ATE545156T1 - Einzelelektrontransistoren und verfahren zur herstellung in welchen ein vorspringendes teil das raum zwischen die elektroden definiert - Google Patents
Einzelelektrontransistoren und verfahren zur herstellung in welchen ein vorspringendes teil das raum zwischen die elektroden definiertInfo
- Publication number
- ATE545156T1 ATE545156T1 AT02759144T AT02759144T ATE545156T1 AT E545156 T1 ATE545156 T1 AT E545156T1 AT 02759144 T AT02759144 T AT 02759144T AT 02759144 T AT02759144 T AT 02759144T AT E545156 T1 ATE545156 T1 AT E545156T1
- Authority
- AT
- Austria
- Prior art keywords
- electrodes
- projecting feature
- electrode
- production
- space
- Prior art date
Links
- 239000000758 substrate Substances 0.000 abstract 6
- 239000002105 nanoparticle Substances 0.000 abstract 2
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N99/00—Subject matter not provided for in other groups of this subclass
- H10N99/05—Devices based on quantum mechanical effects, e.g. quantum interference devices or metal single-electron transistors
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y10/00—Nanotechnology for information processing, storage or transmission, e.g. quantum computing or single electron logic
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D30/00—Field-effect transistors [FET]
- H10D30/40—FETs having zero-dimensional [0D], one-dimensional [1D] or two-dimensional [2D] charge carrier gas channels
- H10D30/402—Single electron transistors; Coulomb blockade transistors
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S438/00—Semiconductor device manufacturing: process
- Y10S438/962—Quantum dots and lines
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S977/00—Nanotechnology
- Y10S977/902—Specified use of nanostructure
- Y10S977/932—Specified use of nanostructure for electronic or optoelectronic application
- Y10S977/936—Specified use of nanostructure for electronic or optoelectronic application in a transistor or 3-terminal device
- Y10S977/937—Single electron transistor
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T428/00—Stock material or miscellaneous articles
- Y10T428/24—Structurally defined web or sheet [e.g., overall dimension, etc.]
- Y10T428/24479—Structurally defined web or sheet [e.g., overall dimension, etc.] including variation in thickness
- Y10T428/24612—Composite web or sheet
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T428/00—Stock material or miscellaneous articles
- Y10T428/24—Structurally defined web or sheet [e.g., overall dimension, etc.]
- Y10T428/24479—Structurally defined web or sheet [e.g., overall dimension, etc.] including variation in thickness
- Y10T428/24612—Composite web or sheet
- Y10T428/2462—Composite web or sheet with partial filling of valleys on outer surface
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T428/00—Stock material or miscellaneous articles
- Y10T428/24—Structurally defined web or sheet [e.g., overall dimension, etc.]
- Y10T428/24628—Nonplanar uniform thickness material
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T428/00—Stock material or miscellaneous articles
- Y10T428/24—Structurally defined web or sheet [e.g., overall dimension, etc.]
- Y10T428/24628—Nonplanar uniform thickness material
- Y10T428/24669—Aligned or parallel nonplanarities
- Y10T428/24678—Waffle-form
Landscapes
- Engineering & Computer Science (AREA)
- Chemical & Material Sciences (AREA)
- Nanotechnology (AREA)
- Physics & Mathematics (AREA)
- Mathematical Physics (AREA)
- Theoretical Computer Science (AREA)
- Crystallography & Structural Chemistry (AREA)
- Thin Film Transistor (AREA)
- Insulated Gate Type Field-Effect Transistor (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US09/905,471 US6653653B2 (en) | 2001-07-13 | 2001-07-13 | Single-electron transistors and fabrication methods in which a projecting feature defines spacing between electrodes |
| PCT/US2002/022260 WO2003007385A1 (en) | 2001-07-13 | 2002-07-12 | Single-electron transistors and fabrication methods in which a projecting feature defines spacing between electrodes |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| ATE545156T1 true ATE545156T1 (de) | 2012-02-15 |
Family
ID=25420883
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| AT02759144T ATE545156T1 (de) | 2001-07-13 | 2002-07-12 | Einzelelektrontransistoren und verfahren zur herstellung in welchen ein vorspringendes teil das raum zwischen die elektroden definiert |
Country Status (6)
| Country | Link |
|---|---|
| US (2) | US6653653B2 (de) |
| EP (1) | EP1407493B1 (de) |
| JP (1) | JP4343683B2 (de) |
| AT (1) | ATE545156T1 (de) |
| TW (1) | TW558740B (de) |
| WO (1) | WO2003007385A1 (de) |
Families Citing this family (28)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6479892B1 (en) * | 2000-10-31 | 2002-11-12 | Motorola, Inc. | Enhanced probe for gathering data from semiconductor devices |
| US7115986B2 (en) * | 2001-05-02 | 2006-10-03 | Micron Technology, Inc. | Flexible ball grid array chip scale packages |
| US6653653B2 (en) * | 2001-07-13 | 2003-11-25 | Quantum Logic Devices, Inc. | Single-electron transistors and fabrication methods in which a projecting feature defines spacing between electrodes |
| JP3857141B2 (ja) * | 2002-01-07 | 2006-12-13 | 富士通株式会社 | 光半導体装置及びその製造方法 |
| SG104293A1 (en) | 2002-01-09 | 2004-06-21 | Micron Technology Inc | Elimination of rdl using tape base flip chip on flex for die stacking |
| SG115455A1 (en) * | 2002-03-04 | 2005-10-28 | Micron Technology Inc | Methods for assembly and packaging of flip chip configured dice with interposer |
| SG115456A1 (en) * | 2002-03-04 | 2005-10-28 | Micron Technology Inc | Semiconductor die packages with recessed interconnecting structures and methods for assembling the same |
| SG121707A1 (en) * | 2002-03-04 | 2006-05-26 | Micron Technology Inc | Method and apparatus for flip-chip packaging providing testing capability |
| US6975035B2 (en) * | 2002-03-04 | 2005-12-13 | Micron Technology, Inc. | Method and apparatus for dielectric filling of flip chip on interposer assembly |
| SG115459A1 (en) * | 2002-03-04 | 2005-10-28 | Micron Technology Inc | Flip chip packaging using recessed interposer terminals |
| SG111935A1 (en) * | 2002-03-04 | 2005-06-29 | Micron Technology Inc | Interposer configured to reduce the profiles of semiconductor device assemblies and packages including the same and methods |
| US7022287B2 (en) * | 2002-05-08 | 2006-04-04 | Sandia National Laboratories | Single particle electrochemical sensors and methods of utilization |
| US20040036170A1 (en) * | 2002-08-20 | 2004-02-26 | Lee Teck Kheng | Double bumping of flexible substrate for first and second level interconnects |
| US7208784B2 (en) * | 2003-10-07 | 2007-04-24 | Quantum Logic Devices, Inc. | Single-electron transistor for detecting biomolecules |
| AU2004316286A1 (en) | 2003-11-20 | 2005-09-09 | Biowarn, Llc | Methodology and apparatus for the detection of biological substances |
| KR100625999B1 (ko) * | 2004-02-26 | 2006-09-20 | 삼성에스디아이 주식회사 | 도너 시트, 상기 도너 시트의 제조방법, 상기 도너 시트를이용한 박막 트랜지스터의 제조방법, 및 상기 도너 시트를이용한 평판 표시장치의 제조방법 |
| JP4878550B2 (ja) * | 2004-03-12 | 2012-02-15 | 独立行政法人科学技術振興機構 | 量子ドット操作方法および量子ドット生成操作装置 |
| US6946693B1 (en) * | 2004-04-27 | 2005-09-20 | Wisconsin Alumni Research Foundation | Electromechanical electron transfer devices |
| JP4112597B2 (ja) | 2004-09-30 | 2008-07-02 | 独立行政法人科学技術振興機構 | 自己組織化材料のパターニング方法、及び自己組織化材料パターニング基板とその生産方法、並びに自己組織化材料パターニング基板を用いたフォトマスク |
| JP4613314B2 (ja) * | 2005-05-26 | 2011-01-19 | 独立行政法人産業技術総合研究所 | 単結晶の製造方法 |
| KR100723410B1 (ko) * | 2005-08-17 | 2007-05-30 | 삼성전자주식회사 | 자기정렬된 메탈쉴드를 구비한 저항성 탐침의 제조방법 |
| KR100777973B1 (ko) * | 2006-07-13 | 2007-11-29 | 한국표준과학연구원 | 다중선형전극 센서 유닛으로 이루어진 바이오센서 |
| AU2009214818B2 (en) * | 2008-02-11 | 2014-05-01 | Newsouth Innovations Pty Limited | Control and readout of electron or hole spin |
| US8378895B2 (en) * | 2010-04-08 | 2013-02-19 | Wisconsin Alumni Research Foundation | Coupled electron shuttle providing electrical rectification |
| PT108561B (pt) * | 2015-06-16 | 2017-07-20 | Sapec Agro S A | Mistura herbicida |
| PT109118B (pt) * | 2016-01-26 | 2018-02-27 | Sapec Agro S A | Mistura herbicida compreendendo iodossulfurão-metilo ou os seus sais e flazassulfurão |
| US10032897B2 (en) | 2016-06-01 | 2018-07-24 | International Business Machines Corporation | Single electron transistor with self-aligned Coulomb blockade |
| CN112444540B (zh) * | 2019-09-04 | 2023-05-05 | 张家港万众一芯生物科技有限公司 | 一种生物传感器和生物传感器的制备方法 |
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| GB8406955D0 (en) | 1984-03-16 | 1984-04-18 | Serono Diagnostics Ltd | Assay |
| DE3513168A1 (de) | 1985-04-12 | 1986-10-16 | Thomas 8000 München Dandekar | Biosensor bestehend aus einem halbleiter auf silizium oder kohlenstoffbasis (elektronischer teil) und nukleinbasen (od. anderen biol. monomeren) |
| US4894339A (en) | 1985-12-18 | 1990-01-16 | Seitaikinouriyou Kagakuhin Sinseizogijutsu Kenkyu Kumiai | Immobilized enzyme membrane for a semiconductor sensor |
| JPS6350745A (ja) | 1986-08-20 | 1988-03-03 | Fuji Photo Film Co Ltd | 化学センサ− |
| DE3827314C1 (de) | 1988-08-11 | 1989-10-19 | Christoff Prof. Dr. Braeuchle | |
| US5219577A (en) | 1990-06-22 | 1993-06-15 | The Regents Of The University Of California | Biologically active composition having a nanocrystalline core |
| GB2278235B (en) | 1991-10-21 | 1996-05-08 | Holm Kennedy James W | Method and device for biochemical sensing |
| US5234848A (en) * | 1991-11-05 | 1993-08-10 | Texas Instruments Incorporated | Method for fabricating lateral resonant tunneling transistor with heterojunction barriers |
| US5846708A (en) | 1991-11-19 | 1998-12-08 | Massachusetts Institiute Of Technology | Optical and electrical methods and apparatus for molecule detection |
| US5405454A (en) | 1992-03-19 | 1995-04-11 | Matsushita Electric Industrial Co., Ltd. | Electrically insulated silicon structure and producing method therefor |
| US5420746A (en) | 1993-04-13 | 1995-05-30 | The United States Of America As Represented By The Secretary Of The Army | Single electron device including clusters of pure carbon atoms |
| GB2288274A (en) * | 1994-03-31 | 1995-10-11 | Sharp Kk | Quantum device and method of making such a device |
| EP0756761B1 (de) | 1994-04-19 | 1998-06-24 | Siemens Aktiengesellschaft | Mikroelektronisches bauelement und verfahren zu dessen herstellung |
| JP3149718B2 (ja) | 1995-02-03 | 2001-03-26 | 松下電器産業株式会社 | 単電子トランジスタ |
| US5576563A (en) | 1995-04-24 | 1996-11-19 | Motorola Inc. | Chemical probe field effect transistor for measuring the surface potential of a gate electrode in response to chemical exposure |
| DE19522351A1 (de) | 1995-06-20 | 1997-01-09 | Max Planck Gesellschaft | Verfahren zur Herstellung von Quantenstrukturen, insbesondere von Quantenpunkten und Tunnelbarrieren sowie Bauelemente mit solchen Quantenstrukturen |
| DE69721929T2 (de) | 1996-03-26 | 2004-05-13 | Samsung Electronics Co., Ltd., Suwon | Tunneleffektanordnung und verfahren zur herstellung |
| DE19621994C1 (de) | 1996-05-31 | 1997-06-12 | Siemens Ag | Einzelelektron-Speicherzellenanordnung |
| US6066265A (en) | 1996-06-19 | 2000-05-23 | Kionix, Inc. | Micromachined silicon probe for scanning probe microscopy |
| JP3320641B2 (ja) * | 1996-09-13 | 2002-09-03 | 株式会社東芝 | メモリセル |
| US5747839A (en) | 1996-09-30 | 1998-05-05 | Motorola, Inc. | Chemical sensing trench field effect transistor |
| US5922537A (en) | 1996-11-08 | 1999-07-13 | N.o slashed.AB Immunoassay, Inc. | Nanoparticles biosensor |
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| EP0865078A1 (de) | 1997-03-13 | 1998-09-16 | Hitachi Europe Limited | Verfahren zum Ablegen von nanometrischen Partikeln |
| US5900729A (en) | 1997-03-20 | 1999-05-04 | International Business Machines Corporation | Magnetic force microscopy probe with integrated coil |
| US5900728A (en) | 1997-03-20 | 1999-05-04 | International Business Machines Corporation | Alternating current magnetic force microscopy system with probe having integrated coil |
| US6159620A (en) | 1997-03-31 | 2000-12-12 | The Regents Of The University Of California | Single-electron solid state electronic device |
| EP0881691B1 (de) | 1997-05-30 | 2004-09-01 | Matsushita Electric Industrial Co., Ltd. | Anordnung mit Quanten-Schachteln |
| JP3452764B2 (ja) | 1997-06-11 | 2003-09-29 | 科学技術振興事業団 | 超微細突起構造体の製造方法 |
| US5892252A (en) | 1998-02-05 | 1999-04-06 | Motorola, Inc. | Chemical sensing trench field effect transistor and method for same |
| AU6016999A (en) | 1998-04-20 | 1999-12-13 | University Of North Carolina At Chapel Hill, The | Nanometer sized particles containing a reactive monolayer adsorbed thereon and methods of making the same |
| US6211530B1 (en) | 1998-06-12 | 2001-04-03 | Motorola, Inc. | Sparse-carrier devices and method of fabrication |
| AU7700600A (en) | 1999-08-18 | 2001-03-13 | North Carolina State University | Sensing devices using chemically-gated single electron transistors |
| US6653653B2 (en) * | 2001-07-13 | 2003-11-25 | Quantum Logic Devices, Inc. | Single-electron transistors and fabrication methods in which a projecting feature defines spacing between electrodes |
| US6483125B1 (en) * | 2001-07-13 | 2002-11-19 | North Carolina State University | Single electron transistors in which the thickness of an insulating layer defines spacing between electrodes |
-
2001
- 2001-07-13 US US09/905,471 patent/US6653653B2/en not_active Expired - Fee Related
-
2002
- 2002-07-02 TW TW091114626A patent/TW558740B/zh not_active IP Right Cessation
- 2002-07-12 JP JP2003513047A patent/JP4343683B2/ja not_active Expired - Fee Related
- 2002-07-12 EP EP02759144A patent/EP1407493B1/de not_active Expired - Lifetime
- 2002-07-12 AT AT02759144T patent/ATE545156T1/de active
- 2002-07-12 WO PCT/US2002/022260 patent/WO2003007385A1/en not_active Ceased
-
2003
- 2003-10-07 US US10/680,871 patent/US20040113144A1/en not_active Abandoned
Also Published As
| Publication number | Publication date |
|---|---|
| US20040113144A1 (en) | 2004-06-17 |
| EP1407493B1 (de) | 2012-02-08 |
| JP2004535677A (ja) | 2004-11-25 |
| EP1407493A1 (de) | 2004-04-14 |
| US20030012930A1 (en) | 2003-01-16 |
| US6653653B2 (en) | 2003-11-25 |
| JP4343683B2 (ja) | 2009-10-14 |
| TW558740B (en) | 2003-10-21 |
| WO2003007385A1 (en) | 2003-01-23 |
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