ATE518244T1 - Wafer mit optischen steuermodulen in ic-feldern - Google Patents
Wafer mit optischen steuermodulen in ic-feldernInfo
- Publication number
- ATE518244T1 ATE518244T1 AT04801512T AT04801512T ATE518244T1 AT E518244 T1 ATE518244 T1 AT E518244T1 AT 04801512 T AT04801512 T AT 04801512T AT 04801512 T AT04801512 T AT 04801512T AT E518244 T1 ATE518244 T1 AT E518244T1
- Authority
- AT
- Austria
- Prior art keywords
- ocm
- fields
- control module
- field
- wafer
- Prior art date
Links
- 230000003287 optical effect Effects 0.000 title abstract 2
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/544—Marks applied to semiconductor devices or parts, e.g. registration marks, alignment structures, wafer maps
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70425—Imaging strategies, e.g. for increasing throughput or resolution, printing product fields larger than the image field or compensating lithography- or non-lithography errors, e.g. proximity correction, mix-and-match, stitching or double patterning
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70425—Imaging strategies, e.g. for increasing throughput or resolution, printing product fields larger than the image field or compensating lithography- or non-lithography errors, e.g. proximity correction, mix-and-match, stitching or double patterning
- G03F7/70433—Layout for increasing efficiency or for compensating imaging errors, e.g. layout of exposure fields for reducing focus errors; Use of mask features for increasing efficiency or for compensating imaging errors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/20—Deposition of semiconductor materials on a substrate, e.g. epitaxial growth solid phase epitaxy
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
- H01L21/77—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate
- H01L21/78—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2223/00—Details relating to semiconductor or other solid state devices covered by the group H01L23/00
- H01L2223/544—Marks applied to semiconductor devices or parts
- H01L2223/54453—Marks applied to semiconductor devices or parts for use prior to dicing
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/0001—Technical content checked by a classifier
- H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Manufacturing & Machinery (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP03104956 | 2003-12-23 | ||
PCT/IB2004/052724 WO2005064679A1 (en) | 2003-12-23 | 2004-12-09 | Wafer with optical control modules in ic fields |
Publications (1)
Publication Number | Publication Date |
---|---|
ATE518244T1 true ATE518244T1 (de) | 2011-08-15 |
Family
ID=34717252
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
AT04801512T ATE518244T1 (de) | 2003-12-23 | 2004-12-09 | Wafer mit optischen steuermodulen in ic-feldern |
Country Status (7)
Country | Link |
---|---|
US (1) | US7456489B2 (de) |
EP (1) | EP1700341B1 (de) |
JP (1) | JP2007516619A (de) |
KR (1) | KR20060111611A (de) |
CN (1) | CN100477204C (de) |
AT (1) | ATE518244T1 (de) |
WO (1) | WO2005064679A1 (de) |
Families Citing this family (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2009007930A2 (en) * | 2007-07-12 | 2009-01-15 | Nxp B.V. | Integrated circuits on a wafer and method for separating integrated circuits on a wafer |
CN101689540B (zh) * | 2007-07-12 | 2014-06-25 | Nxp股份有限公司 | 制造集成电路的方法 |
ATE485597T1 (de) * | 2007-07-12 | 2010-11-15 | Nxp Bv | Integrierte schaltungen auf einem wafer und verfahren zur herstellung integrierter schaltungen |
US8600800B2 (en) | 2008-06-19 | 2013-12-03 | Societe Stationnement Urbain Developpements et Etudes (SUD SAS) | Parking locator system including promotion distribution system |
WO2011071548A1 (en) | 2009-12-11 | 2011-06-16 | Jean-Louis Fiorucci | Providing city services using mobile devices and a sensor network |
US9749823B2 (en) | 2009-12-11 | 2017-08-29 | Mentis Services France | Providing city services using mobile devices and a sensor network |
US10942444B2 (en) | 2019-05-01 | 2021-03-09 | Nxp Usa, Inc. | Optical control modules for integrated circuit device patterning and reticles and methods including the same |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5948924A (ja) * | 1982-09-14 | 1984-03-21 | Nec Corp | 電子線露光用位置合せマ−ク |
JPS5994418A (ja) * | 1982-11-19 | 1984-05-31 | Nec Kyushu Ltd | 半導体装置 |
JP4301584B2 (ja) * | 1998-01-14 | 2009-07-22 | 株式会社ルネサステクノロジ | レチクル、それを用いた露光装置、露光方法および半導体装置の製造方法 |
EP1366515A2 (de) * | 2001-02-27 | 2003-12-03 | Koninklijke Philips Electronics N.V. | Halbleiterscheibe mit prozesskontrollmodulen |
US20030034489A1 (en) * | 2001-08-16 | 2003-02-20 | Broadcom Corporation | Apparatus and method for a production testline to monitor CMOS SRAMs |
US6974653B2 (en) * | 2002-04-19 | 2005-12-13 | Nikon Precision Inc. | Methods for critical dimension and focus mapping using critical dimension test marks |
-
2004
- 2004-12-09 JP JP2006546427A patent/JP2007516619A/ja not_active Withdrawn
- 2004-12-09 US US10/584,095 patent/US7456489B2/en active Active
- 2004-12-09 AT AT04801512T patent/ATE518244T1/de not_active IP Right Cessation
- 2004-12-09 WO PCT/IB2004/052724 patent/WO2005064679A1/en not_active Application Discontinuation
- 2004-12-09 KR KR1020067012516A patent/KR20060111611A/ko not_active Application Discontinuation
- 2004-12-09 EP EP04801512A patent/EP1700341B1/de active Active
- 2004-12-09 CN CNB200480038428XA patent/CN100477204C/zh active Active
Also Published As
Publication number | Publication date |
---|---|
CN100477204C (zh) | 2009-04-08 |
EP1700341B1 (de) | 2011-07-27 |
EP1700341A1 (de) | 2006-09-13 |
JP2007516619A (ja) | 2007-06-21 |
KR20060111611A (ko) | 2006-10-27 |
WO2005064679A1 (en) | 2005-07-14 |
CN1898797A (zh) | 2007-01-17 |
US20070158798A1 (en) | 2007-07-12 |
US7456489B2 (en) | 2008-11-25 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
RER | Ceased as to paragraph 5 lit. 3 law introducing patent treaties |