ZA844740B - Light-sensitive mixture and copying material prepared with this mixture - Google Patents

Light-sensitive mixture and copying material prepared with this mixture

Info

Publication number
ZA844740B
ZA844740B ZA844740A ZA844740A ZA844740B ZA 844740 B ZA844740 B ZA 844740B ZA 844740 A ZA844740 A ZA 844740A ZA 844740 A ZA844740 A ZA 844740A ZA 844740 B ZA844740 B ZA 844740B
Authority
ZA
South Africa
Prior art keywords
group
mixture
hydrogen atom
light
alkyl group
Prior art date
Application number
ZA844740A
Other languages
English (en)
Inventor
Paul Stahlhofen
Original Assignee
Hoechst Ag
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hoechst Ag filed Critical Hoechst Ag
Publication of ZA844740B publication Critical patent/ZA844740B/xx

Links

Classifications

    • C—CHEMISTRY; METALLURGY
    • C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08L—COMPOSITIONS OF MACROMOLECULAR COMPOUNDS
    • C08L65/00—Compositions of macromolecular compounds obtained by reactions forming a carbon-to-carbon link in the main chain; Compositions of derivatives of such polymers
    • C—CHEMISTRY; METALLURGY
    • C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08G—MACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
    • C08G61/00—Macromolecular compounds obtained by reactions forming a carbon-to-carbon link in the main chain of the macromolecule
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004—Photosensitive materials
    • G03F7/022—Quinonediazides
    • G03F7/023—Macromolecular quinonediazides; Macromolecular additives, e.g. binders
    • G03F7/0233—Macromolecular quinonediazides; Macromolecular additives, e.g. binders characterised by the polymeric binders or the macromolecular additives other than the macromolecular quinonediazides
    • G03F7/0236—Condensation products of carbonyl compounds and phenolic compounds, e.g. novolak resins

Landscapes

  • Chemical & Material Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Medicinal Chemistry (AREA)
  • Polymers & Plastics (AREA)
  • Organic Chemistry (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Photosensitive Polymer And Photoresist Processing (AREA)
  • Acyclic And Carbocyclic Compounds In Medicinal Compositions (AREA)
  • Non-Silver Salt Photosensitive Materials And Non-Silver Salt Photography (AREA)
  • Polyoxymethylene Polymers And Polymers With Carbon-To-Carbon Bonds (AREA)
  • Materials For Photolithography (AREA)
  • Printing Plates And Materials Therefor (AREA)
  • Manufacture Or Reproduction Of Printing Formes (AREA)
  • Color Printing (AREA)
  • Holo Graphy (AREA)
  • Optical Record Carriers And Manufacture Thereof (AREA)
  • Developing Agents For Electrophotography (AREA)
ZA844740A 1983-06-29 1984-06-22 Light-sensitive mixture and copying material prepared with this mixture ZA844740B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE3323343A DE3323343A1 (de) 1983-06-29 1983-06-29 Lichtempfindliches gemisch und daraus hergestelltes kopiermaterial

Publications (1)

Publication Number Publication Date
ZA844740B true ZA844740B (en) 1985-02-27

Family

ID=6202631

Family Applications (1)

Application Number Title Priority Date Filing Date
ZA844740A ZA844740B (en) 1983-06-29 1984-06-22 Light-sensitive mixture and copying material prepared with this mixture

Country Status (10)

Country Link
US (1) US4642282A (xx)
EP (1) EP0131780B1 (xx)
JP (1) JPS6021046A (xx)
AT (1) ATE23409T1 (xx)
AU (1) AU569530B2 (xx)
BR (1) BR8403198A (xx)
CA (1) CA1246378A (xx)
DE (2) DE3323343A1 (xx)
ES (1) ES8604362A1 (xx)
ZA (1) ZA844740B (xx)

Families Citing this family (46)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3442756A1 (de) * 1984-11-23 1986-05-28 Hoechst Ag, 6230 Frankfurt Strahlungsempfindliches gemisch, daraus hergestelltes aufzeichnungsmaterial und verfahren zur herstellung von waermebestaendigen reliefaufzeichnungen
JPH07109510B2 (ja) * 1985-04-02 1995-11-22 三菱化学株式会社 ポジ型フォトレジスト組成物
JPS62123444A (ja) * 1985-08-07 1987-06-04 Japan Synthetic Rubber Co Ltd ポジ型感放射線性樹脂組成物
US5217840A (en) * 1985-08-12 1993-06-08 Hoechst Celanese Corporation Image reversal negative working o-quinone diazide and cross-linking compound containing photoresist process with thermal curing treatment and element produced therefrom
US5256522A (en) * 1985-08-12 1993-10-26 Hoechst Celanese Corporation Image reversal negative working O-naphthoquinone diazide and cross-linking compound containing photoresist process with thermal curing
US4931381A (en) * 1985-08-12 1990-06-05 Hoechst Celanese Corporation Image reversal negative working O-quinone diazide and cross-linking compound containing photoresist process with thermal curing treatment
US4929536A (en) * 1985-08-12 1990-05-29 Hoechst Celanese Corporation Image reversal negative working O-napthoquinone diazide and cross-linking compound containing photoresist process with thermal curing
JPS6267181U (xx) * 1985-10-17 1987-04-25
DE3730785A1 (de) * 1987-09-13 1989-03-23 Hoechst Ag Positiv arbeitendes strahlungsempfindliches gemisch und daraus hergestelltes strahlungsempfindliches aufzeichnungsmaterial
DE3730787A1 (de) * 1987-09-13 1989-03-23 Hoechst Ag Positiv arbeitendes strahlungsempfindliches gemisch und daraus hergestelltes strahlungsempfindliches aufzeichnungsmaterial
US4970287A (en) * 1987-11-23 1990-11-13 Olin Hunt Specialty Products Inc. Thermally stable phenolic resin compositions with ortho, ortho methylene linkage
US5024921A (en) * 1987-11-23 1991-06-18 Ocg Microelectronic Materials, Inc. Thermally stable light-sensitive compositions with o-quinone diazide and phenolic resin used in a method of forming a positive photoresist image
US4837121A (en) * 1987-11-23 1989-06-06 Olin Hunt Specialty Products Inc. Thermally stable light-sensitive compositions with o-quinone diazide and phenolic resin
US4920028A (en) * 1988-03-31 1990-04-24 Morton Thiokol, Inc. High contrast high thermal stability positive photoresists with mixed cresol and hydroxybenzaldehyde prepared novolak and photosensitive diazoquinone
US4997734A (en) * 1988-08-02 1991-03-05 Morton International, Inc. Method of forming a thermally stable mixed aldehyde novolak resin containing resist pattern and that pattern on a substrate
US5130409A (en) * 1988-04-22 1992-07-14 Morton International, Inc. Mixed aldehyde novolak resins useful as high contrast high thermal stability positive photoresists
JPH01293340A (ja) * 1988-05-20 1989-11-27 Japan Synthetic Rubber Co Ltd 感放射線性樹脂組成物
US5254440A (en) * 1988-05-31 1993-10-19 Ocg Microelectronic Materials, Inc. Selected methylol-substituted trihydroxybenzophenones and their use in phenolic resin compositions and processes of forming resist images
US5177172A (en) * 1988-05-31 1993-01-05 Ocg Microelectronic Materials, Inc. Selected methylol-substituted trihydroxybenzophenones and their use in phenolic resin compositions
US5239122A (en) * 1988-05-31 1993-08-24 Ocg Microelectronic Materials, Inc. Selected methylol-substituted trihydroxybenzophenones and their use in phenolic resin compositions
US5002851A (en) * 1988-05-31 1991-03-26 Olin Hunt Specialty Products, Inc. Light sensitive composition with o-quinone diazide and phenolic novolak resin made using methylol substituted trihydroxybenzophenone as reactant
US5178986A (en) * 1988-10-17 1993-01-12 Shipley Company Inc. Positive photoresist composition with naphthoquinonediazidesulfonate of oligomeric phenol
US5753406A (en) * 1988-10-18 1998-05-19 Japan Synthetic Rubber Co., Ltd. Radiation-sensitive resin composition
US4957846A (en) * 1988-12-27 1990-09-18 Olin Hunt Specialty Products Inc. Radiation sensitive compound and mixtures with trinuclear novolak oligomer with o-naphthoquinone diazide sulfonyl group
US4992356A (en) * 1988-12-27 1991-02-12 Olin Hunt Specialty Products Inc. Process of developing a radiation imaged product with trinuclear novolak oligomer having o-naphthoquinone diazide sulfonyl group
US4992596A (en) * 1988-12-27 1991-02-12 Olin Hunt Specialty Products Inc. Selected trinuclear novolak oligomers and their use in photoactive compounds and radiation sensitive mixtures
JPH02254450A (ja) * 1989-03-29 1990-10-15 Toshiba Corp レジスト
US5288587A (en) * 1989-09-05 1994-02-22 Sumitomo Chemical Co., Ltd. Radiation-sensitive positive resist composition comprising an o-quinone diazide, an alkali-soluble resin and a polyphenol compound
WO1991004512A1 (en) * 1989-09-07 1991-04-04 Ocg Microelectronic Materials, Inc. Selected block copolymer novolak binder resins and their use in radiation-sensitive compositions
US5196289A (en) * 1989-09-07 1993-03-23 Ocg Microelectronic Materials, Inc. Selected block phenolic oligomers and their use in radiation-sensitive resist compositions
US5188921A (en) * 1989-09-07 1993-02-23 Ocg Microelectronic Materials, Inc. Selected block copolymer novolak binder resins in radiation-sensitive resist compositions
US5235022A (en) * 1989-09-07 1993-08-10 Ocg Microelectronic Materials, Inc. Selected block copolymer novolak binder resins
US5232819A (en) * 1989-09-07 1993-08-03 Ocg Microelectronic Materials, Inc. Selected block phenolic oligomers and their use in phenolic resin compositions and in radiation-sensitive resist compositions
US5234795A (en) * 1989-09-07 1993-08-10 Ocg Microelectronic Materials, Inc. Process of developing an image-wise exposed resist-coated substrate
WO1991003448A1 (en) * 1989-09-07 1991-03-21 Ocg Microelectronic Materials, Inc. Selected block phenolic oligomers and their use in phenolic resin compositions and in radiation-sensitive resist compositions
US5798422A (en) * 1994-08-25 1998-08-25 Mitsui Toatsu Chemicals, Inc. Aromatic hydroxycarboxylic acid resins and their use
US5652081A (en) * 1995-09-20 1997-07-29 Fuji Photo Film Co., Ltd. Positive working photoresist composition
US6103443A (en) * 1997-11-21 2000-08-15 Clariant Finance Lmited Photoresist composition containing a novel polymer
US20050037293A1 (en) * 2000-05-08 2005-02-17 Deutsch Albert S. Ink jet imaging of a lithographic printing plate
US20040025730A1 (en) * 2002-08-06 2004-02-12 Fromson Howard A. Method for imaging a lithographic printing plate
KR20130095815A (ko) * 2010-12-27 2013-08-28 아사히 가세이 이-매터리얼즈 가부시키가이샤 알칼리 현상용 감광성 페놀 수지 조성물, 경화 릴리프 패턴 및 반도체의 제조 방법, 그리고 비페닐디일트리하이드록시벤젠 수지
WO2013085004A1 (ja) * 2011-12-09 2013-06-13 旭化成イーマテリアルズ株式会社 感光性樹脂組成物、硬化レリーフパターンの製造方法、半導体装置及び表示体装置
US9868868B2 (en) * 2014-03-06 2018-01-16 Lg Chem, Ltd. Offset printing composition, printing method using same, and pattern comprising offset printing composition
KR101754901B1 (ko) * 2014-05-16 2017-07-06 제일모직 주식회사 하드마스크 조성물 및 상기 하드마스크 조성물을 사용하는 패턴형성방법
KR101852457B1 (ko) * 2015-11-12 2018-04-26 삼성에스디아이 주식회사 신규한 중합체를 포함하는 수지 조성물 및 이를 이용한 유기막
JP6809200B2 (ja) * 2016-12-19 2021-01-06 Dic株式会社 エポキシ樹脂、硬化性樹脂組成物及びその硬化物

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
NL130926C (xx) * 1959-09-04
GB1150203A (en) * 1966-07-27 1969-04-30 Midland Silicones Ltd Polymeric Compositions
US3849392A (en) * 1969-05-20 1974-11-19 Kalle Ag Process for the production of polycondensation products of aromatic diazonium compounds
BE789196A (fr) * 1971-09-25 1973-03-22 Kalle Ag Matiere a copier photosensible
DE2718254C3 (de) * 1977-04-25 1980-04-10 Hoechst Ag, 6000 Frankfurt Strahlungsempfindliche Kopiermasse
DE2834059A1 (de) * 1978-08-03 1980-02-14 Hoechst Ag Lichtempfindliches kopiermaterial und verfahren zu seiner herstellung
JPS561044A (en) * 1979-06-16 1981-01-08 Konishiroku Photo Ind Co Ltd Photosensitive composition
DE3022473A1 (de) * 1980-06-14 1981-12-24 Hoechst Ag, 6000 Frankfurt Lichtempfindliches kopiermaterial und verfahren zu seiner herstellung
DE3039926A1 (de) * 1980-10-23 1982-05-27 Hoechst Ag, 6000 Frankfurt Lichtempfindliches gemisch, daraus hergestelltes lichtempfindliches kopiermaterial und verfahren zur herstellung einer druckform aus dem kopiermaterial
DE3040156A1 (de) * 1980-10-24 1982-06-03 Hoechst Ag, 6000 Frankfurt Lichtempfindliches gemisch und damit hergestelltes lichtempfindliches kopiermaterial
DE3174017D1 (en) * 1980-12-17 1986-04-10 Konishiroku Photo Ind Photosensitive compositions
AU543462B2 (en) * 1981-10-23 1985-04-18 Hoechst A.G. Napthoquinone diazide sulphonic acid esters and light sensitive compositions containing them

Also Published As

Publication number Publication date
US4642282A (en) 1987-02-10
JPS6021046A (ja) 1985-02-02
EP0131780B1 (de) 1986-11-05
CA1246378A (en) 1988-12-13
JPH0455298B2 (xx) 1992-09-02
DE3323343A1 (de) 1985-01-10
DE3461229D1 (en) 1986-12-11
ATE23409T1 (de) 1986-11-15
ES8604362A1 (es) 1986-01-16
AU569530B2 (en) 1988-02-04
BR8403198A (pt) 1985-06-11
EP0131780A1 (de) 1985-01-23
ES533562A0 (es) 1986-01-16
AU2992384A (en) 1985-01-03

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