ATE214156T1 - Dichotomisches abtastsystem zur kantenbestimmung von gegenständen mit relativ gleichförmigen oberflächen - Google Patents
Dichotomisches abtastsystem zur kantenbestimmung von gegenständen mit relativ gleichförmigen oberflächenInfo
- Publication number
- ATE214156T1 ATE214156T1 AT96250121T AT96250121T ATE214156T1 AT E214156 T1 ATE214156 T1 AT E214156T1 AT 96250121 T AT96250121 T AT 96250121T AT 96250121 T AT96250121 T AT 96250121T AT E214156 T1 ATE214156 T1 AT E214156T1
- Authority
- AT
- Austria
- Prior art keywords
- light
- leading
- objects
- edge
- detections
- Prior art date
Links
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
- B65H—HANDLING THIN OR FILAMENTARY MATERIAL, e.g. SHEETS, WEBS, CABLES
- B65H7/00—Controlling article feeding, separating, pile-advancing, or associated apparatus, to take account of incorrect feeding, absence of articles, or presence of faulty articles
- B65H7/02—Controlling article feeding, separating, pile-advancing, or associated apparatus, to take account of incorrect feeding, absence of articles, or presence of faulty articles by feelers or detectors
- B65H7/06—Controlling article feeding, separating, pile-advancing, or associated apparatus, to take account of incorrect feeding, absence of articles, or presence of faulty articles by feelers or detectors responsive to presence of faulty articles or incorrect separation or feed
- B65H7/12—Controlling article feeding, separating, pile-advancing, or associated apparatus, to take account of incorrect feeding, absence of articles, or presence of faulty articles by feelers or detectors responsive to presence of faulty articles or incorrect separation or feed responsive to double feed or separation
- B65H7/125—Controlling article feeding, separating, pile-advancing, or associated apparatus, to take account of incorrect feeding, absence of articles, or presence of faulty articles by feelers or detectors responsive to presence of faulty articles or incorrect separation or feed responsive to double feed or separation sensing the double feed or separation without contacting the articles
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
- G01B11/028—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by measuring lateral position of a boundary of the object
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
- G01B11/04—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness specially adapted for measuring length or width of objects while moving
- G01B11/043—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness specially adapted for measuring length or width of objects while moving for measuring length
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US08/482,827 US5659396A (en) | 1995-06-07 | 1995-06-07 | Dichotomous scan system for detection of edges of objects and overlapped objects having relatively uniform surfaces |
Publications (1)
Publication Number | Publication Date |
---|---|
ATE214156T1 true ATE214156T1 (de) | 2002-03-15 |
Family
ID=23917621
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
AT96250121T ATE214156T1 (de) | 1995-06-07 | 1996-06-06 | Dichotomisches abtastsystem zur kantenbestimmung von gegenständen mit relativ gleichförmigen oberflächen |
Country Status (4)
Country | Link |
---|---|
US (2) | US5659396A (de) |
EP (1) | EP0747665B1 (de) |
AT (1) | ATE214156T1 (de) |
DE (1) | DE69619591T2 (de) |
Families Citing this family (25)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5969371A (en) * | 1996-08-29 | 1999-10-19 | Hewlett-Packard Company | Method and apparatus for finding media top-of-page in an optical image scanner |
JPH10229473A (ja) | 1997-01-21 | 1998-08-25 | Xerox Corp | 二重焦点深度入力スキャナ |
DE10142331C1 (de) * | 2001-08-30 | 2003-03-27 | Siemens Dematic Ag | Verfahren und Anordnung zum Erkennen von Überlappungen |
WO2003024849A1 (de) * | 2001-09-12 | 2003-03-27 | Wincor Nixdorf International Gmbh | Verfahren und einrichtung zum erfassen von mehrfachabzügen beim abziehen von einzelblättern von einem blattpaket |
US6817610B2 (en) * | 2001-12-03 | 2004-11-16 | Siemens Aktiengesellschaft | Multiples detect apparatus and method |
US6927864B2 (en) * | 2002-08-05 | 2005-08-09 | Xyratex Technology Limited | Method and system for determining dimensions of optically recognizable features |
US7235806B2 (en) * | 2003-05-16 | 2007-06-26 | Asm America, Inc. | Wafer edge with light sensor |
US6823753B1 (en) * | 2003-05-16 | 2004-11-30 | Asm America, Inc. | Sensor signal transmission from processing system |
US7684053B2 (en) * | 2006-12-12 | 2010-03-23 | Hong Kong Applied Science And Technology Research Institute Co., Ltd. | Optical displacement sensor and distance measuring apparatus |
CN101369549B (zh) * | 2007-08-14 | 2010-12-08 | 京元电子股份有限公司 | 叠料监视装置与方法 |
KR101489963B1 (ko) | 2007-12-13 | 2015-02-04 | 한국에이에스엠지니텍 주식회사 | 박막 증착 장치 및 이를 이용한 증착 방법 |
US8273178B2 (en) | 2008-02-28 | 2012-09-25 | Asm Genitech Korea Ltd. | Thin film deposition apparatus and method of maintaining the same |
US8139231B2 (en) * | 2008-05-01 | 2012-03-20 | Cognex Corporation | Machine vision technique for manufacturing semiconductor wafers |
US8570516B2 (en) * | 2008-09-12 | 2013-10-29 | Cognex Corporation | Infrared direct illumination machine vision technique for semiconductor processing equipment |
US8189194B2 (en) * | 2008-09-12 | 2012-05-29 | Cognex Corporation | Direct illumination machine vision technique for processing semiconductor wafers |
US20110238589A1 (en) * | 2010-03-25 | 2011-09-29 | Don Willis | Commodity identification, verification and authentication system and methods of use |
DE102010022273A1 (de) * | 2010-05-31 | 2011-12-01 | Sick Ag | Optoelektronischer Sensor zur Detektion von Objektkanten |
CN103443802B (zh) | 2011-01-24 | 2016-12-14 | 数据逻辑Adc公司 | 用于读取光学代码的系统和方法 |
JP6021909B2 (ja) | 2011-07-21 | 2016-11-09 | ブルックス オートメーション インコーポレイテッド | 低温試料グループホルダーにおける寸法変化の補正のための方法と装置 |
US8508719B2 (en) * | 2011-11-09 | 2013-08-13 | Cheng Uei Precision Industry Co., Ltd. | Method for measuring the heights of components based on laser ranging |
ES2553878T3 (es) | 2012-09-17 | 2015-12-14 | Roland Electronic Gmbh | Procedimiento y dispositivo para detectar piezas dobles |
EP2801786B1 (de) | 2013-05-08 | 2019-01-02 | Sick AG | Optoelektronischer Sensor und Verfahren zur Erkennung von Objektkanten |
JP2015104476A (ja) * | 2013-11-29 | 2015-06-08 | 船井電機株式会社 | 光音響画像化装置 |
JP6606549B2 (ja) * | 2014-08-08 | 2019-11-13 | パーセプティメッド インコーポレイテッド | 錠剤の速度及び位置センサ |
US11014093B1 (en) * | 2017-11-22 | 2021-05-25 | Amazon Technologies, Inc. | Secure destruction machine |
Family Cites Families (20)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3283163A (en) * | 1963-11-06 | 1966-11-01 | Ibm | Photosensitive overlapped document detector |
US3278754A (en) * | 1964-09-16 | 1966-10-11 | Ibm | Photosensitive double document detector |
US3414732A (en) * | 1965-10-19 | 1968-12-03 | Milgo Electronic Corp | Counter for folded paper objects |
SE331367B (de) * | 1967-11-03 | 1970-12-21 | Nordstjernan Rederi Ab | |
US3614419A (en) * | 1970-04-06 | 1971-10-19 | Xerox Corp | Multiple sheet detection system |
US3737666A (en) * | 1971-04-15 | 1973-06-05 | L Dutro | Counter for a stream of overlapped articles |
US3892492A (en) * | 1972-10-16 | 1975-07-01 | Loepfe Ag Geb | Optoelectrical apparatus with directional light sources for detecting reflection behaviour of an object |
US3822946A (en) * | 1972-12-07 | 1974-07-09 | Schiller Industries Inc | Dimensional measuring apparatus using optical scan especially for hardness testing |
US4063820A (en) * | 1975-11-10 | 1977-12-20 | Rca Corporation | Apparatus for measuring a dimension of an object |
JPS5263755A (en) * | 1975-11-22 | 1977-05-26 | Nippon Chemical Ind | Pattern line width measuring device |
DE2554086A1 (de) * | 1975-12-02 | 1977-06-16 | Ibm Deutschland | Verfahren zur analyse und/oder zur ortsbestimmung von kanten |
US4217491A (en) * | 1978-06-29 | 1980-08-12 | Nolan Systems Inc. | Counting system for articles conveyed in a stream |
US4286149A (en) * | 1979-08-09 | 1981-08-25 | Ncr Canada Ltd - Ncr Canada Ltee | Apparatus and method for detection of overlapping objects |
US4481667A (en) * | 1981-12-21 | 1984-11-06 | Autronics Corporation | Item counting apparatus |
JPS58223004A (ja) * | 1982-06-21 | 1983-12-24 | Hitachi Ltd | 段差の山谷識別装置 |
US4679941A (en) * | 1983-09-16 | 1987-07-14 | Citizen Watch Co., Ltd. | Micro-dimensional measurement apparatus |
SE463724B (sv) * | 1989-05-09 | 1991-01-14 | Atlas Copco Constr & Mining | Bearbetningsverktyg foer tunnelborrningsmaskin |
US5351126A (en) * | 1991-10-31 | 1994-09-27 | Matsushita Electric Works, Ltd. | Optical measurement system for determination of an object's profile or thickness |
CH684656A5 (de) * | 1992-05-06 | 1994-11-15 | Baumer Electric Ag | Verfahren und Vorrichtung zum Erkennen und Auswerten von Kanten an Gegenständen. |
JPH0820222B2 (ja) * | 1992-05-20 | 1996-03-04 | 新光電子株式会社 | 長さ測定装置 |
-
1995
- 1995-06-07 US US08/482,827 patent/US5659396A/en not_active Expired - Fee Related
-
1996
- 1996-06-06 DE DE69619591T patent/DE69619591T2/de not_active Expired - Fee Related
- 1996-06-06 AT AT96250121T patent/ATE214156T1/de not_active IP Right Cessation
- 1996-06-06 EP EP96250121A patent/EP0747665B1/de not_active Expired - Lifetime
-
1997
- 1997-08-15 US US08/912,918 patent/US5841540A/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
US5841540A (en) | 1998-11-24 |
EP0747665B1 (de) | 2002-03-06 |
DE69619591T2 (de) | 2002-10-24 |
EP0747665A3 (de) | 1997-05-21 |
DE69619591D1 (de) | 2002-04-11 |
EP0747665A2 (de) | 1996-12-11 |
US5659396A (en) | 1997-08-19 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
RER | Ceased as to paragraph 5 lit. 3 law introducing patent treaties |