WO2024105966A1 - Dispositif d'analyse automatisé - Google Patents

Dispositif d'analyse automatisé Download PDF

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Publication number
WO2024105966A1
WO2024105966A1 PCT/JP2023/031363 JP2023031363W WO2024105966A1 WO 2024105966 A1 WO2024105966 A1 WO 2024105966A1 JP 2023031363 W JP2023031363 W JP 2023031363W WO 2024105966 A1 WO2024105966 A1 WO 2024105966A1
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WO
WIPO (PCT)
Prior art keywords
temperature
unit
light receiving
light
photometer
Prior art date
Application number
PCT/JP2023/031363
Other languages
English (en)
Japanese (ja)
Inventor
昌平 有田
貴洋 安藤
裕哉 松岡
Original Assignee
株式会社日立ハイテク
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 株式会社日立ハイテク filed Critical 株式会社日立ハイテク
Publication of WO2024105966A1 publication Critical patent/WO2024105966A1/fr

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/27—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor

Definitions

  • the present invention relates to an automatic analyzer.
  • the object of the present invention is to provide an automatic analyzer with high-precision analytical performance by keeping the temperature of the photometer housing constant and stabilizing the temperature of the light receiving part, which is greatly affected by temperature.
  • the present invention provides an automatic analyzer that includes a photometer equipped with a spectroscopic section and a light receiving section, and a temperature adjustment section that is attached to the housing of the photometer and equilibrates the temperature of the photometer, the temperature adjustment section being attached to the surface of the photometer opposite to the surface to which the light receiving section is attached.
  • FIG. 1 is a schematic diagram of an example of an automatic analyzer.
  • FIG. 2 is a diagram showing a configuration example of a photometer in the first embodiment.
  • FIG. 4 is a diagram showing another example of the configuration of the photometer in the first embodiment.
  • FIG. 4 is a diagram showing another example of the configuration of the photometer in the first embodiment.
  • FIG. 13 is a supplementary diagram of a configuration example of a photometer in the first embodiment.
  • FIG. 11 is a diagram showing an example of the configuration of a photometer in a second embodiment.
  • FIG. 13 is a diagram showing an example of the configuration of a photometer according to a third embodiment.
  • FIG. 11 is a top view of a photometer in Example 3.
  • FIG. 13 is a diagram showing an example of the configuration of a photometer in Example 4.
  • FIG. 1 is a schematic diagram showing the overall configuration of an automatic analyzer 100.
  • the automatic analyzer 100 shown in the figure is an apparatus that performs measurements by irradiating a sample with light.
  • the automatic analyzer 100 includes a sample disk 103, a reagent disk 106, a reaction disk 109, a dispensing mechanism, a control circuit 201, a light quantity measuring circuit 202, a data processing unit 203, an input unit 204, and an output unit 205.
  • the dispensing mechanism on the reaction disk moves samples and reagents between disks.
  • the control circuit 201 controls each disk and the dispensing mechanism, and the light quantity measuring circuit 202 measures the absorbance of the reaction solution.
  • the data processing unit 203 processes the data measured by the light quantity measuring circuit 202.
  • the input unit 204 and the output unit 205 are interfaces with the data processing unit 203.
  • the dispensing mechanism includes a sample dispensing mechanism 110 and a reagent dispensing mechanism 111.
  • the data processing unit 203 includes an information recording unit 2031 and an analysis unit 2032.
  • the information recording unit 2031 stores control data, measurement data, data used in data analysis, analysis result data, etc.
  • the data processing unit 203 may be realized using a computer.
  • a number of specimen cups 102 which are containers for specimens 101, are arranged on the circumference of the specimen disk 103.
  • the specimen 101 is, for example, blood.
  • a number of reagent bottles 105 which are containers for reagents 104, are arranged on the circumference of the reagent disk 106.
  • a number of reaction cells 108 (reaction containers), which are containers for reaction solutions 107 in which the specimens 101 and reagents 104 are mixed, are arranged on the circumference of the reaction disk 109.
  • the specimen dispensing mechanism 110 is a mechanism used to transfer a fixed amount of specimen 101 from the specimen cup 102 to the reaction cell 108.
  • the specimen dispensing mechanism 110 is composed of, for example, a nozzle that dispenses or aspirates a solution, a robot that positions and transports the nozzle to a predetermined position, a pump that dispenses or aspirates a solution from the nozzle, and a flow path that connects the nozzle and the pump.
  • the reagent dispensing mechanism 111 is a mechanism used when transferring a fixed amount of reagent 104 from the reagent bottle 105 to the reaction cell 108.
  • the reagent dispensing mechanism 111 is also composed of, for example, a nozzle that dispenses or aspirates a solution, a robot that positions and transports the nozzle to a predetermined position, a pump that dispenses solution from the nozzle or aspirates solution into the nozzle, and a flow path that connects the nozzle and the pump.
  • the stirring unit 112 is a mechanism that stirs and mixes the specimen 101 and the reagent 104 in the reaction cell 108.
  • the washing unit 114 is a mechanism that discharges the reaction solution 107 from the reaction cell 108 after the analysis process has been completed, and then washes the reaction cell 108.
  • the reaction cell 108 is immersed in a constant temperature fluid 115 in a temperature-controlled thermostatic bath. This allows the reaction cell 108 and the reaction solution 107 therein to be kept at a constant temperature by the control circuit 201 even while being moved by the reaction disk 109.
  • a constant temperature fluid 115 For example, water or air is used as the constant temperature fluid 115.
  • a photometer 113 that performs absorbance analysis on the sample 101 is positioned on a portion of the circumference of the reaction disk 109.
  • the amounts of components such as proteins, sugars, and lipids contained in the sample 101 are calculated according to the following procedure.
  • the control circuit 201 causes the sample dispensing mechanism 110 to dispense a fixed amount of the sample 101 in the sample cup 102 into the reaction cell 108.
  • the control circuit 201 causes the reagent dispensing mechanism 111 to dispense a fixed amount of the reagent 104 in the reagent bottle 105 into the reaction cell 108.
  • the control circuit 201 rotates the specimen disk 103, the reagent disk 106, and the reaction disk 109 using the corresponding drive units. At this time, the specimen cup 102, the reagent bottle 105, and the reaction cell 108 are positioned at a predetermined dispensing position according to the drive timing of the corresponding dispensing mechanism.
  • reaction cell 108 containing the reaction solution 107 passes the measurement position where the photometer 113 is located. Each time it passes the measurement position, the amount of light transmitted from the reaction solution 107 is measured via the photometer 113.
  • the measurement data is output sequentially to the information recording unit 2031 and stored as reaction process data.
  • reaction process data acquired at fixed time intervals is stored in the information recording unit 2031.
  • FIG. 2 is a diagram showing an example of the configuration of the photometer of the first embodiment, i.e., the photometer 113.
  • the irradiation light generated from the light source unit 301 is emitted along the optical path 401, and is collected by the collecting lens 403 and irradiated onto the reaction cell 108.
  • a light source side slit 402 may be arranged to limit the width of the light emitted from the light source unit 301.
  • the irradiation light generated from the light source unit 301 is emitted along the optical path 401, and is collected by the collecting lens 403 and irradiated onto the reaction cell 108.
  • a light source side slit 402 may be arranged to uniformly distribute the amount of light within the irradiation surface of the light, thereby restricting the width of the light emitted from the light source unit 301.
  • the light transmitted through the reaction solution 107 in the reaction cell 108 is split by a spectroscopic unit (e.g., a diffraction grating) 3021 attached to the housing 302, and is received by a light receiving unit 3022 equipped with a number of light receivers.
  • a spectroscopic unit e.g., a diffraction grating
  • the spectroscopic unit 3021 may not be provided. Since light that has not transmitted through the reaction solution 107 becomes noise, a slit 404 on the spectroscopic unit side may be provided to prevent such stray light from entering the light receiving unit 3022.
  • Examples of measurement wavelengths received by the light receiving unit 3022 include 340 nm, 376 nm, 405 nm, 415 nm, 450 nm, 480 nm, 505 nm, 546 nm, 570 nm, 600 nm, 660 nm, 700 nm, 750 nm, and 800 nm.
  • the light reception signals from these photoreceivers are sent to the information recording unit 2031 of the data processing unit 203 via the light quantity measurement circuit 202.
  • the first temperature adjustment unit 3024 is attached to the housing 302, and is attached to the surface opposite to the surface to which the light receiving unit 3022 is attached.
  • the first temperature adjustment unit 3024 is preferably attached near the light receiving unit 3022.
  • the first temperature adjustment unit 3024 has a function of controlling the output according to the temperature of the first temperature sensor 3026, and adjusting the temperature by at least raising the temperature.
  • the first temperature adjustment unit 3024 can suppress the temperature change of the housing 302, and the analytical performance can be stably maintained. By assembling it near the light receiving unit 3022, which is particularly affected by temperature, the time until the analytical performance stabilizes can be further shortened.
  • a heater, a Peltier element, a block in which a temperature-controlled liquid is circulated inside, etc. can be used.
  • FIG. 3 shows a form in which the light receiving unit 3022 is attached to a holding member 3023, and the holding member 3023 is then attached to the housing 302.
  • the holding member 3023 has a base material of a metal with high thermal conductivity.
  • the temperature adjustment unit transfers heat to the housing 302, but dissipates heat from the surface exposed to the outside air. Therefore, as shown in Figure 4, the surface exposed to the outside air and dissipating heat may be covered with insulating material 3029. This allows heat to be transferred to the housing 302 efficiently.
  • FIG. 5 is a perspective view focusing on the temperature adjustment unit 3024 in FIG. 4.
  • the light receiving unit 3022 is attached to the upper surface of the housing 302, and the first temperature adjustment unit 3024 is attached to the lower surface (opposite surface) of the housing 302.
  • the insulation material 3029 consists of two sheets: one plate with screw holes for fixing the temperature sensor, and one regular plate. This is because heat escapes from the screw heads, and insulation is then layered on top to cover the plate.
  • optical components such as a mirror 3028 that reflects light, a filter that transmits specific wavelengths, and a filter that reflects heat rays from a light source that is a high-temperature heat source such as a xenon lamp or halogen lamp may be installed on the optical path 401 from the light source unit 301 to the spectroscopic unit 3021.
  • Example 1 the output of the first temperature adjustment unit 3024 is adjusted according to the temperature of the first temperature sensor 3026.
  • the method of controlling the temperature adjustment unit is not limited to this.
  • the automatic analyzer according to Example 2 includes a second temperature sensor 3027 that measures the environmental temperature, as shown in FIG. 6. The rest of the configuration is the same as in Example 1.
  • first temperature sensor 3026 When controlling the temperature of first temperature sensor 3026 to, for example, 32°C, the amount of heat required to raise the temperature differs when the ambient temperature is 10°C and 30°C, resulting in differences in the temperature distribution in housing 302, the time it takes for the temperature to stabilize, and power consumption.
  • second temperature sensor 3027 By measuring the ambient temperature using second temperature sensor 3027 and switching the target temperature of first temperature sensor 3026 in accordance with the ambient temperature using control circuit 201, it is possible to optimize the target temperature of first temperature sensor 3026. This makes it possible to control first temperature adjustment unit 3024 with a constant amount of heat, regardless of the ambient temperature.
  • the number of temperature adjustment units does not have to be one.
  • the automatic analyzer according to Example 3 has a configuration in which a second temperature adjustment unit 3025 is assembled to the housing 302, and is assembled to the surface opposite to the surface to which the spectroscopic unit 3021 is assembled. The rest of the configuration is the same as in Example 1.
  • FIG. 8 is a top view of FIG. 7.
  • the temperature distribution in the housing 302 can be balanced by installing the second temperature adjustment unit 3025, and the effects of changes in the environmental temperature can be reduced.
  • the automatic analyzer of Example 4 has a configuration in which the surface of the housing 302 exposed to the outside air is covered with insulating material 3029.
  • the other configurations are the same as those of Example 1.
  • the surface of the housing 302 exposed to the outside air may be partially covered with the insulating material 3029.
  • the insulating material 3029 For example, only the surface close to the heat source around the housing 302 that is affected by the heat source may be covered with the insulating material 3029.

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  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Engineering & Computer Science (AREA)
  • Mathematical Physics (AREA)
  • Theoretical Computer Science (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)

Abstract

Afin d'obtenir une performance analytique suffisante dans une spectrométrie d'absorption dans laquelle un photomètre d'un dispositif d'analyse automatisé est utilisé, il est nécessaire de maintenir constant le trajet optique du photomètre et de rendre constante la sensibilité d'une partie de réception de lumière. Cependant, la température du photomètre change en fonction d'une augmentation de température à l'intérieur du dispositif, et ainsi la longueur de trajet optique change en raison de la distorsion thermique et la sensibilité de la partie de réception de lumière change en raison des caractéristiques de température de la partie de réception de lumière, ou de changements de la température ambiante, et ainsi un courant photoélectrique varie. Cette partie de réglage de température qui est fixée à un boîtier du photomètre est caractérisée en ce qu'elle est fixée à une surface sur le côté opposé à la surface où est fixée la partie de réception de lumière du photomètre et supprime des changements de température dans le photomètre, en particulier dans la partie de réception de lumière, qui sont provoqués par une augmentation de la température à l'intérieur du dispositif, des changements de la température ambiante, ou similaires, et peut ainsi stabiliser le courant photoélectrique.
PCT/JP2023/031363 2022-11-16 2023-08-30 Dispositif d'analyse automatisé WO2024105966A1 (fr)

Applications Claiming Priority (2)

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JP2022-182978 2022-11-16
JP2022182978 2022-11-16

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Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61209344A (ja) * 1985-03-13 1986-09-17 Konishiroku Photo Ind Co Ltd 生化学分析装置
JPH08114541A (ja) * 1994-10-14 1996-05-07 Hitachi Ltd 自動化学分析装置
JP2004101295A (ja) * 2002-09-06 2004-04-02 Fuji Kiki Kogyo Kk 自動分析機器
KR20070108654A (ko) * 2006-05-08 2007-11-13 한국유리공업주식회사 연속적으로 이동되는 투과 가능한 판재의 자동 결함 검사시스템 및 자동 결함 검사방법
JP2008014637A (ja) * 2006-06-30 2008-01-24 Sakae:Kk 自動分析装置
WO2010013777A1 (fr) * 2008-07-30 2010-02-04 株式会社日立ハイテクノロジーズ Dispositif d'analyse d'échantillon
JP2010156611A (ja) * 2008-12-26 2010-07-15 Beckman Coulter Inc 反応容器ホルダ及び自動分析装置
JP2016024055A (ja) * 2014-07-21 2016-02-08 株式会社サカエ 自動分析装置
JP2021081312A (ja) * 2019-11-20 2021-05-27 株式会社日立ハイテク 自動分析装置

Patent Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61209344A (ja) * 1985-03-13 1986-09-17 Konishiroku Photo Ind Co Ltd 生化学分析装置
JPH08114541A (ja) * 1994-10-14 1996-05-07 Hitachi Ltd 自動化学分析装置
JP2004101295A (ja) * 2002-09-06 2004-04-02 Fuji Kiki Kogyo Kk 自動分析機器
KR20070108654A (ko) * 2006-05-08 2007-11-13 한국유리공업주식회사 연속적으로 이동되는 투과 가능한 판재의 자동 결함 검사시스템 및 자동 결함 검사방법
JP2008014637A (ja) * 2006-06-30 2008-01-24 Sakae:Kk 自動分析装置
WO2010013777A1 (fr) * 2008-07-30 2010-02-04 株式会社日立ハイテクノロジーズ Dispositif d'analyse d'échantillon
JP2010156611A (ja) * 2008-12-26 2010-07-15 Beckman Coulter Inc 反応容器ホルダ及び自動分析装置
JP2016024055A (ja) * 2014-07-21 2016-02-08 株式会社サカエ 自動分析装置
JP2021081312A (ja) * 2019-11-20 2021-05-27 株式会社日立ハイテク 自動分析装置

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