ATE168306T1 - Vorrichtung zum chemisch-mechanischen polieren mit verbesserter verteilung der polierzusammensetzung - Google Patents

Vorrichtung zum chemisch-mechanischen polieren mit verbesserter verteilung der polierzusammensetzung

Info

Publication number
ATE168306T1
ATE168306T1 AT95301342T AT95301342T ATE168306T1 AT E168306 T1 ATE168306 T1 AT E168306T1 AT 95301342 T AT95301342 T AT 95301342T AT 95301342 T AT95301342 T AT 95301342T AT E168306 T1 ATE168306 T1 AT E168306T1
Authority
AT
Austria
Prior art keywords
polishing pad
polishing
chemical
improved distribution
mechanical polishing
Prior art date
Application number
AT95301342T
Other languages
English (en)
Inventor
Homayoun Talieh
Original Assignee
Applied Materials Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Applied Materials Inc filed Critical Applied Materials Inc
Application granted granted Critical
Publication of ATE168306T1 publication Critical patent/ATE168306T1/de

Links

Classifications

    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B37/00Lapping machines or devices; Accessories
    • B24B37/11Lapping tools
    • B24B37/20Lapping pads for working plane surfaces
    • B24B37/26Lapping pads for working plane surfaces characterised by the shape of the lapping pad surface, e.g. grooved
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B37/00Lapping machines or devices; Accessories
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/30Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
    • H01L21/302Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
    • H01L21/304Mechanical treatment, e.g. grinding, polishing, cutting

Landscapes

  • Engineering & Computer Science (AREA)
  • Mechanical Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Mechanical Treatment Of Semiconductor (AREA)
  • Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
AT95301342T 1994-03-02 1995-03-02 Vorrichtung zum chemisch-mechanischen polieren mit verbesserter verteilung der polierzusammensetzung ATE168306T1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US08/205,278 US5650039A (en) 1994-03-02 1994-03-02 Chemical mechanical polishing apparatus with improved slurry distribution

Publications (1)

Publication Number Publication Date
ATE168306T1 true ATE168306T1 (de) 1998-08-15

Family

ID=22761558

Family Applications (1)

Application Number Title Priority Date Filing Date
AT95301342T ATE168306T1 (de) 1994-03-02 1995-03-02 Vorrichtung zum chemisch-mechanischen polieren mit verbesserter verteilung der polierzusammensetzung

Country Status (6)

Country Link
US (1) US5650039A (de)
EP (1) EP0674972B1 (de)
JP (1) JPH0839423A (de)
KR (1) KR950031381A (de)
AT (1) ATE168306T1 (de)
DE (1) DE69503408T2 (de)

Families Citing this family (81)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5908530A (en) * 1995-05-18 1999-06-01 Obsidian, Inc. Apparatus for chemical mechanical polishing
KR970018240A (ko) * 1995-09-08 1997-04-30 모리시다 요이치 반도체 기판의 연마방법 및 그 장치
US5709593A (en) * 1995-10-27 1998-01-20 Applied Materials, Inc. Apparatus and method for distribution of slurry in a chemical mechanical polishing system
US5938507A (en) * 1995-10-27 1999-08-17 Applied Materials, Inc. Linear conditioner apparatus for a chemical mechanical polishing system
US5840202A (en) * 1996-04-26 1998-11-24 Memc Electronic Materials, Inc. Apparatus and method for shaping polishing pads
US6056851A (en) * 1996-06-24 2000-05-02 Taiwan Semiconductor Manufacturing Company Slurry supply system for chemical mechanical polishing
US6328642B1 (en) 1997-02-14 2001-12-11 Lam Research Corporation Integrated pad and belt for chemical mechanical polishing
US6019670A (en) * 1997-03-10 2000-02-01 Applied Materials, Inc. Method and apparatus for conditioning a polishing pad in a chemical mechanical polishing system
US5944583A (en) * 1997-03-17 1999-08-31 International Business Machines Corporation Composite polish pad for CMP
US6273806B1 (en) 1997-05-15 2001-08-14 Applied Materials, Inc. Polishing pad having a grooved pattern for use in a chemical mechanical polishing apparatus
US5921855A (en) * 1997-05-15 1999-07-13 Applied Materials, Inc. Polishing pad having a grooved pattern for use in a chemical mechanical polishing system
US6030487A (en) * 1997-06-19 2000-02-29 International Business Machines Corporation Wafer carrier assembly
US5957754A (en) * 1997-08-29 1999-09-28 Applied Materials, Inc. Cavitational polishing pad conditioner
JPH11216663A (ja) * 1998-02-03 1999-08-10 Sony Corp 研磨パッド、研磨装置および研磨方法
US6015499A (en) * 1998-04-17 2000-01-18 Parker-Hannifin Corporation Membrane-like filter element for chemical mechanical polishing slurries
US6106662A (en) * 1998-06-08 2000-08-22 Speedfam-Ipec Corporation Method and apparatus for endpoint detection for chemical mechanical polishing
US6135865A (en) * 1998-08-31 2000-10-24 International Business Machines Corporation CMP apparatus with built-in slurry distribution and removal
US6203407B1 (en) 1998-09-03 2001-03-20 Micron Technology, Inc. Method and apparatus for increasing-chemical-polishing selectivity
US6235635B1 (en) 1998-11-19 2001-05-22 Chartered Semiconductor Manufacturing Ltd. Linear CMP tool design using in-situ slurry distribution and concurrent pad conditioning
US6464571B2 (en) 1998-12-01 2002-10-15 Nutool, Inc. Polishing apparatus and method with belt drive system adapted to extend the lifetime of a refreshing polishing belt provided therein
US6589105B2 (en) 1998-12-01 2003-07-08 Nutool, Inc. Pad tensioning method and system in a bi-directional linear polisher
US6103628A (en) * 1998-12-01 2000-08-15 Nutool, Inc. Reverse linear polisher with loadable housing
US7204917B2 (en) 1998-12-01 2007-04-17 Novellus Systems, Inc. Workpiece surface influencing device designs for electrochemical mechanical processing and method of using the same
US6468139B1 (en) 1998-12-01 2002-10-22 Nutool, Inc. Polishing apparatus and method with a refreshing polishing belt and loadable housing
US7425250B2 (en) * 1998-12-01 2008-09-16 Novellus Systems, Inc. Electrochemical mechanical processing apparatus
US6409904B1 (en) 1998-12-01 2002-06-25 Nutool, Inc. Method and apparatus for depositing and controlling the texture of a thin film
US6328872B1 (en) 1999-04-03 2001-12-11 Nutool, Inc. Method and apparatus for plating and polishing a semiconductor substrate
US6261168B1 (en) 1999-05-21 2001-07-17 Lam Research Corporation Chemical mechanical planarization or polishing pad with sections having varied groove patterns
US6273797B1 (en) * 1999-11-19 2001-08-14 International Business Machines Corporation In-situ automated CMP wedge conditioner
US20020068516A1 (en) * 1999-12-13 2002-06-06 Applied Materials, Inc Apparatus and method for controlled delivery of slurry to a region of a polishing device
KR100575857B1 (ko) * 1999-12-29 2006-05-03 주식회사 하이닉스반도체 반도체 제조용 연마판
US6241596B1 (en) 2000-01-14 2001-06-05 Applied Materials, Inc. Method and apparatus for chemical mechanical polishing using a patterned pad
US6630059B1 (en) * 2000-01-14 2003-10-07 Nutool, Inc. Workpeice proximity plating apparatus
US6579797B1 (en) * 2000-01-25 2003-06-17 Agere Systems Inc. Cleaning brush conditioning apparatus
US20090020437A1 (en) * 2000-02-23 2009-01-22 Basol Bulent M Method and system for controlled material removal by electrochemical polishing
US6488565B1 (en) 2000-08-29 2002-12-03 Applied Materials, Inc. Apparatus for chemical mechanical planarization having nested load cups
JP2002200555A (ja) * 2000-12-28 2002-07-16 Ebara Corp 研磨工具および該研磨工具を具備したポリッシング装置
US6609961B2 (en) 2001-01-09 2003-08-26 Lam Research Corporation Chemical mechanical planarization belt assembly and method of assembly
US6620031B2 (en) 2001-04-04 2003-09-16 Lam Research Corporation Method for optimizing the planarizing length of a polishing pad
US6837779B2 (en) * 2001-05-07 2005-01-04 Applied Materials, Inc. Chemical mechanical polisher with grooved belt
KR20030015567A (ko) * 2001-08-16 2003-02-25 에스케이에버텍 주식회사 웨이브 형태의 그루브가 형성된 화학적 기계적 연마패드
US7314402B2 (en) * 2001-11-15 2008-01-01 Speedfam-Ipec Corporation Method and apparatus for controlling slurry distribution
US6939203B2 (en) * 2002-04-18 2005-09-06 Asm Nutool, Inc. Fluid bearing slide assembly for workpiece polishing
US7704125B2 (en) 2003-03-24 2010-04-27 Nexplanar Corporation Customized polishing pads for CMP and methods of fabrication and use thereof
US7377840B2 (en) 2004-07-21 2008-05-27 Neopad Technologies Corporation Methods for producing in-situ grooves in chemical mechanical planarization (CMP) pads, and novel CMP pad designs
US8864859B2 (en) 2003-03-25 2014-10-21 Nexplanar Corporation Customized polishing pads for CMP and methods of fabrication and use thereof
US9278424B2 (en) 2003-03-25 2016-03-08 Nexplanar Corporation Customized polishing pads for CMP and methods of fabrication and use thereof
US6783436B1 (en) 2003-04-29 2004-08-31 Rohm And Haas Electronic Materials Cmp Holdings, Inc. Polishing pad with optimized grooves and method of forming same
JP4292025B2 (ja) 2003-05-23 2009-07-08 Jsr株式会社 研磨パッド
US7442116B2 (en) 2003-11-04 2008-10-28 Jsr Corporation Chemical mechanical polishing pad
US7125318B2 (en) * 2003-11-13 2006-10-24 Rohm And Haas Electronic Materials Cmp Holdings, Inc. Polishing pad having a groove arrangement for reducing slurry consumption
US7648622B2 (en) * 2004-02-27 2010-01-19 Novellus Systems, Inc. System and method for electrochemical mechanical polishing
US7329174B2 (en) 2004-05-20 2008-02-12 Jsr Corporation Method of manufacturing chemical mechanical polishing pad
US20050260929A1 (en) * 2004-05-20 2005-11-24 Jsr Corporation Chemical mechanical polishing pad and chemical mechanical polishing method
JP2005340271A (ja) * 2004-05-24 2005-12-08 Jsr Corp 化学機械研磨用パッド
US7198549B2 (en) * 2004-06-16 2007-04-03 Cabot Microelectronics Corporation Continuous contour polishing of a multi-material surface
EP1637281B1 (de) 2004-09-17 2008-05-28 JSR Corporation Chemisch-mechanisches Polierkissen und chemisch-mechanisches Polierverfahren
US7059949B1 (en) 2004-12-14 2006-06-13 Rohm And Haas Electronic Materials Cmp Holdings, Inc. CMP pad having an overlapping stepped groove arrangement
US7059950B1 (en) 2004-12-14 2006-06-13 Rohm And Haas Electronic Materials Cmp Holdings, Inc. CMP polishing pad having grooves arranged to improve polishing medium utilization
US7182677B2 (en) * 2005-01-14 2007-02-27 Applied Materials, Inc. Chemical mechanical polishing pad for controlling polishing slurry distribution
JP2007103602A (ja) * 2005-10-03 2007-04-19 Toshiba Corp 研磨パッド及び研磨装置
US7226345B1 (en) 2005-12-09 2007-06-05 The Regents Of The University Of California CMP pad with designed surface features
US20070197132A1 (en) * 2006-02-15 2007-08-23 Applied Materials, Inc. Dechuck using subpad with recess
US7300340B1 (en) 2006-08-30 2007-11-27 Rohm and Haas Electronics Materials CMP Holdings, Inc. CMP pad having overlaid constant area spiral grooves
JP2008290197A (ja) * 2007-05-25 2008-12-04 Nihon Micro Coating Co Ltd 研磨パッド及び方法
US7544115B2 (en) * 2007-09-20 2009-06-09 Novellus Systems, Inc. Chemical mechanical polishing assembly with altered polishing pad topographical components
JP2009220265A (ja) * 2008-02-18 2009-10-01 Jsr Corp 化学機械研磨パッド
US9180570B2 (en) 2008-03-14 2015-11-10 Nexplanar Corporation Grooved CMP pad
TWI409137B (zh) * 2008-06-19 2013-09-21 Bestac Advanced Material Co Ltd 研磨墊及其微型結構形成方法
TWI449597B (zh) * 2008-07-09 2014-08-21 Iv Technologies Co Ltd 研磨墊及其製造方法
TWM352127U (en) * 2008-08-29 2009-03-01 Bestac Advanced Material Co Ltd Polishing pad
TWM352126U (en) * 2008-10-23 2009-03-01 Bestac Advanced Material Co Ltd Polishing pad
EP2355915B1 (de) * 2008-12-09 2018-03-14 E. I. du Pont de Nemours and Company Verfahren zur selektiven entfernung von grossen teilchen aus teilchenaufschlämmungen
TWI535527B (zh) * 2009-07-20 2016-06-01 智勝科技股份有限公司 研磨方法、研磨墊與研磨系統
US20120255635A1 (en) * 2011-04-11 2012-10-11 Applied Materials, Inc. Method and apparatus for refurbishing gas distribution plate surfaces
US20120289131A1 (en) * 2011-05-13 2012-11-15 Li-Chung Liu Cmp apparatus and method
CN106002638B (zh) 2011-12-31 2019-01-11 圣戈班磨料磨具有限公司 具有开口的不均匀分布的研磨制品
JP5620465B2 (ja) * 2012-12-28 2014-11-05 東洋ゴム工業株式会社 円形状研磨パッド
TWI599447B (zh) * 2013-10-18 2017-09-21 卡博特微電子公司 具有偏移同心溝槽圖樣之邊緣排除區的cmp拋光墊
US20170232573A1 (en) * 2016-02-12 2017-08-17 Kabushiki Kaisha Toshiba Polishing member and semiconductor manufacturing method
US10625393B2 (en) * 2017-06-08 2020-04-21 Rohm And Haas Electronic Materials Cmp Holdings, Inc. Chemical mechanical polishing pads having offset circumferential grooves for improved removal rate and polishing uniformity

Family Cites Families (53)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3170273A (en) * 1963-01-10 1965-02-23 Monsanto Co Process for polishing semiconductor materials
US3156073A (en) * 1963-01-15 1964-11-10 Ray H Strasbaugh Irregular, non-repetitive, closed-loop surfacing mechanism
US3137977A (en) * 1963-01-24 1964-06-23 Buehler Ltd Polishing method and apparatus
US3342652A (en) * 1964-04-02 1967-09-19 Ibm Chemical polishing of a semi-conductor substrate
US3559346A (en) * 1969-02-04 1971-02-02 Bell Telephone Labor Inc Wafer polishing apparatus and method
FR2063961A1 (en) * 1969-10-13 1971-07-16 Radiotechnique Compelec Mechanico-chemical grinder for semi-con-ducting panels
US3841031A (en) * 1970-10-21 1974-10-15 Monsanto Co Process for polishing thin elements
US3748790A (en) * 1971-08-16 1973-07-31 F Pizzarello Lapping machine and vibratory drive system therefor
US4021279A (en) * 1972-04-20 1977-05-03 Stichting Reactor Centrum Nederland Method of forming groove pattern
US3906678A (en) * 1972-09-14 1975-09-23 Buehler Ltd Automatic specimen polishing machine and method
US3962832A (en) * 1974-08-26 1976-06-15 R. Howard Strasbaugh, Inc. Fluid responsive, leverage operated chuck
US3986433A (en) * 1974-10-29 1976-10-19 R. Howard Strasbaugh, Inc. Lap milling machine
US3978622A (en) * 1975-07-23 1976-09-07 Solid State Measurements, Inc. Lapping and polishing apparatus
US4143490A (en) * 1977-12-21 1979-03-13 Wood W N Lens polishing apparatus
FR2424101A1 (fr) * 1978-04-25 1979-11-23 Essilor Int Machine pour l'usinage de pieces, en particulier pieces a surface courbe
US4239567A (en) * 1978-10-16 1980-12-16 Western Electric Company, Inc. Removably holding planar articles for polishing operations
US4380412A (en) * 1979-08-02 1983-04-19 R. Howard Strasbaugh, Inc. Lap shaping machine with oscillatable point cutter and selectively rotatable or oscillatable lap
US4256535A (en) * 1979-12-05 1981-03-17 Western Electric Company, Inc. Method of polishing a semiconductor wafer
US4358295A (en) * 1980-03-27 1982-11-09 Matsushita Electric Industrial Co., Ltd. Polishing method
JPS5859764A (ja) * 1981-10-07 1983-04-08 Toshiba Ceramics Co Ltd ラツプ定盤
US4373991A (en) * 1982-01-28 1983-02-15 Western Electric Company, Inc. Methods and apparatus for polishing a semiconductor wafer
JPS5953317B2 (ja) * 1983-03-10 1984-12-24 インタ−ナショナル ビジネス マシ−ンズ コ−ポレ−ション 非晶質酸化アルミニウム表面の化学的−機械的研摩方法
DE3411120A1 (de) * 1983-03-26 1984-11-08 TOTO Ltd., Kitakyushyu, Fukuoka Laeppvorrichtung
JPS609129A (ja) * 1983-06-29 1985-01-18 Fujitsu Ltd ウエツト処理装置
US4525954A (en) * 1983-09-15 1985-07-02 Larsen Erik A Drive mechanism for a lapping machine or the like
US4680893A (en) * 1985-09-23 1987-07-21 Motorola, Inc. Apparatus for polishing semiconductor wafers
US4944836A (en) * 1985-10-28 1990-07-31 International Business Machines Corporation Chem-mech polishing method for producing coplanar metal/insulator films on a substrate
US4653231A (en) * 1985-11-01 1987-03-31 Motorola, Inc. Polishing system with underwater Bernoulli pickup
US4839993A (en) * 1986-01-28 1989-06-20 Fujisu Limited Polishing machine for ferrule of optical fiber connector
US4918870A (en) * 1986-05-16 1990-04-24 Siltec Corporation Floating subcarriers for wafer polishing apparatus
JPS63237865A (ja) * 1987-03-25 1988-10-04 Matsushima Kogyo Co Ltd 回転式研磨機の定盤
US4956313A (en) * 1987-08-17 1990-09-11 International Business Machines Corporation Via-filling and planarization technique
US4940507A (en) * 1989-10-05 1990-07-10 Motorola Inc. Lapping means and method
US5234867A (en) * 1992-05-27 1993-08-10 Micron Technology, Inc. Method for planarizing semiconductor wafers with a non-circular polishing pad
US5020283A (en) * 1990-01-22 1991-06-04 Micron Technology, Inc. Polishing pad with uniform abrasion
US4992135A (en) * 1990-07-24 1991-02-12 Micron Technology, Inc. Method of etching back of tungsten layers on semiconductor wafers, and solution therefore
USRE34425E (en) * 1990-08-06 1993-11-02 Micron Technology, Inc. Method and apparatus for mechanical planarization and endpoint detection of a semiconductor wafer
US5081796A (en) * 1990-08-06 1992-01-21 Micron Technology, Inc. Method and apparatus for mechanical planarization and endpoint detection of a semiconductor wafer
US5081051A (en) * 1990-09-12 1992-01-14 Intel Corporation Method for conditioning the surface of a polishing pad
US5036015A (en) * 1990-09-24 1991-07-30 Micron Technology, Inc. Method of endpoint detection during chemical/mechanical planarization of semiconductor wafers
US5064683A (en) * 1990-10-29 1991-11-12 Motorola, Inc. Method for polish planarizing a semiconductor substrate by using a boron nitride polish stop
US5069002A (en) * 1991-04-17 1991-12-03 Micron Technology, Inc. Apparatus for endpoint detection during mechanical planarization of semiconductor wafers
US5114875A (en) * 1991-05-24 1992-05-19 Motorola, Inc. Planar dielectric isolated wafer
US5169491A (en) * 1991-07-29 1992-12-08 Micron Technology, Inc. Method of etching SiO2 dielectric layers using chemical mechanical polishing techniques
US5205082A (en) * 1991-12-20 1993-04-27 Cybeq Systems, Inc. Wafer polisher head having floating retainer ring
US5244534A (en) * 1992-01-24 1993-09-14 Micron Technology, Inc. Two-step chemical mechanical polishing process for producing flush and protruding tungsten plugs
JP2789153B2 (ja) * 1992-01-27 1998-08-20 マイクロン テクノロジー インコーポレイテッド マイクロスクラッチのない平滑面を形成するための半導体ウェハの化学機械的平坦化方法
US5222329A (en) * 1992-03-26 1993-06-29 Micron Technology, Inc. Acoustical method and system for detecting and controlling chemical-mechanical polishing (CMP) depths into layers of conductors, semiconductors, and dielectric materials
US5209816A (en) * 1992-06-04 1993-05-11 Micron Technology, Inc. Method of chemical mechanical polishing aluminum containing metal layers and slurry for chemical mechanical polishing
US5225034A (en) * 1992-06-04 1993-07-06 Micron Technology, Inc. Method of chemical mechanical polishing predominantly copper containing metal layers in semiconductor processing
US5216843A (en) * 1992-09-24 1993-06-08 Intel Corporation Polishing pad conditioning apparatus for wafer planarization process
US5232875A (en) * 1992-10-15 1993-08-03 Micron Technology, Inc. Method and apparatus for improving planarity of chemical-mechanical planarization operations
US5302233A (en) * 1993-03-19 1994-04-12 Micron Semiconductor, Inc. Method for shaping features of a semiconductor structure using chemical mechanical planarization (CMP)

Also Published As

Publication number Publication date
US5650039A (en) 1997-07-22
KR950031381A (ko) 1995-12-18
DE69503408T2 (de) 1999-02-11
DE69503408D1 (de) 1998-08-20
EP0674972A1 (de) 1995-10-04
EP0674972B1 (de) 1998-07-15
JPH0839423A (ja) 1996-02-13

Similar Documents

Publication Publication Date Title
ATE168306T1 (de) Vorrichtung zum chemisch-mechanischen polieren mit verbesserter verteilung der polierzusammensetzung
TW428225B (en) A method of polishing a surface of a substrate, a method of manufacturing semiconductor device, and an apparatus of manufacturing the same
TW376350B (en) Process for polishing a semiconductor device substrate
AU5148198A (en) Method for chemical-mechanical planarization of a substrate on a fixed-abrasive polishing pad
TW429462B (en) Manufacturing method and processing device for semiconductor device
EP1120191A3 (de) Halbleiterscheibe Bearbeitungsmaschine
EP0812656A3 (de) Abrichtvorrichtung zum Abrichten eines Polierkissen in einer Läppmaschine
KR970018170A (ko) 연마용 슬러리 및 이 연마용 슬러리를 사용하는 연마방법
ATE156054T1 (de) Schleifgerät
CA2245498A1 (en) Lapping and polishing method and apparatus for planarizing photoresist and metal microstructure layers
MY123347A (en) Planarization apparatus and method
ATE459453T1 (de) Polierkissen zum chemisch-mechanischen polieren von substraten in gegenwart von schleifpartikeln enthaltende aufschlämmung
KR970061445A (ko) 웨이퍼 및 기판의 재생방법 및 장치
EP1053828A3 (de) Verfahren und Vorrichtung zum Abrichten eines Poliertuches
KR970061441A (ko) 화학기계적 연마 장치 및 이를 이용한 화학기계적 연마방법
MY119713A (en) Abrasive composition for magnetic recording disc substrate
SG97161A1 (en) Polishing method and polishing apparatus
DE69323178T2 (de) Polierverfahren, hierzu bestimmte vorrichtung und schwabbel-/polierscheibe
US6227948B1 (en) Polishing pad reconditioning via polishing pad material as conditioner
ID30452A (id) Perkakas pengikis berputar
CA2001487A1 (en) Gel producing pad and improved method for surfacing and polishing lenses
EP0796702A3 (de) Poliervorrichtung
ATE215420T1 (de) Gerät zum chemisch-mechanischen polieren von wafern
EP0934801A3 (de) Verfahren und Vorrichtung zum Polieren von Werkstücken
KR970023800A (ko) 폴리싱포의 드레싱방법 및 장치

Legal Events

Date Code Title Description
RER Ceased as to paragraph 5 lit. 3 law introducing patent treaties