AU557007B2 - Radiation scatter testing - Google Patents

Radiation scatter testing

Info

Publication number
AU557007B2
AU557007B2 AU25986/84A AU2598684A AU557007B2 AU 557007 B2 AU557007 B2 AU 557007B2 AU 25986/84 A AU25986/84 A AU 25986/84A AU 2598684 A AU2598684 A AU 2598684A AU 557007 B2 AU557007 B2 AU 557007B2
Authority
AU
Australia
Prior art keywords
overlay
radiation
density
detector
values
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
AU25986/84A
Other languages
English (en)
Other versions
AU2598684A (en
Inventor
John L. Molbert
Eddie R. Riddle
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Troxler Electronic Laboratories Inc
Original Assignee
Troxler Electronic Laboratories Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Troxler Electronic Laboratories Inc filed Critical Troxler Electronic Laboratories Inc
Publication of AU2598684A publication Critical patent/AU2598684A/en
Application granted granted Critical
Publication of AU557007B2 publication Critical patent/AU557007B2/en
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/203—Measuring back scattering
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
    • G01B15/02—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness

Landscapes

  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Pathology (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Immunology (AREA)
  • Health & Medical Sciences (AREA)
  • Electromagnetism (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
  • Radiation-Therapy Devices (AREA)
  • Measurement Of Radiation (AREA)
  • Heating, Cooling, Or Curing Plastics Or The Like In General (AREA)
  • Crystals, And After-Treatments Of Crystals (AREA)
AU25986/84A 1983-03-20 1984-03-21 Radiation scatter testing Ceased AU557007B2 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US06/477,820 US4525854A (en) 1983-03-22 1983-03-22 Radiation scatter apparatus and method
US477820 1983-03-22

Publications (2)

Publication Number Publication Date
AU2598684A AU2598684A (en) 1984-09-27
AU557007B2 true AU557007B2 (en) 1986-11-27

Family

ID=23897498

Family Applications (1)

Application Number Title Priority Date Filing Date
AU25986/84A Ceased AU557007B2 (en) 1983-03-20 1984-03-21 Radiation scatter testing

Country Status (11)

Country Link
US (1) US4525854A (enExample)
EP (1) EP0120676B1 (enExample)
JP (1) JPS59218941A (enExample)
AT (1) ATE40750T1 (enExample)
AU (1) AU557007B2 (enExample)
CA (1) CA1219970A (enExample)
DE (1) DE3476698D1 (enExample)
ES (1) ES8607546A1 (enExample)
IL (1) IL71299A (enExample)
NZ (1) NZ207628A (enExample)
ZA (1) ZA842056B (enExample)

Cited By (2)

* Cited by examiner, † Cited by third party
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AU578501B2 (en) * 1984-02-09 1988-10-27 Kawasaki Steel Corporation Method of determining thickness and composition of alloy film
AU630933B2 (en) * 1987-03-31 1992-11-12 Adaptive Technologies Inc. Thickness/density measuring apparatus

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US4641030A (en) * 1984-12-13 1987-02-03 Troxler Electronic Laboratories, Inc. Apparatus and method for directly measuring the density of a thin layer
EP0244498B1 (de) * 1986-05-06 1991-06-12 Siemens Aktiengesellschaft Anordnung und Verfahren zur Ermittelung der Berechtigung von Personen durch Überprüfen ihrer Fingerabdrücke
US4979197A (en) * 1986-05-22 1990-12-18 Troxler Electronic Laboratories, Inc. Nuclear radiation apparatus and method for dynamically measuring density of test materials during compaction
GB2207502B (en) * 1986-12-25 1991-03-20 Inst Gornogo Dela Imeni Skochi Method of monitoring hidden coal-rock interface and transducer realizing this method
US4766319A (en) * 1987-02-12 1988-08-23 Troxler Electronic Laboratories, Inc. Portable nuclear moisture-density gauge with low activity nuclear sources
FR2629914B1 (fr) * 1988-04-06 1991-09-06 Aerospatiale Procede et dispositif pour determiner la masse volumique d'un volume elementaire de matiere
GB9417419D0 (en) 1994-08-30 1994-10-19 Mackenzie Innes Method of measuring film thickness and monitoring liquid flow using backscattered x-rays and gamma-rays
GB2323440A (en) * 1997-03-17 1998-09-23 Johnson & Johnson Medical Measuring thickness of a layer within a body
US6207462B1 (en) 1998-03-20 2001-03-27 Cem Corporation Microwave apparatus and method for analysis of asphalt-aggregate compositions
US6190917B1 (en) 1998-03-20 2001-02-20 Cem Corporation Microwave apparatus and method for analysis of asphalt-aggregate compositions
US6320933B1 (en) * 1998-11-30 2001-11-20 American Science And Engineering, Inc. Multiple scatter system for threat identification
US6310936B1 (en) 1999-03-03 2001-10-30 Troxler Electronic Laboratories, Inc. Thin layer nuclear density guage
US6284986B1 (en) * 1999-03-15 2001-09-04 Seh America, Inc. Method of determining the thickness of a layer on a silicon substrate
US6492641B1 (en) * 2000-06-29 2002-12-10 Troxler Electronic Laboratories, Inc. Apparatus and method for gamma-ray determination of bulk density of samples
US6567498B1 (en) * 2002-01-10 2003-05-20 Troxler Electronic Laboratories, Inc. Low activity nuclear density gauge
EP1357382A1 (en) * 2002-04-26 2003-10-29 Rijksuniversiteit te Groningen Method and system for determining a property of a pavement by measuring natural gamma radiation
US7963695B2 (en) 2002-07-23 2011-06-21 Rapiscan Systems, Inc. Rotatable boom cargo scanning system
US8503605B2 (en) 2002-07-23 2013-08-06 Rapiscan Systems, Inc. Four sided imaging system and method for detection of contraband
US9958569B2 (en) 2002-07-23 2018-05-01 Rapiscan Systems, Inc. Mobile imaging system and method for detection of contraband
US8275091B2 (en) 2002-07-23 2012-09-25 Rapiscan Systems, Inc. Compact mobile cargo scanning system
US6995667B2 (en) * 2002-12-23 2006-02-07 Instrotek, Inc. Systems, methods, and computer program products for automatic tracking and/or remote monitoring of nuclear gauges and/or data communication therewith
US6928141B2 (en) 2003-06-20 2005-08-09 Rapiscan, Inc. Relocatable X-ray imaging system and method for inspecting commercial vehicles and cargo containers
US7809109B2 (en) * 2004-04-09 2010-10-05 American Science And Engineering, Inc. Multiple image collection and synthesis for personnel screening
US7400701B1 (en) * 2004-04-09 2008-07-15 American Science And Engineering, Inc. Backscatter inspection portal
US7471764B2 (en) 2005-04-15 2008-12-30 Rapiscan Security Products, Inc. X-ray imaging system having improved weather resistance
WO2007027760A2 (en) * 2005-08-30 2007-03-08 Troxler Electronic Laboratories, Inc. Methods, systems, and computer program products for determining a property of construction material
US7605366B2 (en) * 2005-09-21 2009-10-20 Troxler Electronic Laboratories, Inc. Nuclear density gauge
CN101467071B (zh) * 2006-04-21 2012-06-13 美国科技工程公司 使用分立源阵列和多个准直束的对于行李和人员的x射线成像
US7526064B2 (en) 2006-05-05 2009-04-28 Rapiscan Security Products, Inc. Multiple pass cargo inspection system
PL2049888T3 (pl) 2006-08-11 2014-08-29 American Science & Eng Inc Badanie z wykorzystaniem promieniowania rentgenowskiego z równoczesną i proksymalną transmisją i obrazowanie rozpraszania wstecznego
US8638904B2 (en) 2010-03-14 2014-01-28 Rapiscan Systems, Inc. Personnel screening system
US8995619B2 (en) 2010-03-14 2015-03-31 Rapiscan Systems, Inc. Personnel screening system
US8576982B2 (en) 2008-02-01 2013-11-05 Rapiscan Systems, Inc. Personnel screening system
EP2238600A4 (en) 2008-01-04 2016-12-21 Troxler Electronic Lab Inc NUCLEAR MEASURING DEVICES AND METHOD FOR CONFIGURING AND CALIBRATING NUCLEAR MEASURING EQUIPMENT
GB0809110D0 (en) 2008-05-20 2008-06-25 Rapiscan Security Products Inc Gantry scanner systems
US8824632B2 (en) 2009-07-29 2014-09-02 American Science And Engineering, Inc. Backscatter X-ray inspection van with top-down imaging
MY154268A (en) * 2009-07-29 2015-05-29 American Science & Eng Inc Top-down x-ray inspection trailer
WO2011115929A1 (en) 2010-03-14 2011-09-22 Rapiscan Systems, Inc. Multiple screen detection systems
EP2673660B1 (en) 2011-02-08 2017-08-30 Rapiscan Systems, Inc. Covert surveillance using multi-modality sensing
US9218933B2 (en) 2011-06-09 2015-12-22 Rapidscan Systems, Inc. Low-dose radiographic imaging system
PL3242315T3 (pl) 2012-02-03 2024-02-19 Rapiscan Systems, Inc. Rentgenowski układ inspekcyjny do skanowania obiektu
US10670740B2 (en) 2012-02-14 2020-06-02 American Science And Engineering, Inc. Spectral discrimination using wavelength-shifting fiber-coupled scintillation detectors
CA2898654C (en) 2013-01-31 2020-02-25 Rapiscan Systems, Inc. Portable security inspection system
US10515731B1 (en) 2013-03-14 2019-12-24 Troxler Electronic Laboratories, Inc. Nuclear Gauge
GB2538921B (en) 2014-03-07 2020-06-03 Rapiscan Systems Inc Ultra wide band detectors
US11280898B2 (en) 2014-03-07 2022-03-22 Rapiscan Systems, Inc. Radar-based baggage and parcel inspection systems
WO2016012799A1 (en) 2014-07-24 2016-01-28 Johnson Matthey Public Limited Company Apparatus for determining thickness of lining layer
AU2015353439A1 (en) 2014-11-25 2017-06-29 Rapiscan Systems, Inc. Intelligent security management system
WO2016154044A1 (en) 2015-03-20 2016-09-29 Rapiscan Systems, Inc. Hand-held portable backscatter inspection system
CN109791811A (zh) 2016-09-30 2019-05-21 美国科学及工程股份有限公司 用于2d扫描光束成像的x射线源
SK8449Y1 (sk) * 2018-05-11 2019-05-06 Fulop Marko Zariadenie na odhaľovanie nelegálnych úkrytov v náklade železnej rudy
CN112424644A (zh) 2018-06-20 2021-02-26 美国科学及工程股份有限公司 波长偏移片耦合的闪烁检测器
KR102609389B1 (ko) * 2019-01-30 2023-12-01 노드슨 코포레이션 복사선-기반의 두께 게이지
US11175245B1 (en) 2020-06-15 2021-11-16 American Science And Engineering, Inc. Scatter X-ray imaging with adaptive scanning beam intensity
US11340361B1 (en) 2020-11-23 2022-05-24 American Science And Engineering, Inc. Wireless transmission detector panel for an X-ray scanner
JP2022137873A (ja) * 2021-03-09 2022-09-22 東芝Ｉｔコントロールシステム株式会社 放射線検査装置
GB2624599B (en) 2021-10-01 2026-08-05 Rapiscan Holdings Inc Methods and systems for the concurrent generation of multiple substantially similar X-ray beams
WO2024026152A1 (en) 2022-07-26 2024-02-01 Rapiscan Holdings, Inc. Methods and systems for performing on-the-fly automatic calibration adjustments of x-ray inspection systems

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US2781453A (en) * 1953-02-11 1957-02-12 Univ Cornell Methods and apparatus for determination of characteristics of matter in a surface layer
US2997586A (en) * 1955-08-16 1961-08-22 Serge A Scherbatskoy Gamma ray testing
US2943202A (en) * 1956-01-26 1960-06-28 Curtiss Wright Corp Apparatus for measuring wall thickness or density by radiation detection
US3148279A (en) * 1961-05-04 1964-09-08 Western Electric Co Radiation method of measuring sheath thickness and eccentricity
US3202822A (en) * 1961-11-13 1965-08-24 Phillips Petroleum Co Method of determining density utilizing a gamma ray source and a pair of detectors
US3497691A (en) * 1967-06-30 1970-02-24 Ohmart Corp Dual mode fluorescence and backscatter coating thickness measuring gauge
US3840746A (en) * 1971-12-13 1974-10-08 Applied Invention Corp Gamma ray density probe utilizing a pair of gamma ray sources and a gamma ray detector
JPS5222553B2 (enExample) * 1973-02-20 1977-06-17
US3854042A (en) * 1973-05-10 1974-12-10 A Ott Device for measuring the thickness of layers with a radionuclide irradiating the layer
DE2544354A1 (de) * 1975-10-03 1977-04-14 Siemens Ag Verfahren zur bestimmung der dichte von koerpern mittels durchdingender strahlen und geraet zu seiner durchfuehrung
US4297575A (en) * 1979-08-13 1981-10-27 Halliburton Company Simultaneous gamma ray measurement of formation bulk density and casing thickness

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
AU578501B2 (en) * 1984-02-09 1988-10-27 Kawasaki Steel Corporation Method of determining thickness and composition of alloy film
AU630933B2 (en) * 1987-03-31 1992-11-12 Adaptive Technologies Inc. Thickness/density measuring apparatus

Also Published As

Publication number Publication date
ZA842056B (en) 1984-10-31
ES8607546A1 (es) 1986-06-01
ES531211A0 (es) 1986-06-01
US4525854A (en) 1985-06-25
NZ207628A (en) 1988-02-29
CA1219970A (en) 1987-03-31
ATE40750T1 (de) 1989-02-15
DE3476698D1 (en) 1989-03-16
AU2598684A (en) 1984-09-27
IL71299A (en) 1988-11-15
JPH0247697B2 (enExample) 1990-10-22
JPS59218941A (ja) 1984-12-10
EP0120676A3 (en) 1985-06-12
EP0120676B1 (en) 1989-02-08
EP0120676A2 (en) 1984-10-03
IL71299A0 (en) 1984-06-29

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