ATE428134T1 - Verfahren und vorrichtung zur hochgeschwindigkeits-eingabeabtastung - Google Patents

Verfahren und vorrichtung zur hochgeschwindigkeits-eingabeabtastung

Info

Publication number
ATE428134T1
ATE428134T1 AT05784286T AT05784286T ATE428134T1 AT E428134 T1 ATE428134 T1 AT E428134T1 AT 05784286 T AT05784286 T AT 05784286T AT 05784286 T AT05784286 T AT 05784286T AT E428134 T1 ATE428134 T1 AT E428134T1
Authority
AT
Austria
Prior art keywords
signal
sampler
sampled
sampled signals
output
Prior art date
Application number
AT05784286T
Other languages
English (en)
Inventor
Seonghoon Lee
Original Assignee
Micron Technology Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Micron Technology Inc filed Critical Micron Technology Inc
Application granted granted Critical
Publication of ATE428134T1 publication Critical patent/ATE428134T1/de

Links

Classifications

    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K5/00—Manipulating of pulses not covered by one of the other main groups of this subclass
    • H03K5/153—Arrangements in which a pulse is delivered at the instant when a predetermined characteristic of an input signal is present or at a fixed time interval after this instant
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K5/00—Manipulating of pulses not covered by one of the other main groups of this subclass
    • H03K5/13—Arrangements having a single output and transforming input signals into pulses delivered at desired time intervals
    • H03K5/135—Arrangements having a single output and transforming input signals into pulses delivered at desired time intervals by the use of time reference signals, e.g. clock signals
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C27/00—Electric analogue stores, e.g. for storing instantaneous values
    • G11C27/02—Sample-and-hold arrangements
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K3/00—Circuits for generating electric pulses; Monostable, bistable or multistable circuits
    • H03K3/02—Generators characterised by the type of circuit or by the means used for producing pulses
    • H03K3/027—Generators characterised by the type of circuit or by the means used for producing pulses by the use of logic circuits, with internal or external positive feedback
    • H03K3/037—Bistable circuits
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K5/00—Manipulating of pulses not covered by one of the other main groups of this subclass
    • H03K5/153—Arrangements in which a pulse is delivered at the instant when a predetermined characteristic of an input signal is present or at a fixed time interval after this instant
    • H03K5/1534—Transition or edge detectors

Landscapes

  • Physics & Mathematics (AREA)
  • Nonlinear Science (AREA)
  • Synchronisation In Digital Transmission Systems (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Steroid Compounds (AREA)
  • Logic Circuits (AREA)
  • Dc Digital Transmission (AREA)
AT05784286T 2004-08-12 2005-08-11 Verfahren und vorrichtung zur hochgeschwindigkeits-eingabeabtastung ATE428134T1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US10/918,008 US7366942B2 (en) 2004-08-12 2004-08-12 Method and apparatus for high-speed input sampling

Publications (1)

Publication Number Publication Date
ATE428134T1 true ATE428134T1 (de) 2009-04-15

Family

ID=35311572

Family Applications (1)

Application Number Title Priority Date Filing Date
AT05784286T ATE428134T1 (de) 2004-08-12 2005-08-11 Verfahren und vorrichtung zur hochgeschwindigkeits-eingabeabtastung

Country Status (8)

Country Link
US (2) US7366942B2 (de)
EP (1) EP1776619B1 (de)
JP (1) JP2008510387A (de)
KR (1) KR20070059083A (de)
AT (1) ATE428134T1 (de)
DE (1) DE602005013789D1 (de)
TW (1) TWI300935B (de)
WO (1) WO2006020795A1 (de)

Families Citing this family (50)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7366942B2 (en) * 2004-08-12 2008-04-29 Micron Technology, Inc. Method and apparatus for high-speed input sampling
JP2009188993A (ja) * 2008-01-07 2009-08-20 Nikon Systems Inc データ転送装置およびカメラ
JP5304280B2 (ja) * 2009-01-30 2013-10-02 株式会社ニコン 位相調整装置およびカメラ
DE102009029517A1 (de) * 2009-09-16 2011-03-24 Robert Bosch Gmbh Anordnung und Verfahren zum Betreiben einer Abgasnachbehandlungsvorrichtung
US9288089B2 (en) 2010-04-30 2016-03-15 Ecole Polytechnique Federale De Lausanne (Epfl) Orthogonal differential vector signaling
US9077386B1 (en) 2010-05-20 2015-07-07 Kandou Labs, S.A. Methods and systems for selection of unions of vector signaling codes for power and pin efficient chip-to-chip communication
US9251873B1 (en) 2010-05-20 2016-02-02 Kandou Labs, S.A. Methods and systems for pin-efficient memory controller interface using vector signaling codes for chip-to-chip communications
US9288082B1 (en) 2010-05-20 2016-03-15 Kandou Labs, S.A. Circuits for efficient detection of vector signaling codes for chip-to-chip communication using sums of differences
US8451644B2 (en) 2010-06-29 2013-05-28 Hewlett-Packard Development Company, L.P. Non-volatile sampler
US8451969B2 (en) * 2011-03-15 2013-05-28 Intel Corporation Apparatus, system, and method for timing recovery
US9582451B2 (en) * 2013-02-01 2017-02-28 Infineon Technologies Ag Receiver architecture
WO2014124450A1 (en) 2013-02-11 2014-08-14 Kandou Labs, S.A. Methods and systems for high bandwidth chip-to-chip communications interface
EP2979388B1 (de) 2013-04-16 2020-02-12 Kandou Labs, S.A. Verfahren und systeme für eine kommunikationsschnittstelle mit hoher bandbreite
WO2014210074A1 (en) 2013-06-25 2014-12-31 Kandou Labs SA Vector signaling with reduced receiver complexity
US8970276B1 (en) * 2013-12-17 2015-03-03 Analog Devices, Inc. Clock signal synchronization
US9806761B1 (en) 2014-01-31 2017-10-31 Kandou Labs, S.A. Methods and systems for reduction of nearest-neighbor crosstalk
CN105993151B (zh) 2014-02-02 2019-06-21 康杜实验室公司 低isi比低功率芯片间通信方法和装置
WO2015131203A1 (en) 2014-02-28 2015-09-03 Kandou Lab, S.A. Clock-embedded vector signaling codes
US9509437B2 (en) 2014-05-13 2016-11-29 Kandou Labs, S.A. Vector signaling code with improved noise margin
US9852806B2 (en) 2014-06-20 2017-12-26 Kandou Labs, S.A. System for generating a test pattern to detect and isolate stuck faults for an interface using transition coding
US9112550B1 (en) 2014-06-25 2015-08-18 Kandou Labs, SA Multilevel driver for high speed chip-to-chip communications
EP3138253A4 (de) 2014-07-10 2018-01-10 Kandou Labs S.A. Vektorsignalisierungscodierung mit erhöhten signal-rausch-eigenschaften
US9432082B2 (en) 2014-07-17 2016-08-30 Kandou Labs, S.A. Bus reversable orthogonal differential vector signaling codes
EP3152879B1 (de) 2014-07-21 2019-09-04 Kandou Labs S.A. Multidrop-datenübertragung
CN106576087B (zh) 2014-08-01 2019-04-12 康杜实验室公司 带内嵌时钟的正交差分向量信令码
US9674014B2 (en) 2014-10-22 2017-06-06 Kandou Labs, S.A. Method and apparatus for high speed chip-to-chip communications
KR102517583B1 (ko) 2015-06-26 2023-04-03 칸도우 랩스 에스에이 고속 통신 시스템
US10055372B2 (en) 2015-11-25 2018-08-21 Kandou Labs, S.A. Orthogonal differential vector signaling codes with embedded clock
US10003454B2 (en) 2016-04-22 2018-06-19 Kandou Labs, S.A. Sampler with low input kickback
WO2017185070A1 (en) * 2016-04-22 2017-10-26 Kandou Labs, S.A. Calibration apparatus and method for sampler with adjustable high frequency gain
CN115085727A (zh) 2016-04-22 2022-09-20 康杜实验室公司 高性能锁相环
WO2017190102A1 (en) 2016-04-28 2017-11-02 Kandou Labs, S.A. Low power multilevel driver
US10193716B2 (en) 2016-04-28 2019-01-29 Kandou Labs, S.A. Clock data recovery with decision feedback equalization
WO2017189931A1 (en) 2016-04-28 2017-11-02 Kandou Labs, S.A. Vector signaling codes for densely-routed wire groups
US10153591B2 (en) 2016-04-28 2018-12-11 Kandou Labs, S.A. Skew-resistant multi-wire channel
US9906358B1 (en) 2016-08-31 2018-02-27 Kandou Labs, S.A. Lock detector for phase lock loop
US10411922B2 (en) 2016-09-16 2019-09-10 Kandou Labs, S.A. Data-driven phase detector element for phase locked loops
US10200188B2 (en) 2016-10-21 2019-02-05 Kandou Labs, S.A. Quadrature and duty cycle error correction in matrix phase lock loop
US10372665B2 (en) 2016-10-24 2019-08-06 Kandou Labs, S.A. Multiphase data receiver with distributed DFE
US10200218B2 (en) 2016-10-24 2019-02-05 Kandou Labs, S.A. Multi-stage sampler with increased gain
US10225161B2 (en) * 2016-10-31 2019-03-05 Accedian Networks Inc. Precise statistics computation for communication networks
EP3590020A4 (de) 2017-02-28 2021-01-06 Kandou Labs S.A. Verfahren zur messung und korrektur von mehrdrahtigem schräglauf
US10116468B1 (en) 2017-06-28 2018-10-30 Kandou Labs, S.A. Low power chip-to-chip bidirectional communications
US10686583B2 (en) 2017-07-04 2020-06-16 Kandou Labs, S.A. Method for measuring and correcting multi-wire skew
US10203226B1 (en) 2017-08-11 2019-02-12 Kandou Labs, S.A. Phase interpolation circuit
US10326623B1 (en) 2017-12-08 2019-06-18 Kandou Labs, S.A. Methods and systems for providing multi-stage distributed decision feedback equalization
US10243614B1 (en) 2018-01-26 2019-03-26 Kandou Labs, S.A. Method and system for calibrating multi-wire skew
US10554380B2 (en) 2018-01-26 2020-02-04 Kandou Labs, S.A. Dynamically weighted exclusive or gate having weighted output segments for phase detection and phase interpolation
US10601574B2 (en) 2018-06-11 2020-03-24 Kandou Labs, S.A. Skew detection and correction for orthogonal differential vector signaling codes
CN114094996A (zh) * 2021-11-09 2022-02-25 成都海光微电子技术有限公司 一种校准电路、校准方法、接口和相关设备

Family Cites Families (23)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
IL96808A (en) 1990-04-18 1996-03-31 Rambus Inc Introductory / Origin Circuit Agreed Using High-Performance Brokerage
US5132990A (en) 1990-11-05 1992-07-21 Ncr Corporation High speed data synchronizer
US5179295A (en) * 1992-03-20 1993-01-12 Vlsi Technology, Inc. Dual edge-triggered digital storage element and method therefor
US5748020A (en) 1996-02-02 1998-05-05 Lsi Logic Corporation High speed capture latch
US5872736A (en) 1996-10-28 1999-02-16 Micron Technology, Inc. High speed input buffer
TW397259U (en) * 1997-04-19 2000-07-01 United Microelectronics Corp The filter circuit
AUPO688197A0 (en) * 1997-05-19 1997-06-12 Bhp Steel (Jla) Pty Limited Improvements in jet stripping apparatus
JP4063392B2 (ja) * 1998-03-26 2008-03-19 富士通株式会社 信号伝送システム
US6430696B1 (en) 1998-11-30 2002-08-06 Micron Technology, Inc. Method and apparatus for high speed data capture utilizing bit-to-bit timing correction, and memory device using same
US6424684B1 (en) 1999-08-30 2002-07-23 Micron Technology, Inc. Method and apparatus for receiving synchronous data
EP1081857A1 (de) 1999-09-03 2001-03-07 Lsi Logic Corporation Verfahren zum Betreiben einer ASIC Vorrichtung, ASIC Vorrichtung und Flip-Flop zur Verwendung in der ASIC Vorrichtung
US6272985B1 (en) * 1999-09-07 2001-08-14 Kelray Tech, Inc. Link arm mechanism for adjustable spacing of plate and blanket cylinders in a rotary offset printing press
JP4683690B2 (ja) * 1999-11-05 2011-05-18 ルネサスエレクトロニクス株式会社 半導体装置
US6460457B1 (en) * 1999-11-22 2002-10-08 Heidelberger Druckmaschinen Ag Method and device for automatically providing a printing plate to a plate cylinder
US6724846B1 (en) 2000-04-28 2004-04-20 Hewlett-Packard Development Company, L.P. Simple, high performance, bit-sliced mesochronous synchronizer for a source synchronous link
JP2002046251A (ja) * 2000-06-26 2002-02-12 Heidelberger Druckmas Ag 偏心箱を使用して胴の胴抜きを行うための機構
KR100783687B1 (ko) 2000-10-23 2007-12-07 더 트러스티스 오브 콜롬비아 유니버시티 인 더 시티 오브 뉴욕 래치 제어기를 갖는 비동기 파이프라인
JP2002368728A (ja) * 2001-05-25 2002-12-20 Texas Instr Inc <Ti> 複数のチャネルを介して並列伝送された受信データを同期させる装置及び方法
JP4513323B2 (ja) * 2001-05-30 2010-07-28 株式会社日立製作所 半導体装置
US6982575B2 (en) * 2002-01-30 2006-01-03 Agilent Technologies, Inc. Clock ratio data synchronizer
US20040027185A1 (en) 2002-08-09 2004-02-12 Alan Fiedler High-speed differential sampling flip-flop
US7356095B2 (en) 2002-12-18 2008-04-08 Agere Systems Inc. Hybrid data recovery system
US7366942B2 (en) * 2004-08-12 2008-04-29 Micron Technology, Inc. Method and apparatus for high-speed input sampling

Also Published As

Publication number Publication date
KR20070059083A (ko) 2007-06-11
US7366942B2 (en) 2008-04-29
US7747890B2 (en) 2010-06-29
WO2006020795A1 (en) 2006-02-23
JP2008510387A (ja) 2008-04-03
TWI300935B (en) 2008-09-11
EP1776619A1 (de) 2007-04-25
DE602005013789D1 (de) 2009-05-20
US20070046515A1 (en) 2007-03-01
TW200629282A (en) 2006-08-16
US20060034405A1 (en) 2006-02-16
EP1776619B1 (de) 2009-04-08

Similar Documents

Publication Publication Date Title
ATE428134T1 (de) Verfahren und vorrichtung zur hochgeschwindigkeits-eingabeabtastung
ATE506754T1 (de) Schaltungsvorrichtung und verfahren zur messung von taktschwankungen
WO2007112360A3 (en) Improved digital trigger
TW200717239A (en) Semiconductor integrated circuit device
WO2007076097A3 (en) Apparatus and method for compensating digital input delays in an intelligent electronic device
TW200639808A (en) Signal processing circuits and methods, and memory systems
TW200643433A (en) Programmable devices to route signals on probe cards
TW200626917A (en) Low cost test for IC&#39;s or electrical modules using standard reconfigurable logic devices
TW200615944A (en) Memory hub tester interface and method for use thereof
ATE524746T1 (de) System und verfahren zur verzögerungsleitungsprüfung
WO2006039224A3 (en) Racecheck: a race logic analyzer program for digital integrated circuits
ATE415619T1 (de) Probenahmevorrichtung und verfahren für einen analyseautomaten
ATE482523T1 (de) Vorrichtung zur umsetzung der datenverarbeitung und digitalisierung eines energiespektrums aus elektromagnetischer strahlung
WO2007143664A3 (en) Systems and methods for providing anti-aliasing in a sample-and-hold circuit
WO2010045400A3 (en) Devices and methods for direct sampling analog time-resolved detection
DE602005005340D1 (de) Gps-empfänger und diesbezügliches verfahren und diesbezügliche vorrichtung
WO2007019339A3 (en) Clock-and-data-recovery system
GB2467340B (en) Signal sample trigger apparatus, data acquisition system and method of sampling an analogue signal
WO2007120957A3 (en) Dynamic timing adjustment in a circuit device
ATE528106T1 (de) Objektdetektionsvorrichtung und -verfahren
TW200736623A (en) Locally in-order strobing
ATE520118T1 (de) Verarbeitung von digitalen media-strömen
DE502008001399D1 (de) Verfahren zur bestimmung einer asymmetrischen signalverzögerung eines signalpfades innerhalb einer integrierten schaltung
GB2439261A (en) Analytical instrumentation apparatus and methods
TW200631025A (en) Method and system for timing measurement of embedded macro module

Legal Events

Date Code Title Description
RER Ceased as to paragraph 5 lit. 3 law introducing patent treaties