WO2024079220A1 - Dispositif de test et sonde de test pour dispositif de test - Google Patents

Dispositif de test et sonde de test pour dispositif de test Download PDF

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Publication number
WO2024079220A1
WO2024079220A1 PCT/EP2023/078257 EP2023078257W WO2024079220A1 WO 2024079220 A1 WO2024079220 A1 WO 2024079220A1 EP 2023078257 W EP2023078257 W EP 2023078257W WO 2024079220 A1 WO2024079220 A1 WO 2024079220A1
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WO
WIPO (PCT)
Prior art keywords
test
needle
sleeve
reference electrode
section
Prior art date
Application number
PCT/EP2023/078257
Other languages
German (de)
English (en)
Inventor
Andreas Egbers
Original Assignee
Leoni Bordnetz-Systeme Gmbh
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Leoni Bordnetz-Systeme Gmbh filed Critical Leoni Bordnetz-Systeme Gmbh
Publication of WO2024079220A1 publication Critical patent/WO2024079220A1/fr

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07314—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06716—Elastic
    • G01R1/06722—Spring-loaded
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06733—Geometry aspects
    • G01R1/0675—Needle-like
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06755—Material aspects
    • G01R1/06761—Material aspects related to layers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/66—Testing of connections, e.g. of plugs or non-disconnectable joints
    • G01R31/68—Testing of releasable connections, e.g. of terminals mounted on a printed circuit board
    • G01R31/69—Testing of releasable connections, e.g. of terminals mounted on a printed circuit board of terminals at the end of a cable or a wire harness; of plugs; of sockets, e.g. wall sockets or power sockets in appliances
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06794—Devices for sensing when probes are in contact, or in position to contact, with measured object

Definitions

  • the invention relates to a test device for testing a plug connector for an on-board network for correct assembly of a number of plug contacts of the plug connector.
  • the invention also relates to a test pin for such a test device.
  • a connector designed for a vehicle electrical system usually has a number of connector contacts which have to be installed in a connector housing of the connector when the connector is installed.
  • test device with several test pins is usually used for this purpose.
  • the connector is placed on the test device with its plug contacts first until the individual test pins make electrical contact with a plug contact. This checks that the plug contacts are correctly installed. Carrying out the test can be complex.
  • the invention is based on the object of enabling a simple and reliable testing of a connector for an on-board network for correct assembly of a number of plug contacts of the connector.
  • test device with the features of claim 1 and by a test pin with the features of claim 24.
  • test pin with the features of claim 24.
  • the test device is used to test a plug connector, specifically an electrical plug connector that is designed for use in an on-board network, in particular in an on-board network of a motor vehicle.
  • a corresponding plug connector has a number of plug contacts, i.e. at least one plug contact and typically two or more plug contacts.
  • Such a plug contact is usually made of a metal or a metal alloy and is designed, for example, as a contact pin or contact sleeve.
  • the test device is now set up to check whether a number of plug contacts of the connector are correctly installed and in particular to check whether all of the plug contacts of the connector are correctly installed.
  • the test device is preferably set up to check whether the number of plug contacts of the connector are correctly installed in a plug housing of the connector.
  • the test device also has an electromechanical measuring device with at least one test pin.
  • the test device preferably has more than one test pin, for example four, six or eight test pins.
  • the test device has a test pin for each plug contact provided on the connector.
  • at least two of the test pins are Test device is designed in the same way and in particular all test pins of the test device are designed in the same way, namely according to the type of at least one
  • the at least one test pin is usually elongated in a longitudinal direction. It has a sleeve and a test needle held by the sleeve.
  • the test needle on the one hand and the sleeve on the other hand are each elongated in the longitudinal direction.
  • the test needle is expediently at least partially inserted in the sleeve, similar to a ballpoint pen refill in a ballpoint pen.
  • the test needle is displaceable or held displaceably so that the test needle can be displaced in the longitudinal direction, i.e. in particular displaced relative to the sleeve. A longitudinal position of the test needle can thus be changed.
  • the measuring device comprising the at least one test pin, i.e. the electromechanical measuring device, is further configured to determine the longitudinal position of the test needle of the at least one test pin in a measuring process by means of a capacitive measurement.
  • the testing device and in particular the electromechanical measuring device preferably has a control and evaluation unit by means of which the capacitive measurement is controlled, carried out and/or evaluated.
  • the capacitive measurement allows the longitudinal position of the test needle to be determined automatically and reliably in a simple manner. This longitudinal position allows conclusions to be drawn about the installation of the plug contact to be tested, so that it can be checked whether the plug contact has been installed correctly.
  • the test needle of the at least one test pin has at least three sections when viewed in the longitudinal direction, namely an upper section, a middle section and a lower section.
  • the three sections are expediently connected to one another mechanically and/or materially.
  • the lower section is preferably made of a metal or a metal alloy.
  • the upper section is also made of a metal or a metal alloy.
  • the middle section is preferably made of an insulating material, for example a plastic, so that the middle section electrically insulates the upper section from the lower section.
  • the advantage is achieved that the lower and upper sections can have different reference potentials during the test.
  • the lower section is used for the desired capacitive measurement and the upper section is used simultaneously for a resistance measurement or current line measurement. This therefore makes it possible in particular for the position of the test needle and the electrical resistance to the plug contact to be determined - for example at the same time.
  • test device has a receptacle for the connector, for example a slot into which the connector can be plugged for testing.
  • the test device is then preferably set up in such a way that by inserting the connector into the receptacle, for example by plugging it into the slot, the test needle of the at least one test pin is moved differently depending on whether the connector contact to be tested is correctly mounted or not.
  • the test needle of the at least one test pin is preferably spring-mounted, in particular in such a way that a spring restoring force acting on the test needle is directed in the longitudinal direction.
  • the sleeve and the test needle are then coupled by a spring element, for example a helical spring.
  • a restoring force is also specified in such a way that the restoring force is, on the one hand, sufficiently large to move an incorrectly adjusted plug contact relative to the plug housing of the connector, and, on the other hand, sufficiently small not to move a correctly rusted plug contact relative to the plug housing of the connector. In this way, it is not only possible to determine whether a plug contact is correctly positioned in the plug housing of the connector to be tested, but also whether it is correctly installed.
  • the sleeve of the at least one test pin preferably has at least three sections when viewed in the longitudinal direction, namely an upper section, a middle section and a lower section.
  • the three sections are expediently connected to one another mechanically and/or materially.
  • the lower section is preferably made of a metal or a metal alloy.
  • the upper section is also made of a metal or a metal alloy.
  • the middle section is preferably made of an insulating material, for example a plastic, so that the middle section electrically insulates the upper section from the lower section.
  • the at least one test pin has at least three sections in at least one position of the test needle in the longitudinal direction, namely an upper section, a middle section and a lower section.
  • the lower section is preferably made of a metal or a metal alloy.
  • the upper section is also made of a metal or a metal alloy.
  • the middle section is preferably made of an insulating material, for example a plastic, so that the middle section electrically insulates the upper section from the lower section.
  • the lower section of the sleeve is made of a metal or a metal alloy and the lower section of the test needle is made of a metal or a metal alloy, it is also advantageous if the lower section of the sleeve and the lower section of the test needle are connected to one another in an electrically conductive manner.
  • the electrical connection is expediently implemented via a sliding contact or touch contact.
  • the lower section of the sleeve has a lower electrical connection, via which an electrical connection is then established, for example, between the lower section of the test needle on the one hand and a measuring circuit and/or a previously mentioned control and evaluation unit on the other hand.
  • the measuring device is then further preferably set up to determine the longitudinal position of the test needle by means of the lower electrical connection using the capacitive measurement.
  • the upper section of the sleeve and the upper section of the test needle are preferably connected to one another in an electrically conductive manner.
  • the electrical connection is expediently implemented via a sliding contact or touch contact.
  • the upper section of the sleeve has an upper electrical connection, via which an electrical connection is then established, for example, between the upper section of the test needle on the one hand and a measuring circuit and/or a previously mentioned control and evaluation unit on the other.
  • the measuring device is then further preferably set up to carry out a current line measurement by means of the upper electrical connection, in particular a current line measurement across the plug contact to be tested. In this case, for example, a current intensity or an ohmic resistance is then determined.
  • the test device is now set up to check the correct assembly of a number of plug contacts of the connector by determining the longitudinal position of the test needle of at least one test pin by means of capacitive measurement.
  • the measuring device preferably has a reference electrode which, depending on the application, is plate-shaped, for example. It is also useful if the reference electrode has a simple cuboid shape. In a slightly modified design variant of the reference electrode, this has a recess for the at least one test pin, which typically forms a blind hole or an opening. Furthermore, the test needle of the at least one test pin can then be moved in the longitudinal direction so far that in at least one position of the test needle the lower section of the test needle at least protrudes into the opening.
  • the test device is also preferably designed such that the lower section of the test needle penetrates the opening if there is a correctly rusted plug contact in the contact receptacle tested with the at least one test pin.
  • the lower section of the test needle then further preferably projects a little way into the opening if there is a plug contact in the contact receptacle tested with the at least one test pin, but this plug contact is not properly rusted with the contact receptacle.
  • the lower section of the test needle does not project into the opening if there is no plug contact in the contact receptacle tested with the at least one test pin.
  • test device has a guide aid for the test needle of at least one test pin.
  • the guide aid is typically arranged in the area of the reference electrode.
  • the guide aid preferably has at least one guide plate, which is arranged in particular between the sleeve of the at least one test pin and the reference electrode.
  • This at least one guide plate is typically arranged on an upper side of the reference electrode facing the sleeve and expediently has an opening for the at least one test pin as a guide for the test needle of the at least one test pin.
  • the edge of the at least one guide plate that limits the opening forms a sliding bearing for the test needle.
  • the guide aid has a further guide plate in addition to the previously described guide plate. This further guide plate is then arranged, for example, on a lower side of the reference electrode opposite the upper side.
  • it has a recess for the at least one test pin, for example a blind hole or an opening, as a guide for the test needle of the at least one test pin.
  • a recess for the at least one test pin for example a blind hole or an opening
  • the edge of the second guide plate delimiting the respective recess in turn forms a sliding bearing for the test needle.
  • test device has more than one test pin, as preferred and previously stated, the following also applies:
  • the reference electrode typically has more than one recess, namely in particular one recess for each test pin.
  • this guide plate typically has more than one opening, namely in particular one opening for each test pin.
  • the test device additionally has a further guide plate and the further guide plate has a recess
  • the further guide plate typically has more than one recess, namely in particular one recess for each test pin.
  • each of the guide plates of the guide aid typically consists of an electrically insulating material/material mix.
  • the previously described reference electrode is further arranged at a predetermined distance from the sleeve of the at least one test pin in the longitudinal direction and is usually elongated transversely to the longitudinal direction. Furthermore, the reference electrode and the sleeve are each expediently arranged in a fixed position in the test device so that the distance between the reference electrode and the Sleeve is fixed.
  • the stationary arrangement is achieved, for example, by a housing or a support structure of the test device.
  • the test needle on the other hand, can be moved longitudinally relative to the sleeve and thus also relative to the reference electrode. In this case, the longitudinal position of the test needle correlates with a distance between the test needle and the reference electrode.
  • the measuring device is then preferably set up to determine the distance between the test needle and the reference electrode in the measuring process by means of the capacitive measurement, whereby the test needle is used as a counter electrode to the reference electrode.
  • the at least one test pin is also typically arranged between the receptacle and the reference electrode.
  • a lower end of the at least one test pin faces the reference electrode and an upper end of the at least one test pin, which is opposite the lower end in the longitudinal direction, faces the receptacle.
  • the measuring device is further configured such that a voltage measurement is carried out on the reference electrode for the capacitive measurement.
  • Voltage measurement here means in particular that the electrical potential on the reference electrode is compared to a reference potential, the potential difference then corresponding to a measurable voltage that is determined during the voltage measurement.
  • a ground connection provides the reference potential, i.e. that the electrical potential on the reference electrode is compared in particular to the earth potential.
  • a comparable voltage measurement is carried out on the test needle instead of on the reference electrode. This means that the electrical potential on the test needle is then compared with a corresponding reference potential.
  • the previously mentioned lower electrical connection is preferably used for voltage measurement.
  • test device is advantageous in which the measuring device is set up to apply a test voltage to the test needle during the measuring process. This means that an electrical potential is specified for the test needle with a specified difference to a reference potential. The electrical potential is then preferably specified via a previously mentioned lower electrical connection.
  • the measuring device has a charge pump with which the test voltage can be generated.
  • a defined amount of charge is preferably applied to the test needle, which is designed as an electrode at least in some areas, so that a test voltage is established between the test needle and the reference potential.
  • the measuring device is therefore set up to apply the test voltage to the test needle in the measuring process.
  • such a test voltage is applied to the reference electrode instead of to the test needle.
  • the measuring device is designed to determine the potential difference between the test needle and the reference electrode by a voltage measurement.
  • the capacitive measurement serves to determine the longitudinal position of the test needle, whereby the longitudinal position of the test needle indicates whether the tested plug contact is correctly mounted or not.
  • the test device preferably has a control and evaluation unit by means of which the capacitive measurement is controlled, carried out and/or evaluated.
  • the control and evaluation unit has for example, a microcontroller.
  • a conversion algorithm is preferably specified in the control and evaluation unit, with which a measured value of the capacitive measurement is assigned to a result of the test, which is then output via the output unit.
  • control and evaluation unit is also programmable and in particular parameterizable.
  • the control and evaluation unit is configurable for different types of plug connectors, which differ, for example, in terms of the number of plug contacts and/or in terms of the intended installation depths/plug-in depths of the plug contacts.
  • control and evaluation unit is programmable, it is also preferably provided with an access restriction that prevents unauthorized persons from interfering with the programming.
  • the evaluation unit is password-protected, for example. This ensures reliable protection against manipulation and thus reliable testing.
  • the measuring device is designed according to a preferred embodiment to determine the distance between the test needle and the reference electrode in the measuring process by means of the capacitive measurement, the test needle being used for this purpose as a counter electrode to the reference electrode.
  • the test needle of the at least one test pin is then expediently made at least partially from a metal or a metal alloy.
  • test device has more than one test pin and in which further preferably all test pins of the test device are designed in the same way, namely in the manner of at least one test pin.
  • the measuring device is set up, at least in some cases, to determine the longitudinal positions of the test needles of the individual test pins in a sequence one after the other in the measuring process using a capacitive measurement.
  • x capacitive measurements are then carried out in the measuring process if the test device has x test pins.
  • the longitudinal position of exactly one test needle is determined per measurement.
  • the individual test pins are successively charged using the charge pump for this purpose. After the individual measurement has been carried out, the respective test pin is preferably discharged again and the next test pin is charged and discharged for the next individual measurement, and so on.
  • the measuring device is generally preferably set up in such a way that in the measuring process, during one of the capacitive measurements y for determining the longitudinal position of the test needle of a given test pin y, the aforementioned test voltage is applied to the test needle of the test pin y.
  • the measuring device is then also set up in such a way that during the capacitive measurement y, a reference potential, for example a ground potential, is applied to the test needles of the other test pins of the test device.
  • This reference potential also advantageously corresponds to the reference potential that is preferably applied to the previously described reference electrode during the measuring process.
  • the reference electrode then further preferably serves as a reference electrode for more than one test needle. It serves in particular as a reference electrode for the test needles of all test pins of the test device.
  • test pins are held by a common carrier plate.
  • the test pins are, for example, inserted into the carrier plate.
  • the carrier plate also serves as a stop for the connector to be tested. In this case, the carrier plate is then part of the previously described holder for the connector.
  • the at least one test pin and in particular all test pins are interchangeable and/or the test needle of the at least one test pin and in particular all test needles are interchangeable.
  • test needle and the associated sleeve are preferably designed in such a way that the test needle can be rotated around the longitudinal axis relative to the sleeve for assembly. This creates a type of bayonet lock, for example.
  • the measuring device is set up such that a voltage measurement is carried out on the reference electrode for the capacitive measurement and in particular for each of the capacitive measurements x.
  • the measuring device has more than one reference electrode, for example 10 reference electrodes.
  • the reference electrodes are then usually arranged one behind the other in the longitudinal direction and a distance is typically specified between the reference electrodes.
  • the reference electrodes each have an opening for the at least one test pin, with the openings being positioned in alignment. If several test pins are present, each of the reference electrodes preferably has an opening for each test pin.
  • the measuring device is then preferably also set up in such a way that for the capacitive measurement or each of the capacitive measurements x several voltage measurements are carried out, namely in particular one at each reference electrode.
  • the measuring device then has its own voltage measuring circuit for each reference electrode or it is set up in such a way that each reference electrode can be switched individually. and in particular can be connected to a common voltage measuring circuit.
  • the measuring device is then further preferably set up in such a way that exactly z voltage measurements are carried out for each of the capacitive measurements x.
  • all z voltage measurements of a specific capacitive measurement y from x are then preferably evaluated together by the measuring device and the longitudinal position of the associated test needle y is determined based on all z voltage measurements of a specific capacitive measurement y. Carrying out more than one voltage measurement per capacitive measurement typically enables the longitudinal position of a test needle to be determined with greater accuracy.
  • the z voltage measurements of a capacitive measurement y from x are carried out either simultaneously or one after the other. If the voltage measurements are carried out one after the other, the reference electrodes on which no voltage measurement is currently being carried out are typically switched to a ground potential for the duration of the measurement, in particular to the earth potential, for example by means of a relay or transistor. The measuring device is then set up accordingly for this.
  • a shielding plate is arranged between two reference electrodes that follow one another in the longitudinal direction.
  • Such a shielding plate serves to reduce the mutual influence of the reference electrodes. It is typically made from an electrically conductive material and is expediently switched to a ground potential at least for the duration of a voltage measurement described above. The measuring device is then set up accordingly for this. If there are more than two reference electrodes, a shielding plate is typically arranged between each of the reference electrodes that follow one another in the longitudinal direction. Designs are also advantageous in which, alternatively or additionally, at least one guide plate of the guide aid is arranged between two reference electrodes that follow one another in the longitudinal direction. If there are more than two reference electrodes, then typically at least one guide plate of the guide aid is arranged between each of the reference electrodes that follow one another in the longitudinal direction.
  • each shielding plate described above as well as to each guide plate described above: It expediently has an opening for the at least one test pin, with all openings for the at least one test pin being positioned in alignment. If several test pins are present, each of the plates preferably has an opening for each test pin.
  • Fig. 1 shows a block diagram of a test device with three test pins
  • Fig. 2 shows a simplified sectional view of a part of the test device with a reference electrode in a first embodiment
  • Fig. 3 in a simplified sectional view of one of the test pins
  • Fig. 4 shows an enlarged section of a simplified sectional view of the reference electrode in a second embodiment together with a guide aid and
  • Fig. 5 shows a reference electrode stack in an enlarged section of a simplified sectional view.
  • a test device 2 described below as an example and sketched in a block diagram in Fig. 1, is used to test an electrical plug connector 4 (see Fig. 2) which is designed for use in an on-board power supply system of a motor vehicle.
  • this plug connector 4 is designed to latch three plug contacts 6 and for this purpose has several contact receptacles in which a respective plug contact 6 can be secured. Each plug contact 6 typically has a latching element for this purpose.
  • Outgoing, single-core cables are preferably connected to the plug contacts 6.
  • the test device 2 is now set up to check whether the plug contacts 6 of the plug connector 2 have been correctly installed, in particular to check whether the plug contacts 6 have been correctly rusted into the plug housing 8.
  • Fig. 2 For illustration purposes, different situations are shown in the embodiment of Fig. 2: In the left contact receptacle there is a plug contact 6, which is however not properly rusted to the contact receptacle. In the middle contact receptacle there is a correctly rusted plug contact 6. In the right contact receptacle, however, there is no plug contact 6.
  • the test device 2 has an electromechanical measuring device 10 with a test pin 12 for each plug contact 6 provided or for each contact receptacle of the plug connector 4.
  • a large number of test pins 12 are provided so that the test device can be used for different plug connectors with different numbers of contact receptacles or plug contacts.
  • three test pins 12 are shown, as indicated in Fig. 2.
  • the test pins 12 are designed in the same way.
  • Fig. 3 shows one of these test pins 12 in a simplified representation.
  • the test pin 12 is then elongated in a longitudinal direction 14. It has a sleeve 16 and a test needle 18 held by the sleeve 16.
  • the test needle 18 on the one hand and the sleeve 16 on the other hand are each elongated in the longitudinal direction 14.
  • the test needle 18 also lies in the sleeve 16 and penetrates in the embodiment, the sleeve 16.
  • the test needle 18 is displaceable or held displaceably so that the test needle 18 can be displaced in the longitudinal direction 16 relative to the sleeve, for example by a maximum of 3 mm or for example by a maximum of 5 mm.
  • a longitudinal position of the test needle 18 can then be changed.
  • the test needle 18 has three sections 18a, 18b, 18c when viewed in the longitudinal direction 14, namely an upper section 18a, a middle section 18b and a lower section 18c.
  • the three sections 18a, 18b, 18c are expediently connected to one another mechanically and/or materially.
  • the lower section 18c and the upper section 18a are electrically conductive and in particular made of a metal or a metal alloy, and the middle section 18b is made of an electrical insulating material, for example a plastic.
  • the middle section 18b thus insulates the upper section 18a from the lower section 18c.
  • the sleeve 16 also has three sections 16a, 16b, 16c when viewed in the longitudinal direction 14, namely an upper section 16a, a middle section 16b and a lower section 16c. These three sections 16a, 16b, 16c are also expediently connected to one another mechanically and/or materially.
  • the lower section 16c and the upper section 16a are in turn electrically conductive and in particular made of a metal or a metal alloy, and the middle section 16b is made of an electrical insulating material, for example a plastic.
  • the middle section 16b thus insulates the upper section 16a from the lower section 16c.
  • the lower section 16c of the sleeve 16 in the test device 2 has a lower electrical connection 20, via which an electrical connection is established between the lower section 16c of the sleeve 16 on the one hand and a control and evaluation unit 22 of the electromechanical measuring device 10 on the other hand (see Fig. 1).
  • the lower section 16c of the sleeve 16 is electrically conductively connected to the lower section 18c of the test needle 18 The electrical connection is realized via a sliding contact or touch contact.
  • the upper section 16a of the sleeve 16 in the test device 2 has an upper electrical connection 24, via which an electrical connection is established between the upper section 16a of the sleeve 16 on the one hand and the control and evaluation unit 22 on the other.
  • the upper section 16a of the sleeve 16 is electrically conductively connected to the upper section 18a of the test needle 18. The electrical connection is again realized via a sliding contact or touch contact.
  • the test device 2 also has a reference electrode 26, which is designed in the form of a plate and is made, for example, of copper or brass. It is elongated transversely to the longitudinal direction 14 and serves as a reference electrode 14 for all three test pins 12 and in particular for their test needles 18.
  • the thickness of the reference electrode 14 is approximately 1 mm, depending on the application.
  • the test pins 12 are held by a common carrier plate 28.
  • This carrier plate 28 together with further housing parts 30 of a housing of the test device 2 (not shown in full), forms a receptacle for the connector 2 to be tested.
  • the connector 4 to be tested is positioned in the receptacle and is therefore ready for testing by the test device 2.
  • the connector 4 to be tested shown in Fig. 2, has a correctly rusted connector contact 6 (centre) and an incorrectly rusted connector contact 6 (left). The intended third connector contact 6 (right) is missing.
  • test needles 18 of the test device 2 were moved individually, depending on whether the respective plug contact 6 to be tested was correctly rusted, not correctly rusted or missing. This is at least indicated in Fig. 2.
  • the test needles 18 of the test device 2 are in a manner not shown in detail. spring-mounted in such a way that a spring restoring force acting on the respective test needle 18 is directed in the longitudinal direction 14.
  • each sleeve 16 is coupled to its test needle 18 by a helical spring.
  • the restoring force is also predetermined in such a way that the restoring force is, on the one hand, sufficiently large to displace an incorrectly rusted plug contact 6 (left) relative to the plug housing 8 of the plug connector 4, and, on the other hand, is sufficiently small not to displace a correctly rusted plug contact 6 (central) relative to the plug housing 8 of the plug connector 4.
  • control and evaluation unit 22 of the test device 2 is set up to carry out a sequence of three capacitive measurements, wherein each of the three capacitive measurements for one of the test needles 18 determines the longitudinal position and thus also how the longitudinal position has changed when the connector 6 to be tested is inserted into the receptacle.
  • test needle 18 is connected to a charge pump 32 of the control and evaluation unit 22 via the associated sleeve 16 and the associated lower electrical connection 20.
  • This test needle 18 is then used as a counter electrode for the reference electrode 26 during this capacitive measurement under the control of the control and evaluation unit 22, while a voltage measurement is carried out on the reference electrode 26, namely by means of a measuring circuit 34 of the control and evaluation unit 22.
  • the remaining two test needles 18 are connected to a ground during this capacitive measurement under the control of the control and evaluation unit 22, namely via the associated lower electrical connections 20.
  • the loaded test needle 18 and the reference electrode 26 form electrodes of a capacitor. Based on the measured voltage, the distance of this test needle to the Counter electrode and thus its overall longitudinal position is determined. On the basis of this measurement, a conclusion is then drawn as to whether the plug contact is correctly positioned. Such a measurement is carried out successively for each of the test needles 18.
  • the three capacitive measurements are now used to determine the respective longitudinal positions of the three test needles 18 and thus to determine for each intended plug contact 6 whether it is correctly mounted and, in particular, correctly rusted.
  • the result of the test is then output via an output unit 36 of the control and evaluation unit 22 under the control of the control and evaluation unit 22.
  • the control and evaluation unit 22 typically has a microcontroller 38 for the control tasks.
  • a further test controlled by the control and evaluation unit 22 is preferably carried out parallel to the sequence of capacitive measurements.
  • current line measurements are typically carried out via the upper electrical connections 20, in particular current line measurements across the plug contacts 6 to be tested. In this case, for example, a current strength or an ohmic resistance is determined for each test pin 12.
  • the reference electrode 26 of the test device 2 is designed in the form of a plate in the exemplary embodiment. According to Fig. 2, the reference electrode 26 has a simple cuboid shape. A slightly modified embodiment of the reference electrode 26 is indicated in Fig. 4. This is part of a slightly modified embodiment of the test device 2 and has an opening 40 for each test pin 12.
  • each test needle 18 can be displaced in the longitudinal direction 14 such that in at least one position the lower section 18c of the test needle 18 at least projects into the associated opening 40.
  • the test device 2 is then also designed such that the lower section 18c of the test needle 18 penetrates the associated opening 40 when a correctly rusted plug contact 6 is located in the contact receptacle tested with the corresponding test pin 12.
  • the lower section 18c of the test needle 18 projects a little way into the associated opening 40 when a plug contact 6 is located in the contact receptacle tested with the corresponding test pin 12, but is not properly rusted with the contact receptacle.
  • the lower section 18c of the test needle 18 does not project into the associated opening 40 when there is no plug contact 6 in the contact receptacle tested with the corresponding test pin 12.
  • the test device 2 in the embodiment shown in Fig. 4 has a guide plate 42, which is part of a guide aid 44.
  • This guide plate 42 is arranged on an upper side 46 of the reference electrode 26 and has an opening 48 for each test pin 12, namely as a guide for the associated test needle 18.
  • the edge of the guide plate 42 delimiting the respective opening 48 forms a sliding bearing for the associated test needle 18.
  • Part of the guide aid 44 is also a further guide plate 42, which is arranged on a bottom side 50 opposite the top side 46. This also has an opening 48 for each test pin 12 as a guide for the associated test needle 18. Depending on the application, the edge of the further guide plate 42 delimiting the respective opening 48 in turn forms a sliding bearing for the associated test needle 18.
  • the previously described guide plates 42 are preferably made of an electrically insulating material or material mix and typically each have a thickness of about 1 mm.
  • the reference electrode 26 located between them is typically made of copper or brass and has a thickness of about 1 mm, for example.
  • a further modified embodiment of the test device 2 is indicated in Fig. 5.
  • a reference electrode stack replaces the single reference electrode 26 from Fig. 2 or Fig. 4. In the exemplary embodiment, that reference electrode stack has three reference electrodes 26.
  • four guide plates 42 are part of the reference electrode stack.
  • the guide aid 44 in this embodiment of the test device 2 has four guide plates 42.
  • a guide plate 42 is arranged between each two of the reference electrodes 26 and the reference electrode stack also ends with a guide plate 42 on both the top side and the opposite bottom side.
  • the reference electrodes 26 and the guide plates 42 of the reference electrode stack when considered individually, are identical to the reference electrode 26 and the guide plates 42 of the embodiment according to Fig. 4.
  • the extension of the reference electrode stack in the longitudinal direction 14 is approximately 7 mm.
  • a capacitive measurement is carried out for each test pin, in which the reference electrode 26 is used as a counter electrode and in which a voltage measurement is carried out on the reference electrode 26 by means of the measuring circuit 34 of the control and evaluation unit 22.
  • each of these capacitive measurements comprises a voltage measurement at each reference electrode 26, i.e. a total of three voltage measurements.
  • the three voltage measurements are carried out one after the other, whereby those reference electrodes 26 at which no voltage measurement is being carried out are always switched to a ground potential for the duration of the measurement.
  • the measuring circuit 34 of the control and evaluation unit 22 is then set up accordingly for this.
  • the middle reference electrode 26 from Fig. 5 is replaced by a shielding plate. This differs from the middle reference electrode 26 according to Fig. 5 in its wiring.
  • the shielding plate is wired in such a way that no voltage measurement can be carried out on it. Instead, it is permanently connected to a ground potential connection.
  • two reference electrodes 26 remain and two voltage measurements are made for each of the capacitive measurements. However, these are preferably carried out simultaneously.
  • the measurement concepts described above can be easily transferred to a larger number of reference electrodes 26.
  • the reference electrode stack has more than three reference electrodes 26, for example four, five or more.
  • the test device 2 preferably has a shield 52.
  • a shield 52 is indicated by a dashed frame.
  • the shield 52 is designed in such a way that it encloses a spatial region in which the reference electrode 26 or the reference electrode stack and the lower sections c of the test needles 18 are arranged.

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Geometry (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)

Abstract

L'invention concerne un dispositif de test (2) conçu pour tester une fiche de connexion (4) de système de câblage pour l'assemblage adéquat d'un certain nombre de contacts de fiche (6) de la fiche de connexion (4) et comprenant un dispositif de mesure électromécanique (10) avec au moins une sonde de test (12), ladite au moins une sonde de test (12) comportant un manchon (16) et une aiguille de test (18) maintenue par le manchon (16), l'aiguille de test (18) vue dans le sens longitudinal (14) comportant trois sections (18a, 18b, 18c), à savoir une section supérieure (18a), une section intermédiaire (18b) et une section inférieure (18c), une partie centrale (18b) et une partie inférieure (18c), la partie centrale (18b) de l'aiguille de test (18) isolant électriquement la partie supérieure (18a) de la partie inférieure (18c), l'aiguille de test (18) pouvant être déplacée dans le sens longitudinal (14) afin de modifier la position longitudinale de l'aiguille de test (18), et le dispositif de mesure (10) étant conçu pour déterminer la position longitudinale de l'aiguille de test (18) au cours d'un processus de mesure par le biais d'une mesure capacitive.
PCT/EP2023/078257 2022-10-12 2023-10-11 Dispositif de test et sonde de test pour dispositif de test WO2024079220A1 (fr)

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DE102022210765.9 2022-10-12
DE102022210765.9A DE102022210765A1 (de) 2022-10-12 2022-10-12 Prüfvorrichtung sowie Prüfstift für eine Prüfvorrichtung

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Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102006025850B3 (de) * 2006-06-02 2007-09-20 TSK Prüfsysteme GmbH Prüfstift für eine Prüfvorrichtung zum Prüfen von Stecken und Verfahren zum Prüfen von Steckern
WO2022101288A1 (fr) * 2020-11-13 2022-05-19 Technoprobe S.P.A. Élément de contact amélioré destiné à une tête de sonde permettant de tester des dispositifs électroniques hautes fréquences et tête de sonde associée

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3577208A (en) 1969-07-03 1971-05-04 John T Petrick Electrostatic grounding probe for use in explosive atmospheres
DE102011102791A1 (de) 2011-05-27 2012-11-29 Feinmetall Gmbh Federkontaktstiftanordnung

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102006025850B3 (de) * 2006-06-02 2007-09-20 TSK Prüfsysteme GmbH Prüfstift für eine Prüfvorrichtung zum Prüfen von Stecken und Verfahren zum Prüfen von Steckern
WO2022101288A1 (fr) * 2020-11-13 2022-05-19 Technoprobe S.P.A. Élément de contact amélioré destiné à une tête de sonde permettant de tester des dispositifs électroniques hautes fréquences et tête de sonde associée

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