ATE91026T1 - Pruefstift fuer einen adapter eines leiterplattenpruefgeraetes. - Google Patents

Pruefstift fuer einen adapter eines leiterplattenpruefgeraetes.

Info

Publication number
ATE91026T1
ATE91026T1 AT87116978T AT87116978T ATE91026T1 AT E91026 T1 ATE91026 T1 AT E91026T1 AT 87116978 T AT87116978 T AT 87116978T AT 87116978 T AT87116978 T AT 87116978T AT E91026 T1 ATE91026 T1 AT E91026T1
Authority
AT
Austria
Prior art keywords
adapter
test
circuit board
section
guide
Prior art date
Application number
AT87116978T
Other languages
English (en)
Inventor
Martin Maelzer
Ruediger Dehmel
Hans-Hermann Higgen
Andreas Guelzow
Original Assignee
Luther & Maelzer Gmbh
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Luther & Maelzer Gmbh filed Critical Luther & Maelzer Gmbh
Application granted granted Critical
Publication of ATE91026T1 publication Critical patent/ATE91026T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07364—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch
    • G01R1/07371—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch using an intermediate card or back card with apertures through which the probes pass
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07342—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being at an angle other than perpendicular to test object, e.g. probe card
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R12/00—Structural associations of a plurality of mutually-insulated electrical connecting elements, specially adapted for printed circuits, e.g. printed circuit boards [PCB], flat or ribbon cables, or like generally planar structures, e.g. terminal strips, terminal blocks; Coupling devices specially adapted for printed circuits, flat or ribbon cables, or like generally planar structures; Terminals specially adapted for contact with, or insertion into, printed circuits, flat or ribbon cables, or like generally planar structures
    • H01R12/70—Coupling devices
    • H01R12/71—Coupling devices for rigid printing circuits or like structures
    • H01R12/712—Coupling devices for rigid printing circuits or like structures co-operating with the surface of the printed circuit or with a coupling device exclusively provided on the surface of the printed circuit
    • H01R12/714—Coupling devices for rigid printing circuits or like structures co-operating with the surface of the printed circuit or with a coupling device exclusively provided on the surface of the printed circuit with contacts abutting directly the printed circuit; Button contacts therefore provided on the printed circuit

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Leads Or Probes (AREA)
  • Tests Of Electronic Circuits (AREA)
AT87116978T 1986-11-18 1987-11-17 Pruefstift fuer einen adapter eines leiterplattenpruefgeraetes. ATE91026T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE19863639360 DE3639360A1 (de) 1986-11-18 1986-11-18 Pruefstift fuer einen adapter zum verbinden von im raster befindlichen pruefkontakten eines leiterplattenpruefgeraetes mit in und/oder ausser raster befindlichen pruefpunkten eines prueflings
EP87116978A EP0278073B1 (de) 1986-11-18 1987-11-17 Prüfstift für einen Adapter eines Leiterplattenprüfgerätes

Publications (1)

Publication Number Publication Date
ATE91026T1 true ATE91026T1 (de) 1993-07-15

Family

ID=6314195

Family Applications (1)

Application Number Title Priority Date Filing Date
AT87116978T ATE91026T1 (de) 1986-11-18 1987-11-17 Pruefstift fuer einen adapter eines leiterplattenpruefgeraetes.

Country Status (5)

Country Link
US (1) US4896107A (de)
EP (1) EP0278073B1 (de)
AT (1) ATE91026T1 (de)
DE (2) DE3639360A1 (de)
HK (1) HK58894A (de)

Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH05215773A (ja) * 1992-02-04 1993-08-24 Nhk Spring Co Ltd 多点測定用導電性接触子ユニット
US5414369A (en) * 1992-11-09 1995-05-09 Nhk Spring Co., Ltd. Coil spring-pressed needle contact probe modules with offset needles
DE4323276A1 (de) * 1993-07-12 1995-01-19 Mania Gmbh Vollmaterialadapter
US5534784A (en) * 1994-05-02 1996-07-09 Motorola, Inc. Method for probing a semiconductor wafer
DE4439758C2 (de) * 1994-11-07 1999-04-22 Luther & Maelzer Gmbh Prüfstift für einen Prüfadapter für Leiterplatten und Verfahren zur Herstellung eines Prüfstiftes
DE19654404A1 (de) * 1996-12-24 1998-06-25 Hewlett Packard Co Adaptationsvorrichtung zum elektrischen Test von Leiterplatten
FR2772921B1 (fr) 1997-12-24 2000-01-28 Sgs Thomson Microelectronics Carte a pointes pour le test de composants semi-conducteurs
TW398676U (en) * 1998-11-20 2000-07-11 Promos Technologies Inc Probe adjusting tool
US6330744B1 (en) * 1999-07-12 2001-12-18 Pjc Technologies, Inc. Customized electrical test probe head using uniform probe assemblies
DE19939955A1 (de) * 1999-08-23 2001-03-01 Atg Test Systems Gmbh Prüfnadel für einen Rasteranpassungsadapter einer Vorrichtung zum Testen von Leiterplatten
DE19951501A1 (de) * 1999-10-26 2001-05-23 Atg Test Systems Gmbh Prüfstift für eine Vorrichtung zum Testen von Leiterplatten
ITVI20110343A1 (it) * 2011-12-30 2013-07-01 St Microelectronics Srl Sistema e adattatore per testare chips con circuiti integrati in un package
JP5822042B1 (ja) * 2015-03-27 2015-11-24 日本電産リード株式会社 検査治具、基板検査装置、及び検査治具の製造方法
CN111525290A (zh) * 2020-04-30 2020-08-11 番禺得意精密电子工业有限公司 基板及基板的制作方法

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3444708C2 (de) * 1983-12-08 1994-03-31 Luther & Maelzer Gmbh Adapter für ein Leiterplattenprüfgerät
US4622514A (en) * 1984-06-15 1986-11-11 Ibm Multiple mode buckling beam probe assembly
DE3533218A1 (de) * 1984-09-18 1986-03-20 Feinmetall Gmbh, 7033 Herrenberg Kontaktnadel
DE3507619C2 (de) * 1985-03-04 1994-06-30 Luther & Maelzer Gmbh Adapter für ein Leiterplattenprüfgerät

Also Published As

Publication number Publication date
EP0278073A1 (de) 1988-08-17
US4896107A (en) 1990-01-23
DE3639360A1 (de) 1988-05-19
DE3786344D1 (de) 1993-07-29
HK58894A (en) 1994-07-08
EP0278073B1 (de) 1993-06-23

Similar Documents

Publication Publication Date Title
ATE253731T1 (de) Prüfstift für eine vorrichtung zum testen von leiterplatten
ATE91026T1 (de) Pruefstift fuer einen adapter eines leiterplattenpruefgeraetes.
DE3778233D1 (de) Pruefeinrichtung fuer beidseitige kontaktierung bestueckter leiterplatten.
WO2000003252A3 (en) Multi-point probe
EP0840130A3 (de) Hybrid-Prüfadapter für Gebiete mit Standard- oder beschränkter Zugänglichkeit
EP1512980A3 (de) Prüfadapter mit Nadelführung für bestückte Leiterplatten
KR950023986A (ko) 인쇄회로기판의 상호접속부 검사장치 및 인쇄회로기판 검사방법
DE69030015D1 (de) Verfahren und Vorrichtung zur Prüfung von integrierten Schaltungen mit zahlreichen Anschlüssen
DE3882563D1 (de) Vorrichtung fuer die elektrische funktionspruefung von verdrahtungsfeldern, insbesondere von leiterplatten.
EP0309956A3 (de) Verfahren und Apparatur zum Prüfen von Halbleiter-Elementen
KR960039256A (ko) 반도체 시험 장치
ATE45427T1 (de) Adapter fuer ein leiterplattenpruefgeraet.
KR890008960A (ko) 전기적 프로우빙 시험 장치
JPS56110060A (en) Inspecting method and device for base plate of circuit
ATE34621T1 (de) Adapter fuer ein leiterplattenpruefgeraet.
DE10146879A1 (de) Verfahren zum Nachweis und zur Lokalisierung von Rissen in Silizium-Solarzellen und Silizium-Scheiben
DE3575206D1 (de) Einrichtung fuer die funktionspruefung integrierter schaltkreise.
NZ306552A (en) Testing printed circuit boards by passing them between opposed boards bearing test probes
US5519315A (en) Printed wiring assembly coplanarity inspection fixture
KR900000330Y1 (ko) 전자 회로 검사를 위한 인쇄회로 기판(pcb) 고정구
JPS56114346A (en) Semiconductor structure for novel wafer inspecting system
JPH022901A (ja) 配線基板端子ピンの長さ検査機構
KR940002455Y1 (ko) 레스트신호 체크용 보드가 구비된 반도체 웨이퍼 레스트장치
ATE113384T1 (de) Nadelkarte.
JPS57172261A (en) Method and device for inspecting through-hole printed circuit board

Legal Events

Date Code Title Description
REN Ceased due to non-payment of the annual fee