ATE407430T1 - Optische vorrichtung zur messung von modulierten lichtsignalen - Google Patents

Optische vorrichtung zur messung von modulierten lichtsignalen

Info

Publication number
ATE407430T1
ATE407430T1 AT05021500T AT05021500T ATE407430T1 AT E407430 T1 ATE407430 T1 AT E407430T1 AT 05021500 T AT05021500 T AT 05021500T AT 05021500 T AT05021500 T AT 05021500T AT E407430 T1 ATE407430 T1 AT E407430T1
Authority
AT
Austria
Prior art keywords
signal light
light path
interferometer
probe
detector
Prior art date
Application number
AT05021500T
Other languages
English (en)
Inventor
Nenad Ocelic
Rainer Hillenbrand
Original Assignee
Max Planck Gesellschaft
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Max Planck Gesellschaft filed Critical Max Planck Gesellschaft
Application granted granted Critical
Publication of ATE407430T1 publication Critical patent/ATE407430T1/de

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01QSCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q60/00Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
    • G01Q60/18SNOM [Scanning Near-Field Optical Microscopy] or apparatus therefor, e.g. SNOM probes
    • G01Q60/22Probes, their manufacture, or their related instrumentation, e.g. holders
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B82NANOTECHNOLOGY
    • B82YSPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y20/00Nanooptics, e.g. quantum optics or photonic crystals
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B82NANOTECHNOLOGY
    • B82YSPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y35/00Methods or apparatus for measurement or analysis of nanostructures
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11BINFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B7/00Recording or reproducing by optical means, e.g. recording using a thermal beam of optical radiation by modifying optical properties or the physical structure, reproducing using an optical beam at lower power by sensing optical properties; Record carriers therefor
    • G11B7/004Recording, reproducing or erasing methods; Read, write or erase circuits therefor
    • G11B7/005Reproducing
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11BINFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B7/00Recording or reproducing by optical means, e.g. recording using a thermal beam of optical radiation by modifying optical properties or the physical structure, reproducing using an optical beam at lower power by sensing optical properties; Record carriers therefor
    • G11B7/12Heads, e.g. forming of the optical beam spot or modulation of the optical beam
    • G11B7/135Means for guiding the beam from the source to the record carrier or from the record carrier to the detector
    • G11B7/1387Means for guiding the beam from the source to the record carrier or from the record carrier to the detector using the near-field effect

Landscapes

  • Chemical & Material Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Nanotechnology (AREA)
  • Engineering & Computer Science (AREA)
  • Optics & Photonics (AREA)
  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Radiology & Medical Imaging (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Analytical Chemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Biophysics (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Instruments For Measurement Of Length By Optical Means (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
AT05021500T 2005-09-30 2005-09-30 Optische vorrichtung zur messung von modulierten lichtsignalen ATE407430T1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
EP05021500A EP1770714B1 (de) 2005-09-30 2005-09-30 Optische Vorrichtung zur Messung von modulierten Lichtsignalen

Publications (1)

Publication Number Publication Date
ATE407430T1 true ATE407430T1 (de) 2008-09-15

Family

ID=35311504

Family Applications (1)

Application Number Title Priority Date Filing Date
AT05021500T ATE407430T1 (de) 2005-09-30 2005-09-30 Optische vorrichtung zur messung von modulierten lichtsignalen

Country Status (6)

Country Link
US (1) US7738115B2 (de)
EP (1) EP1770714B1 (de)
AT (1) ATE407430T1 (de)
DE (1) DE602005009540D1 (de)
ES (1) ES2313179T3 (de)
WO (1) WO2007039210A1 (de)

Families Citing this family (42)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10955327B2 (en) * 2004-03-06 2021-03-23 Michael Trainer Method and apparatus for determining particle characteristics utilizing a plurality of beam splitting functions and correction of scattered light
US8705040B2 (en) * 2004-03-06 2014-04-22 Michael Trainer Methods and apparatus for determining particle characteristics by measuring scattered light
US7933025B2 (en) * 2006-12-18 2011-04-26 Zygo Corporation Sinusoidal phase shifting interferometry
JP5183989B2 (ja) * 2007-07-19 2013-04-17 株式会社ミツトヨ 形状測定装置
FR2922307B1 (fr) * 2007-10-10 2017-03-24 Centre Nat Rech Scient Procede et dispositif de caracterisation d'elements microscopiques
US8564961B2 (en) * 2007-11-30 2013-10-22 Apple Inc. Methods and apparatus for providing holes through portions of a housing of an electronic device
CN101620357B (zh) * 2008-07-02 2012-06-13 昂纳信息技术(深圳)有限公司 一种光信号解调器和解调方法
US8004750B1 (en) * 2008-09-07 2011-08-23 Optoplex Corporation Multiple-FSR DPSK demodulator
US20140223612A1 (en) * 2013-02-05 2014-08-07 Asylum Corporation Modular Atomic Force Microscope
WO2010045400A2 (en) * 2008-10-14 2010-04-22 Tissuevision, Inc. Devices and methods for direct sampling analog time-resolved detection
US7948637B2 (en) * 2009-03-20 2011-05-24 Zygo Corporation Error compensation in phase shifting interferometry
US20110043814A1 (en) * 2009-08-24 2011-02-24 Raytheon Company Ultra stable short pulse remote sensor
KR101691560B1 (ko) * 2009-11-24 2017-01-10 삼성디스플레이 주식회사 표시기판 및 이의 제조방법
DE102010013829A1 (de) * 2010-03-26 2011-09-29 Carl Zeiss Microlmaging Gmbh Mikroskop und Verfahren zur Erfassung von Probenlicht
JP2014507663A (ja) 2011-02-23 2014-03-27 アール・エイチ・ケイ・テクノロジー・インコーポレイテッド 統合型顕微鏡ならびに関連する方法および装置
EP2613159A1 (de) 2012-01-05 2013-07-10 Neaspec GmbH Messverfahren eines Nahfeldsignals
CN104428643B (zh) * 2012-06-04 2017-10-13 英派尔科技开发有限公司 集成式拉曼光谱检测器
US8646110B1 (en) * 2012-11-27 2014-02-04 Xiaoji Xu Method to obtain absorption spectra from near-field infrared scattering using homodyne detection
US9778282B2 (en) * 2013-03-15 2017-10-03 Anasys Instruments Method and apparatus for infrared scattering scanning near-field optical microscopy with high speed point spectroscopy
US9658247B2 (en) 2013-03-15 2017-05-23 Anasys Instruments Method and apparatus for infrared scattering scanning near-field optical microscopy with high speed point spectroscopy
EP3467518B1 (de) 2013-03-15 2024-01-03 Bruker Nano, Inc. Chemische nanoidentifizierung einer probe mittels normalisierter nahfeldspektroskopie
FR3010555B1 (fr) * 2013-09-11 2019-12-20 Universite De Technologie De Troyes Procede electronique d'extraction de l'amplitude et de la phase d'un signal dans une detection synchrone et son application dans des montages interferometriques.
WO2015126826A1 (en) * 2014-02-19 2015-08-27 Bruker Nano, Inc. Field-mapping and focal-spot tracking for s-snom
EP3067701A1 (de) 2015-03-13 2016-09-14 Asociación-centro De Investigación Cooperativa En Nanociencias - CIC Nanogune Optisches Nahfeldmikroskop zur Erfassung von Spektren
US10822943B2 (en) 2015-04-13 2020-11-03 Halliburton Energy Services, Inc. Modulating downhole reflector
US10228389B2 (en) * 2015-12-02 2019-03-12 Bruker Nano, Inc. Method and apparatus for infrared scattering scanning near-field optical microscopy with background suppression
US10408049B2 (en) 2015-12-03 2019-09-10 Halliburton Energy Services, Inc. Downhole telemetry using adaptive feedback
US10241131B2 (en) * 2016-08-28 2019-03-26 Bruker Nano, Inc. Method and apparatus for chemical and optical imaging with a broadband source
EP3404424A1 (de) * 2017-05-15 2018-11-21 Nederlandse Organisatie voor toegepast- natuurwetenschappelijk onderzoek TNO Rastersondenmikroskopiesystem und verfahren zur abbildung von nanostrukturen auf der oberfläche einer probe
US11415597B2 (en) 2018-01-22 2022-08-16 Lehigh University System and method for a non-tapping mode scattering-type scanning near-field optical microscopy
US11391834B2 (en) * 2018-02-28 2022-07-19 Illusense, Inc. Method and device for interferometric range measurements
CN112424562B (zh) * 2018-05-18 2023-07-07 密歇根大学董事会 用于频率调制干涉仪的路径波动监测
US11493323B2 (en) * 2019-01-03 2022-11-08 The Board Of Trustees Of The University Of Illinois Infrared-optical hybrid imaging technology for all-digital histopathology
JP6834116B2 (ja) * 2020-02-26 2021-02-24 株式会社東京精密 距離測定装置及び距離測定方法
CN111693133B (zh) * 2020-06-24 2022-04-15 中国电子产品可靠性与环境试验研究所((工业和信息化部电子第五研究所)(中国赛宝实验室)) 光纤水听器光程差测试装置、方法、计算机设备
EP3940393A1 (de) 2020-07-17 2022-01-19 attocube systems AG Verfahren zur referenzierung einer nahfeldmessung mit drift- und fluktuationskorrektur
CA3200738A1 (en) 2020-12-08 2022-06-16 Kyzyl HERZOG Method and system for simultaneous detection of signed doppler shifts and range measurements
CN115912036B (zh) * 2021-08-04 2025-09-09 中国科学院西安光学精密机械研究所 光纤拉伸器以及频率可调的全光纤超短脉冲激光器
CN114184276B (zh) * 2021-11-05 2025-03-14 深圳华迈兴微医疗科技有限公司 一种基于光纤的多通道采光方法及装置
CN115164715B (zh) * 2022-06-21 2025-11-18 清华大学 一种零差激光干涉仪信号鉴相方法及装置
CN115459862A (zh) * 2022-08-30 2022-12-09 武汉滨湖电子有限责任公司 一种基于射频响应互补的光子辅助瞬时测频装置及方法
DE102023108849A1 (de) * 2023-04-06 2024-10-10 Humboldt-Universität zu Berlin, Körperschaft des öffentlichen Rechts Optische Anordnung und Verfahren zum Erzeugen eines Messsignals

Family Cites Families (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2704601B2 (ja) * 1993-04-12 1998-01-26 セイコーインスツルメンツ株式会社 走査型近視野原子間力顕微鏡、及びその顕微鏡に使用されるプローブ、及びそのプローブの製造方法
AU3152795A (en) * 1994-07-28 1996-02-22 Victor B. Kley Scanning probe microscope assembly
US6337479B1 (en) * 1994-07-28 2002-01-08 Victor B. Kley Object inspection and/or modification system and method
US6339217B1 (en) * 1995-07-28 2002-01-15 General Nanotechnology Llc Scanning probe microscope assembly and method for making spectrophotometric, near-field, and scanning probe measurements
US5565987A (en) * 1995-03-23 1996-10-15 Anvik Corporation Fabry-Perot probe profilometer having feedback loop to maintain resonance
US5623339A (en) * 1995-08-04 1997-04-22 International Business Machines Corporation Interferometric measuring method based on multi-pole sensing
US5939709A (en) * 1997-06-19 1999-08-17 Ghislain; Lucien P. Scanning probe optical microscope using a solid immersion lens
DE10035134B4 (de) * 2000-07-19 2006-06-01 MAX-PLANCK-Gesellschaft zur Förderung der Wissenschaften e.V. Verfahren und Vorrichtung zur optischen Nahfeldmikroskopie
US6667809B2 (en) * 2000-07-27 2003-12-23 Zetetic Institute Scanning interferometric near-field confocal microscopy with background amplitude reduction and compensation
US6643012B2 (en) * 2001-02-23 2003-11-04 National University Of Singapore Apertureless near-field scanning raman microscopy using reflection scattering geometry
JP4076792B2 (ja) * 2001-06-19 2008-04-16 独立行政法人科学技術振興機構 カンチレバーアレイ、その製造方法及びその装置
US6718821B1 (en) * 2001-11-07 2004-04-13 Sandia Corporation Laser interferometry force-feedback sensor for an interfacial force microscope
US6650420B2 (en) * 2002-02-27 2003-11-18 The United States Of America As Represented By The Secretary Of The Navy Nanoscale vibrometric measurement apparatus and method
DE10228123B4 (de) * 2002-06-24 2011-09-15 MAX-PLANCK-Gesellschaft zur Förderung der Wissenschaften e.V. Verfahren und Vorrichtungen zur Erfassung von optischen Nahfeldwechselwirkungssignalen
JP3958206B2 (ja) * 2002-12-27 2007-08-15 独立行政法人科学技術振興機構 マルチカンチレバーの振動周波数の計測方法及び装置
US6985223B2 (en) * 2003-03-07 2006-01-10 Purdue Research Foundation Raman imaging and sensing apparatus employing nanoantennas
JP2008051556A (ja) * 2006-08-22 2008-03-06 Sii Nanotechnology Inc 光学式変位検出機構及びそれを用いた表面情報計測装置
JP5122775B2 (ja) * 2006-08-23 2013-01-16 株式会社ミツトヨ 測定装置
US8156568B2 (en) * 2007-04-27 2012-04-10 Picocal, Inc. Hybrid contact mode scanning cantilever system
US8402819B2 (en) * 2007-05-15 2013-03-26 Anasys Instruments, Inc. High frequency deflection measurement of IR absorption
JP5183989B2 (ja) * 2007-07-19 2013-04-17 株式会社ミツトヨ 形状測定装置

Also Published As

Publication number Publication date
US7738115B2 (en) 2010-06-15
WO2007039210A1 (en) 2007-04-12
US20080285041A1 (en) 2008-11-20
ES2313179T3 (es) 2009-03-01
DE602005009540D1 (de) 2008-10-16
EP1770714B1 (de) 2008-09-03
EP1770714A1 (de) 2007-04-04

Similar Documents

Publication Publication Date Title
ATE407430T1 (de) Optische vorrichtung zur messung von modulierten lichtsignalen
Todd et al. Improved, operationally-passive interferometric demodulation method using 3× 3 coupler
WO2009064670A3 (en) Interferometer utilizing polarization scanning
CN105136175B (zh) 一种基于自混频技术的相位敏感光时域反射系统
JP6241283B2 (ja) レーダ装置および距離速度測定方法
CN101893562B (zh) 基于数字式微滴进样通道的高灵敏度集成光波导传感器件
CN109141490B (zh) 一种扰动波形和位置同时测量的光纤传感装置和解调方法
Orozco Synchronous detectors facilitate precision, low-level measurements
EP1136811A4 (de) Verfahren und vorrichtung zur messung der inneren eigenschaften eines streuenden absorbers
US8630551B2 (en) Method and system for characterizing an optical device
WO2007056772A3 (en) Modulation cancellation method in laser spectroscopy
WO2003060422A3 (de) Interferometrische optische anordnung
CN111751845A (zh) 用于气体检测的激光雷达频率锁定装置及方法
KR100483147B1 (ko) 광섬유 길이 측정시스템 및 측정방법
WO2002010705A3 (en) Electromagnetic and optical analyzer
DE50307538D1 (de) Faseroptischer stromsensor mit mehreren sensorköpfen
ATE456022T1 (de) Verfahren zur interferenzmessung und vorrichtung zur interferenzmessung
DE60313479D1 (de) Vorrichtung zur messung einer optischen weglängenveränderung
CN108709506B (zh) 一种光纤位移传感探头及光纤位移传感系统
CA2743694C (en) Method and device for spatially resolved measuring of a physical variable
US7688451B2 (en) Heterodyne interferometer having an optical modulator
JP4213877B2 (ja) マッハツェンダ干渉計光センサ
CN207280928U (zh) 一种基于数字锁相的抗杂散光干扰光电检测系统
RU2350930C1 (ru) Фотоэлектрический анализатор
DE60239083D1 (de) Apparat und verfahren zur messung der chromatischen dispersion bei variablen wellenlängen

Legal Events

Date Code Title Description
RER Ceased as to paragraph 5 lit. 3 law introducing patent treaties