TW398676U - Probe adjusting tool - Google Patents
Probe adjusting toolInfo
- Publication number
- TW398676U TW398676U TW87219328U TW87219328U TW398676U TW 398676 U TW398676 U TW 398676U TW 87219328 U TW87219328 U TW 87219328U TW 87219328 U TW87219328 U TW 87219328U TW 398676 U TW398676 U TW 398676U
- Authority
- TW
- Taiwan
- Prior art keywords
- adjusting tool
- probe adjusting
- probe
- tool
- adjusting
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06705—Apparatus for holding or moving single probes
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Measuring Leads Or Probes (AREA)
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW87219328U TW398676U (en) | 1998-11-20 | 1998-11-20 | Probe adjusting tool |
DE1998160560 DE19860560B4 (en) | 1998-11-20 | 1998-12-22 | Use of a used tungsten test probe |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW87219328U TW398676U (en) | 1998-11-20 | 1998-11-20 | Probe adjusting tool |
Publications (1)
Publication Number | Publication Date |
---|---|
TW398676U true TW398676U (en) | 2000-07-11 |
Family
ID=21637833
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW87219328U TW398676U (en) | 1998-11-20 | 1998-11-20 | Probe adjusting tool |
Country Status (2)
Country | Link |
---|---|
DE (1) | DE19860560B4 (en) |
TW (1) | TW398676U (en) |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4001685A (en) * | 1974-03-04 | 1977-01-04 | Electroglas, Inc. | Micro-circuit test probe |
DE3639360A1 (en) * | 1986-11-18 | 1988-05-19 | Luther Erich | TEST PIN FOR AN ADAPTER FOR CONNECTING TEST CONTACTS OF A CIRCUIT BOARD TEST DEVICE WITH IN AND / OR OUTSIDE TEST POINTS OF A TEST UNIT |
DE19617488C2 (en) * | 1996-05-02 | 2002-03-07 | Gustav Krueger | Contact element for detachable electrical connections |
-
1998
- 1998-11-20 TW TW87219328U patent/TW398676U/en not_active IP Right Cessation
- 1998-12-22 DE DE1998160560 patent/DE19860560B4/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
DE19860560B4 (en) | 2007-12-27 |
DE19860560A1 (en) | 2000-06-15 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
GD4K | Issue of patent certificate for granted utility model filed before june 30, 2004 | ||
MM4K | Annulment or lapse of a utility model due to non-payment of fees |