ATE323401T1 - Gerät und verfahren zum testen einer lichtemittierenden vorrichtung - Google Patents
Gerät und verfahren zum testen einer lichtemittierenden vorrichtungInfo
- Publication number
- ATE323401T1 ATE323401T1 AT01923918T AT01923918T ATE323401T1 AT E323401 T1 ATE323401 T1 AT E323401T1 AT 01923918 T AT01923918 T AT 01923918T AT 01923918 T AT01923918 T AT 01923918T AT E323401 T1 ATE323401 T1 AT E323401T1
- Authority
- AT
- Austria
- Prior art keywords
- brightness
- light
- optical fibers
- circuit board
- values
- Prior art date
Links
- 239000013307 optical fiber Substances 0.000 abstract 3
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
- G01R31/2607—Circuits therefor
- G01R31/2632—Circuits therefor for testing diodes
- G01R31/2635—Testing light-emitting diodes, laser diodes or photodiodes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/02—Details
- G01J1/04—Optical or mechanical part supplementary adjustable parts
- G01J1/0407—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings
- G01J1/0425—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings using optical fibers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/46—Measurement of colour; Colour measuring devices, e.g. colorimeters
- G01J3/50—Measurement of colour; Colour measuring devices, e.g. colorimeters using electric radiation detectors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
- G01J2001/4247—Photometry, e.g. photographic exposure meter using electric radiation detectors for testing lamps or other light sources
- G01J2001/4252—Photometry, e.g. photographic exposure meter using electric radiation detectors for testing lamps or other light sources for testing LED's
Landscapes
- Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- General Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Photometry And Measurement Of Optical Pulse Characteristics (AREA)
- Testing Of Optical Devices Or Fibers (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
IE20000322A IES20000322A2 (en) | 2000-04-28 | 2000-04-28 | Apparatus for testing a light source |
Publications (1)
Publication Number | Publication Date |
---|---|
ATE323401T1 true ATE323401T1 (de) | 2006-04-15 |
Family
ID=11042602
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
AT01923918T ATE323401T1 (de) | 2000-04-28 | 2001-04-27 | Gerät und verfahren zum testen einer lichtemittierenden vorrichtung |
Country Status (7)
Country | Link |
---|---|
US (1) | US7056000B2 (de) |
EP (1) | EP1277383B1 (de) |
AT (1) | ATE323401T1 (de) |
AU (1) | AU5059801A (de) |
DE (1) | DE60118721T2 (de) |
IE (1) | IES20000322A2 (de) |
WO (1) | WO2001084901A1 (de) |
Families Citing this family (46)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6600562B1 (en) * | 2002-01-11 | 2003-07-29 | Koninklijke Philips Electronics N.V. | Method of extended color sense and estimation for RGB LED illuminants |
US7064832B2 (en) * | 2003-02-26 | 2006-06-20 | Delaware Capital Formation, Inc. | Color and intensity measuring module for test of light emitting components by automated test equipment |
KR20060065713A (ko) * | 2003-09-08 | 2006-06-14 | 코닌클리즈케 필립스 일렉트로닉스 엔.브이. | 다수의 광 전송 로드를 포함하는 도광 시스템 |
DE10356372B4 (de) * | 2003-12-03 | 2013-12-12 | Odelo Gmbh | Beleuchtungseinheit mit Lichtleitkörper |
TWI236530B (en) * | 2004-07-29 | 2005-07-21 | Chroma Ate Inc | Automatic optical characteristics testing apparatus and method for light emitting device |
EP1628494A1 (de) * | 2004-08-17 | 2006-02-22 | Dialog Semiconductor GmbH | Intelligente Lichtquelle mit Synchronisation mit einer Digitalkamera |
EP1648181A1 (de) | 2004-10-12 | 2006-04-19 | Dialog Semiconductor GmbH | Einzelbildabspeichervorrichtung |
US20070086206A1 (en) * | 2005-10-14 | 2007-04-19 | Allen Weng | Light guiding structure for optical fiber |
US20070127258A1 (en) * | 2005-12-07 | 2007-06-07 | Bwt Property, Inc. | Projection lighting apparatus for marking and demarcation |
US9131548B2 (en) * | 2006-02-09 | 2015-09-08 | Production Resource Group, Llc | Test machine for an automated light |
CN101169340B (zh) * | 2006-10-27 | 2010-12-08 | 鸿富锦精密工业(深圳)有限公司 | 主板发光二极管检测装置及方法 |
TWI390194B (zh) * | 2006-11-10 | 2013-03-21 | Hon Hai Prec Ind Co Ltd | 主機板發光二極體測試裝置及方法 |
US8225496B2 (en) * | 2007-08-31 | 2012-07-24 | Applied Materials, Inc. | Automated integrated solar cell production line composed of a plurality of automated modules and tools including an autoclave for curing solar devices that have been laminated |
EP2320125A1 (de) * | 2009-11-04 | 2011-05-11 | Koninklijke Philips Electronics N.V. | Beleuchtungsvorrichtung |
US8705023B2 (en) * | 2010-03-22 | 2014-04-22 | Lg Innotek Co., Ltd. | Testing apparatus and method for testing light emitting diode lamp |
KR101039652B1 (ko) * | 2010-03-22 | 2011-06-09 | 엘지이노텍 주식회사 | 엘이디 램프 검사장치의 동작방법 |
TWI463149B (zh) * | 2010-03-31 | 2014-12-01 | Chi Mei Comm Systems Inc | 檢測裝置 |
EP2388605B1 (de) * | 2010-05-19 | 2018-10-17 | Feasa Enterprises Limited | Testen eines Lichterzeugungselements |
US8823406B2 (en) | 2010-10-20 | 2014-09-02 | Cascade Micotech, Inc. | Systems and methods for simultaneous optical testing of a plurality of devices under test |
US9658252B2 (en) * | 2011-02-21 | 2017-05-23 | United Microelectronics Corp. | Probe insertion auxiliary and method of probe insertion |
GB2488569A (en) * | 2011-03-02 | 2012-09-05 | Feasa Entpr Ltd | Testing light emitting diode light sources in a climate controlled chamber |
KR101182822B1 (ko) * | 2011-03-29 | 2012-09-13 | 삼성전자주식회사 | 발광소자 검사장치 및 방법 |
TWI431291B (zh) * | 2011-07-14 | 2014-03-21 | Chroma Ate Inc | 發光二極體量測裝置 |
GB2496450A (en) * | 2011-11-14 | 2013-05-15 | Feasa Entpr Ltd | A light source testing device which compares a property of light with a predetermined threshold value |
TWI467500B (zh) * | 2011-12-21 | 2015-01-01 | Inventec Corp | 利用數位影像對發光二極體的檢測方法 |
TWM430614U (en) * | 2011-12-21 | 2012-06-01 | Youngtek Electronics Corp | Fiber optic light guiding top cover structure |
CN103175606A (zh) * | 2011-12-26 | 2013-06-26 | 鸿富锦精密工业(深圳)有限公司 | Led亮度检测系统 |
CN103185663B (zh) * | 2011-12-28 | 2015-11-25 | 英业达股份有限公司 | 利用数字影像对发光二极管的检测方法 |
TWI497625B (zh) * | 2012-01-13 | 2015-08-21 | Etamax Co Ltd | 發光二極體磊晶片之對應磊晶載盤位置量測分佈圖像的呈現方法 |
TWI468651B (zh) * | 2012-03-23 | 2015-01-11 | Oto Photonics Inc | 光學量測系統、用以架設其之承載結構及光學量測方法 |
JP5914385B2 (ja) * | 2012-05-09 | 2016-05-11 | 太平洋工業株式会社 | サーバ監視装置及びサーバ監視システム |
CN103424186A (zh) * | 2012-05-18 | 2013-12-04 | 全亿大科技(佛山)有限公司 | 发光二极管检测量具 |
EP2793092B1 (de) * | 2013-08-26 | 2015-07-08 | Advanced Digital Broadcast S.A. | Montagestraßensystem, Verfahren und Vorrichtung zur Senkung der Anzahl Montagearbeitsstationen |
DE102013218062A1 (de) * | 2013-09-10 | 2015-03-12 | Osram Opto Semiconductors Gmbh | Testvorrichtung und Verfahren zum Testen von optoelektronischen Bauelementen |
GB2521176A (en) * | 2013-12-11 | 2015-06-17 | Infiniled Ltd | Apparatus and method for profiling a beam of a light emitting semiconductor device |
WO2015107655A1 (ja) * | 2014-01-16 | 2015-07-23 | パイオニア株式会社 | 光学測定装置 |
JP6318912B2 (ja) * | 2014-06-26 | 2018-05-09 | 富士通株式会社 | 光源検査方法 |
WO2016087939A1 (en) * | 2014-12-01 | 2016-06-09 | Cooledge Lighting, Inc. | Automated test systems and methods for light-emitting arrays |
TWI508028B (zh) * | 2015-02-26 | 2015-11-11 | Senao Networks Inc | Method for detecting quantity of luminous body |
WO2017081723A1 (ja) * | 2015-11-09 | 2017-05-18 | オリンパス株式会社 | 減光率測定方法および光強度測定装置 |
GB2547428A (en) * | 2016-02-16 | 2017-08-23 | Feasa Entpr Ltd | Method and apparatus for testing optical outputs |
KR20190099004A (ko) * | 2016-12-16 | 2019-08-23 | 테소로 사이언티픽, 인코포레이티드 | 발광 다이오드 테스트 장치 및 제조 방법 |
CN106707068B (zh) * | 2017-02-07 | 2023-08-29 | 武汉灿光光电有限公司 | Ptto交直流自动测试装置 |
IT201900025027A1 (it) * | 2019-12-20 | 2021-06-20 | Techno Sky S R L | Dispositivo per testare luci di terra aeroportuali |
WO2021133350A1 (en) * | 2019-12-27 | 2021-07-01 | Farba Aydinlatma Sistemleri A.S. | A test mechanism for testing light sources |
CN113820576B (zh) * | 2020-06-17 | 2023-11-14 | Tcl科技集团股份有限公司 | 测试发光二极管器件的方法及装置 |
Family Cites Families (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4808815A (en) * | 1987-03-23 | 1989-02-28 | Genrad, Inc. | Apparatus for testing light-emitting devices using probe means having a preselected pattern arrangement |
US4775640A (en) * | 1987-05-01 | 1988-10-04 | American Telephone And Telegraph Company | Electronic device test method and apparatus |
-
2000
- 2000-04-28 IE IE20000322A patent/IES20000322A2/en not_active IP Right Cessation
-
2001
- 2001-04-27 WO PCT/IE2001/000055 patent/WO2001084901A1/en active IP Right Grant
- 2001-04-27 EP EP01923918A patent/EP1277383B1/de not_active Expired - Lifetime
- 2001-04-27 DE DE60118721T patent/DE60118721T2/de not_active Expired - Lifetime
- 2001-04-27 US US10/258,658 patent/US7056000B2/en not_active Expired - Lifetime
- 2001-04-27 AT AT01923918T patent/ATE323401T1/de not_active IP Right Cessation
- 2001-04-27 AU AU50598/01A patent/AU5059801A/en not_active Abandoned
Also Published As
Publication number | Publication date |
---|---|
IES20000322A2 (en) | 2001-11-14 |
WO2001084901A1 (en) | 2001-11-08 |
US7056000B2 (en) | 2006-06-06 |
AU5059801A (en) | 2001-11-12 |
EP1277383A1 (de) | 2003-01-22 |
US20030161163A1 (en) | 2003-08-28 |
DE60118721T2 (de) | 2007-01-25 |
DE60118721D1 (de) | 2006-05-24 |
EP1277383B1 (de) | 2006-04-12 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
RER | Ceased as to paragraph 5 lit. 3 law introducing patent treaties |