ATE168306T1 - Vorrichtung zum chemisch-mechanischen polieren mit verbesserter verteilung der polierzusammensetzung - Google Patents
Vorrichtung zum chemisch-mechanischen polieren mit verbesserter verteilung der polierzusammensetzungInfo
- Publication number
- ATE168306T1 ATE168306T1 AT95301342T AT95301342T ATE168306T1 AT E168306 T1 ATE168306 T1 AT E168306T1 AT 95301342 T AT95301342 T AT 95301342T AT 95301342 T AT95301342 T AT 95301342T AT E168306 T1 ATE168306 T1 AT E168306T1
- Authority
- AT
- Austria
- Prior art keywords
- polishing pad
- polishing
- chemical
- improved distribution
- mechanical polishing
- Prior art date
Links
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/11—Lapping tools
- B24B37/20—Lapping pads for working plane surfaces
- B24B37/26—Lapping pads for working plane surfaces characterised by the shape of the lapping pad surface, e.g. grooved
Landscapes
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US08/205,278 US5650039A (en) | 1994-03-02 | 1994-03-02 | Chemical mechanical polishing apparatus with improved slurry distribution |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| ATE168306T1 true ATE168306T1 (de) | 1998-08-15 |
Family
ID=22761558
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| AT95301342T ATE168306T1 (de) | 1994-03-02 | 1995-03-02 | Vorrichtung zum chemisch-mechanischen polieren mit verbesserter verteilung der polierzusammensetzung |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US5650039A (de) |
| EP (1) | EP0674972B1 (de) |
| JP (1) | JPH0839423A (de) |
| KR (1) | KR950031381A (de) |
| AT (1) | ATE168306T1 (de) |
| DE (1) | DE69503408T2 (de) |
Families Citing this family (81)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5908530A (en) * | 1995-05-18 | 1999-06-01 | Obsidian, Inc. | Apparatus for chemical mechanical polishing |
| KR970018240A (ko) * | 1995-09-08 | 1997-04-30 | 모리시다 요이치 | 반도체 기판의 연마방법 및 그 장치 |
| US5709593A (en) * | 1995-10-27 | 1998-01-20 | Applied Materials, Inc. | Apparatus and method for distribution of slurry in a chemical mechanical polishing system |
| US5938507A (en) * | 1995-10-27 | 1999-08-17 | Applied Materials, Inc. | Linear conditioner apparatus for a chemical mechanical polishing system |
| US5840202A (en) * | 1996-04-26 | 1998-11-24 | Memc Electronic Materials, Inc. | Apparatus and method for shaping polishing pads |
| US6056851A (en) * | 1996-06-24 | 2000-05-02 | Taiwan Semiconductor Manufacturing Company | Slurry supply system for chemical mechanical polishing |
| US6328642B1 (en) | 1997-02-14 | 2001-12-11 | Lam Research Corporation | Integrated pad and belt for chemical mechanical polishing |
| US6019670A (en) * | 1997-03-10 | 2000-02-01 | Applied Materials, Inc. | Method and apparatus for conditioning a polishing pad in a chemical mechanical polishing system |
| US5944583A (en) * | 1997-03-17 | 1999-08-31 | International Business Machines Corporation | Composite polish pad for CMP |
| US5921855A (en) * | 1997-05-15 | 1999-07-13 | Applied Materials, Inc. | Polishing pad having a grooved pattern for use in a chemical mechanical polishing system |
| US6273806B1 (en) | 1997-05-15 | 2001-08-14 | Applied Materials, Inc. | Polishing pad having a grooved pattern for use in a chemical mechanical polishing apparatus |
| US6030487A (en) * | 1997-06-19 | 2000-02-29 | International Business Machines Corporation | Wafer carrier assembly |
| US5957754A (en) * | 1997-08-29 | 1999-09-28 | Applied Materials, Inc. | Cavitational polishing pad conditioner |
| JPH11216663A (ja) * | 1998-02-03 | 1999-08-10 | Sony Corp | 研磨パッド、研磨装置および研磨方法 |
| US6015499A (en) * | 1998-04-17 | 2000-01-18 | Parker-Hannifin Corporation | Membrane-like filter element for chemical mechanical polishing slurries |
| US6106662A (en) * | 1998-06-08 | 2000-08-22 | Speedfam-Ipec Corporation | Method and apparatus for endpoint detection for chemical mechanical polishing |
| US6135865A (en) | 1998-08-31 | 2000-10-24 | International Business Machines Corporation | CMP apparatus with built-in slurry distribution and removal |
| US6203407B1 (en) | 1998-09-03 | 2001-03-20 | Micron Technology, Inc. | Method and apparatus for increasing-chemical-polishing selectivity |
| US6235635B1 (en) | 1998-11-19 | 2001-05-22 | Chartered Semiconductor Manufacturing Ltd. | Linear CMP tool design using in-situ slurry distribution and concurrent pad conditioning |
| US6409904B1 (en) * | 1998-12-01 | 2002-06-25 | Nutool, Inc. | Method and apparatus for depositing and controlling the texture of a thin film |
| US6328872B1 (en) | 1999-04-03 | 2001-12-11 | Nutool, Inc. | Method and apparatus for plating and polishing a semiconductor substrate |
| US6468139B1 (en) | 1998-12-01 | 2002-10-22 | Nutool, Inc. | Polishing apparatus and method with a refreshing polishing belt and loadable housing |
| US6589105B2 (en) | 1998-12-01 | 2003-07-08 | Nutool, Inc. | Pad tensioning method and system in a bi-directional linear polisher |
| US7425250B2 (en) * | 1998-12-01 | 2008-09-16 | Novellus Systems, Inc. | Electrochemical mechanical processing apparatus |
| US7204917B2 (en) | 1998-12-01 | 2007-04-17 | Novellus Systems, Inc. | Workpiece surface influencing device designs for electrochemical mechanical processing and method of using the same |
| US6103628A (en) | 1998-12-01 | 2000-08-15 | Nutool, Inc. | Reverse linear polisher with loadable housing |
| US6464571B2 (en) | 1998-12-01 | 2002-10-15 | Nutool, Inc. | Polishing apparatus and method with belt drive system adapted to extend the lifetime of a refreshing polishing belt provided therein |
| US6261168B1 (en) | 1999-05-21 | 2001-07-17 | Lam Research Corporation | Chemical mechanical planarization or polishing pad with sections having varied groove patterns |
| US6273797B1 (en) * | 1999-11-19 | 2001-08-14 | International Business Machines Corporation | In-situ automated CMP wedge conditioner |
| US20020068516A1 (en) * | 1999-12-13 | 2002-06-06 | Applied Materials, Inc | Apparatus and method for controlled delivery of slurry to a region of a polishing device |
| KR100575857B1 (ko) * | 1999-12-29 | 2006-05-03 | 주식회사 하이닉스반도체 | 반도체 제조용 연마판 |
| US6241596B1 (en) | 2000-01-14 | 2001-06-05 | Applied Materials, Inc. | Method and apparatus for chemical mechanical polishing using a patterned pad |
| US6630059B1 (en) * | 2000-01-14 | 2003-10-07 | Nutool, Inc. | Workpeice proximity plating apparatus |
| US6579797B1 (en) * | 2000-01-25 | 2003-06-17 | Agere Systems Inc. | Cleaning brush conditioning apparatus |
| US20090020437A1 (en) * | 2000-02-23 | 2009-01-22 | Basol Bulent M | Method and system for controlled material removal by electrochemical polishing |
| US6488565B1 (en) | 2000-08-29 | 2002-12-03 | Applied Materials, Inc. | Apparatus for chemical mechanical planarization having nested load cups |
| JP2002200555A (ja) * | 2000-12-28 | 2002-07-16 | Ebara Corp | 研磨工具および該研磨工具を具備したポリッシング装置 |
| US6609961B2 (en) | 2001-01-09 | 2003-08-26 | Lam Research Corporation | Chemical mechanical planarization belt assembly and method of assembly |
| US6620031B2 (en) | 2001-04-04 | 2003-09-16 | Lam Research Corporation | Method for optimizing the planarizing length of a polishing pad |
| US6837779B2 (en) * | 2001-05-07 | 2005-01-04 | Applied Materials, Inc. | Chemical mechanical polisher with grooved belt |
| KR20030015567A (ko) * | 2001-08-16 | 2003-02-25 | 에스케이에버텍 주식회사 | 웨이브 형태의 그루브가 형성된 화학적 기계적 연마패드 |
| US7314402B2 (en) | 2001-11-15 | 2008-01-01 | Speedfam-Ipec Corporation | Method and apparatus for controlling slurry distribution |
| US6939203B2 (en) * | 2002-04-18 | 2005-09-06 | Asm Nutool, Inc. | Fluid bearing slide assembly for workpiece polishing |
| US7377840B2 (en) | 2004-07-21 | 2008-05-27 | Neopad Technologies Corporation | Methods for producing in-situ grooves in chemical mechanical planarization (CMP) pads, and novel CMP pad designs |
| US7704125B2 (en) | 2003-03-24 | 2010-04-27 | Nexplanar Corporation | Customized polishing pads for CMP and methods of fabrication and use thereof |
| US8864859B2 (en) | 2003-03-25 | 2014-10-21 | Nexplanar Corporation | Customized polishing pads for CMP and methods of fabrication and use thereof |
| US9278424B2 (en) | 2003-03-25 | 2016-03-08 | Nexplanar Corporation | Customized polishing pads for CMP and methods of fabrication and use thereof |
| US6783436B1 (en) | 2003-04-29 | 2004-08-31 | Rohm And Haas Electronic Materials Cmp Holdings, Inc. | Polishing pad with optimized grooves and method of forming same |
| JP4292025B2 (ja) | 2003-05-23 | 2009-07-08 | Jsr株式会社 | 研磨パッド |
| US7442116B2 (en) | 2003-11-04 | 2008-10-28 | Jsr Corporation | Chemical mechanical polishing pad |
| US7125318B2 (en) * | 2003-11-13 | 2006-10-24 | Rohm And Haas Electronic Materials Cmp Holdings, Inc. | Polishing pad having a groove arrangement for reducing slurry consumption |
| US7648622B2 (en) * | 2004-02-27 | 2010-01-19 | Novellus Systems, Inc. | System and method for electrochemical mechanical polishing |
| US7329174B2 (en) | 2004-05-20 | 2008-02-12 | Jsr Corporation | Method of manufacturing chemical mechanical polishing pad |
| US20050260929A1 (en) * | 2004-05-20 | 2005-11-24 | Jsr Corporation | Chemical mechanical polishing pad and chemical mechanical polishing method |
| JP2005340271A (ja) * | 2004-05-24 | 2005-12-08 | Jsr Corp | 化学機械研磨用パッド |
| US7198549B2 (en) * | 2004-06-16 | 2007-04-03 | Cabot Microelectronics Corporation | Continuous contour polishing of a multi-material surface |
| DE602005007125D1 (de) | 2004-09-17 | 2008-07-10 | Jsr Corp | Chemisch-mechanisches Polierkissen und chemisch-mechanisches Polierverfahren |
| US7059949B1 (en) | 2004-12-14 | 2006-06-13 | Rohm And Haas Electronic Materials Cmp Holdings, Inc. | CMP pad having an overlapping stepped groove arrangement |
| US7059950B1 (en) | 2004-12-14 | 2006-06-13 | Rohm And Haas Electronic Materials Cmp Holdings, Inc. | CMP polishing pad having grooves arranged to improve polishing medium utilization |
| US7182677B2 (en) * | 2005-01-14 | 2007-02-27 | Applied Materials, Inc. | Chemical mechanical polishing pad for controlling polishing slurry distribution |
| JP2007103602A (ja) * | 2005-10-03 | 2007-04-19 | Toshiba Corp | 研磨パッド及び研磨装置 |
| US7226345B1 (en) | 2005-12-09 | 2007-06-05 | The Regents Of The University Of California | CMP pad with designed surface features |
| US20070197147A1 (en) * | 2006-02-15 | 2007-08-23 | Applied Materials, Inc. | Polishing system with spiral-grooved subpad |
| US7300340B1 (en) | 2006-08-30 | 2007-11-27 | Rohm and Haas Electronics Materials CMP Holdings, Inc. | CMP pad having overlaid constant area spiral grooves |
| JP2008290197A (ja) * | 2007-05-25 | 2008-12-04 | Nihon Micro Coating Co Ltd | 研磨パッド及び方法 |
| US7544115B2 (en) * | 2007-09-20 | 2009-06-09 | Novellus Systems, Inc. | Chemical mechanical polishing assembly with altered polishing pad topographical components |
| JP2009220265A (ja) * | 2008-02-18 | 2009-10-01 | Jsr Corp | 化学機械研磨パッド |
| US9180570B2 (en) | 2008-03-14 | 2015-11-10 | Nexplanar Corporation | Grooved CMP pad |
| TWI409137B (zh) * | 2008-06-19 | 2013-09-21 | Bestac Advanced Material Co Ltd | 研磨墊及其微型結構形成方法 |
| TWI449597B (zh) * | 2008-07-09 | 2014-08-21 | Iv Technologies Co Ltd | 研磨墊及其製造方法 |
| TWM352127U (en) * | 2008-08-29 | 2009-03-01 | Bestac Advanced Material Co Ltd | Polishing pad |
| TWM352126U (en) * | 2008-10-23 | 2009-03-01 | Bestac Advanced Material Co Ltd | Polishing pad |
| BRPI0916466A2 (pt) | 2008-12-09 | 2016-02-16 | Du Pont | método de remoção da cauda e dispositivo de remoção da cauda |
| TWI535527B (zh) * | 2009-07-20 | 2016-06-01 | 智勝科技股份有限公司 | 研磨方法、研磨墊與研磨系統 |
| US20120255635A1 (en) * | 2011-04-11 | 2012-10-11 | Applied Materials, Inc. | Method and apparatus for refurbishing gas distribution plate surfaces |
| US20120289131A1 (en) * | 2011-05-13 | 2012-11-15 | Li-Chung Liu | Cmp apparatus and method |
| MX356390B (es) | 2011-12-31 | 2018-05-28 | Saint Gobain Abrasives Inc | Artículo abrasivo que tiene una distribución no uniforme de aberturas. |
| JP5620465B2 (ja) * | 2012-12-28 | 2014-11-05 | 東洋ゴム工業株式会社 | 円形状研磨パッド |
| TWI599447B (zh) * | 2013-10-18 | 2017-09-21 | 卡博特微電子公司 | 具有偏移同心溝槽圖樣之邊緣排除區的cmp拋光墊 |
| US20170232573A1 (en) * | 2016-02-12 | 2017-08-17 | Kabushiki Kaisha Toshiba | Polishing member and semiconductor manufacturing method |
| US10625393B2 (en) * | 2017-06-08 | 2020-04-21 | Rohm And Haas Electronic Materials Cmp Holdings, Inc. | Chemical mechanical polishing pads having offset circumferential grooves for improved removal rate and polishing uniformity |
Family Cites Families (53)
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|---|---|---|---|---|
| US3170273A (en) * | 1963-01-10 | 1965-02-23 | Monsanto Co | Process for polishing semiconductor materials |
| US3156073A (en) * | 1963-01-15 | 1964-11-10 | Ray H Strasbaugh | Irregular, non-repetitive, closed-loop surfacing mechanism |
| US3137977A (en) * | 1963-01-24 | 1964-06-23 | Buehler Ltd | Polishing method and apparatus |
| US3342652A (en) * | 1964-04-02 | 1967-09-19 | Ibm | Chemical polishing of a semi-conductor substrate |
| US3559346A (en) * | 1969-02-04 | 1971-02-02 | Bell Telephone Labor Inc | Wafer polishing apparatus and method |
| FR2063961A1 (en) * | 1969-10-13 | 1971-07-16 | Radiotechnique Compelec | Mechanico-chemical grinder for semi-con-ducting panels |
| US3841031A (en) * | 1970-10-21 | 1974-10-15 | Monsanto Co | Process for polishing thin elements |
| US3748790A (en) * | 1971-08-16 | 1973-07-31 | F Pizzarello | Lapping machine and vibratory drive system therefor |
| US4021279A (en) * | 1972-04-20 | 1977-05-03 | Stichting Reactor Centrum Nederland | Method of forming groove pattern |
| US3906678A (en) * | 1972-09-14 | 1975-09-23 | Buehler Ltd | Automatic specimen polishing machine and method |
| US3962832A (en) * | 1974-08-26 | 1976-06-15 | R. Howard Strasbaugh, Inc. | Fluid responsive, leverage operated chuck |
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| FR2424101A1 (fr) * | 1978-04-25 | 1979-11-23 | Essilor Int | Machine pour l'usinage de pieces, en particulier pieces a surface courbe |
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| JPS5859764A (ja) * | 1981-10-07 | 1983-04-08 | Toshiba Ceramics Co Ltd | ラツプ定盤 |
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| DE3411120A1 (de) * | 1983-03-26 | 1984-11-08 | TOTO Ltd., Kitakyushyu, Fukuoka | Laeppvorrichtung |
| JPS609129A (ja) * | 1983-06-29 | 1985-01-18 | Fujitsu Ltd | ウエツト処理装置 |
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| US5234867A (en) * | 1992-05-27 | 1993-08-10 | Micron Technology, Inc. | Method for planarizing semiconductor wafers with a non-circular polishing pad |
| US4992135A (en) * | 1990-07-24 | 1991-02-12 | Micron Technology, Inc. | Method of etching back of tungsten layers on semiconductor wafers, and solution therefore |
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| US5081051A (en) * | 1990-09-12 | 1992-01-14 | Intel Corporation | Method for conditioning the surface of a polishing pad |
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| US5114875A (en) * | 1991-05-24 | 1992-05-19 | Motorola, Inc. | Planar dielectric isolated wafer |
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| US5205082A (en) * | 1991-12-20 | 1993-04-27 | Cybeq Systems, Inc. | Wafer polisher head having floating retainer ring |
| US5244534A (en) * | 1992-01-24 | 1993-09-14 | Micron Technology, Inc. | Two-step chemical mechanical polishing process for producing flush and protruding tungsten plugs |
| JP2789153B2 (ja) * | 1992-01-27 | 1998-08-20 | マイクロン テクノロジー インコーポレイテッド | マイクロスクラッチのない平滑面を形成するための半導体ウェハの化学機械的平坦化方法 |
| US5222329A (en) * | 1992-03-26 | 1993-06-29 | Micron Technology, Inc. | Acoustical method and system for detecting and controlling chemical-mechanical polishing (CMP) depths into layers of conductors, semiconductors, and dielectric materials |
| US5225034A (en) * | 1992-06-04 | 1993-07-06 | Micron Technology, Inc. | Method of chemical mechanical polishing predominantly copper containing metal layers in semiconductor processing |
| US5209816A (en) * | 1992-06-04 | 1993-05-11 | Micron Technology, Inc. | Method of chemical mechanical polishing aluminum containing metal layers and slurry for chemical mechanical polishing |
| US5216843A (en) * | 1992-09-24 | 1993-06-08 | Intel Corporation | Polishing pad conditioning apparatus for wafer planarization process |
| US5232875A (en) * | 1992-10-15 | 1993-08-03 | Micron Technology, Inc. | Method and apparatus for improving planarity of chemical-mechanical planarization operations |
| US5302233A (en) * | 1993-03-19 | 1994-04-12 | Micron Semiconductor, Inc. | Method for shaping features of a semiconductor structure using chemical mechanical planarization (CMP) |
-
1994
- 1994-03-02 US US08/205,278 patent/US5650039A/en not_active Expired - Lifetime
-
1995
- 1995-03-02 JP JP4323395A patent/JPH0839423A/ja not_active Withdrawn
- 1995-03-02 KR KR1019950004239A patent/KR950031381A/ko not_active Withdrawn
- 1995-03-02 AT AT95301342T patent/ATE168306T1/de not_active IP Right Cessation
- 1995-03-02 DE DE69503408T patent/DE69503408T2/de not_active Expired - Fee Related
- 1995-03-02 EP EP95301342A patent/EP0674972B1/de not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| US5650039A (en) | 1997-07-22 |
| DE69503408T2 (de) | 1999-02-11 |
| DE69503408D1 (de) | 1998-08-20 |
| KR950031381A (ko) | 1995-12-18 |
| JPH0839423A (ja) | 1996-02-13 |
| EP0674972B1 (de) | 1998-07-15 |
| EP0674972A1 (de) | 1995-10-04 |
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