WO2024241665A1 - 電磁波反射パネル、電磁波反射装置、及び電磁波反射フェンス - Google Patents

電磁波反射パネル、電磁波反射装置、及び電磁波反射フェンス Download PDF

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Publication number
WO2024241665A1
WO2024241665A1 PCT/JP2024/009349 JP2024009349W WO2024241665A1 WO 2024241665 A1 WO2024241665 A1 WO 2024241665A1 JP 2024009349 W JP2024009349 W JP 2024009349W WO 2024241665 A1 WO2024241665 A1 WO 2024241665A1
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WO
WIPO (PCT)
Prior art keywords
electromagnetic wave
wave reflecting
curvature
hollow
radius
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/JP2024/009349
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English (en)
French (fr)
Japanese (ja)
Inventor
久美子 神原
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
AGC Inc
Original Assignee
Asahi Glass Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Asahi Glass Co Ltd filed Critical Asahi Glass Co Ltd
Priority to JP2025521813A priority Critical patent/JPWO2024241665A1/ja
Publication of WO2024241665A1 publication Critical patent/WO2024241665A1/ja
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

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Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01Q—ANTENNAS, i.e. RADIO AERIALS
    • H01Q15/00—Devices for reflection, refraction, diffraction or polarisation of waves radiated from an antenna, e.g. quasi-optical devices
    • H01Q15/02—Refracting or diffracting devices, e.g. lens, prism
    • H01Q15/12—Refracting or diffracting devices, e.g. lens, prism functioning also as polarisation filter
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01Q—ANTENNAS, i.e. RADIO AERIALS
    • H01Q15/00—Devices for reflection, refraction, diffraction or polarisation of waves radiated from an antenna, e.g. quasi-optical devices
    • H01Q15/14—Reflecting surfaces; Equivalent structures
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K9/00—Screening of apparatus or components against electric or magnetic fields

Definitions

  • the dielectric layer 11 is an insulating polymer film such as polycarbonate, cycloolefin polymer (COP), polyethylene terephthalate (PET), or fluororesin, and has a thickness of approximately 0.3 mm to 1.0 mm.
  • the dielectric layer 11 may be any material that has a relative dielectric constant and dielectric tangent suitable for achieving the target reflection characteristics.
  • the adhesive layer 23 protects the surface of the ground layer 12 and adheres and holds the dielectric substrate 21.
  • the adhesive layer 24 protects the surface of the conductive pattern 15 and adheres and holds the dielectric substrate 22. It is desirable for the adhesive layers 23 and 24 to be durable and moisture resistant, and for example, ethylene-vinyl acetate (EVA) copolymer or cycloolefin polymer (COP) can be used.
  • EVA ethylene-vinyl acetate
  • COP cycloolefin polymer
  • the thickness of the adhesive layers 23 and 24 is appropriately determined in the range of 10 ⁇ m to 400 ⁇ m so that the dielectric substrates 21 and 22 can be joined.
  • the intrusion of moisture and air into the surface of the conductive pattern 15 is suppressed, and deterioration of the reflective surface is suppressed.
  • the ground layer 12 By covering the ground layer 12 with an adhesive layer 23 and bonding the dielectric substrate 21, the intrusion of moisture and air into the surface of the ground layer 12 is suppressed, and surface deterioration of the ground layer 12 is suppressed. This keeps the capacitance between the ground layer 12 and the conductive pattern 15 constant, and makes it possible to maintain the magnitude of the designed phase delay. In other words, the reflection efficiency of radio waves in the designed direction can be maintained.
  • Hollow patterns 151a, 151b, 151c, 151d, 151e, and 151f are hollowed out with a width W2.
  • the width of the vertical line segments is half the difference between the width W1 of the outer periphery and the width W2 of the inner periphery of each hollow pattern 151.
  • the width of the horizontal line segments of hollow pattern 151 is determined according to the area of the hollowed out area.
  • the vertical and horizontal line segments of hollow pattern 151 enable it to respond to both vertically polarized waves and horizontally polarized waves.
  • the conductive pattern 15 is a periodic pattern in which unit cells 20 are repeatedly arranged in the X and Y directions.
  • the calculated power reflection efficiency must be corrected.
  • An ideal conductive plate is a perfect mirror reflector, and for perpendicular incidence, it reflects electromagnetic waves in the same direction, whereas a metasurface reflects electromagnetic waves in a direction different from the angle of incidence.
  • the power reflection efficiency of a metasurface is calculated by dividing the power reflection efficiency calculated from the gain value (dB) by the correction value.
  • Figure 7 shows the analysis space 101 for the electromagnetic wave simulation.
  • the thickness direction of the layered structure of the electromagnetic wave reflecting panel 10 is the Z direction
  • the width direction of the hollow pattern 151 (see Figure 5) of the model in Figure 6 is the X direction
  • the length direction is the Y direction
  • the analysis space is expressed as (size in the X direction) x (size in the Y direction) x (size in the Z direction).
  • the size of the analysis space 101 when the frequency of the incident electromagnetic wave is 28.0 GHz is 111.8 mm x 32.1 mm x 3.7 mm.
  • the boundary condition is a design in which electromagnetic wave absorbers 102 are placed around the periphery of the analysis space 101.
  • Figure 8 is a schematic diagram of the XZ plane of the analysis space 101 surrounded by the electromagnetic wave absorber 102.
  • the radius of curvature of the corners of the hollow patterns 151 that constitute the conductive pattern 15 is changed to calculate the power reflection efficiency.
  • All the conductive patterns 15 used in the simulation are the same.
  • the six hollow patterns 151 that constitute the unit cell 20 are hollow rectangles with a uniform outer periphery width W1 of 1.5 mm and an inner periphery width W2 of 1.0 mm, and the lengths L are 2.5349 mm, 2.7342 mm, 3.2636 mm, 1.4708 mm, 1.9762 mm, and 2.2889 mm, respectively.
  • Example 8 is Comparative Example 1.
  • Example 8 the same unit cell 20 as in Example 1 is used, but the corners of the hollow pattern 151 are not rounded. That is, the radius of curvature R1 of the four outer corners of the hollow pattern 151 is set to 0.0 mm, and the radius of curvature R2 of the four inner corners is set to 0.0 mm.
  • a reflective film is produced under the same conditions as in Example 1 except for the radius of curvature, and the reflective film is sandwiched between two polycarbonate substrates having a thickness of 2.0 mm via an adhesive layer of ethylene glycol acetate having a thickness of 400 ⁇ m.
  • the gain value at 50° in the RCS plot is ⁇ 1.5994 dB for vertical polarization and ⁇ 4.8567 dB for horizontal polarization.
  • the power reflection efficiency is 76.0% for vertical polarization and 36.8% for horizontal polarization.
  • Example 9 when all corners of hollow pattern 151 are sharply rounded, the effect of suppressing current concentration is small, and a power reflection efficiency of 40% or more cannot be obtained for horizontal polarization.

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  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Aerials With Secondary Devices (AREA)
PCT/JP2024/009349 2023-05-23 2024-03-11 電磁波反射パネル、電磁波反射装置、及び電磁波反射フェンス Ceased WO2024241665A1 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2025521813A JPWO2024241665A1 (https=) 2023-05-23 2024-03-11

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2023084435 2023-05-23
JP2023-084435 2023-05-23

Publications (1)

Publication Number Publication Date
WO2024241665A1 true WO2024241665A1 (ja) 2024-11-28

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Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2024/009349 Ceased WO2024241665A1 (ja) 2023-05-23 2024-03-11 電磁波反射パネル、電磁波反射装置、及び電磁波反射フェンス

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JP (1) JPWO2024241665A1 (https=)
WO (1) WO2024241665A1 (https=)

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH10322156A (ja) * 1996-06-10 1998-12-04 Fuji Electric Co Ltd 電力変換器用ノイズフィルタ
JP2006179671A (ja) * 2004-12-22 2006-07-06 Mitsubishi Gas Chem Co Inc 電波吸収体および電波吸収体の製造方法
JP2014138058A (ja) * 2013-01-16 2014-07-28 Panasonic Corp 電磁波遮蔽材
WO2020179349A1 (ja) * 2019-03-01 2020-09-10 リンテック株式会社 電磁波吸収フィルム、電磁波吸収シート
WO2021199504A1 (ja) * 2020-03-31 2021-10-07 Ａｇｃ株式会社 無線伝達システム
WO2022102708A1 (ja) * 2020-11-13 2022-05-19 Ａｇｃ株式会社 電磁波遮蔽体

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH10322156A (ja) * 1996-06-10 1998-12-04 Fuji Electric Co Ltd 電力変換器用ノイズフィルタ
JP2006179671A (ja) * 2004-12-22 2006-07-06 Mitsubishi Gas Chem Co Inc 電波吸収体および電波吸収体の製造方法
JP2014138058A (ja) * 2013-01-16 2014-07-28 Panasonic Corp 電磁波遮蔽材
WO2020179349A1 (ja) * 2019-03-01 2020-09-10 リンテック株式会社 電磁波吸収フィルム、電磁波吸収シート
WO2021199504A1 (ja) * 2020-03-31 2021-10-07 Ａｇｃ株式会社 無線伝達システム
WO2022102708A1 (ja) * 2020-11-13 2022-05-19 Ａｇｃ株式会社 電磁波遮蔽体

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