ATE214156T1 - Dichotomisches abtastsystem zur kantenbestimmung von gegenständen mit relativ gleichförmigen oberflächen - Google Patents

Dichotomisches abtastsystem zur kantenbestimmung von gegenständen mit relativ gleichförmigen oberflächen

Info

Publication number
ATE214156T1
ATE214156T1 AT96250121T AT96250121T ATE214156T1 AT E214156 T1 ATE214156 T1 AT E214156T1 AT 96250121 T AT96250121 T AT 96250121T AT 96250121 T AT96250121 T AT 96250121T AT E214156 T1 ATE214156 T1 AT E214156T1
Authority
AT
Austria
Prior art keywords
light
leading
objects
edge
detections
Prior art date
Application number
AT96250121T
Other languages
English (en)
Inventor
George R Mondie
Original Assignee
Electrocom Automation Lp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Electrocom Automation Lp filed Critical Electrocom Automation Lp
Application granted granted Critical
Publication of ATE214156T1 publication Critical patent/ATE214156T1/de

Links

Classifications

    • BPERFORMING OPERATIONS; TRANSPORTING
    • B65CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
    • B65HHANDLING THIN OR FILAMENTARY MATERIAL, e.g. SHEETS, WEBS, CABLES
    • B65H7/00Controlling article feeding, separating, pile-advancing, or associated apparatus, to take account of incorrect feeding, absence of articles, or presence of faulty articles
    • B65H7/02Controlling article feeding, separating, pile-advancing, or associated apparatus, to take account of incorrect feeding, absence of articles, or presence of faulty articles by feelers or detectors
    • B65H7/06Controlling article feeding, separating, pile-advancing, or associated apparatus, to take account of incorrect feeding, absence of articles, or presence of faulty articles by feelers or detectors responsive to presence of faulty articles or incorrect separation or feed
    • B65H7/12Controlling article feeding, separating, pile-advancing, or associated apparatus, to take account of incorrect feeding, absence of articles, or presence of faulty articles by feelers or detectors responsive to presence of faulty articles or incorrect separation or feed responsive to double feed or separation
    • B65H7/125Controlling article feeding, separating, pile-advancing, or associated apparatus, to take account of incorrect feeding, absence of articles, or presence of faulty articles by feelers or detectors responsive to presence of faulty articles or incorrect separation or feed responsive to double feed or separation sensing the double feed or separation without contacting the articles
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/02Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/028Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by measuring lateral position of a boundary of the object
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/02Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/04Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness specially adapted for measuring length or width of objects while moving
    • G01B11/043Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness specially adapted for measuring length or width of objects while moving for measuring length

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
AT96250121T 1995-06-07 1996-06-06 Dichotomisches abtastsystem zur kantenbestimmung von gegenständen mit relativ gleichförmigen oberflächen ATE214156T1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US08/482,827 US5659396A (en) 1995-06-07 1995-06-07 Dichotomous scan system for detection of edges of objects and overlapped objects having relatively uniform surfaces

Publications (1)

Publication Number Publication Date
ATE214156T1 true ATE214156T1 (de) 2002-03-15

Family

ID=23917621

Family Applications (1)

Application Number Title Priority Date Filing Date
AT96250121T ATE214156T1 (de) 1995-06-07 1996-06-06 Dichotomisches abtastsystem zur kantenbestimmung von gegenständen mit relativ gleichförmigen oberflächen

Country Status (4)

Country Link
US (2) US5659396A (de)
EP (1) EP0747665B1 (de)
AT (1) ATE214156T1 (de)
DE (1) DE69619591T2 (de)

Families Citing this family (25)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5969371A (en) * 1996-08-29 1999-10-19 Hewlett-Packard Company Method and apparatus for finding media top-of-page in an optical image scanner
JPH10229473A (ja) 1997-01-21 1998-08-25 Xerox Corp 二重焦点深度入力スキャナ
DE10142331C1 (de) * 2001-08-30 2003-03-27 Siemens Dematic Ag Verfahren und Anordnung zum Erkennen von Überlappungen
WO2003024849A1 (de) * 2001-09-12 2003-03-27 Wincor Nixdorf International Gmbh Verfahren und einrichtung zum erfassen von mehrfachabzügen beim abziehen von einzelblättern von einem blattpaket
US6817610B2 (en) * 2001-12-03 2004-11-16 Siemens Aktiengesellschaft Multiples detect apparatus and method
US6927864B2 (en) * 2002-08-05 2005-08-09 Xyratex Technology Limited Method and system for determining dimensions of optically recognizable features
US7235806B2 (en) * 2003-05-16 2007-06-26 Asm America, Inc. Wafer edge with light sensor
US6823753B1 (en) * 2003-05-16 2004-11-30 Asm America, Inc. Sensor signal transmission from processing system
US7684053B2 (en) * 2006-12-12 2010-03-23 Hong Kong Applied Science And Technology Research Institute Co., Ltd. Optical displacement sensor and distance measuring apparatus
CN101369549B (zh) * 2007-08-14 2010-12-08 京元电子股份有限公司 叠料监视装置与方法
KR101489963B1 (ko) 2007-12-13 2015-02-04 한국에이에스엠지니텍 주식회사 박막 증착 장치 및 이를 이용한 증착 방법
US8273178B2 (en) 2008-02-28 2012-09-25 Asm Genitech Korea Ltd. Thin film deposition apparatus and method of maintaining the same
US8139231B2 (en) * 2008-05-01 2012-03-20 Cognex Corporation Machine vision technique for manufacturing semiconductor wafers
US8570516B2 (en) * 2008-09-12 2013-10-29 Cognex Corporation Infrared direct illumination machine vision technique for semiconductor processing equipment
US8189194B2 (en) * 2008-09-12 2012-05-29 Cognex Corporation Direct illumination machine vision technique for processing semiconductor wafers
US20110238589A1 (en) * 2010-03-25 2011-09-29 Don Willis Commodity identification, verification and authentication system and methods of use
DE102010022273A1 (de) * 2010-05-31 2011-12-01 Sick Ag Optoelektronischer Sensor zur Detektion von Objektkanten
CN103443802B (zh) 2011-01-24 2016-12-14 数据逻辑Adc公司 用于读取光学代码的系统和方法
JP6021909B2 (ja) 2011-07-21 2016-11-09 ブルックス オートメーション インコーポレイテッド 低温試料グループホルダーにおける寸法変化の補正のための方法と装置
US8508719B2 (en) * 2011-11-09 2013-08-13 Cheng Uei Precision Industry Co., Ltd. Method for measuring the heights of components based on laser ranging
ES2553878T3 (es) 2012-09-17 2015-12-14 Roland Electronic Gmbh Procedimiento y dispositivo para detectar piezas dobles
EP2801786B1 (de) 2013-05-08 2019-01-02 Sick AG Optoelektronischer Sensor und Verfahren zur Erkennung von Objektkanten
JP2015104476A (ja) * 2013-11-29 2015-06-08 船井電機株式会社 光音響画像化装置
JP6606549B2 (ja) * 2014-08-08 2019-11-13 パーセプティメッド インコーポレイテッド 錠剤の速度及び位置センサ
US11014093B1 (en) * 2017-11-22 2021-05-25 Amazon Technologies, Inc. Secure destruction machine

Family Cites Families (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3283163A (en) * 1963-11-06 1966-11-01 Ibm Photosensitive overlapped document detector
US3278754A (en) * 1964-09-16 1966-10-11 Ibm Photosensitive double document detector
US3414732A (en) * 1965-10-19 1968-12-03 Milgo Electronic Corp Counter for folded paper objects
SE331367B (de) * 1967-11-03 1970-12-21 Nordstjernan Rederi Ab
US3614419A (en) * 1970-04-06 1971-10-19 Xerox Corp Multiple sheet detection system
US3737666A (en) * 1971-04-15 1973-06-05 L Dutro Counter for a stream of overlapped articles
US3892492A (en) * 1972-10-16 1975-07-01 Loepfe Ag Geb Optoelectrical apparatus with directional light sources for detecting reflection behaviour of an object
US3822946A (en) * 1972-12-07 1974-07-09 Schiller Industries Inc Dimensional measuring apparatus using optical scan especially for hardness testing
US4063820A (en) * 1975-11-10 1977-12-20 Rca Corporation Apparatus for measuring a dimension of an object
JPS5263755A (en) * 1975-11-22 1977-05-26 Nippon Chemical Ind Pattern line width measuring device
DE2554086A1 (de) * 1975-12-02 1977-06-16 Ibm Deutschland Verfahren zur analyse und/oder zur ortsbestimmung von kanten
US4217491A (en) * 1978-06-29 1980-08-12 Nolan Systems Inc. Counting system for articles conveyed in a stream
US4286149A (en) * 1979-08-09 1981-08-25 Ncr Canada Ltd - Ncr Canada Ltee Apparatus and method for detection of overlapping objects
US4481667A (en) * 1981-12-21 1984-11-06 Autronics Corporation Item counting apparatus
JPS58223004A (ja) * 1982-06-21 1983-12-24 Hitachi Ltd 段差の山谷識別装置
US4679941A (en) * 1983-09-16 1987-07-14 Citizen Watch Co., Ltd. Micro-dimensional measurement apparatus
SE463724B (sv) * 1989-05-09 1991-01-14 Atlas Copco Constr & Mining Bearbetningsverktyg foer tunnelborrningsmaskin
US5351126A (en) * 1991-10-31 1994-09-27 Matsushita Electric Works, Ltd. Optical measurement system for determination of an object's profile or thickness
CH684656A5 (de) * 1992-05-06 1994-11-15 Baumer Electric Ag Verfahren und Vorrichtung zum Erkennen und Auswerten von Kanten an Gegenständen.
JPH0820222B2 (ja) * 1992-05-20 1996-03-04 新光電子株式会社 長さ測定装置

Also Published As

Publication number Publication date
US5841540A (en) 1998-11-24
EP0747665B1 (de) 2002-03-06
DE69619591T2 (de) 2002-10-24
EP0747665A3 (de) 1997-05-21
DE69619591D1 (de) 2002-04-11
EP0747665A2 (de) 1996-12-11
US5659396A (en) 1997-08-19

Similar Documents

Publication Publication Date Title
ATE214156T1 (de) Dichotomisches abtastsystem zur kantenbestimmung von gegenständen mit relativ gleichförmigen oberflächen
MY123530A (en) High speed flaw detecting system for reflective material
KR950033416A (ko) 용기 마무리부 조사 장치 및 방법
DE69631618D1 (de) Zweileitungsabtastsystem zur Detektion von überlappenden Gegenständen
DE3688547T2 (de) "diffraktosight"-verfahren.
DE69221931T2 (de) Optische Abtastvorrichtung
US6752318B2 (en) Optical symbol reading device
DE69723510D1 (de) Verfahren und Vorrichtung zur automatischen Erkennung und Klassifizierung von Mängeln in Paletten oder ähnlichen Objekten
JP2704145B2 (ja) ラベル位置検出装置
ATE177549T1 (de) Verfahren und gerät zur verarbeitung von bildern mit symbolen mit dichten kanten
CA2083037A1 (en) Method and apparatus for determining the image clarity of a surface
JPH10142350A (ja) 物品検出装置
ATE26893T1 (de) Vorrichtung zum erkennen von dokumenten mittels modulierten reflektierten lichtes.
DE3889190D1 (de) Vorrichtung zur Prüfung von Münzen.
SU1179392A1 (ru) Способ обнаружени локальных неоднородностей изображений объектов
ATE190406T1 (de) Verfahren zur automatischen detektion von festen oder beweglichen objekten in natürlicher umgebung einer echtzeitbildfolge
JPS56155803A (en) Shape detector
JPH0694438A (ja) 光切断法による外観検査装置
JPS6469987A (en) Presence detecting apparatus for electronic part in printed board
JPS5796206A (en) Graphic inspection
JPH0431984A (ja) 無人搬送車を用いた搬送システムにおける光学式マーク検出方法
JPH0241586A (ja) 帳票搬送装置
JPS61259150A (ja) 板材エツジ部の線状疵検出方法
KR970012216A (ko) 휴대용 스캐너의 스캐닝제어장치
JPS6473206A (en) Pattern detector

Legal Events

Date Code Title Description
RER Ceased as to paragraph 5 lit. 3 law introducing patent treaties