ATE483964T1 - Analyseverfahren und analyseeinrichtung - Google Patents

Analyseverfahren und analyseeinrichtung

Info

Publication number
ATE483964T1
ATE483964T1 AT03754014T AT03754014T ATE483964T1 AT E483964 T1 ATE483964 T1 AT E483964T1 AT 03754014 T AT03754014 T AT 03754014T AT 03754014 T AT03754014 T AT 03754014T AT E483964 T1 ATE483964 T1 AT E483964T1
Authority
AT
Austria
Prior art keywords
response
analyzing
reaction system
sample liquid
reference board
Prior art date
Application number
AT03754014T
Other languages
English (en)
Inventor
Hideki Tanji
Original Assignee
Arkray Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Arkray Inc filed Critical Arkray Inc
Application granted granted Critical
Publication of ATE483964T1 publication Critical patent/ATE483964T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/27—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration
    • G01N21/274—Calibration, base line adjustment, drift correction
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/75—Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated
    • G01N21/77—Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated by observing the effect on a chemical indicator
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/8483—Investigating reagent band
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T29/00—Metal working
    • Y10T29/49—Method of mechanical manufacture
    • Y10T29/49002—Electrical device making

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Molecular Biology (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Plasma & Fusion (AREA)
  • Mathematical Physics (AREA)
  • Theoretical Computer Science (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Investigating Or Analysing Materials By The Use Of Chemical Reactions (AREA)
  • Holo Graphy (AREA)
  • Spinning Or Twisting Of Yarns (AREA)
  • Investigating Or Analysing Biological Materials (AREA)
AT03754014T 2002-10-08 2003-10-07 Analyseverfahren und analyseeinrichtung ATE483964T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2002294448A JP3991267B2 (ja) 2002-10-08 2002-10-08 分析装置およびこれの製造方法
PCT/JP2003/012849 WO2004034040A1 (ja) 2002-10-08 2003-10-07 分析方法、分析装置およびこれの製造方法

Publications (1)

Publication Number Publication Date
ATE483964T1 true ATE483964T1 (de) 2010-10-15

Family

ID=32089176

Family Applications (1)

Application Number Title Priority Date Filing Date
AT03754014T ATE483964T1 (de) 2002-10-08 2003-10-07 Analyseverfahren und analyseeinrichtung

Country Status (8)

Country Link
US (2) US7815861B2 (de)
EP (1) EP1550859B1 (de)
JP (1) JP3991267B2 (de)
CN (1) CN100487434C (de)
AT (1) ATE483964T1 (de)
AU (1) AU2003272932A1 (de)
DE (1) DE60334472D1 (de)
WO (1) WO2004034040A1 (de)

Families Citing this family (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008170340A (ja) * 2007-01-12 2008-07-24 Olympus Corp 波長特定方法および分析装置
JP4884239B2 (ja) * 2007-01-12 2012-02-29 ベックマン コールター， インコーポレイテッド 波長特定方法および分析装置
JP2009002864A (ja) * 2007-06-22 2009-01-08 Olympus Corp 分析装置および分析方法
WO2011156701A2 (en) 2010-06-10 2011-12-15 C2C Development, Llc Trajectory guide, access port, and fiducial marker alignment
JP5216051B2 (ja) * 2010-06-23 2013-06-19 株式会社日立ハイテクノロジーズ 自動分析装置および自動分析方法
CN102384890B (zh) * 2011-08-05 2014-04-30 广州万孚生物技术股份有限公司 化验检测判定设备及方法
JP5847674B2 (ja) * 2012-09-10 2016-01-27 株式会社東芝 Ｘ線厚さ計
JP6002311B2 (ja) * 2013-02-14 2016-10-05 シャープ株式会社 光学センサヘッド、および光学センサシステム
KR101498096B1 (ko) * 2013-11-19 2015-03-06 대한민국 초분광 영상을 이용한 농산물의 원산지 판별 장치 및 방법
JP6435856B2 (ja) * 2014-12-26 2018-12-12 株式会社サタケ 穀粒品位判別装置
US10578557B2 (en) 2014-12-19 2020-03-03 Satake Corporation Grain quality level discrimination device
JP6435858B2 (ja) * 2014-12-26 2018-12-12 株式会社サタケ 穀粒品位判別装置
JP6435847B2 (ja) * 2014-12-19 2018-12-12 株式会社サタケ 穀粒品位判別装置
WO2022026444A1 (en) * 2020-07-29 2022-02-03 Baker Hughes Oilfield Operations Llc Automated contamination prediction based on downhole fluid sampling
JP7814999B2 (ja) * 2022-03-22 2026-02-17 富士フイルム株式会社 分析装置及び分析方法
JP2026017150A (ja) 2024-07-23 2026-02-04 富士フイルム株式会社 分析装置

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61133826A (ja) * 1984-12-04 1986-06-21 Mitsubishi Electric Corp 光計測装置
US5259381A (en) * 1986-08-18 1993-11-09 Physio-Control Corporation Apparatus for the automatic calibration of signals employed in oximetry
US4986665A (en) * 1987-08-06 1991-01-22 Minolta Camera Kabushiki Kaisha Optical density detector
JPH0460447A (ja) 1990-06-28 1992-02-26 Konica Corp 光学式濃度測定機の干渉フィルタ補正用着色標準物及び干渉フィルタの補正方法
JP3488925B2 (ja) 1994-09-08 2004-01-19 ライフスキヤン・インコーポレーテツド 条片上標準を備えた分析物検出用の光学読取式条片
US5728352A (en) * 1994-11-14 1998-03-17 Advanced Care Products Disposable electronic diagnostic instrument
MXPA00004120A (es) * 1997-10-31 2004-12-02 Technical Chemicals & Products Reflectometro.
JP2000105196A (ja) * 1998-09-29 2000-04-11 Hitachi Ltd 光度計
JP4341153B2 (ja) 2000-05-17 2009-10-07 和光純薬工業株式会社 試験紙分析装置
CN1319762A (zh) 2000-01-21 2001-10-31 和光纯药工业株式会社 多项目测试具的制造方法及测试具检测装置

Also Published As

Publication number Publication date
DE60334472D1 (de) 2010-11-18
WO2004034040A1 (ja) 2004-04-22
CN1703616A (zh) 2005-11-30
EP1550859A4 (de) 2006-01-11
EP1550859A1 (de) 2005-07-06
US20060153738A1 (en) 2006-07-13
CN100487434C (zh) 2009-05-13
AU2003272932A1 (en) 2004-05-04
EP1550859B1 (de) 2010-10-06
JP2004132706A (ja) 2004-04-30
US7815861B2 (en) 2010-10-19
US20110002813A1 (en) 2011-01-06
JP3991267B2 (ja) 2007-10-17

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Legal Events

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