ATE385324T1 - Lichtempfindliche harzzusammensetzungen - Google Patents
Lichtempfindliche harzzusammensetzungenInfo
- Publication number
- ATE385324T1 ATE385324T1 AT99950005T AT99950005T ATE385324T1 AT E385324 T1 ATE385324 T1 AT E385324T1 AT 99950005 T AT99950005 T AT 99950005T AT 99950005 T AT99950005 T AT 99950005T AT E385324 T1 ATE385324 T1 AT E385324T1
- Authority
- AT
- Austria
- Prior art keywords
- group
- mixtures
- diol
- photosensitive resin
- heterocyclic
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/022—Quinonediazides
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08G—MACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
- C08G73/00—Macromolecular compounds obtained by reactions forming a linkage containing nitrogen with or without oxygen or carbon in the main chain of the macromolecule, not provided for in groups C08G12/00 - C08G71/00
- C08G73/06—Polycondensates having nitrogen-containing heterocyclic rings in the main chain of the macromolecule
- C08G73/22—Polybenzoxazoles
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/0045—Photosensitive materials with organic non-macromolecular light-sensitive compounds not otherwise provided for, e.g. dissolution inhibitors
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/022—Quinonediazides
- G03F7/0226—Quinonediazides characterised by the non-macromolecular additives
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/022—Quinonediazides
- G03F7/023—Macromolecular quinonediazides; Macromolecular additives, e.g. binders
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/022—Quinonediazides
- G03F7/023—Macromolecular quinonediazides; Macromolecular additives, e.g. binders
- G03F7/0233—Macromolecular quinonediazides; Macromolecular additives, e.g. binders characterised by the polymeric binders or the macromolecular additives other than the macromolecular quinonediazides
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/038—Macromolecular compounds which are rendered insoluble or differentially wettable
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/039—Macromolecular compounds which are photodegradable, e.g. positive electron resists
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/039—Macromolecular compounds which are photodegradable, e.g. positive electron resists
- G03F7/0392—Macromolecular compounds which are photodegradable, e.g. positive electron resists the macromolecular compound being present in a chemically amplified positive photoresist composition
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/075—Silicon-containing compounds
- G03F7/0751—Silicon-containing compounds used as adhesion-promoting additives or as means to improve adhesion
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/075—Silicon-containing compounds
- G03F7/0755—Non-macromolecular compounds containing Si-O, Si-C or Si-N bonds
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Chemical & Material Sciences (AREA)
- Medicinal Chemistry (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Health & Medical Sciences (AREA)
- Polymers & Plastics (AREA)
- Organic Chemistry (AREA)
- Materials For Photolithography (AREA)
- Macromonomer-Based Addition Polymer (AREA)
- Compositions Of Macromolecular Compounds (AREA)
- Addition Polymer Or Copolymer, Post-Treatments, Or Chemical Modifications (AREA)
- Macromolecular Compounds Obtained By Forming Nitrogen-Containing Linkages In General (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US10269498P | 1998-10-01 | 1998-10-01 | |
US09/406,007 US6127086A (en) | 1998-10-01 | 1999-09-24 | Photosensitive resin compositions |
Publications (1)
Publication Number | Publication Date |
---|---|
ATE385324T1 true ATE385324T1 (de) | 2008-02-15 |
Family
ID=26799635
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
AT99950005T ATE385324T1 (de) | 1998-10-01 | 1999-09-29 | Lichtempfindliche harzzusammensetzungen |
Country Status (8)
Country | Link |
---|---|
US (1) | US6127086A (de) |
EP (1) | EP1171802B1 (de) |
JP (1) | JP4088910B2 (de) |
KR (1) | KR100767197B1 (de) |
AT (1) | ATE385324T1 (de) |
DE (1) | DE69938082T2 (de) |
TW (1) | TWI229238B (de) |
WO (1) | WO2000019275A1 (de) |
Families Citing this family (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6214516B1 (en) * | 1998-10-01 | 2001-04-10 | Arch Specialty Chemicals, Inc. | Photosensitive resin compositions |
EP1554033A4 (de) * | 2002-02-06 | 2007-12-05 | Fujifilm Electronic Materials | Verbesserte zusammensetzungen zur entfernung von randperlen von halbleiterbelastungspufferbeschichtungen und verfahren zu ihrer verwendung |
WO2004081663A2 (en) * | 2003-03-11 | 2004-09-23 | Arch Specialty Chemicals, Inc. | Novel photosensitive resin compositions |
KR20060002751A (ko) * | 2003-03-11 | 2006-01-09 | 후지필름 일렉트로닉 머티리얼스 유.에스.에이., 아이엔씨. | 새로운 감광성 수지 조성물들 |
US7195849B2 (en) * | 2003-03-11 | 2007-03-27 | Arch Specialty Chemicals, Inc. | Photosensitive resin compositions |
JP2007525545A (ja) * | 2003-03-11 | 2007-09-06 | フジフィルム・エレクトロニック・マテリアルズ・ユーエスエイ・インコーポレイテッド | 新規な感光性樹脂組成物 |
EP1636648B1 (de) * | 2003-06-05 | 2015-08-12 | FujiFilm Electronic Materials USA, Inc. | Neuartige positiv-lichtempfindliche harzzusammensetzungen |
TW200512543A (en) * | 2003-08-06 | 2005-04-01 | Sumitomo Bakelite Co | Polyamide resin, positive-working photosensitive resin composition, method for producing pattern-formed resin film, semiconductor device, display device, and method for producing the semiconductor device and the display device |
TWI363249B (en) * | 2003-10-15 | 2012-05-01 | Fujifilm Electronic Materials | Novel photosensitive resin compositions |
EP1885819A2 (de) * | 2005-06-03 | 2008-02-13 | FujiFilm Electronic Materials USA, Inc. | Zusammensetzungen zur vorbehandlung |
JP4530949B2 (ja) * | 2005-08-29 | 2010-08-25 | 富士フイルム株式会社 | 感光性樹脂組成物及びそれを用いた半導体装置の製造方法 |
TW200927832A (en) * | 2007-10-16 | 2009-07-01 | Fujifilm Electronic Materials | Novel photosensitive resin compositions |
KR102605655B1 (ko) | 2017-06-16 | 2023-11-23 | 후지필름 일렉트로닉 머티리얼스 유.에스.에이., 아이엔씨. | 다층 구조물 |
WO2021146033A1 (en) | 2020-01-16 | 2021-07-22 | Fujifilm Electronic Materials U.S.A., Inc. | Dry film |
Family Cites Families (34)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE2931297A1 (de) * | 1979-08-01 | 1981-02-19 | Siemens Ag | Waermebestaendige positivresists und verfahren zur herstellung waermebestaendiger reliefstrukturen |
JPS57202536A (en) * | 1981-06-09 | 1982-12-11 | Fujitsu Ltd | Positive type resist composition |
US4684597A (en) * | 1985-10-25 | 1987-08-04 | Eastman Kodak Company | Non-precipitating quinone diazide polymer containing photoresist composition with o-quinone diazide trisester as dissolution inhibitor |
US5037720A (en) * | 1987-07-21 | 1991-08-06 | Hoechst Celanese Corporation | Hydroxylated aromatic polyamide polymer containing bound naphthoquinone diazide photosensitizer, method of making and use |
US4957846A (en) * | 1988-12-27 | 1990-09-18 | Olin Hunt Specialty Products Inc. | Radiation sensitive compound and mixtures with trinuclear novolak oligomer with o-naphthoquinone diazide sulfonyl group |
EP0388482B1 (de) * | 1989-03-20 | 1994-07-06 | Siemens Aktiengesellschaft | Lichtempfindliches Gemisch |
JPH087434B2 (ja) * | 1989-10-30 | 1996-01-29 | 日本ゼオン株式会社 | ポジ型レジスト組成物 |
JP2813033B2 (ja) * | 1990-05-25 | 1998-10-22 | 東京応化工業株式会社 | ポジ型感光性樹脂組成物 |
JP2877895B2 (ja) * | 1990-05-29 | 1999-04-05 | 住友ベークライト株式会社 | ポジ型感光性樹脂組成物 |
DE69131529T2 (de) * | 1990-05-29 | 2000-01-20 | Sumitomo Bakelite Co. Ltd., Tokio/Tokyo | Positiv arbeitende lichtempfindliche Harzzusammensetzung |
JPH087436B2 (ja) * | 1990-07-06 | 1996-01-29 | 住友ベークライト株式会社 | 感光性ジアゾキノン化合物及びそれを用いたポジ型感光性樹脂組成物 |
JPH04251849A (ja) * | 1991-01-29 | 1992-09-08 | Fuji Photo Film Co Ltd | 感電離放射線性樹脂組成物 |
JP3000705B2 (ja) * | 1991-03-20 | 2000-01-17 | 日本ゼオン株式会社 | ポジ型レジスト組成物 |
JPH0548063A (ja) * | 1991-03-25 | 1993-02-26 | Hitachi Ltd | カラー固体撮像素子及びその製造方法 |
JP2817441B2 (ja) * | 1991-03-29 | 1998-10-30 | 日本ゼオン株式会社 | ポジ型レジスト組成物 |
JP2981024B2 (ja) * | 1991-07-05 | 1999-11-22 | 住友ベークライト株式会社 | ポジ型感光性樹脂組成物 |
JPH0537720A (ja) * | 1991-07-31 | 1993-02-12 | Kuraray Co Ltd | 光学読取り装置用のパツド |
US5296330A (en) * | 1991-08-30 | 1994-03-22 | Ciba-Geigy Corp. | Positive photoresists containing quinone diazide photosensitizer, alkali-soluble resin and tetra(hydroxyphenyl) alkane additive |
US5302489A (en) * | 1991-10-29 | 1994-04-12 | E. I. Du Pont De Nemours And Company | Positive photoresist compositions containing base polymer which is substantially insoluble at pH between 7 and 10, quinonediazide acid generator and silanol solubility enhancer |
JP2626479B2 (ja) * | 1993-06-29 | 1997-07-02 | 日本ゼオン株式会社 | ポジ型レジスト組成物 |
JPH07168355A (ja) * | 1993-12-13 | 1995-07-04 | Sumitomo Chem Co Ltd | ポジ型レジスト組成物 |
JPH0895240A (ja) * | 1994-07-26 | 1996-04-12 | Nippon Zeon Co Ltd | ポジ型レジスト組成物 |
US5541033A (en) * | 1995-02-01 | 1996-07-30 | Ocg Microelectronic Materials, Inc. | Selected o-quinonediazide sulfonic acid esters of phenolic compounds and their use in radiation-sensitive compositions |
JP3499032B2 (ja) * | 1995-02-02 | 2004-02-23 | ダウ コーニング アジア株式会社 | 放射線硬化性組成物、その硬化方法及びパターン形成方法 |
JP3664334B2 (ja) * | 1995-04-27 | 2005-06-22 | 富士写真フイルム株式会社 | ポジ型フォトレジスト組成物 |
JPH0915853A (ja) * | 1995-04-27 | 1997-01-17 | Fuji Photo Film Co Ltd | ポジ型フォトレジスト組成物 |
JP3467118B2 (ja) * | 1995-05-24 | 2003-11-17 | 富士写真フイルム株式会社 | ポジ型フォトレジスト組成物 |
JPH09127690A (ja) * | 1995-10-30 | 1997-05-16 | Shin Etsu Chem Co Ltd | ポジ型フォトレジスト材料 |
US5856065A (en) * | 1996-03-27 | 1999-01-05 | Olin Microelectronic Chemicals, Inc. | Negative working photoresist composition based on polyimide primers |
US6051358A (en) * | 1997-11-04 | 2000-04-18 | Shipley Company, L.L.C. | Photoresist with novel photoactive compound |
JP3449933B2 (ja) * | 1997-12-09 | 2003-09-22 | 住友ベークライト株式会社 | ポジ型感光性樹脂組成物及びそれを用いた半導体装置 |
JP3992351B2 (ja) * | 1998-03-12 | 2007-10-17 | 住友ベークライト株式会社 | ポジ型感光性樹脂組成物及びそれを用いた半導体装置 |
JP3369471B2 (ja) * | 1998-05-29 | 2003-01-20 | 東京応化工業株式会社 | ポジ型ホトレジスト組成物およびレジストパターンの形成方法 |
JP2000019724A (ja) * | 1998-06-30 | 2000-01-21 | Fuji Photo Film Co Ltd | 感光性樹脂組成物 |
-
1999
- 1999-09-24 US US09/406,007 patent/US6127086A/en not_active Expired - Lifetime
- 1999-09-29 AT AT99950005T patent/ATE385324T1/de not_active IP Right Cessation
- 1999-09-29 DE DE69938082T patent/DE69938082T2/de not_active Expired - Lifetime
- 1999-09-29 JP JP2000572721A patent/JP4088910B2/ja not_active Expired - Fee Related
- 1999-09-29 KR KR1020017004132A patent/KR100767197B1/ko not_active IP Right Cessation
- 1999-09-29 EP EP99950005A patent/EP1171802B1/de not_active Expired - Lifetime
- 1999-09-29 WO PCT/US1999/022618 patent/WO2000019275A1/en active IP Right Grant
- 1999-11-17 TW TW088116829A patent/TWI229238B/zh not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
WO2000019275A1 (en) | 2000-04-06 |
DE69938082T2 (de) | 2009-02-12 |
DE69938082D1 (de) | 2008-03-20 |
KR20010088829A (ko) | 2001-09-28 |
EP1171802B1 (de) | 2008-01-30 |
US6127086A (en) | 2000-10-03 |
EP1171802A4 (de) | 2002-03-13 |
JP4088910B2 (ja) | 2008-05-21 |
TWI229238B (en) | 2005-03-11 |
EP1171802A1 (de) | 2002-01-16 |
KR100767197B1 (ko) | 2007-10-17 |
JP2002526794A (ja) | 2002-08-20 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
RER | Ceased as to paragraph 5 lit. 3 law introducing patent treaties |