AR125440A1 - Inspección de vidrio - Google Patents

Inspección de vidrio

Info

Publication number
AR125440A1
AR125440A1 ARP220100130A ARP220100130A AR125440A1 AR 125440 A1 AR125440 A1 AR 125440A1 AR P220100130 A ARP220100130 A AR P220100130A AR P220100130 A ARP220100130 A AR P220100130A AR 125440 A1 AR125440 A1 AR 125440A1
Authority
AR
Argentina
Prior art keywords
defect
image
slice
glass sheet
capture
Prior art date
Application number
ARP220100130A
Other languages
English (en)
Inventor
Simon Richard Cherry
Andrew R Thomson
Ian Ross Williams
Original Assignee
Pilkington Group Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Pilkington Group Ltd filed Critical Pilkington Group Ltd
Publication of AR125440A1 publication Critical patent/AR125440A1/es

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G01N21/896—Optical defects in or on transparent materials, e.g. distortion, surface flaws in conveyed flat sheet or rod
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8901—Optical details; Scanning details
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features
    • G01N2021/8809—Adjustment for highlighting flaws
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features
    • G01N2021/8835—Adjustable illumination, e.g. software adjustable screen
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features
    • G01N2021/8845—Multiple wavelengths of illumination or detection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8854—Grading and classifying of flaws
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8854—Grading and classifying of flaws
    • G01N2021/8867—Grading and classifying of flaws using sequentially two or more inspection runs, e.g. coarse and fine, or detecting then analysing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8887—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges based on image processing techniques
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/10—Scanning
    • G01N2201/104—Mechano-optical scan, i.e. object and beam moving

Landscapes

  • Analytical Chemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Pathology (AREA)
  • Biochemistry (AREA)
  • Immunology (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Signal Processing (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)

Abstract

Se describe un método para detectar un defecto en una lámina de vidrio, que comprende los pasos: (i) dirigir un haz convergente desde una fuente de iluminación sobre una superficie de la lámina de vidrio para iluminar el defecto; (ii) enfocar un dispositivo de captura de imágenes en un primer plano para obtener imágenes del defecto en la lámina de vidrio; (iii) capturar una primera imagen del defecto; (iv) realizar un paso de ajuste; (v) capturar una segunda imagen del defecto. Cada una de las imágenes primera y segunda comprende una primera porción respectiva del defecto iluminado y una segunda porción respectiva debida a la reflexión de una porción del haz desde la superficie del vidrio. En la primera imagen del defecto, la primera porción es más brillante que la segunda porción, y en la segunda imagen del defecto, la primera porción es más oscura que la segunda porción. También se describe el aparato para llevar a cabo el método.
ARP220100130A 2021-01-22 2022-01-21 Inspección de vidrio AR125440A1 (es)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GBGB2100905.5A GB202100905D0 (en) 2021-01-22 2021-01-22 Glass inspection

Publications (1)

Publication Number Publication Date
AR125440A1 true AR125440A1 (es) 2023-07-19

Family

ID=74859032

Family Applications (1)

Application Number Title Priority Date Filing Date
ARP220100130A AR125440A1 (es) 2021-01-22 2022-01-21 Inspección de vidrio

Country Status (8)

Country Link
US (1) US20240085342A1 (es)
EP (1) EP4281758A1 (es)
JP (1) JP2024504715A (es)
KR (1) KR20230133360A (es)
CN (1) CN116917720A (es)
AR (1) AR125440A1 (es)
GB (1) GB202100905D0 (es)
WO (1) WO2022157505A1 (es)

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4236906A (en) 1979-08-01 1980-12-02 Ppg Industries, Inc. Reducing tin drip with sulfur containing gas
JP5322543B2 (ja) * 2008-09-08 2013-10-23 株式会社日立ハイテクノロジーズ 基板検査装置及び基板検査方法
CN204359710U (zh) 2014-12-29 2015-05-27 武汉中导光电设备有限公司 一种玻璃表面缺陷检测装置
CN105259189B (zh) 2015-10-21 2019-04-16 凌云光技术集团有限责任公司 玻璃的缺陷成像系统和方法
KR102027364B1 (ko) 2017-06-28 2019-10-02 삼성디스플레이 주식회사 멀티 광학 디스플레이 검사 장치
CN109632828B (zh) * 2018-10-29 2021-11-09 彩虹显示器件股份有限公司 一种平板玻璃缺陷复检系统及复检方法

Also Published As

Publication number Publication date
US20240085342A1 (en) 2024-03-14
CN116917720A (zh) 2023-10-20
EP4281758A1 (en) 2023-11-29
GB202100905D0 (en) 2021-03-10
JP2024504715A (ja) 2024-02-01
WO2022157505A1 (en) 2022-07-28
KR20230133360A (ko) 2023-09-19

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