ATE40750T1 - Streustrahlungsverfahren und -apparat. - Google Patents

Streustrahlungsverfahren und -apparat.

Info

Publication number
ATE40750T1
ATE40750T1 AT84301920T AT84301920T ATE40750T1 AT E40750 T1 ATE40750 T1 AT E40750T1 AT 84301920 T AT84301920 T AT 84301920T AT 84301920 T AT84301920 T AT 84301920T AT E40750 T1 ATE40750 T1 AT E40750T1
Authority
AT
Austria
Prior art keywords
density
determined
scattered radiation
pavement
radiation method
Prior art date
Application number
AT84301920T
Other languages
German (de)
English (en)
Inventor
John L Molbert
Eddie R Riddle
Original Assignee
Troxler Electronic Lab Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Troxler Electronic Lab Inc filed Critical Troxler Electronic Lab Inc
Application granted granted Critical
Publication of ATE40750T1 publication Critical patent/ATE40750T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/203—Measuring back scattering
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
    • G01B15/02—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness

Landscapes

  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Biochemistry (AREA)
  • Immunology (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Electromagnetism (AREA)
  • General Health & Medical Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
  • Radiation-Therapy Devices (AREA)
  • Measurement Of Radiation (AREA)
  • Heating, Cooling, Or Curing Plastics Or The Like In General (AREA)
  • Crystals, And After-Treatments Of Crystals (AREA)
AT84301920T 1983-03-22 1984-03-21 Streustrahlungsverfahren und -apparat. ATE40750T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US06/477,820 US4525854A (en) 1983-03-22 1983-03-22 Radiation scatter apparatus and method
EP84301920A EP0120676B1 (en) 1983-03-22 1984-03-21 Radiation scatter apparatus and method

Publications (1)

Publication Number Publication Date
ATE40750T1 true ATE40750T1 (de) 1989-02-15

Family

ID=23897498

Family Applications (1)

Application Number Title Priority Date Filing Date
AT84301920T ATE40750T1 (de) 1983-03-22 1984-03-21 Streustrahlungsverfahren und -apparat.

Country Status (11)

Country Link
US (1) US4525854A (enExample)
EP (1) EP0120676B1 (enExample)
JP (1) JPS59218941A (enExample)
AT (1) ATE40750T1 (enExample)
AU (1) AU557007B2 (enExample)
CA (1) CA1219970A (enExample)
DE (1) DE3476698D1 (enExample)
ES (1) ES8607546A1 (enExample)
IL (1) IL71299A (enExample)
NZ (1) NZ207628A (enExample)
ZA (1) ZA842056B (enExample)

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US4979197A (en) * 1986-05-22 1990-12-18 Troxler Electronic Laboratories, Inc. Nuclear radiation apparatus and method for dynamically measuring density of test materials during compaction
WO1988005116A1 (fr) * 1986-12-25 1988-07-02 Institut Gornogo Dela Imeni A.A.Skochinskogo Procede et detecteur pour determiner les limites cachees d'un gisement de charbon
US4766319A (en) * 1987-02-12 1988-08-23 Troxler Electronic Laboratories, Inc. Portable nuclear moisture-density gauge with low activity nuclear sources
AU630933B2 (en) * 1987-03-31 1992-11-12 Adaptive Technologies Inc. Thickness/density measuring apparatus
FR2629914B1 (fr) * 1988-04-06 1991-09-06 Aerospatiale Procede et dispositif pour determiner la masse volumique d'un volume elementaire de matiere
GB9417419D0 (en) 1994-08-30 1994-10-19 Mackenzie Innes Method of measuring film thickness and monitoring liquid flow using backscattered x-rays and gamma-rays
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US6207462B1 (en) 1998-03-20 2001-03-27 Cem Corporation Microwave apparatus and method for analysis of asphalt-aggregate compositions
US6190917B1 (en) 1998-03-20 2001-02-20 Cem Corporation Microwave apparatus and method for analysis of asphalt-aggregate compositions
WO2000033059A2 (en) * 1998-11-30 2000-06-08 American Science And Engineering, Inc. Multiple scatter system for threat identification
ATE371861T1 (de) 1999-03-03 2007-09-15 Troxler Electronic Lab Inc Nukleares messgerät zur bestimmung der dichte dünner lagen
US6284986B1 (en) * 1999-03-15 2001-09-04 Seh America, Inc. Method of determining the thickness of a layer on a silicon substrate
US6492641B1 (en) * 2000-06-29 2002-12-10 Troxler Electronic Laboratories, Inc. Apparatus and method for gamma-ray determination of bulk density of samples
US6567498B1 (en) 2002-01-10 2003-05-20 Troxler Electronic Laboratories, Inc. Low activity nuclear density gauge
EP1357382A1 (en) * 2002-04-26 2003-10-29 Rijksuniversiteit te Groningen Method and system for determining a property of a pavement by measuring natural gamma radiation
US9958569B2 (en) 2002-07-23 2018-05-01 Rapiscan Systems, Inc. Mobile imaging system and method for detection of contraband
US8275091B2 (en) 2002-07-23 2012-09-25 Rapiscan Systems, Inc. Compact mobile cargo scanning system
US8503605B2 (en) 2002-07-23 2013-08-06 Rapiscan Systems, Inc. Four sided imaging system and method for detection of contraband
US7963695B2 (en) 2002-07-23 2011-06-21 Rapiscan Systems, Inc. Rotatable boom cargo scanning system
US6995667B2 (en) * 2002-12-23 2006-02-07 Instrotek, Inc. Systems, methods, and computer program products for automatic tracking and/or remote monitoring of nuclear gauges and/or data communication therewith
US6928141B2 (en) 2003-06-20 2005-08-09 Rapiscan, Inc. Relocatable X-ray imaging system and method for inspecting commercial vehicles and cargo containers
US7809109B2 (en) * 2004-04-09 2010-10-05 American Science And Engineering, Inc. Multiple image collection and synthesis for personnel screening
DE602005019552D1 (de) * 2004-04-09 2010-04-08 American Science & Eng Inc Eliminierung von cross-talk in einem mehrere quellen umfassenden rückstreuungs-inspektionsportal durch sicherstellen, dass zu einem zeitpunkt jeweils nur eine quelle strahlung emittiert
US7471764B2 (en) 2005-04-15 2008-12-30 Rapiscan Security Products, Inc. X-ray imaging system having improved weather resistance
WO2007027760A2 (en) 2005-08-30 2007-03-08 Troxler Electronic Laboratories, Inc. Methods, systems, and computer program products for determining a property of construction material
US7605366B2 (en) * 2005-09-21 2009-10-20 Troxler Electronic Laboratories, Inc. Nuclear density gauge
EP2010943A2 (en) * 2006-04-21 2009-01-07 American Science & Engineering, Inc. X-ray imaging of baggage and personnel using arrays of discrete sources and multiple collimated beams
US7526064B2 (en) 2006-05-05 2009-04-28 Rapiscan Security Products, Inc. Multiple pass cargo inspection system
WO2008021807A2 (en) 2006-08-11 2008-02-21 American Science And Engineering, Inc. X-ray inspection with contemporaneous and proximal transmission and backscatter imaging
US8638904B2 (en) 2010-03-14 2014-01-28 Rapiscan Systems, Inc. Personnel screening system
US8576982B2 (en) 2008-02-01 2013-11-05 Rapiscan Systems, Inc. Personnel screening system
US8995619B2 (en) 2010-03-14 2015-03-31 Rapiscan Systems, Inc. Personnel screening system
US8716650B2 (en) * 2008-01-04 2014-05-06 Troxler Electronic Laboratories, Inc. Nuclear gauges and related methods of assembly
GB0809110D0 (en) 2008-05-20 2008-06-25 Rapiscan Security Products Inc Gantry scanner systems
MY154268A (en) * 2009-07-29 2015-05-29 American Science & Eng Inc Top-down x-ray inspection trailer
US8824632B2 (en) 2009-07-29 2014-09-02 American Science And Engineering, Inc. Backscatter X-ray inspection van with top-down imaging
CA2793225A1 (en) 2010-03-14 2011-09-22 Rapiscan Systems, Inc. Multiple screen detection systems
US8903046B2 (en) 2011-02-08 2014-12-02 Rapiscan Systems, Inc. Covert surveillance using multi-modality sensing
US9218933B2 (en) 2011-06-09 2015-12-22 Rapidscan Systems, Inc. Low-dose radiographic imaging system
KR102065318B1 (ko) 2012-02-03 2020-01-10 라피스캔 시스템스, 인코포레이티드 조합형 산란 및 투과 멀티-뷰 이미징 시스템
US10670740B2 (en) 2012-02-14 2020-06-02 American Science And Engineering, Inc. Spectral discrimination using wavelength-shifting fiber-coupled scintillation detectors
CN105379425B (zh) 2013-01-31 2018-03-27 瑞皮斯坎系统股份有限公司 便携式安全检查系统
US10515731B1 (en) 2013-03-14 2019-12-24 Troxler Electronic Laboratories, Inc. Nuclear Gauge
US11280898B2 (en) 2014-03-07 2022-03-22 Rapiscan Systems, Inc. Radar-based baggage and parcel inspection systems
AU2015227069B2 (en) 2014-03-07 2020-05-14 Rapiscan Systems, Inc. Ultra wide band detectors
WO2016012799A1 (en) 2014-07-24 2016-01-28 Johnson Matthey Public Limited Company Apparatus for determining thickness of lining layer
CN107251088A (zh) 2014-11-25 2017-10-13 拉皮斯坎系统股份有限公司 智能安全管理系统
WO2016154044A1 (en) 2015-03-20 2016-09-29 Rapiscan Systems, Inc. Hand-held portable backscatter inspection system
GB2572700A (en) 2016-09-30 2019-10-09 American Science & Eng Inc X-Ray source for 2D scanning beam imaging
SK8449Y1 (sk) * 2018-05-11 2019-05-06 Fulop Marko Zariadenie na odhaľovanie nelegálnych úkrytov v náklade železnej rudy
US10830911B2 (en) 2018-06-20 2020-11-10 American Science And Engineering, Inc. Wavelength-shifting sheet-coupled scintillation detectors
KR102609389B1 (ko) * 2019-01-30 2023-12-01 노드슨 코포레이션 복사선-기반의 두께 게이지
US11175245B1 (en) 2020-06-15 2021-11-16 American Science And Engineering, Inc. Scatter X-ray imaging with adaptive scanning beam intensity
US11340361B1 (en) 2020-11-23 2022-05-24 American Science And Engineering, Inc. Wireless transmission detector panel for an X-ray scanner
JP2022137873A (ja) * 2021-03-09 2022-09-22 東芝Ｉｔコントロールシステム株式会社 放射線検査装置
US12283389B2 (en) 2021-10-01 2025-04-22 Rapiscan Holdings, Inc. Methods and systems for the concurrent generation of multiple substantially similar X-ray beams
US12385854B2 (en) 2022-07-26 2025-08-12 Rapiscan Holdings, Inc. Methods and systems for performing on-the-fly automatic calibration adjustments of X-ray inspection systems

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US2781453A (en) * 1953-02-11 1957-02-12 Univ Cornell Methods and apparatus for determination of characteristics of matter in a surface layer
US2997586A (en) * 1955-08-16 1961-08-22 Serge A Scherbatskoy Gamma ray testing
US2943202A (en) * 1956-01-26 1960-06-28 Curtiss Wright Corp Apparatus for measuring wall thickness or density by radiation detection
US3148279A (en) * 1961-05-04 1964-09-08 Western Electric Co Radiation method of measuring sheath thickness and eccentricity
US3202822A (en) * 1961-11-13 1965-08-24 Phillips Petroleum Co Method of determining density utilizing a gamma ray source and a pair of detectors
US3497691A (en) * 1967-06-30 1970-02-24 Ohmart Corp Dual mode fluorescence and backscatter coating thickness measuring gauge
US3840746A (en) * 1971-12-13 1974-10-08 Applied Invention Corp Gamma ray density probe utilizing a pair of gamma ray sources and a gamma ray detector
JPS5222553B2 (enExample) * 1973-02-20 1977-06-17
US3854042A (en) * 1973-05-10 1974-12-10 A Ott Device for measuring the thickness of layers with a radionuclide irradiating the layer
DE2544354A1 (de) * 1975-10-03 1977-04-14 Siemens Ag Verfahren zur bestimmung der dichte von koerpern mittels durchdingender strahlen und geraet zu seiner durchfuehrung
US4297575A (en) * 1979-08-13 1981-10-27 Halliburton Company Simultaneous gamma ray measurement of formation bulk density and casing thickness

Also Published As

Publication number Publication date
IL71299A (en) 1988-11-15
ES8607546A1 (es) 1986-06-01
US4525854A (en) 1985-06-25
IL71299A0 (en) 1984-06-29
ZA842056B (en) 1984-10-31
ES531211A0 (es) 1986-06-01
EP0120676B1 (en) 1989-02-08
JPH0247697B2 (enExample) 1990-10-22
AU2598684A (en) 1984-09-27
AU557007B2 (en) 1986-11-27
NZ207628A (en) 1988-02-29
DE3476698D1 (en) 1989-03-16
EP0120676A2 (en) 1984-10-03
EP0120676A3 (en) 1985-06-12
JPS59218941A (ja) 1984-12-10
CA1219970A (en) 1987-03-31

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Legal Events

Date Code Title Description
UEP Publication of translation of european patent specification
REN Ceased due to non-payment of the annual fee