ATE284037T1 - Methode und apparatus zur auswertung von einem satz elektronischer bauelemente - Google Patents

Methode und apparatus zur auswertung von einem satz elektronischer bauelemente

Info

Publication number
ATE284037T1
ATE284037T1 AT02794658T AT02794658T ATE284037T1 AT E284037 T1 ATE284037 T1 AT E284037T1 AT 02794658 T AT02794658 T AT 02794658T AT 02794658 T AT02794658 T AT 02794658T AT E284037 T1 ATE284037 T1 AT E284037T1
Authority
AT
Austria
Prior art keywords
storage device
sensing element
memory storage
electronic components
container
Prior art date
Application number
AT02794658T
Other languages
English (en)
Inventor
Yuen-Foo Michael Kou
Original Assignee
Accu Assembly Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Accu Assembly Inc filed Critical Accu Assembly Inc
Application granted granted Critical
Publication of ATE284037T1 publication Critical patent/ATE284037T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G01R31/2872—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation
    • G01R31/2881—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation related to environmental aspects other than temperature, e.g. humidity or vibrations
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K13/00—Apparatus or processes specially adapted for manufacturing or adjusting assemblages of electric components
    • H05K13/08—Monitoring manufacture of assemblages
    • H05K13/083—Quality monitoring using results from monitoring devices, e.g. feedback loops
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K13/00—Apparatus or processes specially adapted for manufacturing or adjusting assemblages of electric components
    • H05K13/08—Monitoring manufacture of assemblages
    • H05K13/086—Supply management, e.g. supply of components or of substrates
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
    • G01R31/2868—Complete testing stations; systems; procedures; software aspects
    • G01R31/287—Procedures; Software aspects

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Environmental & Geological Engineering (AREA)
  • Operations Research (AREA)
  • Manufacturing & Machinery (AREA)
  • Health & Medical Sciences (AREA)
  • Toxicology (AREA)
  • General Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Recording Measured Values (AREA)
  • Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
  • Air Conditioning Control Device (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Electric Connection Of Electric Components To Printed Circuits (AREA)
AT02794658T 2001-08-08 2002-08-05 Methode und apparatus zur auswertung von einem satz elektronischer bauelemente ATE284037T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US09/924,279 US6759862B2 (en) 2001-08-08 2001-08-08 Method and apparatus for evaluating a set of electronic components
PCT/US2002/024744 WO2003014751A2 (en) 2001-08-08 2002-08-05 Method and apparatus for evaluating a set of electronic components

Publications (1)

Publication Number Publication Date
ATE284037T1 true ATE284037T1 (de) 2004-12-15

Family

ID=25450007

Family Applications (1)

Application Number Title Priority Date Filing Date
AT02794658T ATE284037T1 (de) 2001-08-08 2002-08-05 Methode und apparatus zur auswertung von einem satz elektronischer bauelemente

Country Status (10)

Country Link
US (2) US6759862B2 (de)
EP (1) EP1415167B1 (de)
JP (1) JP2004538629A (de)
CN (1) CN1551993A (de)
AT (1) ATE284037T1 (de)
AU (1) AU2002332461A1 (de)
DE (1) DE60202151T2 (de)
MY (1) MY129835A (de)
TW (1) TWI224072B (de)
WO (1) WO2003014751A2 (de)

Families Citing this family (24)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6759862B2 (en) * 2001-08-08 2004-07-06 Accu-Assembly Incorporated Method and apparatus for evaluating a set of electronic components
US6775624B2 (en) * 2001-10-19 2004-08-10 International Business Machines Corporation Method and apparatus for estimating remaining life of a product
US7066038B2 (en) * 2002-04-15 2006-06-27 Amebis Intellectual Properties Limited Material stability test system
ITGE20030022A1 (it) * 2003-03-12 2004-09-13 Thermochron S R L Dispositivo indicatore della vita residua
US6879869B2 (en) 2003-03-28 2005-04-12 Accu-Assembly Incorporated Placement of electronic components
US7164281B2 (en) * 2004-02-20 2007-01-16 Accu-Assembly Incorporated Circuit board component ambient moisture exposure monitoring
US7290701B2 (en) 2004-08-13 2007-11-06 Accu-Assembly Incorporated Gathering data relating to electrical components picked from stacked trays
US20060101927A1 (en) * 2004-11-18 2006-05-18 Blakeley Gerald W Iii Analytical measurement meters with location determination capability
US7272896B2 (en) * 2005-02-18 2007-09-25 Accu-Assembly Incorporated Data transfer between moisture sensors
US20070171083A1 (en) * 2005-02-18 2007-07-26 Kou Yuen-Foo M Monitoring moisture inside a container
US20080291033A1 (en) * 2006-09-07 2008-11-27 Xerxes Aghassipour System and method for optimization of and analysis of insulated systems
US8136982B2 (en) * 2009-03-16 2012-03-20 International Business Machines Corporation Thermal profiling to validate electronic device authenticity
US8242793B2 (en) * 2009-03-17 2012-08-14 International Business Machines Corporation Electromagnetic profiling to validate electronic device authenticity
KR101654060B1 (ko) * 2010-03-08 2016-09-05 엘지전자 주식회사 공기조화시스템 및 제어방법
JP5679956B2 (ja) * 2011-12-12 2015-03-04 株式会社日立製作所 フロアーライフ管理装置及びフロアーライフ管理方法
JP5877314B2 (ja) 2012-05-08 2016-03-08 パナソニックＩｐマネジメント株式会社 電子部品実装システムおよび電子部品実装方法
JP6077003B2 (ja) * 2012-11-20 2017-02-08 富士機械製造株式会社 電子部品の収容体の管理を支援する装置及び方法
JP6099394B2 (ja) * 2012-12-28 2017-03-22 三菱電機株式会社 除湿管理装置、除湿装置、除湿管理方法およびプログラム
US20140259656A1 (en) * 2013-03-15 2014-09-18 Onset Computer Corporation Data logger sensor component assembly and test process
EP3047713B1 (de) 2013-09-18 2019-11-13 Mycronic AB Verfahren, system und vorrichtung zur umverteilung von komponenten und behältern in smd-lagern
CN105891622B (zh) * 2014-12-23 2019-10-15 中科众志信通(大连)科技有限公司 电路板维修辅助图片像素动态链接方法
US10909607B2 (en) 2015-06-05 2021-02-02 Boveda Inc. Systems, methods and devices for controlling humidity in a closed environment with automatic and predictive identification, purchase and replacement of optimal humidity controller
US10055781B2 (en) 2015-06-05 2018-08-21 Boveda Inc. Systems, methods and devices for controlling humidity in a closed environment with automatic and predictive identification, purchase and replacement of optimal humidity controller
CN108827394B (zh) * 2018-07-27 2020-08-18 中国兵器工业第五九研究所 一种库房贮存环境谱自动摄入装置

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US4165633A (en) * 1978-02-09 1979-08-28 Motorola Process Control Inc. System for measuring moisture content
US4242632A (en) 1978-09-11 1980-12-30 Semicon, Inc. Method and apparatus for testing axial-lead components
US4298946A (en) * 1978-12-18 1981-11-03 Texas Instruments Incorporated Electronically controlled programmable digital thermostat
US4426619A (en) 1981-06-03 1984-01-17 Temptronic Corporation Electrical testing system including plastic window test chamber and method of using same
JPS6168514A (ja) * 1984-09-13 1986-04-08 Yoshida Seiki Kk 環境条件計測装置
US4684884A (en) * 1985-07-02 1987-08-04 Gte Communication Systems Corporation Universal test circuit for integrated circuit packages
US4728885A (en) * 1986-01-23 1988-03-01 Desanto Joseph J Method and apparatus for duplicating electrical environmental conditions
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JPH0642986A (ja) 1992-07-22 1994-02-18 Yokogawa Electric Corp 信号伝送器
EP0611968B1 (de) 1993-02-10 1999-03-31 Sieba Ag Vorrichtung zur Prüfung von Modulen
JPH07306239A (ja) 1994-05-16 1995-11-21 Hitachi Ltd 余寿命センサー付き電気製品
DE4447270A1 (de) * 1994-12-30 1996-07-04 Bosch Siemens Hausgeraete Verfahren zum Steuern von Trockenvorgängen in Haushalt-Wäschetrocknern
US5606264A (en) 1995-04-21 1997-02-25 Licari; James J. Moisture sensor for electronic modules
JP3206374B2 (ja) * 1995-06-19 2001-09-10 松下電器産業株式会社 回路機能ブロックの信頼性試験方法
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US6759862B2 (en) * 2001-08-08 2004-07-06 Accu-Assembly Incorporated Method and apparatus for evaluating a set of electronic components
US6879869B2 (en) * 2003-03-28 2005-04-12 Accu-Assembly Incorporated Placement of electronic components

Also Published As

Publication number Publication date
EP1415167B1 (de) 2004-12-01
JP2004538629A (ja) 2004-12-24
CN1551993A (zh) 2004-12-01
US20040239360A1 (en) 2004-12-02
US6759862B2 (en) 2004-07-06
AU2002332461A1 (en) 2003-02-24
EP1415167A2 (de) 2004-05-06
WO2003014751A3 (en) 2003-07-03
DE60202151T2 (de) 2005-12-08
US20030030429A1 (en) 2003-02-13
WO2003014751A2 (en) 2003-02-20
DE60202151D1 (de) 2005-01-05
US7015713B2 (en) 2006-03-21
MY129835A (en) 2007-05-31
TWI224072B (en) 2004-11-21

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