ATE85849T1 - Gasanalysiervorrichtung. - Google Patents
Gasanalysiervorrichtung.Info
- Publication number
- ATE85849T1 ATE85849T1 AT87112686T AT87112686T ATE85849T1 AT E85849 T1 ATE85849 T1 AT E85849T1 AT 87112686 T AT87112686 T AT 87112686T AT 87112686 T AT87112686 T AT 87112686T AT E85849 T1 ATE85849 T1 AT E85849T1
- Authority
- AT
- Austria
- Prior art keywords
- gas
- current component
- passing
- light
- alternating current
- Prior art date
Links
- 230000003287 optical effect Effects 0.000 abstract 2
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/27—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration
- G01N21/274—Calibration, base line adjustment, drift correction
- G01N21/276—Calibration, base line adjustment, drift correction with alternation of sample and standard in optical path
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
- G01N21/3504—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing gases, e.g. multi-gas analysis
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP61222326A JPS6378053A (ja) | 1986-09-20 | 1986-09-20 | ガス分析計 |
| EP87112686A EP0261452B1 (de) | 1986-09-20 | 1987-08-31 | Gasanalysiervorrichtung |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| ATE85849T1 true ATE85849T1 (de) | 1993-03-15 |
Family
ID=16780597
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| AT87112686T ATE85849T1 (de) | 1986-09-20 | 1987-08-31 | Gasanalysiervorrichtung. |
Country Status (4)
| Country | Link |
|---|---|
| EP (1) | EP0261452B1 (de) |
| JP (1) | JPS6378053A (de) |
| AT (1) | ATE85849T1 (de) |
| DE (1) | DE3784206T2 (de) |
Families Citing this family (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0774784B2 (ja) * | 1989-05-20 | 1995-08-09 | 株式会社堀場製作所 | 赤外線分析計 |
| US5340987A (en) * | 1991-03-15 | 1994-08-23 | Li-Cor, Inc. | Apparatus and method for analyzing gas |
| JP2744742B2 (ja) * | 1992-11-05 | 1998-04-28 | 東京電力株式会社 | ガス濃度測定方法およびその測定装置 |
| JP4397213B2 (ja) * | 2003-10-28 | 2010-01-13 | 株式会社アイ電子工業 | オゾン水濃度測定装置 |
| DE102006059652A1 (de) * | 2006-12-18 | 2008-06-26 | Tyco Electronics Raychem Gmbh | Verfahren zum Verarbeiten eines analogen Sensorsignals in einer Gassensoranordnung und Messwertverarbeitungsvorrichtung |
| WO2016112964A1 (en) | 2015-01-14 | 2016-07-21 | Abb Technology Ag | Method for determining a property of a fluid component of a fluid present in a compartment of an electrical apparatus |
| CN106769977A (zh) * | 2016-12-30 | 2017-05-31 | 武汉市欧睿科技有限公司 | 一种手持高精度气体定量检漏仪 |
Family Cites Families (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| GB1423460A (en) * | 1972-06-23 | 1976-02-04 | Bayer Ag | Self-equalising industrial photometer |
| DE2520197C2 (de) * | 1975-05-06 | 1983-11-17 | Siemens AG, 1000 Berlin und 8000 München | Anordnung zur Driftkompensierung eines Gasanalysators |
| JPS5494387A (en) * | 1978-01-10 | 1979-07-26 | Horiba Ltd | Gas analyzer |
| GB2035552B (en) * | 1978-11-29 | 1983-07-06 | Land Pyrometers Ltd | Radiation detection of gas compositions |
| JPS5928855B2 (ja) * | 1979-02-15 | 1984-07-16 | マツダ株式会社 | 内燃機関の排ガス測定方法 |
| US4265964A (en) * | 1979-12-26 | 1981-05-05 | Arco Polymers, Inc. | Lightweight frothed gypsum structural units |
| JPS61243343A (ja) * | 1985-04-20 | 1986-10-29 | Koyo Kensetsu Kogyo Kk | 紫外線吸収ガス分析計 |
-
1986
- 1986-09-20 JP JP61222326A patent/JPS6378053A/ja active Granted
-
1987
- 1987-08-31 EP EP87112686A patent/EP0261452B1/de not_active Expired - Lifetime
- 1987-08-31 AT AT87112686T patent/ATE85849T1/de not_active IP Right Cessation
- 1987-08-31 DE DE19873784206 patent/DE3784206T2/de not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| EP0261452A2 (de) | 1988-03-30 |
| DE3784206D1 (de) | 1993-03-25 |
| EP0261452A3 (en) | 1990-01-31 |
| DE3784206T2 (de) | 1993-09-09 |
| EP0261452B1 (de) | 1993-02-17 |
| JPH0545177B2 (de) | 1993-07-08 |
| JPS6378053A (ja) | 1988-04-08 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| UEP | Publication of translation of european patent specification | ||
| REN | Ceased due to non-payment of the annual fee |