ATE267459T1 - Verfahren zur reduzierung von ausgewählten ionenströmen in räumlich begrenzten ionenstrahlen - Google Patents

Verfahren zur reduzierung von ausgewählten ionenströmen in räumlich begrenzten ionenstrahlen

Info

Publication number
ATE267459T1
ATE267459T1 AT97903735T AT97903735T ATE267459T1 AT E267459 T1 ATE267459 T1 AT E267459T1 AT 97903735 T AT97903735 T AT 97903735T AT 97903735 T AT97903735 T AT 97903735T AT E267459 T1 ATE267459 T1 AT E267459T1
Authority
AT
Austria
Prior art keywords
ions
carrier gas
ion
spatially limited
currents
Prior art date
Application number
AT97903735T
Other languages
English (en)
Inventor
Gregory C Eiden
Charles J Barinaga
David W Koppenaal
Original Assignee
Battelle Memorial Institute
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Battelle Memorial Institute filed Critical Battelle Memorial Institute
Application granted granted Critical
Publication of ATE267459T1 publication Critical patent/ATE267459T1/de

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/14—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers
    • H01J49/145—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers using chemical ionisation

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Physical Vapour Deposition (AREA)
  • Crystals, And After-Treatments Of Crystals (AREA)
AT97903735T 1996-01-05 1997-01-03 Verfahren zur reduzierung von ausgewählten ionenströmen in räumlich begrenzten ionenstrahlen ATE267459T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US08/583,324 US5767512A (en) 1996-01-05 1996-01-05 Method for reduction of selected ion intensities in confined ion beams
PCT/US1997/000023 WO1997025737A1 (en) 1996-01-05 1997-01-03 A method for reduction of selected ion intensities in confined ion beams

Publications (1)

Publication Number Publication Date
ATE267459T1 true ATE267459T1 (de) 2004-06-15

Family

ID=24332634

Family Applications (1)

Application Number Title Priority Date Filing Date
AT97903735T ATE267459T1 (de) 1996-01-05 1997-01-03 Verfahren zur reduzierung von ausgewählten ionenströmen in räumlich begrenzten ionenstrahlen

Country Status (7)

Country Link
US (1) US5767512A (de)
EP (2) EP0871977B1 (de)
JP (2) JP3573464B2 (de)
AT (1) ATE267459T1 (de)
AU (1) AU705918B2 (de)
DE (1) DE69729176T2 (de)
WO (1) WO1997025737A1 (de)

Families Citing this family (37)

* Cited by examiner, † Cited by third party
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US6259091B1 (en) * 1996-01-05 2001-07-10 Battelle Memorial Institute Apparatus for reduction of selected ion intensities in confined ion beams
GB9612070D0 (en) * 1996-06-10 1996-08-14 Micromass Ltd Plasma mass spectrometer
JPH1097838A (ja) * 1996-07-30 1998-04-14 Yokogawa Analytical Syst Kk 誘導結合プラズマ質量分析装置
US6140638A (en) * 1997-06-04 2000-10-31 Mds Inc. Bandpass reactive collision cell
RU2145082C1 (ru) * 1998-03-23 2000-01-27 Общество с ограниченной ответственностью "ВИНТЕЛ" Способ определения элементов в растворах и устройство для его реализации
JP2000067805A (ja) * 1998-08-24 2000-03-03 Hitachi Ltd 質量分析装置
EP0982757A1 (de) * 1998-08-25 2000-03-01 The Perkin-Elmer Corporation Trägergas-Separator für Massenspektrometrie
GB9820210D0 (en) * 1998-09-16 1998-11-11 Vg Elemental Limited Means for removing unwanted ions from an ion transport system and mass spectrometer
WO2000017908A2 (en) 1998-09-23 2000-03-30 Wisconsin Alumni Research Foundation Charge reduction in electrospray mass spectrometry
GB9914836D0 (en) * 1999-06-24 1999-08-25 Thermo Instr Systems Inc Method and apparatus for discriminating ions having the same nominal mass to charge ratio
US7002144B1 (en) * 1999-08-30 2006-02-21 Micron Technology Inc. Transfer line for measurement systems
US6528784B1 (en) 1999-12-03 2003-03-04 Thermo Finnigan Llc Mass spectrometer system including a double ion guide interface and method of operation
US6809312B1 (en) * 2000-05-12 2004-10-26 Bruker Daltonics, Inc. Ionization source chamber and ion beam delivery system for mass spectrometry
US6649907B2 (en) 2001-03-08 2003-11-18 Wisconsin Alumni Research Foundation Charge reduction electrospray ionization ion source
CA2440833C (en) 2001-03-29 2009-07-14 Wisconsin Alumni Research Foundation Piezoelectric charged droplet source
JP4636800B2 (ja) * 2002-03-08 2011-02-23 ヴァリアン オーストラリア ピーティーワイ．エルティーディー． プラズマ質量分析計
US6992281B2 (en) * 2002-05-01 2006-01-31 Micromass Uk Limited Mass spectrometer
GB0210930D0 (en) 2002-05-13 2002-06-19 Thermo Electron Corp Improved mass spectrometer and mass filters therefor
US7078679B2 (en) * 2002-11-27 2006-07-18 Wisconsin Alumni Research Foundation Inductive detection for mass spectrometry
US7518108B2 (en) * 2005-11-10 2009-04-14 Wisconsin Alumni Research Foundation Electrospray ionization ion source with tunable charge reduction
JP5452839B2 (ja) * 2006-10-05 2014-03-26 アジレント・テクノロジーズ・インク 分析装置
JP5308641B2 (ja) * 2007-08-09 2013-10-09 アジレント・テクノロジーズ・インク プラズマ質量分析装置
US8334506B2 (en) 2007-12-10 2012-12-18 1St Detect Corporation End cap voltage control of ion traps
US7973277B2 (en) 2008-05-27 2011-07-05 1St Detect Corporation Driving a mass spectrometer ion trap or mass filter
EP2780930A4 (de) * 2011-11-15 2015-07-22 Univ Helsinki Verfahren und vorrichtung zur bestimmung der eigenschaften von gasphasenbasen oder -säuren
GB2497799B (en) 2011-12-21 2016-06-22 Thermo Fisher Scient (Bremen) Gmbh Collision cell multipole
US9406490B1 (en) 2014-05-02 2016-08-02 Elemental Scientific, Inc. Determination of metal and metalloid concentrations using ICPMS
DE102014226038A1 (de) * 2014-12-16 2016-06-16 Carl Zeiss Microscopy Gmbh Druckreduzierungseinrichtung, Vorrichtung zur massenspektrometrischen Analyse eines Gases und Reinigungsverfahren
GB201513167D0 (en) 2015-07-27 2015-09-09 Thermo Fisher Scient Bremen Elemental analysis of organic samples
GB2546060B (en) 2015-08-14 2018-12-19 Thermo Fisher Scient Bremen Gmbh Multi detector mass spectrometer and spectrometry method
GB2541383B (en) 2015-08-14 2018-12-12 Thermo Fisher Scient Bremen Gmbh Mirror lens for directing an ion beam
GB2541384B (en) 2015-08-14 2018-11-14 Thermo Fisher Scient Bremen Gmbh Collision cell having an axial field
GB2544484B (en) 2015-11-17 2019-01-30 Thermo Fisher Scient Bremen Gmbh Addition of reactive species to ICP source in a mass spectrometer
GB2561142B (en) 2016-12-19 2019-05-08 Thermo Fisher Scient Bremen Gmbh Determination of isobaric interferences in a mass spectrometer
GB2568178B (en) * 2017-02-23 2020-09-02 Thermo Fisher Scient (Bremen) Gmbh Methods in mass spectrometry using collision gas as ion source
GB2560160B (en) 2017-02-23 2021-08-18 Thermo Fisher Scient Bremen Gmbh Methods in mass spectrometry using collision gas as ion source
JP7094752B2 (ja) * 2018-03-29 2022-07-04 株式会社ニューフレアテクノロジー 荷電粒子ビーム照射装置

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JP2753265B2 (ja) * 1988-06-10 1998-05-18 株式会社日立製作所 プラズマイオン化質量分析計
JP2765890B2 (ja) * 1988-12-09 1998-06-18 株式会社日立製作所 プラズマイオン源微量元素質量分析装置
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US5313067A (en) * 1992-05-27 1994-05-17 Iowa State University Research Foundation, Inc. Ion processing apparatus including plasma ion source and mass spectrometer for ion deposition, ion implantation, or isotope separation
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US5396064A (en) * 1994-01-11 1995-03-07 Varian Associates, Inc. Quadrupole trap ion isolation method

Also Published As

Publication number Publication date
AU1822897A (en) 1997-08-01
JP3573464B2 (ja) 2004-10-06
JPH11509036A (ja) 1999-08-03
US5767512A (en) 1998-06-16
AU705918B2 (en) 1999-06-03
EP0871977A1 (de) 1998-10-21
EP1465233A2 (de) 2004-10-06
DE69729176D1 (de) 2004-06-24
DE69729176T2 (de) 2004-11-18
JP2004006328A (ja) 2004-01-08
WO1997025737A1 (en) 1997-07-17
EP0871977B1 (de) 2004-05-19

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