体装置及びその製造方法 |
| US6559052B2 (en) | 2000-07-07 | 2003-05-06 | Applied Materials, Inc. | Deposition of amorphous silicon films by high density plasma HDP-CVD at low temperatures |
| JP2002075980A (ja) * | 2000-08-30 | 2002-03-15 | Miyazaki Oki Electric Co Ltd | 真空紫外光cvdによる低誘電体膜の製造方法 |
| KR100797385B1 (ko) * | 2000-10-19 | 2008-01-24 | 로베르트 보쉬 게엠베하 | 유도 결합 플라즈마를 이용한 기판의 에칭 장치 및 방법 |
| US6436822B1 (en) * | 2000-11-20 | 2002-08-20 | Intel Corporation | Method for making a carbon doped oxide dielectric material |
| US6583048B2 (en) | 2001-01-17 | 2003-06-24 | Air Products And Chemicals, Inc. | Organosilicon precursors for interlayer dielectric films with low dielectric constants |
| US6572925B2 (en) * | 2001-02-23 | 2003-06-03 | Lsi Logic Corporation | Process for forming a low dielectric constant fluorine and carbon containing silicon oxide dielectric material |
| US6649219B2 (en) | 2001-02-23 | 2003-11-18 | Lsi Logic Corporation | Process for forming a low dielectric constant fluorine and carbon-containing silicon oxide dielectric material characterized by improved resistance to oxidation |
| US6858195B2 (en) * | 2001-02-23 | 2005-02-22 | Lsi Logic Corporation | Process for forming a low dielectric constant fluorine and carbon-containing silicon oxide dielectric material |
| US20040055539A1 (en) * | 2002-09-13 | 2004-03-25 | Dielectric Systems, Inc. | Reactive-reactor for generation of gaseous intermediates |
| US6825303B2 (en) * | 2001-02-26 | 2004-11-30 | Dielectric Systems, Inc. | Integration of low ε thin films and Ta into Cu dual damascene |
| US7026052B2 (en) | 2001-02-26 | 2006-04-11 | Dielectric Systems, Inc. | Porous low k(<2.0) thin film derived from homo-transport-polymerization |
| US6797343B2 (en) | 2001-12-20 | 2004-09-28 | Dielectric Systems, Inc. | Dielectric thin films from fluorinated precursors |
| US7192645B2 (en) | 2001-02-26 | 2007-03-20 | Dielectric Systems, Inc. | Porous low E (<2.0) thin films by transport co-polymerization |
| US6881447B2 (en) | 2002-04-04 | 2005-04-19 | Dielectric Systems, Inc. | Chemically and electrically stabilized polymer films |
| US20030196680A1 (en) * | 2002-04-19 | 2003-10-23 | Dielectric Systems, Inc | Process modules for transport polymerization of low epsilon thin films |
| US20040255862A1 (en) * | 2001-02-26 | 2004-12-23 | Lee Chung J. | Reactor for producing reactive intermediates for low dielectric constant polymer thin films |
| US6777171B2 (en) | 2001-04-20 | 2004-08-17 | Applied Materials, Inc. | Fluorine-containing layers for damascene structures |
| US6740601B2 (en) | 2001-05-11 | 2004-05-25 | Applied Materials Inc. | HDP-CVD deposition process for filling high aspect ratio gaps |
| EP1390421A1 (en) * | 2001-05-23 | 2004-02-25 | NKT Research & Innovation A/S | Method of plasma polymerisation of substituted benzenes, polymeric material obtainable by the method, and use thereof |
| US6605549B2 (en) | 2001-09-29 | 2003-08-12 | Intel Corporation | Method for improving nucleation and adhesion of CVD and ALD films deposited onto low-dielectric-constant dielectrics |
| EP1448807A4 (en) * | 2001-10-30 | 2005-07-13 | Massachusetts Inst Technology | FLUORO CARBON ORGANOSILICIUM COPOLYMERS AND COATINGS MADE ACCORDING TO THE HFCVD PROCEDURE |
| AU2003201488A1 (en) | 2002-01-08 | 2003-07-24 | Silecs, Inc. | Materials and methods for forming hybrid organic-inorganic dielectric materials for integrated circuit applications |
| TWI236505B (en) * | 2002-01-14 | 2005-07-21 | Nat Science Council | Thermal cracking chemical vapor deposition process for nanocarbonaceous material |
| US6541397B1 (en) * | 2002-03-29 | 2003-04-01 | Applied Materials, Inc. | Removable amorphous carbon CMP stop |
| EP1354640A1 (de) * | 2002-04-19 | 2003-10-22 | Dürr Systems GmbH | Verfahren und Vorrichtung zum Härten einer Beschichtung |
| US20080011332A1 (en) * | 2002-04-26 | 2008-01-17 | Accretech Usa, Inc. | Method and apparatus for cleaning a wafer substrate |
| US20080190558A1 (en) * | 2002-04-26 | 2008-08-14 | Accretech Usa, Inc. | Wafer processing apparatus and method |
| US20080017316A1 (en) * | 2002-04-26 | 2008-01-24 | Accretech Usa, Inc. | Clean ignition system for wafer substrate processing |
| DE10237787A1 (de) * | 2002-08-17 | 2004-03-04 | Robert Bosch Gmbh | Schichtsystem mit einer Siliziumschicht und einer Passivierschicht, Verfahren zur Erzeugung einer Passivierschicht auf einer Siliziumschicht und deren Verwendung |
| US7404990B2 (en) | 2002-11-14 | 2008-07-29 | Air Products And Chemicals, Inc. | Non-thermal process for forming porous low dielectric constant films |
| TWI240959B (en) | 2003-03-04 | 2005-10-01 | Air Prod & Chem | Mechanical enhancement of dense and porous organosilicate materials by UV exposure |
| US8865271B2 (en) * | 2003-06-06 | 2014-10-21 | Neophotonics Corporation | High rate deposition for the formation of high quality optical coatings |
| EP1670049A4 (en) * | 2003-09-17 | 2008-06-04 | Tokyo Electron Ltd | PREPARATION OF A LOW DIELECTRICITY CONSTANT INSULATION FILM |
| US7138180B2 (en) * | 2003-10-16 | 2006-11-21 | Wisconsin Alumni Research Foundation | Hard carbon films formed from plasma treated polymer surfaces |
| US7094661B2 (en) | 2004-03-31 | 2006-08-22 | Dielectric Systems, Inc. | Single and dual damascene techniques utilizing composite polymer dielectric film |
| US6962871B2 (en) | 2004-03-31 | 2005-11-08 | Dielectric Systems, Inc. | Composite polymer dielectric film |
| US7309395B2 (en) | 2004-03-31 | 2007-12-18 | Dielectric Systems, Inc. | System for forming composite polymer dielectric film |
| US20050245693A1 (en) * | 2004-05-03 | 2005-11-03 | Bhatt Sanjiv M | Fluorinated aromatic polymers |
| US20060201426A1 (en) * | 2004-05-25 | 2006-09-14 | Lee Chung J | Reactor for Producing Reactive Intermediates for Transport Polymerization |
| DE102005003806B3 (de) * | 2005-01-26 | 2006-07-20 | Thermo Electron (Bremen) Gmbh | Glimmentladungsquelle |
| US20070299176A1 (en) * | 2005-01-28 | 2007-12-27 | Markley Thomas J | Photodefinable low dielectric constant material and method for making and using same |
| US7867779B2 (en) | 2005-02-03 | 2011-01-11 | Air Products And Chemicals, Inc. | System and method comprising same for measurement and/or analysis of particles in gas stream |
| US20060183055A1 (en) * | 2005-02-15 | 2006-08-17 | O'neill Mark L | Method for defining a feature on a substrate |
| US7425350B2 (en) * | 2005-04-29 | 2008-09-16 | Asm Japan K.K. | Apparatus, precursors and deposition methods for silicon-containing materials |
| US7749863B1 (en) * | 2005-05-12 | 2010-07-06 | Hrl Laboratories, Llc | Thermal management substrates |
| US20060274474A1 (en) * | 2005-06-01 | 2006-12-07 | Lee Chung J | Substrate Holder |
| US7549905B2 (en) | 2005-09-30 | 2009-06-23 | International Display Systems, Inc. | Method of encapsulating an organic light emitting device |
| US8945684B2 (en) * | 2005-11-04 | 2015-02-03 | Essilor International (Compagnie Generale D'optique) | Process for coating an article with an anti-fouling surface coating by vacuum evaporation |
| US7621794B2 (en) | 2005-11-09 | 2009-11-24 | International Display Systems, Inc. | Method of encapsulating an organic light-emitting device |
| US20070264842A1 (en) * | 2006-05-12 | 2007-11-15 | Samsung Electronics Co., Ltd. | Insulation film deposition method for a semiconductor device |
| US20070299239A1 (en) * | 2006-06-27 | 2007-12-27 | Air Products And Chemicals, Inc. | Curing Dielectric Films Under A Reducing Atmosphere |
| US20080012074A1 (en) * | 2006-07-14 | 2008-01-17 | Air Products And Chemicals, Inc. | Low Temperature Sol-Gel Silicates As Dielectrics or Planarization Layers For Thin Film Transistors |
| US7514375B1 (en) * | 2006-08-08 | 2009-04-07 | Novellus Systems, Inc. | Pulsed bias having high pulse frequency for filling gaps with dielectric material |
| US20080254233A1 (en) * | 2007-04-10 | 2008-10-16 | Kwangduk Douglas Lee | Plasma-induced charge damage control for plasma enhanced chemical vapor deposition processes |
| US20080264672A1 (en) * | 2007-04-26 | 2008-10-30 | Air Products And Chemicals, Inc. | Photoimprintable Low Dielectric Constant Material and Method for Making and Using Same |
| US8987039B2 (en) | 2007-10-12 | 2015-03-24 | Air Products And Chemicals, Inc. | Antireflective coatings for photovoltaic applications |
| US20090096106A1 (en) * | 2007-10-12 | 2009-04-16 | Air Products And Chemicals, Inc. | Antireflective coatings |
| WO2009146744A1 (de) * | 2008-06-05 | 2009-12-10 | Osram Gesellschaft mit beschränkter Haftung | Verfahren zur behandlung von oberflächen, strahler für dieses verfahren sowie bestrahlungssystem mit diesem strahler |
| US9711373B2 (en) * | 2008-09-22 | 2017-07-18 | Taiwan Semiconductor Manufacturing Company, Ltd. | Method of fabricating a gate dielectric for high-k metal gate devices |
| JP5501807B2 (ja) * | 2009-03-31 | 2014-05-28 | 東京エレクトロン株式会社 | 処理装置 |
| TWI423331B (zh) * | 2009-06-26 | 2014-01-11 | 東京威力科創股份有限公司 | 電漿處理方法 |
| FR2950080B1 (fr) * | 2009-09-17 | 2012-03-02 | Essilor Int | Procede et dispositif de depot chimique en phase gazeuse d'un film polymere sur un substrat |
| US9184028B2 (en) * | 2010-08-04 | 2015-11-10 | Lam Research Corporation | Dual plasma volume processing apparatus for neutral/ion flux control |
| US8869742B2 (en) | 2010-08-04 | 2014-10-28 | Lam Research Corporation | Plasma processing chamber with dual axial gas injection and exhaust |
| CN103105736A (zh) * | 2011-11-11 | 2013-05-15 | 中芯国际集成电路制造(上海)有限公司 | 光刻方法、刻蚀方法 |
| US9093265B2 (en) * | 2013-10-15 | 2015-07-28 | Taiwan Semiconductor Manufacturing Co., Ltd. | High UV curing efficiency for low-k dielectrics |
| CN109354903B (zh) * | 2018-10-24 | 2020-01-17 | 江苏菲沃泰纳米科技有限公司 | 一种高透明低色差纳米涂层及其制备方法 |
Family Cites Families (42)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3274267A (en) | 1963-09-23 | 1966-09-20 | Union Carbide Corp | Cyclic alpha-perfluoro-di-p-xylylenes |
| US3332891A (en) | 1963-09-23 | 1967-07-25 | Union Carbide Corp | Process for the preparation of alpha-per-fluoro-p-xylylene polymers |
| US3440277A (en) * | 1965-12-13 | 1969-04-22 | Us Air Force | Fluoroaromatic compounds |
| US3342754A (en) | 1966-02-18 | 1967-09-19 | Union Carbide Corp | Para-xylylene polymers |
| US4291244A (en) * | 1979-09-04 | 1981-09-22 | Union Carbide Corporation | Electrets |
| US4737379A (en) | 1982-09-24 | 1988-04-12 | Energy Conversion Devices, Inc. | Plasma deposited coatings, and low temperature plasma method of making same |
| DE3240303C1 (de) | 1982-10-30 | 1984-01-19 | Merck Patent Gmbh, 6100 Darmstadt | Verfahren zur Herstellung von [2,2]-Paracyclophan |
| JPS601846A (ja) | 1983-06-18 | 1985-01-08 | Toshiba Corp | 多層配線構造の半導体装置とその製造方法 |
| US5714029A (en) * | 1984-03-12 | 1998-02-03 | Nitto Electric Industrial Co., Ltd. | Process for working a semiconductor wafer |
| JPS60231442A (ja) * | 1984-04-28 | 1985-11-18 | Toyota Central Res & Dev Lab Inc | 撥水処理硝子の製造方法 |
| US4657777A (en) * | 1984-12-17 | 1987-04-14 | Canon Kabushiki Kaisha | Formation of deposited film |
| US4911992A (en) | 1986-12-04 | 1990-03-27 | Dow Corning Corporation | Platinum or rhodium catalyzed multilayer ceramic coatings from hydrogen silsesquioxane resin and metal oxides |
| US5139813A (en) * | 1990-09-28 | 1992-08-18 | Union Carbide Chemicals & Plastics Technology Corporation | Method for inducing fluorescence in parylene films by an active plasma |
| US5230929A (en) * | 1992-07-20 | 1993-07-27 | Dow Corning Corporation | Plasma-activated chemical vapor deposition of fluoridated cyclic siloxanes |
| US5210341A (en) * | 1991-12-20 | 1993-05-11 | Union Carbide Chemicals & Plastics Technology Corporation | Processes for the preparation of octafluoro-[2,2]paracyclophane |
| US5324813A (en) * | 1992-07-22 | 1994-06-28 | International Business Machines Corporation | Low dielectric constant fluorinated polymers and methods of fabrication thereof |
| US5268202A (en) * | 1992-10-09 | 1993-12-07 | Rensselaer Polytechnic Institute | Vapor deposition of parylene-F using 1,4-bis (trifluoromethyl) benzene |
| US5424097A (en) * | 1993-09-30 | 1995-06-13 | Specialty Coating Systems, Inc. | Continuous vapor deposition apparatus |
| JP3407086B2 (ja) | 1994-06-17 | 2003-05-19 | 日本テキサス・インスツルメンツ株式会社 | 半導体装置の製造方法 |
| AU5674096A (en) | 1995-05-05 | 1996-11-21 | Specialty Coating Systems, Inc. | Flat panel display with parylene barrier and protective film s |
| US5708116A (en) * | 1995-05-31 | 1998-01-13 | The United States Of America As Represented By The Secretary Of The Navy | Low dielectric constant allylics |
| US5536892A (en) * | 1995-10-18 | 1996-07-16 | Specialty Coating Systems, Inc. | Processes for the preparation of octafluoro-[2,2]paracyclophane |
| JP3932206B2 (ja) * | 1995-10-18 | 2007-06-20 | スペシャルティ、コーティング、システムズ、インコーポレイテッド | オクタフルオロ−〔2,2〕パラシクロファンの製造方法 |
| EP0769788A3 (en) * | 1995-10-20 | 1998-01-14 | W.L. Gore & Associates, Inc. | Low dielectric constant material for use as an insulation element in an electronic device |
| TW297147B (en) * | 1995-10-27 | 1997-02-01 | Specialty Coating Systems Inc | Multi-level circuit structure including fluorinated parylene polymer dielectric interlayers |
| US5536317A (en) * | 1995-10-27 | 1996-07-16 | Specialty Coating Systems, Inc. | Parylene deposition apparatus including a quartz crystal thickness/rate controller |
| US5538758A (en) * | 1995-10-27 | 1996-07-23 | Specialty Coating Systems, Inc. | Method and apparatus for the deposition of parylene AF4 onto semiconductor wafers |
| US5534068A (en) * | 1995-10-27 | 1996-07-09 | Specialty Coating Systems, Inc. | Parylene deposition apparatus including a tapered deposition chamber and dual vacuum outlet pumping arrangement |
| US5556473A (en) * | 1995-10-27 | 1996-09-17 | Specialty Coating Systems, Inc. | Parylene deposition apparatus including dry vacuum pump system and downstream cold trap |
| US5536322A (en) * | 1995-10-27 | 1996-07-16 | Specialty Coating Systems, Inc. | Parylene deposition apparatus including a heated and cooled support platen and an electrostatic clamping device |
| US5536321A (en) * | 1995-10-27 | 1996-07-16 | Specialty Coating Systems, Inc. | Parylene deposition apparatus including a post-pyrolysis filtering chamber and a deposition chamber inlet filter |
| US5536319A (en) * | 1995-10-27 | 1996-07-16 | Specialty Coating Systems, Inc. | Parylene deposition apparatus including an atmospheric shroud and inert gas source |
| EP0862664B1 (en) * | 1995-10-27 | 2003-01-02 | Specialty Coating Systems, Inc. | Method and apparatus for the deposition of parylene af4 onto semiconductor wafers |
| US6284933B1 (en) * | 1996-10-23 | 2001-09-04 | William R. Dolbier, Jr. | TFPX synthesis |
| JP2002505803A (ja) | 1996-10-25 | 2002-02-19 | スペシャルティ、コーティング、システムズ、インコーポレイテッド | パリレンコーティングの製造方法 |
| US5783614A (en) * | 1997-02-21 | 1998-07-21 | Copytele, Inc. | Polymeric-coated dielectric particles and formulation and method for preparing same |
| US5841005A (en) * | 1997-03-14 | 1998-11-24 | Dolbier, Jr.; William R. | Parylene AF4 synthesis |
| US5759906A (en) | 1997-04-11 | 1998-06-02 | Industrial Technology Research Institute | Planarization method for intermetal dielectrics between multilevel interconnections on integrated circuits |
| US6051321A (en) * | 1997-10-24 | 2000-04-18 | Quester Technology, Inc. | Low dielectric constant materials and method |
| TW522144B (en) * | 1998-01-20 | 2003-03-01 | Nippon Catalytic Chem Ind | Process for production of 1,4-bis(difluoroalkyl) benzene derivative |
| US6184572B1 (en) * | 1998-04-29 | 2001-02-06 | Novellus Systems, Inc. | Interlevel dielectric stack containing plasma deposited fluorinated amorphous carbon films for semiconductor devices |
| EP1123991A3 (en) * | 2000-02-08 | 2002-11-13 | Asm Japan K.K. | Low dielectric constant materials and processes |
-
1997
- 1997-10-24 US US08/957,481 patent/US6020458A/en not_active Expired - Fee Related
-
1998
- 1998-10-15 WO PCT/US1998/021840 patent/WO1999021924A1/en not_active Ceased
- 1998-10-15 AU AU10920/99A patent/AU1092099A/en not_active Abandoned
- 1998-10-15 JP JP2000518023A patent/JP2001521045A/ja active Pending
- 1998-10-15 KR KR1020007004416A patent/KR100602222B1/ko not_active Expired - Fee Related
-
1999
- 1999-11-15 US US09/440,297 patent/US6258407B1/en not_active Expired - Fee Related
-
2001
- 2001-04-17 US US09/836,815 patent/US6534616B2/en not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| US20010029110A1 (en) | 2001-10-11 |
| KR100602222B1 (ko) | 2006-07-19 |
| JP2001521045A (ja) | 2001-11-06 |
| US6020458A (en) | 2000-02-01 |
| US6258407B1 (en) | 2001-07-10 |
| US6534616B2 (en) | 2003-03-18 |
| KR20010031399A (ko) | 2001-04-16 |
| WO1999021924A1 (en) | 1999-05-06 |
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