ATE328308T1 - Verfahren und vorrichtung zur vereinfachten systemkonfiguration - Google Patents

Verfahren und vorrichtung zur vereinfachten systemkonfiguration

Info

Publication number
ATE328308T1
ATE328308T1 AT03747271T AT03747271T ATE328308T1 AT E328308 T1 ATE328308 T1 AT E328308T1 AT 03747271 T AT03747271 T AT 03747271T AT 03747271 T AT03747271 T AT 03747271T AT E328308 T1 ATE328308 T1 AT E328308T1
Authority
AT
Austria
Prior art keywords
processing
gui
user
system configuration
simplified system
Prior art date
Application number
AT03747271T
Other languages
English (en)
Inventor
Merritt Funk
Wei Chen
Original Assignee
Tokyo Electron Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Electron Ltd filed Critical Tokyo Electron Ltd
Application granted granted Critical
Publication of ATE328308T1 publication Critical patent/ATE328308T1/de

Links

Classifications

    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B19/00—Programme-control systems
    • G05B19/02—Programme-control systems electric
    • G05B19/04—Programme control other than numerical control, i.e. in sequence controllers or logic controllers
    • G05B19/042—Programme control other than numerical control, i.e. in sequence controllers or logic controllers using digital processors
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B19/00—Programme-control systems
    • G05B19/02—Programme-control systems electric
    • G05B19/418—Total factory control, i.e. centrally controlling a plurality of machines, e.g. direct or distributed numerical control [DNC], flexible manufacturing systems [FMS], integrated manufacturing systems [IMS], computer integrated manufacturing [CIM]
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B19/00—Programme-control systems
    • G05B19/02—Programme-control systems electric
    • G05B19/418—Total factory control, i.e. centrally controlling a plurality of machines, e.g. direct or distributed numerical control [DNC], flexible manufacturing systems [FMS], integrated manufacturing systems [IMS], computer integrated manufacturing [CIM]
    • G05B19/41865—Total factory control, i.e. centrally controlling a plurality of machines, e.g. direct or distributed numerical control [DNC], flexible manufacturing systems [FMS], integrated manufacturing systems [IMS], computer integrated manufacturing [CIM] characterised by job scheduling, process planning, material flow
    • G05B19/4187—Total factory control, i.e. centrally controlling a plurality of machines, e.g. direct or distributed numerical control [DNC], flexible manufacturing systems [FMS], integrated manufacturing systems [IMS], computer integrated manufacturing [CIM] characterised by job scheduling, process planning, material flow by tool management
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B2219/00—Program-control systems
    • G05B2219/30—Nc systems
    • G05B2219/32—Operator till task planning
    • G05B2219/32128—Gui graphical user interface
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B2219/00—Program-control systems
    • G05B2219/30—Nc systems
    • G05B2219/45—Nc applications
    • G05B2219/45031—Manufacturing semiconductor wafers
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
    • Y02P90/00—Enabling technologies with a potential contribution to greenhouse gas [GHG] emissions mitigation
    • Y02P90/02—Total factory control, e.g. smart factories, flexible manufacturing systems [FMS] or integrated manufacturing systems [IMS]
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
    • Y02P90/00—Enabling technologies with a potential contribution to greenhouse gas [GHG] emissions mitigation
    • Y02P90/80—Management or planning
AT03747271T 2002-04-23 2003-04-08 Verfahren und vorrichtung zur vereinfachten systemkonfiguration ATE328308T1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US37448602P 2002-04-23 2002-04-23

Publications (1)

Publication Number Publication Date
ATE328308T1 true ATE328308T1 (de) 2006-06-15

Family

ID=29270514

Family Applications (1)

Application Number Title Priority Date Filing Date
AT03747271T ATE328308T1 (de) 2002-04-23 2003-04-08 Verfahren und vorrichtung zur vereinfachten systemkonfiguration

Country Status (8)

Country Link
US (1) US20050065630A1 (de)
EP (1) EP1497701B1 (de)
JP (1) JP4537196B2 (de)
AT (1) ATE328308T1 (de)
AU (1) AU2003253594A1 (de)
DE (1) DE60305684T2 (de)
TW (1) TWI264667B (de)
WO (1) WO2003092044A2 (de)

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4635121B2 (ja) 2002-07-03 2011-02-16 東京エレクトロン株式会社 動的センサ構築およびランタイム実行のための方法
WO2004006140A2 (en) * 2002-07-03 2004-01-15 Tokyo Electron Limited Method and apparatus for automatic sensor installation
US7269468B2 (en) 2003-09-05 2007-09-11 Fisher-Rosemount Systems, Inc. State machine function block with a user modifiable output configuration database
US7730415B2 (en) * 2003-09-05 2010-06-01 Fisher-Rosemount Systems, Inc. State machine function block with a user modifiable state transition configuration database
JP4900903B2 (ja) * 2006-02-24 2012-03-21 東京エレクトロン株式会社 基板処理装置、基板処理装置のパラメータ管理システム、基板処理装置のパラメータ管理方法、プログラム、及び記憶媒体
US20070271526A1 (en) * 2006-05-22 2007-11-22 Powley John Jay User Interface Paradigm for Manufacturing Applications
US7551072B2 (en) * 2006-09-29 2009-06-23 Rockwell Automation Technologies, Inc. Run-time configuration of alarms and events
US8717181B2 (en) 2010-07-29 2014-05-06 Hill-Rom Services, Inc. Bed exit alert silence with automatic re-enable
US8990375B2 (en) * 2012-08-31 2015-03-24 Facebook, Inc. Subscription groups in publish-subscribe system
US9086688B2 (en) 2013-07-09 2015-07-21 Fisher-Rosemount Systems, Inc. State machine function block with user-definable actions on a transition between states
DE102015211309A1 (de) * 2015-06-19 2016-12-22 Robert Bosch Gmbh Werkzeugsystem für eine Montageanlage mit auswählbaren Benachrichtigungsregeln und ein Verfahren für ein Werkzeugsystem einer Montageanlage
US10073444B2 (en) * 2015-09-20 2018-09-11 Macau University Of Science And Technology Petri net-based optimal one-wafer cyclic scheduling of treelike hybrid multi-cluster tools
JP6962539B2 (ja) * 2017-02-24 2021-11-05 株式会社レクサー・リサーチ 業務計画最適化方法

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3630931B2 (ja) * 1996-08-29 2005-03-23 富士通株式会社 プラズマ処理装置、プロセスモニタ方法及び半導体装置の製造方法
JP2003521807A (ja) * 1998-07-10 2003-07-15 アプライド マテリアルズ インコーポレイテッド 基板製作工程に関する改良された終点検出
US7069101B1 (en) * 1999-07-29 2006-06-27 Applied Materials, Inc. Computer integrated manufacturing techniques
US8028049B1 (en) * 2000-02-01 2011-09-27 Peer Intellectual Property Inc. Apparatus and method for web-based tool management
US6952656B1 (en) * 2000-04-28 2005-10-04 Applied Materials, Inc. Wafer fabrication data acquisition and management systems
US20020022969A1 (en) * 2000-07-07 2002-02-21 Berg Marc Van Den Remote automated customer support for manufacturing equipment
JP2002027567A (ja) * 2000-07-12 2002-01-25 Hitachi Kokusai Electric Inc 半導体製造装置のリモート操作システム、半導体製造装置および遠隔操作装置
US6482744B1 (en) * 2000-08-16 2002-11-19 Promos Technologies, Inc. Two step plasma etch using variable electrode spacing

Also Published As

Publication number Publication date
EP1497701A2 (de) 2005-01-19
WO2003092044A3 (en) 2004-02-05
AU2003253594A8 (en) 2003-11-10
JP2005524229A (ja) 2005-08-11
TW200401224A (en) 2004-01-16
AU2003253594A1 (en) 2003-11-10
EP1497701B1 (de) 2006-05-31
JP4537196B2 (ja) 2010-09-01
TWI264667B (en) 2006-10-21
DE60305684D1 (de) 2006-07-06
DE60305684T2 (de) 2007-05-03
US20050065630A1 (en) 2005-03-24
WO2003092044A2 (en) 2003-11-06

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