ATE308823T1 - Komparator and da-umsetzer mit geschalteten kapazitäten - Google Patents

Komparator and da-umsetzer mit geschalteten kapazitäten

Info

Publication number
ATE308823T1
ATE308823T1 AT99202760T AT99202760T ATE308823T1 AT E308823 T1 ATE308823 T1 AT E308823T1 AT 99202760 T AT99202760 T AT 99202760T AT 99202760 T AT99202760 T AT 99202760T AT E308823 T1 ATE308823 T1 AT E308823T1
Authority
AT
Austria
Prior art keywords
switched
phi
clock
circuit
sample
Prior art date
Application number
AT99202760T
Other languages
English (en)
Inventor
Abdellatif Bellaouar
Original Assignee
Texas Instruments Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Texas Instruments Inc filed Critical Texas Instruments Inc
Application granted granted Critical
Publication of ATE308823T1 publication Critical patent/ATE308823T1/de

Links

Classifications

    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12—Analogue/digital converters
    • H03M1/14—Conversion in steps with each step involving the same or a different conversion means and delivering more than one bit
    • H03M1/16—Conversion in steps with each step involving the same or a different conversion means and delivering more than one bit with scale factor modification, i.e. by changing the amplification between the steps
    • H03M1/164—Conversion in steps with each step involving the same or a different conversion means and delivering more than one bit with scale factor modification, i.e. by changing the amplification between the steps the steps being performed sequentially in series-connected stages
    • H03M1/167—Conversion in steps with each step involving the same or a different conversion means and delivering more than one bit with scale factor modification, i.e. by changing the amplification between the steps the steps being performed sequentially in series-connected stages all stages comprising simultaneous converters
    • H03M1/168—Conversion in steps with each step involving the same or a different conversion means and delivering more than one bit with scale factor modification, i.e. by changing the amplification between the steps the steps being performed sequentially in series-connected stages all stages comprising simultaneous converters and delivering the same number of bits
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K5/00—Manipulating of pulses not covered by one of the other main groups of this subclass
    • H03K5/22—Circuits having more than one input and one output for comparing pulses or pulse trains with each other according to input signal characteristics, e.g. slope, integral
    • H03K5/24—Circuits having more than one input and one output for comparing pulses or pulse trains with each other according to input signal characteristics, e.g. slope, integral the characteristic being amplitude
    • H03K5/2472—Circuits having more than one input and one output for comparing pulses or pulse trains with each other according to input signal characteristics, e.g. slope, integral the characteristic being amplitude using field effect transistors
    • H03K5/2481—Circuits having more than one input and one output for comparing pulses or pulse trains with each other according to input signal characteristics, e.g. slope, integral the characteristic being amplitude using field effect transistors with at least one differential stage
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K5/00—Manipulating of pulses not covered by one of the other main groups of this subclass
    • H03K5/22—Circuits having more than one input and one output for comparing pulses or pulse trains with each other according to input signal characteristics, e.g. slope, integral
    • H03K5/24—Circuits having more than one input and one output for comparing pulses or pulse trains with each other according to input signal characteristics, e.g. slope, integral the characteristic being amplitude
    • H03K5/2472—Circuits having more than one input and one output for comparing pulses or pulse trains with each other according to input signal characteristics, e.g. slope, integral the characteristic being amplitude using field effect transistors
    • H03K5/249—Circuits having more than one input and one output for comparing pulses or pulse trains with each other according to input signal characteristics, e.g. slope, integral the characteristic being amplitude using field effect transistors using clock signals

Landscapes

  • Physics & Mathematics (AREA)
  • Nonlinear Science (AREA)
  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Analogue/Digital Conversion (AREA)
  • Amplifiers (AREA)
  • Measurement Of Current Or Voltage (AREA)
  • Filters That Use Time-Delay Elements (AREA)
AT99202760T 1998-08-28 1999-08-26 Komparator and da-umsetzer mit geschalteten kapazitäten ATE308823T1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US9833498P 1998-08-28 1998-08-28

Publications (1)

Publication Number Publication Date
ATE308823T1 true ATE308823T1 (de) 2005-11-15

Family

ID=22268828

Family Applications (1)

Application Number Title Priority Date Filing Date
AT99202760T ATE308823T1 (de) 1998-08-28 1999-08-26 Komparator and da-umsetzer mit geschalteten kapazitäten

Country Status (5)

Country Link
US (1) US6249240B1 (de)
EP (1) EP0982863B1 (de)
JP (1) JP2000201054A (de)
AT (1) ATE308823T1 (de)
DE (1) DE69928057T2 (de)

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US6566933B1 (en) * 1999-07-23 2003-05-20 Pmc-Sierra, Inc. Switched capacitor transmitter pre-driver
US6452152B1 (en) * 2000-02-22 2002-09-17 Pixim, Inc. Sense amplifier having a precision analog reference level for use with image sensors
JP4569027B2 (ja) * 2001-04-04 2010-10-27 ソニー株式会社 サンプルホールド回路と該回路を用いたａｄ変換器
US6567028B2 (en) * 2001-10-12 2003-05-20 Micron Technology, Inc. Reference voltage stabilization in CMOS sensors
US6515612B1 (en) 2001-10-23 2003-02-04 Agere Systems, Inc. Method and system to reduce signal-dependent charge drawn from reference voltage in switched capacitor circuits
JP3597812B2 (ja) * 2001-11-21 2004-12-08 株式会社半導体理工学研究センター 擬似差動増幅回路及び擬似差動増幅回路を使用したａ／ｄ変換器
US6617908B1 (en) * 2002-03-22 2003-09-09 Cirrus Logic, Inc. Switched-capacitor circuits with reduced distortion
US6784824B1 (en) * 2002-08-29 2004-08-31 Xilinx, Inc. Analog-to-digital converter which is substantially independent of capacitor mismatch
TW586264B (en) * 2003-04-14 2004-05-01 Realtek Semiconductor Corp Amplifying circuit
US20050035891A1 (en) * 2003-08-14 2005-02-17 Tripath Technology, Inc. Digital-to-analog converter with level control
US6906658B2 (en) * 2003-08-28 2005-06-14 Texas Instruments Incorporated Reducing droop in a reference signal provided to ADCs
US20050151576A1 (en) * 2003-09-23 2005-07-14 Chao-Cheng Lee Adjustable impedance circuit
KR100560945B1 (ko) * 2003-11-26 2006-03-14 매그나칩 반도체 유한회사 온-칩 기준전압 발생장치를 구비하는 반도체 칩
JP2005354627A (ja) * 2004-06-14 2005-12-22 Matsushita Electric Ind Co Ltd パイプラインａ／ｄ変換器
US7109902B2 (en) * 2004-06-30 2006-09-19 Texas Instruments Incorporated Method and system for sampling a signal
JP2006033304A (ja) * 2004-07-15 2006-02-02 Daio Denki Kk スイッチトキャパシタ回路及びパイプラインａ／ｄ変換器
JP2006041993A (ja) 2004-07-28 2006-02-09 Renesas Technology Corp Ａ／ｄ変換回路を内蔵した半導体集積回路および通信用半導体集積回路
US7358801B2 (en) * 2004-08-16 2008-04-15 Texas Instruments Incorporated Reducing noise and/or power consumption in a switched capacitor amplifier sampling a reference voltage
US7009549B1 (en) 2004-12-30 2006-03-07 Texas Instruments Incorporated Switched-capacitor circuit with scaled reference voltage
US7183812B2 (en) * 2005-03-23 2007-02-27 Analog Devices, Inc. Stable systems for comparing and converting signals
US7095356B1 (en) * 2005-09-20 2006-08-22 Texas Instruments Incorporated Providing reference voltage with desired accuracy in a short duration to a dynamically varying load
US7522086B2 (en) * 2005-12-29 2009-04-21 Cambridge Analog Technologies, Inc. Reference circuits for sampled-data circuits
US7397412B1 (en) * 2006-02-03 2008-07-08 Marvell International Ltd. Low power analog to digital converter
US7268720B1 (en) 2006-06-30 2007-09-11 Analog Devices, Inc. Converter networks for generation of MDAC reference signals
US20090058473A1 (en) * 2007-09-05 2009-03-05 International Business Machines Corporation Active pre-emphasis for passive rc networks
GB2458902B (en) * 2008-03-31 2011-12-28 Wolfson Microelectronics Plc Switched-capacitor circuit
US7652601B2 (en) * 2008-05-02 2010-01-26 Analog Devices, Inc. Fast, efficient reference networks for providing low-impedance reference signals to signal processing systems
US7636057B2 (en) * 2008-05-02 2009-12-22 Analog Devices, Inc. Fast, efficient reference networks for providing low-impedance reference signals to signal converter systems
US7830288B2 (en) * 2008-05-02 2010-11-09 Analog Devices, Inc. Fast, efficient reference networks for providing low-impedance reference signals to signal processing systems
JP5108850B2 (ja) * 2008-09-12 2012-12-26 旭化成エレクトロニクス株式会社 スイッチトキャパシタ回路
JP5097064B2 (ja) * 2008-09-12 2012-12-12 旭化成エレクトロニクス株式会社 パイプライン型ａ／ｄコンバータ及びパイプライン型ａ／ｄコンバータの制御方法
CN101771411B (zh) * 2008-12-31 2012-06-06 中芯国际集成电路制造(上海)有限公司 模数/数模转换器
US8581769B2 (en) * 2011-11-22 2013-11-12 Stmicroelectronics International N.V. Multiplying digital-to-analog converter configured to maintain impedance balancing
US8730073B1 (en) * 2012-12-18 2014-05-20 Broadcom Corporation Pipelined analog-to-digital converter with dedicated clock cycle for quantization
CN107005243B (zh) * 2014-10-23 2019-06-25 美国莱迪思半导体公司 具有次谐波锁定阻止功能的锁相环
US10311962B2 (en) 2017-02-23 2019-06-04 Mediatek Inc. Differential sampling circuit
US11264959B2 (en) * 2020-06-16 2022-03-01 Texas Instruments Incorporated Reference precharge system

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4237390A (en) 1978-09-28 1980-12-02 National Semiconductor Corporation Switching comparator
US5187390A (en) 1991-07-12 1993-02-16 Crystal Semiconductor Corporation Input sampling switch charge conservation
US5351050A (en) 1992-11-03 1994-09-27 Crystal Semiconductor Corporation Detent switching of summing node capacitors of a delta-sigma modulator
US5644257A (en) 1993-03-24 1997-07-01 Crystal Semiconductor Corporation Sampling circuit charge management
EP0747849A1 (de) * 1995-06-07 1996-12-11 Landis & Gyr Technology Innovation AG SC-Integrator mit umschaltbarer Polarität
US5574457A (en) 1995-06-12 1996-11-12 Motorola, Inc. Switched capacitor gain stage

Also Published As

Publication number Publication date
US6249240B1 (en) 2001-06-19
EP0982863B1 (de) 2005-11-02
DE69928057D1 (de) 2005-12-08
EP0982863A1 (de) 2000-03-01
DE69928057T2 (de) 2006-07-13
JP2000201054A (ja) 2000-07-18

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Legal Events

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