WO2024000898A1 - 显示面板的对位方法、显示面板的伽马调试方法及装置 - Google Patents

显示面板的对位方法、显示面板的伽马调试方法及装置 Download PDF

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Publication number
WO2024000898A1
WO2024000898A1 PCT/CN2022/122861 CN2022122861W WO2024000898A1 WO 2024000898 A1 WO2024000898 A1 WO 2024000898A1 CN 2022122861 W CN2022122861 W CN 2022122861W WO 2024000898 A1 WO2024000898 A1 WO 2024000898A1
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Prior art keywords
brightness value
probe
value corresponding
display panel
alignment
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PCT/CN2022/122861
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English (en)
French (fr)
Inventor
陈�峰
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昆山国显光电有限公司
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Publication of WO2024000898A1 publication Critical patent/WO2024000898A1/zh

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    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/20—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02—Testing optical properties
    • G01M11/0242—Testing optical properties by measuring geometrical properties or aberrations
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G2320/00—Control of display operating conditions
    • G09G2320/06—Adjustment of display parameters
    • G09G2320/0673—Adjustment of display parameters for control of gamma adjustment, e.g. selecting another gamma curve

Definitions

  • the present application belongs to the field of display technology, and in particular relates to an alignment method for a display panel, a gamma debugging method and device for a display panel.
  • gamma debugging can usually be performed on the secondary screen area and the main screen area respectively.
  • the main factor in whether the results of gamma debugging (especially gamma debugging in the secondary screen area) are accurate is whether the alignment between the probe of the optical measurement equipment and the secondary screen area or main screen area is accurate.
  • Embodiments of the present application provide a display panel alignment method, a display panel gamma debugging method and a device, which can solve the problem of inaccurate alignment between the probe of the optical measurement equipment and the display panel.
  • inventions of the present application provide an alignment method for a display panel.
  • the alignment method for a display panel includes: controlling a predetermined area of the display panel to display an alignment pattern that matches the probe size, and the brightness value of the alignment pattern. is smaller than the brightness value of other areas around the predetermined area; control the probe to move along the first direction from the starting position, and collect multiple first brightness values at different positions on the first movement path along the first direction to obtain the first movement path.
  • the first coordinate corresponding to the smallest first brightness value control the probe to move in the second direction, and collect multiple second brightness values at different positions on the second movement path along the second direction to obtain the smallest value on the second movement path.
  • the second coordinate corresponding to the second brightness value, the second direction intersects the first direction; the alignment position is determined based on the first coordinate and the second coordinate.
  • multiple first brightness values at different positions on the first movement path along the first direction are collected to obtain the first coordinate corresponding to the smallest first brightness value on the first movement path.
  • It may include: determining whether the first brightness value corresponding to the i-th position on the first movement path is greater than the first brightness value corresponding to the i-1th position on the first movement path, and the i-1th position is the i-th position.
  • the previous position of , i is a positive integer; when the first brightness value corresponding to the i-th position is greater than the first brightness value corresponding to the i-1th position, the coordinates of the i-1th position are determined as the first coordinates ; Collect multiple second brightness values at different positions on the second movement path along the second direction, and obtain the second coordinate corresponding to the smallest second brightness value on the second movement path. Specifically, it may include: determining the second brightness value on the second movement path.
  • the j-1th position is the previous position of the j-th position, and j is a positive integer ;
  • the coordinates of the j-1th position are determined as the second coordinates.
  • the center of the probe Since the closer the center of the probe is to the center of the alignment pattern, the larger the overlapping area between the probe and the alignment pattern is, so the brightness value collected by the probe at a position closer to the center of the alignment pattern is smaller. Therefore, when the brightness value of the current position collected by the probe is greater than the brightness value of the previous position, it means that the center of the probe has moved away from the center of the alignment pattern, that is, the previous position of the current position is closest to the center of the alignment pattern ( Such as coinciding with the center of the alignment pattern). In this way, based on the inflection point where the brightness value collected by the probe changes from small to large, the center coordinates of the alignment pattern can be accurately determined.
  • the alignment method of the display panel may further include: the first brightness value corresponding to the i-th position. If it is greater than the first brightness value corresponding to the i-1th position, determine whether the first brightness values corresponding to the i+1th position to the i+nth position on the first movement path are all greater than those on the first movement path.
  • the first brightness value corresponding to the i-th position is greater than the first brightness value corresponding to the i-1th position
  • the first brightness value corresponding to the i+1th position to the i+nth position is Verifying the brightness value can improve the accuracy of the determined first coordinate, thereby improving the accuracy of the final determined center coordinate of the alignment pattern, effectively avoiding misjudgment.
  • embodiments of the present application provide a gamma debugging method for a display panel.
  • the display panel includes a first display area and a second display area.
  • the gamma debugging method for the display panel includes: controlling a probe to move to the first display area. , and perform gamma debugging on the first display area; based on the alignment method of the display panel provided in the first aspect, move the probe to the alignment position, and the alignment pattern is at least partially located in the second display area; for the second display area for gamma debugging.
  • inventions of the present application provide a gamma debugging device for a display panel, which is used to perform the gamma debugging method for a display panel as provided in the second aspect.
  • the gamma debugging device includes: a workbench for carrying a display Panel; a first transfer part located on at least one side of the workbench and extending along the first direction; a second transfer part extending along the second direction and suspended above the workbench, and the second transfer part is connected to the first
  • the transmission part is connected, and the second transmission part can move relative to the first transmission part along the first direction;
  • the clamping part is connected with the second transmission part, and the clamping part can move relative to the second transmission part along the second direction;
  • the probe Fixedly installed on the clamping part; the controller is electrically connected to the first transmission part, the second transmission part and the probe.
  • a first groove and a second groove are provided on the workbench.
  • the first groove is used to place the display panel, and the second groove is located along the first direction of the first groove.
  • the gamma debugging device also includes a light-emitting part, the light-emitting part is located in the second groove, the light-emitting part is strip-shaped and extends along the second direction.
  • the display panel can be positioned to ensure the accuracy of the positioning; by opening the second groove on the side of the first groove close to the second display area, The second groove can provide enough moving space for the movement of the probe, preventing the probe from colliding with the edge of the first groove during alignment; by providing a light-emitting part in the second groove, it can be ensured that even if part of the probe moves to the In the second groove, the brightness value collected by the probe will also change from small to large, ensuring the smooth progress of the alignment.
  • the alignment method of the display panel, the gamma debugging method and the device of the display panel control a predetermined area of the display panel to display an alignment pattern that matches the size of the probe, and the brightness value of the alignment pattern is smaller than that around the predetermined area. Brightness values in other areas; control the probe to move in the first direction from the starting position, and collect multiple first brightness values at different positions on the first movement path along the first direction to obtain the smallest first brightness value on the first movement path.
  • the first coordinate corresponding to the brightness value control the probe to move in the second direction, and collect multiple second brightness values at different positions on the second movement path along the second direction to obtain the smallest second brightness value on the second movement path.
  • Embodiments of the present application can accurately determine the center coordinates of the alignment pattern based on the first coordinate corresponding to the smallest first brightness value on the first movement path and the second coordinate corresponding to the smallest second brightness value on the second movement path. , which can achieve precise alignment of the probe and the alignment pattern, improving the accuracy of alignment.
  • automatic alignment of the probe and alignment pattern can be achieved without human intervention.
  • Figure 1 is a schematic structural diagram of a display panel
  • Figure 2 is a schematic top view of an alignment pattern in the alignment method of a display panel provided by an embodiment of the present application
  • Figure 3 is another schematic top view of the alignment pattern in the alignment method of the display panel provided by the embodiment of the present application.
  • Figure 4 is a schematic flowchart of a display panel alignment method provided by an embodiment of the present application.
  • Figure 5 is an operational schematic diagram of a display panel alignment method provided by an embodiment of the present application.
  • Figure 6 is another operational schematic diagram of the alignment method of the display panel provided by the embodiment of the present application.
  • Figure 7 is another operational schematic diagram of the alignment method of the display panel provided by the embodiment of the present application.
  • Figure 8 is another schematic flowchart of a display panel alignment method provided by an embodiment of the present application.
  • Figure 9 is another schematic flowchart of a display panel alignment method provided by an embodiment of the present application.
  • Figure 10 is another schematic flowchart of a display panel alignment method provided by an embodiment of the present application.
  • Figure 11 is another schematic flowchart of a display panel alignment method provided by an embodiment of the present application.
  • Figure 12 is another schematic flowchart of a display panel alignment method provided by an embodiment of the present application.
  • Figure 13 is another schematic flowchart of a display panel alignment method provided by an embodiment of the present application.
  • Figure 14 is another operational schematic diagram of the alignment method of the display panel provided by the embodiment of the present application.
  • Figure 15 is another schematic flowchart of a display panel alignment method provided by an embodiment of the present application.
  • Figure 16 is another operational schematic diagram of the alignment method of the display panel provided by the embodiment of the present application.
  • Figure 17 is another schematic flowchart of a display panel alignment method provided by an embodiment of the present application.
  • Figure 18 is another operational schematic diagram of the alignment method of the display panel provided by the embodiment of the present application.
  • Figure 19 is another schematic flowchart of a display panel alignment method provided by an embodiment of the present application.
  • Figure 20 is a schematic top view of a display panel provided by an embodiment of the present application.
  • Figure 21 is another schematic top view of a display panel provided by an embodiment of the present application.
  • Figure 22 is an operational schematic diagram of a gamma debugging method for a display panel provided by an embodiment of the present application
  • Figure 23 is a schematic flow chart of a gamma debugging method for a display panel provided by an embodiment of the present application.
  • Figure 24 is another schematic diagram of the operation of the gamma debugging method of the display panel provided by the embodiment of the present application.
  • Figure 25 is a schematic structural diagram of a gamma debugging device for a display panel provided by an embodiment of the present application.
  • Figure 26 is another structural schematic diagram of a gamma debugging device for a display panel provided by an embodiment of the present application.
  • Figure 27 shows a schematic diagram of the hardware structure of an electronic device provided by an embodiment of the present application.
  • the display panel includes a main screen area 01' and a secondary screen area 02'.
  • the secondary screen area 02' can be equipped with photosensitive elements such as under-screen cameras.
  • the pixel area and/or pixel density of the secondary screen area 02' can be smaller than the pixel area and/or pixel density of the main screen area 01'. Therefore, since the pixel areas and/or pixel densities of the main screen area 01' and the secondary screen area 02' are different, the gamma debugging results of the main screen area 01' are not suitable for the secondary screen area 02'.
  • gamma debugging can usually be performed on the secondary screen area and the main screen area respectively.
  • the main factor in whether the results of gamma debugging (especially gamma debugging for the secondary screen area) are accurate is whether the alignment between the probe of the optical measurement equipment and the secondary screen area or the main screen area is accurate.
  • the secondary screen area includes a plurality of sub-pixels, and a driver chip (driver IC) provides drive signals to sub-pixels at different positions in the secondary screen area through signal lines to drive the sub-pixels in the secondary screen area to emit light. Since the sub-pixels at different positions in the secondary screen area are at different distances from the driver chip, the brightness at different locations in the secondary screen area is different due to the voltage drop (IR-drop) on the signal line, such as the near IC end and the far end. One of the IC terminals is brighter and the other is darker.
  • IR-drop voltage drop
  • the brightness in the center of the secondary screen area can be regarded as the average of the brightness of the near IC end in the secondary screen area and the brightness of the far IC end in the secondary screen area. Therefore, the brightness in the center of the secondary screen area can best objectively reflect the average of the secondary screen area. brightness. Therefore, when performing gamma debugging on the sub-screen area, it is best to align the center of the probe with the center of the sub-screen area. In this way, the collected brightness value can best objectively reflect the average brightness of the sub-screen area, which is conducive to improving gamma debugging. accuracy.
  • the inventor of the present application discovered that there is currently a problem of inaccurate alignment between the probe and the display panel of the optical measurement equipment. For example, when performing gamma debugging on the sub-screen area, the center of the probe cannot be accurately aligned with the center of the sub-screen area, resulting in poor accuracy in the final gamma debugging. For example, in some related technologies, debugging personnel are required to manually adjust the position of the probe and perform manual alignment, which results in poor alignment accuracy between the probe and the display panel and takes a long time for alignment.
  • the embodiments of the present application provide a display panel alignment method, a display panel gamma debugging method and a device, which can solve the problem of the alignment of the probe and the display panel of the optical measurement equipment existing in the related art. Imprecise technical issues.
  • the technical concept of the embodiment of the present application is to: control a predetermined area of the display panel to display an alignment pattern that matches the size of the probe, and the brightness value of the alignment pattern is smaller than the brightness value of other areas around the predetermined area; control the probe to move from the starting position along the Move in the first direction and collect multiple first brightness values at different positions along the first movement path in the first direction to obtain the first coordinate corresponding to the smallest first brightness value on the first movement path; control the probe to move along the second direction, and collect multiple second brightness values at different positions on the second movement path along the second direction to obtain the second coordinate corresponding to the smallest second brightness value on the second movement path.
  • the second direction and the first direction Cross determine the alignment position based on the first coordinate and the second coordinate.
  • the center coordinates of the alignment pattern can be accurately determined, and then It can achieve precise alignment between the center of the probe and the center of the alignment pattern, improving the accuracy of alignment.
  • FIG. 2 is a schematic top view of an alignment pattern in the alignment method of a display panel provided by an embodiment of the present application.
  • FIG. 3 is another schematic top view of an alignment pattern in the alignment method of a display panel provided by an embodiment of the present application.
  • FIG. 4 is a schematic flowchart of a display panel alignment method provided by an embodiment of the present application.
  • the alignment method of the display panel may include the following steps S101 to S104.
  • a predetermined area of the display panel 10 can be controlled to display an alignment pattern 100 that is adapted to the size of the probe.
  • the probe size can be understood as the lens (cross-section or lighting surface) size of the probe, and the probe is the probe of an optical measurement device (such as a color analyzer).
  • the adaptation of the alignment pattern 100 to the size of the probe can be understood as: the size of the alignment pattern 100 displayed in a predetermined area of the display panel 10 is exactly the same as the size of the probe, or the size of the alignment pattern 100 displayed in a predetermined area of the display panel 10 Can be exactly the same size as part of the probe's lens.
  • the size of the alignment pattern 100 displayed in a predetermined area of the display panel 10 is exactly the same as the size of the probe, that is, the alignment pattern 100 can be equal to Probes are round in shape with the same dimensions.
  • the size of the alignment pattern 100 displayed in a predetermined area of the display panel 10 can be exactly the same as a part of the lens of the probe, that is, the alignment pattern 100 can be a circle with the same size as the probe. a part of.
  • the predetermined area may be a preset partial area of the display panel 10 , such as a secondary screen of the display panel 10 , or a partial area of the secondary screen and the main screen of the display panel 10 , which is not limited in the embodiments of the present application.
  • the size of the alignment pattern 100 is the same as the size of the probe, which can be understood to mean that the size of the alignment pattern 100 is the same as the size of the probe within an allowable error. That is, the difference between the size of the alignment pattern 100 and the size of the probe can be within the allowable error, and the size of the error can be flexibly adjusted according to the actual situation, which is not limited in the embodiments of the present application.
  • the brightness value of the alignment pattern 100 is smaller than the brightness value of other areas around the predetermined area, that is, the brightness value of the alignment pattern 100 is smaller than the brightness value of other areas around the alignment pattern 100 on the display panel 10 , so that Subsequently, the center coordinates of the alignment pattern 100 are determined based on the changes in light and dark.
  • the alignment pattern 100 can be displayed in a predetermined area of the display panel 10
  • the background image 200 can be displayed in other areas on the display panel 10 except for the predetermined area
  • the brightness value of the alignment pattern 100 is smaller than the background image 200 brightness value.
  • the background picture 200 is a white picture or other light-color picture
  • the alignment pattern 100 is a black pattern, a gray pattern, or other dark-color pattern.
  • FIG. 5 is an operational schematic diagram of a display panel alignment method provided by an embodiment of the present application.
  • the first direction may be the column direction Y of the display panel 10 , or the first direction may be the row direction X of the display panel 10 , which is not limited in the embodiments of the present application.
  • the probe 500 can be controlled to move from the starting position P along the first direction (such as the column direction Y), that is, along the first movement shown in FIG. 5 Path s1 moves.
  • the probe 500 can collect the brightness value of the alignment pattern 100 when moving along the first movement path s1.
  • the minimum distance L between the starting position P and the center O of the alignment pattern 100 in the second direction (such as the row direction).
  • the alignment pattern 100 can be located on the first movement path s1.
  • the first distance threshold can be flexibly set according to actual conditions.
  • the first distance threshold can be smaller than the radius of the alignment pattern 100 .
  • the starting position can be simply determined by human eyes.
  • the probe 500 can collect multiple brightness values at different positions along the first movement path s1 in the first direction. To facilitate differentiation, here the probe 500 collects along the first movement path s1 The obtained brightness value is called the first brightness value. For example, every time the probe 500 moves a certain distance on the first movement path s1, the brightness value and the coordinate value of the center of the probe 500 are collected, thereby obtaining multiple first brightness values at different positions on the first movement path s1.
  • FIG. 6 is another operational schematic diagram of the alignment method of the display panel provided by the embodiment of the present application.
  • the first direction may be the column direction Y of the display panel 10 .
  • the first coordinate (that is, the coordinate of the center O' of the probe 500) is (x2, y1). That is to say, after obtaining the first coordinate corresponding to the smallest first brightness value on the first movement path s1, at least one coordinate (such as the ordinate y1) of the center O of the alignment pattern 100 can be determined.
  • the second direction may be the row direction X of the display panel 10
  • the first direction may be the column direction Y of the display panel 10 , which is not limited in the embodiments of the present application.
  • ⁇ y can be flexibly adjusted according to the actual situation, and ⁇ y can be smaller than the radius of the alignment pattern 100 .
  • the probe 500 can collect multiple brightness values at different positions along the second movement path s2 in the second direction. To facilitate differentiation, here the probe 500 collects along the second movement path s2 The obtained brightness value is called the second brightness value. For example, every time the probe 500 moves a certain distance on the second movement path s2, the brightness value and the coordinate value of the center of the probe 500 are collected, thereby obtaining multiple second brightness values at different positions on the second movement path s2.
  • FIG. 7 is another operational schematic diagram of the alignment method of the display panel provided by the embodiment of the present application.
  • the first direction may be the column direction Y of the display panel 10
  • the second direction may be the row direction X of the display panel 10 .
  • the second coordinate (that is, the coordinate of the center O' of the probe 500) is (x1, y1) or (x1, y1 ⁇ y). That is to say, after obtaining the second coordinate corresponding to the smallest second brightness value on the second movement path s2, at least another coordinate (such as the abscissa x1) of the center O of the alignment pattern 100 can be determined.
  • the abscissa x1 is used to obtain the alignment position (x1, y1).
  • the alignment position is the center O of the alignment pattern 100 .
  • Embodiments of the present application can accurately determine the center coordinates of the alignment pattern based on the first coordinate corresponding to the smallest first brightness value on the first movement path and the second coordinate corresponding to the smallest second brightness value on the second movement path. , which can achieve precise alignment of the probe and the alignment pattern, improving the accuracy of alignment.
  • FIG. 8 is another schematic flowchart of a display panel alignment method provided by an embodiment of the present application.
  • S102 collect multiple first brightness values at different positions on the first movement path along the first direction to obtain the minimum value on the first movement path.
  • the first coordinate corresponding to the first brightness value may specifically include the following steps S801 and S802.
  • the i-th position is any position on the first movement path. That is, every time the center of the probe moves to a position, the position can be regarded as the above-mentioned i-th position, and the above-mentioned steps S801 and S802 are executed.
  • the center O′ of the probe 500 is closer to the center O of the alignment pattern 100 , the overlapping area between the probe 500 and the alignment pattern 100 is larger. Therefore, the probe 500 is closer to the center O of the alignment pattern 100 .
  • the first coordinate corresponding to the smallest first brightness value on the first movement path can be accurately determined, and then the center coordinate of the alignment pattern can be accurately determined.
  • the second coordinate corresponding to the smallest second brightness value on the path may specifically include the following steps S901 and S902.
  • the j-th position is any position on the second movement path. That is, every time the center of the probe moves to a position, the position can be regarded as the above-mentioned j-th position, and the above-mentioned steps S901 and S902 are executed.
  • the center O′ of the probe 500 is closer to the center O of the alignment pattern 100 , the overlap area between the probe 500 and the alignment pattern 100 is larger. Therefore, the probe 500 is closer to the center O of the alignment pattern 100 .
  • the second coordinate corresponding to the smallest first brightness value on the second movement path can be accurately determined, and then combined with the first coordinate, the pair of coordinates can be accurately determined.
  • the center coordinate of the bit pattern based on the inflection point where the brightness value collected by the probe changes from small to large.
  • FIG. 10 is another schematic flowchart of a display panel alignment method provided by an embodiment of the present application.
  • the alignment method of the display panel may also include the following steps:
  • the i+1-th position is the position after the i-th position
  • the i+n-th position is the n positions after the i-th position
  • n is a positive integer.
  • n may be equal to 1 or greater than 1.
  • S802 may specifically include the following steps: when the first brightness values corresponding to the i+1th position to the i+nth position are all greater than the first brightness value corresponding to the i-1th position, convert the i-th The coordinates of 1 position are determined as the first coordinates.
  • the first brightness value corresponding to the i-th position is greater than the first brightness value corresponding to the i-1th position
  • the first brightness value corresponding to the i+1th position to the i+nth position is The brightness value is verified, that is, the first brightness value corresponding to the i-1th position is verified through the first brightness value of at least two consecutive positions, which can improve the accuracy of the determined first coordinate, thereby improving the final determined coordinate.
  • the accuracy of the center coordinates of the bit pattern effectively avoids misjudgments.
  • the alignment method of the display panel may also include the following steps:
  • the second brightness value corresponding to the j-th position is greater than the second brightness value corresponding to the j-1th position, determine the second brightness value corresponding to the j+1th position to the j+nth position on the second movement path. Whether the two brightness values are both greater than the second brightness value corresponding to the j-1th position on the second movement path.
  • the j+1th position is the position after the jth position
  • the j+nth position is the n positions after the jth position
  • n is a positive integer.
  • n may be equal to 1, or may be equal to 1.
  • S902 may specifically include the following steps: when the second brightness values corresponding to the j+1th position to the j+nth position are all greater than the second brightness value corresponding to the j-1th position, convert the j-th The coordinates of 1 position are determined as the second coordinates.
  • the second brightness value corresponding to the j-th position is greater than the second brightness value corresponding to the j-1th position
  • the second brightness value corresponding to the j+1th position to the j+nth position is The brightness value is verified, that is, the second brightness value corresponding to the j-1th position is verified through the second brightness value of at least two consecutive positions, which can improve the accuracy of the determined second coordinate, thereby improving the final determined coordinate.
  • the accuracy of the center coordinates of the bit pattern effectively avoids misjudgments.
  • FIG. 11 is another schematic flowchart of a display panel alignment method provided by an embodiment of the present application.
  • the alignment method of the display panel may also include the following steps: S105. Control the probe to move to the alignment position. For example, control the center of the probe to move to the center of the alignment pattern to achieve alignment.
  • FIG. 12 is another schematic flowchart of a display panel alignment method provided by an embodiment of the present application. As shown in Figure 12, what is different from the embodiment shown in Figure 11 is that according to other embodiments of the present application, optionally, the probe can perform step-by-step alignment while determining the first coordinate and the second coordinate.
  • the alignment method of the display panel may also include the following steps:
  • the position corresponding to the smallest first brightness value on the first movement path is the i-1th position, and the coordinates of the i-1th position are the first coordinates.
  • the alignment method of the display panel may further include the following steps:
  • the position corresponding to the smallest second brightness value on the second movement path is the j-1th position, and the coordinates of the j-1th position are the second coordinates.
  • the probe has moved to the j-th position, so the probe can be controlled to return to the j-1 position again.
  • the coordinates of the j-1th position are the coordinates (x1, y1) of the center O of the alignment pattern 100. Then, moving the center of the probe to the j-1th position realizes the alignment between the center O’ of the probe and the center O of the alignment pattern 100.
  • the alignment time of the probe can be shortened and the speed of the alignment process can be increased.
  • FIG. 13 is another schematic flowchart of a display panel alignment method provided by an embodiment of the present application. As shown in Figure 13, according to some embodiments of the present application, optionally, the alignment method of the display panel provided by the embodiment of the present application may also include the following steps S131 to S133.
  • the first reverse movement path is a path of reverse movement in the first direction.
  • the probe 500 can collect multiple brightness values at different positions on the first reverse movement path s1'. To facilitate the distinction, here the probe 500 moves along the first reverse movement path s1'.
  • the collected brightness value is called the third brightness value. For example, every time the probe 500 moves a certain distance on the first reverse movement path s1', the brightness value and the coordinate value of the center of the probe 500 are collected, thereby obtaining multiple data at different positions on the first reverse movement path s1'. a third brightness value.
  • S132 Determine whether the third brightness value corresponding to the p-th position on the first reverse movement path is greater than the third brightness value corresponding to the p-1th position on the first reverse movement path.
  • the p-1th position is the previous position of the p-th position
  • p is a positive integer greater than 1.
  • the accuracy of the determined first coordinate can be improved. accuracy, thus improving the accuracy of the final center coordinates of the alignment pattern and effectively avoiding misjudgments.
  • FIG. 14 is another operational schematic diagram of the alignment method of the display panel provided by the embodiment of the present application.
  • taking the first direction as the column direction Y of the display panel 10 as an example for example, when the first brightness value corresponding to the i-th position is greater than the first brightness value corresponding to the i-1th position, it can be controlled
  • the probe 500 moves in the first direction in the opposite direction (that is, the i-th position points to the direction of the i-1-th position, the dotted arrow indicates the direction). That is, when the inflection point of the brightness increase is found, it moves in the reverse direction in the first direction.
  • the probe may move reversely in the first direction when it reaches the preset end point.
  • the coordinates of the end point can be preset as (xm, ym).
  • the probe is controlled to move in the reverse direction in the first direction.
  • the first distance between the starting position and the end point can be preset.
  • the probe moves the first distance from the starting position in the first direction, the probe is considered to have reached the preset end point, and the probe is then controlled to move along the first direction.
  • the first direction moves in the opposite direction. In this way, the brightness values between multiple adjacent positions between the starting position and the end point can be compared to ensure the accuracy of the determined center of the alignment pattern, thereby ensuring the accuracy of alignment.
  • FIG. 15 is another schematic flowchart of a display panel alignment method provided by an embodiment of the present application. As shown in FIG. 15 , according to some embodiments of the present application, optionally, the alignment method of the display panel provided by the embodiment of the present application may further include the following steps S151 to S153.
  • the second reverse movement path is a path of reverse movement in the second direction.
  • FIG. 16 is another operational schematic diagram of the alignment method of the display panel provided by the embodiment of the present application.
  • the probe can be controlled 500 moves in the second direction in the opposite direction (that is, the j-th position points to the direction of the j-1-th position, the dotted arrow marks the direction).
  • the probe 500 can collect multiple brightness values at different positions on the second reverse movement path s2'.
  • the probe 500 is moved along the second reverse movement path s2'.
  • the collected brightness value is called the fourth brightness value.
  • the fourth brightness value For example, every time the probe 500 moves a certain distance on the second reverse movement path s2', the brightness value and the coordinate value of the center of the probe 500 are collected, thereby obtaining multiple data at different positions on the second reverse movement path s2'. a fourth brightness value.
  • the q-1th position is obtained by controlling the probe to move reversely in the second direction, And using the q-1th position to perform calibration verification on the j-1th position can improve the accuracy of the determined second coordinates, thereby improving the accuracy of the final determined center coordinates of the alignment pattern, effectively avoiding misjudgments.
  • FIG. 17 is another schematic flowchart of a display panel alignment method provided by an embodiment of the present application.
  • S101 control the probe to move in the first direction from the starting position, which may specifically include the following steps:
  • the brightness values collected by the probe 500 at different positions are almost unchanged. That is, when the first brightness value corresponding to the x-th position is equal to the first brightness value corresponding to the x-1th position, it means that the probe has not overlapped with the alignment pattern, that is, the center distance between the probe 500 and the alignment pattern 100 Still far away.
  • the brightness value collected by the probe 500 will decrease. That is, when the first brightness value corresponding to the x-th position is less than the first brightness value corresponding to the x-1th position, it means that the probe 500 begins to overlap with the alignment pattern 100, that is, the probe has approached the center of the alignment pattern.
  • the first step value is greater than the second step value
  • the first moving speed is greater than the second moving speed
  • controlling the movement of the probe with a larger first step value and/or first movement speed can increase the alignment speed and shorten the alignment time;
  • controlling the movement of the probe with a smaller second step value and/or a second moving speed can improve the alignment accuracy and accurately find the center of the alignment pattern. center.
  • the second step value may decrease as time increases, and/or the second moving speed may decrease as time increases. That is, the closer the center of the probe is to the center of the alignment pattern, the smaller the step value for controlling the movement of the probe and/or the slower the movement speed of the probe.
  • the step value for controlling the movement of the probe is smaller and/or the movement speed of the probe is slower, thus the accuracy of finding the center of the alignment pattern can be further improved. This effectively prevents the center of the probe from skipping/crossing the center of the alignment pattern due to a large step value or too fast movement speed.
  • the second step value may also remain unchanged as time increases, and/or the second moving speed may also remain unchanged as time increases.
  • FIG. 19 is another schematic flowchart of a display panel alignment method provided by an embodiment of the present application. As shown in Figure 19, similar to the embodiment shown in Figure 17, according to some embodiments of the present application, optionally, S102, control the probe to move in the second direction according to the first coordinates, which may specifically include the following steps S191 to S193.
  • the third step value is greater than the fourth step value, and the third moving speed is greater than the fourth moving speed.
  • controlling the movement of the probe with a larger third step value and/or a third moving speed can increase the alignment speed and shorten the alignment time;
  • controlling the movement of the probe with a smaller fourth step value and/or a fourth moving speed can improve the alignment accuracy and accurately find the center of the alignment pattern. center.
  • the fourth step value may decrease as time increases, and/or the fourth moving speed may decrease as time increases. That is, the closer the center of the probe is to the center of the alignment pattern, the smaller the step value for controlling the movement of the probe and/or the slower the movement speed of the probe.
  • the step value for controlling the movement of the probe is smaller and/or the movement speed of the probe is slower, thus the accuracy of finding the center of the alignment pattern can be further improved. This effectively prevents the center of the probe from skipping/crossing the center of the alignment pattern due to a large step value or too fast movement speed.
  • the fourth step value may also remain unchanged as time increases, and/or the fourth moving speed may also remain unchanged as time increases.
  • FIG. 20 is a schematic top view of a display panel provided by an embodiment of the present application.
  • the display panel 10 may include a first display area A1 and a second display area A2.
  • the light transmittance of the second display area A2 is greater than that of the first display area A1. of light transmittance. That is, the first display area A1 is the main screen area mentioned above, and the second display area A2 is the secondary screen area mentioned above.
  • the center o of the second display area A2 can be used as the center O of the alignment pattern 100, based on the second display area A2 and the area close to the second display area A2.
  • Part of the first display area A1 of the display area A2 displays the alignment pattern 100 .
  • the alignment pattern 100 may be a circle with the same size as the probe, or may be a part of a circle with the same size as the probe (such as a semicircle, a three-quarter circle).
  • FIG. 21 is another schematic top view of a display panel provided by an embodiment of the present application.
  • the center of the second display area A2 can be o is the center O of the alignment pattern 100, and the alignment pattern 100 is displayed based on the second display area A2.
  • the alignment pattern 100 may be a circle with the same size as the probe, or may be a part of a circle with the same size as the probe (such as a semicircle, a three-quarter circle).
  • embodiments of the present application can be adapted to probes of different sizes and to second display areas of different shapes/different sizes, that is, to adapt to a variety of application scenarios.
  • the second display area A2 may include a light-transmitting area 210
  • the first display area A1 may include a transition area 220 surrounding the light-transmitting area 210 .
  • the light-transmitting area 210 Both the transition area 220 and the transition area 220 can be provided with sub-pixels.
  • the transition region 220 is provided with driving devices (such as transistors), and the light-transmitting region 210 is provided with no driving devices.
  • the center of the light-transmitting area 210 may coincide with the center of the second display area A2, and the transition area 220 may be arranged around the light-transmitting area 210.
  • the center of the light-transmitting area 210 may be o is the center O of the alignment pattern 100 , and the alignment pattern 100 is displayed based on the light-transmitting area 210 .
  • the center of the probe is aligned with the center of the light-transmitting area, and the brightness values collected by the probe are all the brightness values of the light-transmitting area, that is, the accuracy of the brightness values collected by the probe is improved, which is conducive to improving the subsequent second The accuracy of the gamma debugging results of the display area.
  • the shape of the light-transmitting area 210 may be a rectangle, and the shape of the second display area A2 may also be a rectangle.
  • the shape of the light-transmitting area 210 may be circular, and the shape of the second display area A2 may also be circular.
  • the shapes of the light-transmitting area 210 and the second display area A2 can also be other shapes, which are not limited in the embodiments of the present application.
  • the embodiment of the present application also provides a gamma debugging method of the display panel.
  • FIG. 22 is an operational schematic diagram of a gamma debugging method for a display panel provided by an embodiment of the present application.
  • FIG. 23 is a schematic flowchart of a gamma debugging method for a display panel provided by an embodiment of the present application.
  • the display panel 10 includes a first display area A1 and a second display area A2.
  • the light transmittance of the second display area A2 may be greater than the light transmittance of the first display area A1. That is, the first display area A1 is the main screen area mentioned above, and the second display area A2 is the secondary screen area mentioned above.
  • the gamma debugging method of a display panel may include the following steps S221 to S223.
  • the first display area A1 can display a target grayscale image.
  • the target gray level can be any preset gray level.
  • the probe can be controlled to move to the first display area A1 to collect the actual brightness value of the first display area A1. Then, according to the comparison result between the actual brightness value of the first display area A1 and the target brightness value corresponding to the target gray scale, the data voltage value corresponding to the red sub-pixel, the data voltage value corresponding to the green sub-pixel and the corresponding data voltage value of the first display area A1 are adjusted. At least one of the data voltage values corresponding to the blue sub-pixel is used until the difference between the actual brightness value of the first display area A1 and the target brightness value corresponding to the target grayscale is less than the preset first error threshold.
  • the data voltage value corresponding to the red sub-pixel, the data voltage value corresponding to the green sub-pixel, and the data voltage value corresponding to the blue sub-pixel in the adjusted first display area A1 are obtained, thereby completing the gamma of the first display area A1 debug.
  • the first display area A1 when debugging the gamma of the first display area A1, after completing the gamma debugging of one gray scale, the first display area A1 can switch to display another gray scale picture, and repeat the above process, thereby completing Another grayscale gamma debugging.
  • multiple gray levels can be selected as binding points.
  • the corresponding red sub-pixels in the first display area A1 corresponding to other gray levels can be obtained based on the linear interpolation algorithm.
  • the data voltage value, the data voltage value corresponding to the green sub-pixel and the data voltage value corresponding to the blue sub-pixel can be obtained based on the linear interpolation algorithm.
  • the center o of the second display area A2 can be the center O of the alignment pattern 100, based on the second display area A2 and the area close to the second display area Part of the first display area A1 of A2 displays the alignment pattern 100 .
  • the center O of the second display area A2 can be the center O of the alignment pattern 100 , and the alignment pattern is displayed based on the second display area A2 100.
  • the alignment position is the center O of the alignment pattern 100, which is located in the second display area A2.
  • the center of the probe can be moved to the center O of the alignment pattern 100 to complete the alignment.
  • the second display area A2 is controlled to display the target grayscale picture, and the part close to the second display area A2 displays the first Area A1 is written in black. For example, a portion of the first display area A1 close to the second display area A2 still displays the alignment pattern 100 .
  • the probe can effectively prevent the probe from collecting the brightness value of the first display area A1, improve the accuracy of the collected brightness value of the second display area A2, and thereby ensure the accuracy of the gamma debugging result.
  • the second display area A2 can be controlled to display the target grayscale picture, and the part of the first display area A1 close to the second display area A2 does not need to be written in black. .
  • the actual brightness value of the first display area A2 can be collected. Then, according to the comparison result between the actual brightness value of the second display area A2 and the target brightness value corresponding to the target gray scale, the data voltage value corresponding to the red sub-pixel, the data voltage value corresponding to the green sub-pixel and the corresponding data voltage value in the second display area A2 are adjusted. At least one of the data voltage values corresponding to the blue sub-pixel is used until the difference between the actual brightness value of the second display area A2 and the target brightness value corresponding to the target grayscale is less than the preset first error threshold.
  • the data voltage value corresponding to the red sub-pixel, the data voltage value corresponding to the green sub-pixel and the data voltage value corresponding to the blue sub-pixel in the adjusted second display area A2 are obtained, thereby completing the gamma of the second display area A2 debug.
  • the second display area A2 when debugging the gamma of the second display area A2, after completing the gamma debugging of one gray scale, the second display area A2 can switch to display another gray scale picture, and repeat the above process, thereby completing Another grayscale gamma debugging.
  • multiple gray levels can be selected as binding points.
  • the corresponding red sub-pixels in the second display area A2 corresponding to other gray levels can be obtained based on the linear interpolation algorithm.
  • the data voltage value, the data voltage value corresponding to the green sub-pixel and the data voltage value corresponding to the blue sub-pixel can be obtained based on the linear interpolation algorithm.
  • the display panel displays the alignment pattern with the center of the second display area as the center of the alignment pattern, and the first coordinate corresponding to the smallest first brightness value on the first movement path
  • the second coordinate corresponding to the smallest second brightness value on the second movement path can accurately determine the center coordinate of the alignment pattern, achieve precise alignment of the probe and the second display area, and improve the alignment between the probe and the second display area. bit accuracy, thereby improving the accuracy of gamma debugging in the second display area.
  • automatic alignment of the probe and alignment pattern can be achieved without human intervention.
  • the embodiment of the present application also provides a specific implementation of the gamma debugging device of the display panel.
  • FIG. 25 is a schematic structural diagram of a gamma debugging device for a display panel provided by an embodiment of the present application.
  • the gamma debugging device for a display panel provided by the embodiment of the present application can be used to perform the gamma debugging method of the display panel provided by the above embodiment.
  • the gamma debugging device 2500 for a display panel provided by the embodiment of the present application may include a workbench 251, a first transmission part 252, a second transmission part 253, a clamping part 254, and a controller (not shown in the figure). out) and probe 500.
  • the workbench 251 is used to carry the display panel 10 .
  • the first conveying part 252 is located on at least one side of the workbench 251 and extends along the first direction (such as the column direction Y).
  • the first conveying part 252 is located on two opposite sides of the workbench 251 along the second direction (eg, row direction X).
  • the second conveying part 253 extends along the second direction and is suspended above the workbench 251.
  • the second conveying part 253 is connected with the first conveying part 252.
  • the second conveying part 253 can move relative to the first conveying part 252 along the first direction, such as When the first conveying part 252 is working, it drives the second conveying part 253 to move in the first direction, that is, to move up and down as shown in FIG. 25 .
  • the clamping part 254 is connected to the second transmission part 253, and the clamping part 254 can move in the second direction relative to the second transmission part 253. For example, when the second transmission part 253 is working, the clamping part 254 is driven to move in the second direction, as shown in FIG. Move left and right as shown in 25.
  • the probe 500 is fixedly installed on the clamping part 254 , that is, the clamping part 254 clamps the probe 500 .
  • the controller is electrically connected to the first transmission part 252, the second transmission part 253 and the probe.
  • the probe 500 can be placed in the clamping portion 254 at an angle perpendicular to the plane of the display panel, and the clamping portion 254 can clamp the probe 500 .
  • the controller can control the first transmission part 252 and the second transmission part 253 so that the clamping part 254 and the probe 500 can move up, down, left and right.
  • the probe 500 can be controlled to collect the brightness values of different positions of the display panel 10 and collect the coordinate values of the probe 500.
  • the alignment of the display panel is completed.
  • the gamma debugging method of the display panel is completed through the gamma debugging method of the display panel provided in the above embodiment.
  • the display panel displays the alignment pattern with the center of the second display area as the center of the alignment pattern, and the first coordinate corresponding to the smallest first brightness value on the first movement path
  • the second coordinate corresponding to the smallest second brightness value on the second movement path can accurately determine the center coordinate of the alignment pattern, achieve accurate alignment of the probe and the second display area, and improve the alignment of the probe and the second display area.
  • the accuracy of the gamma debugging in the second display area is improved.
  • automatic alignment of the probe center and alignment pattern can be achieved without human intervention.
  • FIG. 26 is another schematic structural diagram of a gamma debugging device for a display panel provided by an embodiment of the present application.
  • a first groove 261 and a second groove 262 are provided on the workbench 251.
  • the first groove 261 is used to place the display panel 10
  • the second groove 262 is located on one side of the first groove 261 along the first direction.
  • the gamma debugging device 2500 of the display panel provided by the embodiment of the present application may also include a light-emitting part 263 located in the second groove 262.
  • the light-emitting part 263 is in a strip shape and extends along the second direction.
  • the light emitting part 263 includes but is not limited to a lamp, such as an LED lamp.
  • Step 1 Control the probe to move to the first display area, and perform gamma debugging on the first display area.
  • Step 2 The display panel displays the alignment pattern with the center of the second display area as the center of the alignment pattern.
  • Step 3 The light-emitting part emits light, and controls the probe to move in the first direction from the starting position, and collects multiple first brightness values at different positions on the first movement path along the first direction to obtain the smallest value on the first movement path.
  • Step 4 Control the probe to move in the second direction, and collect multiple second brightness values at different positions on the second movement path along the second direction, and obtain the second coordinate corresponding to the smallest second brightness value on the second movement path. .
  • Step 5 Control the probe to move to the alignment position determined based on the first coordinate and the second coordinate, the light-emitting part is turned off, the second display area displays the target grayscale image, and gamma debugging is performed on the second display area.
  • Step 6 After completing the gamma debugging of the second display area, control the probe to return to the starting position.
  • the display panel can be positioned to ensure the accuracy of the positioning; by opening the second groove on the side of the first groove close to the second display area, The second groove can provide enough moving space for the movement of the probe, preventing the probe from colliding with the edge of the first groove during alignment; by providing a light-emitting part in the second groove, it can be ensured that even if part of the probe moves to the In the second groove, the brightness value collected by the probe will also change from small to large, ensuring the smooth progress of the alignment.
  • the first groove 261 and the second groove 262 are connected.
  • the first groove and the second groove can be integrally formed through the same process, which is beneficial to simplifying the production process and reducing the production cost of the gamma debugging device of the display panel.
  • the workbench 251 may also be provided with opposite third grooves 264 and fourth grooves 265 .
  • the third groove 264 and the fourth groove 265 can facilitate the debugging personnel to place the display panel 10 in the first groove 261 or facilitate the debugging personnel to remove the display panel 10 from the first groove 261 .
  • the first transmission part 252 includes but is not limited to a combination of a motor (such as a stepper motor) and a transmission mechanism, or a combination of a guide rail and a movable component (such as a trolley).
  • the second transmission part 253 includes, but is not limited to, a combination of a motor (such as a stepper motor) and a transmission mechanism, or a combination of a guide rail and a movable component (such as a trolley).
  • this application also provides a specific implementation of the electronic device. See the examples below.
  • Figure 27 shows a schematic diagram of the hardware structure of an electronic device provided by an embodiment of the present application.
  • the electronic device may include a processor 2701 and a memory 2702 storing computer program instructions.
  • the above-mentioned processor 2701 may include a central processing unit (Central Processing Unit, CPU), or an application specific integrated circuit (Application Specific Integrated Circuit, ASIC), or may be configured to implement one or more integrated circuits of the embodiments of the present application. .
  • CPU Central Processing Unit
  • ASIC Application Specific Integrated Circuit
  • Memory 2702 may include bulk storage for data or instructions.
  • memory 2702 may include a hard disk drive (HDD), a floppy disk drive, flash memory, an optical disk, a magneto-optical disk, a magnetic tape, or a Universal Serial Bus (USB) drive or two or more A combination of many of the above.
  • memory 2702 may include removable or non-removable (or fixed) media, or memory 2702 may be non-volatile solid-state memory.
  • the memory 2702 may be internal or external to the integrated gateway disaster recovery device.
  • memory 2702 may be read-only memory (Read Only Memory, ROM).
  • ROM Read Only Memory
  • the ROM may be a mask-programmed ROM, a programmable ROM (PROM), an erasable PROM (EPROM), an electrically erasable PROM (EEPROM), an electrically rewritable ROM (EAROM), or flash memory, or both.
  • PROM programmable ROM
  • EPROM erasable PROM
  • EEPROM electrically erasable PROM
  • EAROM electrically rewritable ROM
  • Memory 2702 may include read-only memory (ROM), random access memory (RAM), magnetic disk storage media devices, optical storage media devices, flash memory devices, electrical, optical, or other physical/tangible memory storage devices.
  • ROM read-only memory
  • RAM random access memory
  • magnetic disk storage media devices e.g., magnetic disks
  • optical storage media devices e.g., flash memory devices
  • electrical, optical, or other physical/tangible memory storage devices e.g., electrical, optical, or other physical/tangible memory storage devices.
  • memory includes one or more tangible (non-transitory) computer-readable storage media (e.g., memory devices) encoded with software including computer-executable instructions, and when the software is executed (e.g., by one or multiple processors) operable to perform the operations described with reference to a method according to an aspect of the present application.
  • the processor 2701 reads and executes the computer program instructions stored in the memory 2702 to implement the methods/steps in the above-mentioned alignment method of the display panel or the gamma debugging method of the display panel, and achieve the above-mentioned alignment method of the display panel or
  • the gamma debugging method of the display panel achieves corresponding technical effects by executing its methods/steps, which will not be described again here for the sake of concise description.
  • the electronic device may also include a communication interface 2703 and a bus 2710. Among them, as shown in Figure 27, the processor 2701, the memory 2702, and the communication interface 2703 are connected through the bus 2710 and complete communication with each other.
  • the communication interface 2703 is mainly used to implement communication between modules, devices, units and/or equipment in the embodiments of this application.
  • Bus 2710 includes hardware, software, or both, coupling components of an electronic device to one another.
  • the bus may include Accelerated Graphics Port (AGP) or other graphics bus, Enhanced Industry Standard Architecture (EISA) bus, Front Side Bus (FSB), Ultra Transmission (Hyper Transport, HT) interconnect, Industry Standard Architecture (ISA) bus, infinite bandwidth interconnect, low pin count (LPC) bus, memory bus, Micro Channel Architecture (MCA) bus, peripheral component interconnect (PCI) bus, PCI-Express (PCI-X) bus, Serial Advanced Technology Attachment (SATA) bus, Video Electronics Standards Association Local (VLB) bus or other suitable bus or two or more of these combination.
  • bus 2710 may include one or more buses.
  • embodiments of the present application may provide a computer-readable storage medium for implementation.
  • Computer program instructions are stored on the computer-readable storage medium; when the computer program instructions are executed by the processor, any one of the alignment methods of the display panel or the gamma debugging method of the display panel in the above embodiments is implemented.
  • Examples of computer-readable storage media include non-transitory computer-readable storage media such as electronic circuits, semiconductor memory devices, ROM, random access memory, flash memory, erasable ROM (EROM), floppy disks, CD-ROMs, optical disks, harddisk.
  • the functional blocks shown in the above structural block diagram can be implemented as hardware, software, firmware or a combination thereof.
  • it may be, for example, an electronic circuit, an application specific integrated circuit (Application Specific Integrated Circuit, ASIC), appropriate firmware, plug-ins, function cards, etc.
  • elements of the application are programs or code segments that are used to perform the required tasks.
  • the program or code segments may be stored in a machine-readable medium or transmitted over a transmission medium or communications link via a data signal carried in a carrier wave.
  • "Machine-readable medium” may include any medium capable of storing or transmitting information.
  • machine-readable media examples include electronic circuits, semiconductor memory devices, ROM, flash memory, erasable ROM (EROM), floppy disks, CD-ROMs, optical disks, hard disks, fiber optic media, radio frequency (Radio Frequency, RF) links, etc. wait.
  • Code segments may be downloaded via computer networks such as the Internet, intranets, and the like.
  • Such a processor may be, but is not limited to, a general-purpose processor, a special-purpose processor, a special application processor, or a field-programmable logic circuit. It will also be understood that each block in the block diagrams and/or flowchart illustrations, and combinations of blocks in the block diagrams and/or flowchart illustrations, can also be implemented by special purpose hardware that performs the specified functions or actions, or can be implemented by special purpose hardware and A combination of computer instructions.

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Abstract

显示面板的对位方法、显示面板的伽马调试方法及装置。控制显示面板的既定区域显示与探头尺寸相适配的对位图案，对位图案的亮度值小于既定区域周围其它区域的亮度值(S101)；控制探头从起始位置沿第一方向移动，并采集沿第一方向的第一移动路径上不同位置的多个第一亮度值，得到第一移动路径上最小的第一亮度值对应的第一坐标(S102); 控制探头沿第二方向移动，并采集沿第二方向的第二移动路径上不同位置的多个第二亮度值，得到第二移动路径上最小的第二亮度值对应的第二坐标，第二方向与第一方向交叉(S103)；根据第一坐标和第二坐标，确定对位位置(S104)。本方法及装置有助于实现探头中心与对位图案的中心的精准对位及自动化对位。

Description

显示面板的对位方法、显示面板的伽马调试方法及装置
本申请要求于2022年06月30日提交中国专利局、申请号为202210757406.9、申请名称为“显示面板的对位方法、显示面板的伽马调试方法及装置”的中国专利申请的优先权，其全部内容通过引用结合在本申请中。
技术领域
本申请属于显示技术领域，尤其涉及一种显示面板的对位方法、显示面板的伽马调试方法及装置。
背景技术
随着电子设备的快速发展，用户对屏占比的要求越来越高。为了提高屏占比，目前出现了屏下摄像头的设计，将显示面板的显示区划分为副屏区和主屏区，副屏区对应设置摄像头等感光元件。
为了保证副屏区的亮色度与主屏区的亮色度一致，通常可以分别对副屏区和主屏区进行伽马调试。而伽马调试(尤其是对于副屏区的伽马调试)的结果是否精准，主要因素是光学测量设备的探头与副屏区或主屏区的对位是否精准。然而，目前存在光学测量设备的探头与显示面板对位不精准的问题。
发明内容
本申请实施例提供了一种显示面板的对位方法、显示面板的伽马调试方法及装置，能够解决光学测量设备的探头与显示面板对位不精准的问题。
第一方面，本申请实施例提供一种显示面板的对位方法，显示面板的对位方法包括：控制显示面板的既定区域显示与探头尺寸相适配的对位图案，对位图案的亮度值小于既定区域周围其它区域的亮度值；控制探头从起始位置沿第一方向移动，并采集沿第一方向的第一移动路径上不同位置的多个第一亮度值，得到第一移动路径上最小的第一亮度值对应的第一坐标；控制探头沿第二方向移动，并采集沿第二方向的第二移动路径上不同位置的多个第二亮度值，得到第二移动路径上最小的第二亮度值对应的第二坐标，第二方向与第一方向交叉；根据第一坐标和第二坐标，确定对位位置。
根据本申请第一方面的实施方式，采集沿第一方向的第一移动路径上不同位置的多个第一亮度值，得到第一移动路径上最小的第一亮度值对应的第一坐标，具体可以包括：判断第一移动路径上第i个位置对应的第一亮度值是否大于第一移动路径上第i-1个位置对应的第一亮度值，第i-1个位置为第i个位置的前一个位置，i为正整数；当第i个位置对应的第一亮度值大于第i-1个位置对应的第一亮度值时，将第i-1个位置的坐标确定为第一坐标；采集沿第二方向的第二移动路径上不同位置的多个第二亮度值，得到第二移动路径上最小的第二亮度值对应的第二坐标，具体可以包括：判断第二移动路径上第j个位置对应的第二亮度值是否大于第二移动路径上第j-1个位置对应的第二亮度值，第j-1个位置为第j个位置的前一个位置，j为正整数；当第j个位置对应的第二亮度值大于第j-1个位置对应的第二亮度值时，将第j-1个位置的坐标确定为第二坐标。
由于探头的中心越靠近对位图案的中心，探头与对位图案的重叠面积越大，所以探头在越靠近对位图案的中心的位置采集的亮度值越小。因此，当探头采集的当前位置的亮度值比前一位置的亮度值大时，说明探头的中心又向偏离对位图案的中心移动，即当前位置的前一位置最靠近对位图案的中心(如与对位图案的中心重合)。如此一来，基于探头采集的亮度值由小变大的拐点，可以准确地确定出对位图案的中心坐标。
根据本申请第一方面前述任一实施方式，在将第i-1个位置的坐标确定为第一坐标之前，显示面板的对位方法还可以包括：在第i个位置对应的第一亮度值大于第i-1个位置对应的第一亮度值的情况下，判断第一移动路径上第i+1个位置至第i+n个位置对应的第一亮度值是否均大于第一移动路径上第i-1个位置对应的第一亮度值，第i+1个位置为第i个位置的后一个位置，第i+n个位置为第i个位置的后n个位置，n为正整数；将第i-1个位置的坐标确定为第一坐标，具体可以包括：当第i+1个位置至第i+n个位置对应的第一亮度值均大于第i-1个位置对应的第一亮度值时，将第i-1个位置的坐标确定为第一坐标。
如此一来，在第i个位置对应的第一亮度值大于第i-1个位置对应的第一亮度值的情况下，通过第i+1个位置至第i+n个位置对应的第一亮度值进行验证，可以提高确定的第一坐标的准确性，进而提高最终确定的对位图案的中心坐标的准确性，有效避免误判。
第二方面，本申请实施例提供了一种显示面板的伽马调试方法，显示面板包括第一显示区与第二显示区，显示面板的伽马调试方法包括：控制探头移动至第一显示区，并对第一显示区进行伽马调试；基于如第一方面提供的显示面板的对位方法，将探头移动至对位位置，对位图案至少部分位于第二显示区内；对第二显示区进行伽马调试。
第三方面，本申请实施例提供了一种显示面板的伽马调试装置，用于执行如第二方面提供的显示面板的伽马调试方法，伽马调试装置包括：工作台，用于承载显示面板；第一传送部，位于工作台的至少一侧，且沿第一方向延伸；第二传送部，第二传送部沿第二方向延伸且悬于工作台上方，第二传送部与第一传送部连接，且第二传送部可沿第一方向相对第一传送部移动；夹持部，与第二传送部连接，且夹持部可沿第二方向相对第二传送部移动；探头，固定安装于夹持部；控制器，与第一传送部、第二传送部及探头电连接。
根据本申请第三方面前述任一实施方式，工作台上开设有第一凹槽和第二凹槽，第一凹槽用于放置显示面板，第二凹槽位于第一凹槽沿第一方向的一侧；伽马调试装置还包括发光部，发光部位于第二凹槽内，所述发光部呈条状且沿第二方向延伸设置。
如此一来，通过开设第一凹槽放置显示面板，可以实现对于显示面板的定位，保证对位的准确性；通过在第一凹槽的靠近第二显示区的一侧开设第二凹槽，第二凹槽可以为探头的移动提供足够的移动空间，防止探头在对位时碰撞到第一凹槽的边缘；通过在第二凹槽内设置发光部，可以保证即便探头的一部分移动到第二凹槽，探头采集的亮度值也会出现由 小变大的变化，保证对位的顺利进行。
本申请实施例的显示面板的对位方法、显示面板的伽马调试方法及装置，控制显示面板的既定区域显示与探头尺寸相适配的对位图案，对位图案的亮度值小于既定区域周围其它区域的亮度值；控制探头从起始位置沿第一方向移动，并采集沿第一方向的第一移动路径上不同位置的多个第一亮度值，得到第一移动路径上最小的第一亮度值对应的第一坐标；控制探头沿第二方向移动，并采集沿第二方向的第二移动路径上不同位置的多个第二亮度值，得到第二移动路径上最小的第二亮度值对应的第二坐标，第二方向与第一方向交叉；根据第一坐标和第二坐标，确定对位位置。本申请实施例根据第一移动路径上最小的第一亮度值对应的第一坐标和第二移动路径上最小的第二亮度值对应的第二坐标，可以准确地确定出对位图案的中心坐标，进而可以实现探头与对位图案的精准对位，提高对位的精准度。此外，在对位过程中，无需人为干预，可以实现探头与对位图案的自动化对位。
附图说明
图1为显示面板的一种结构示意图；
图2为本申请实施例提供的显示面板的对位方法中对位图案的一种俯视示意图；
图3为本申请实施例提供的显示面板的对位方法中对位图案的另一种俯视示意图；
图4为本申请实施例提供的显示面板的对位方法的一种流程示意图；
图5为本申请实施例提供的显示面板的对位方法的一种操作示意图；
图6为本申请实施例提供的显示面板的对位方法的另一种操作示意图；
图7为本申请实施例提供的显示面板的对位方法的又一种操作示意图；
图8为本申请实施例提供的显示面板的对位方法的另一种流程示意图；
图9为本申请实施例提供的显示面板的对位方法的又一种流程示意图；
图10为本申请实施例提供的显示面板的对位方法的又一种流程示意图；
图11为本申请实施例提供的显示面板的对位方法的又一种流程示意图；
图12为本申请实施例提供的显示面板的对位方法的又一种流程示意图；
图13为本申请实施例提供的显示面板的对位方法的又一种流程示意图；
图14为本申请实施例提供的显示面板的对位方法的又一种操作示意图；
图15为本申请实施例提供的显示面板的对位方法的又一种流程示意图；
图16为本申请实施例提供的显示面板的对位方法的又一种操作示意图；
图17为本申请实施例提供的显示面板的对位方法的又一种流程示意图；
图18为本申请实施例提供的显示面板的对位方法的又一种操作示意图；
图19为本申请实施例提供的显示面板的对位方法的又一种流程示意图；
图20为本申请实施例提供的显示面板的一种俯视示意图；
图21为本申请实施例提供的显示面板的另一种俯视示意图；
图22为本申请实施例提供的显示面板的伽马调试方法的一种操作示意图；
图23为本申请实施例提供的显示面板的伽马调试方法的一种流程示意图；
图24为本申请实施例提供的显示面板的伽马调试方法的另一种操作示意图；
图25为本申请实施例提供的显示面板的伽马调试装置的一种结构示意图；
图26为本申请实施例提供的显示面板的伽马调试装置的另一种结构示意图；
图27示出了本申请实施例提供的电子设备的硬件结构示意图。
具体实施方式
在阐述本申请实施例所提供的技术方案之前，为了便于对本申请实施例理解，本申请首先对现有技术中存在的问题进行具体说明：
如图1所示，显示面板包括主屏区01’和副屏区02’，副屏区02’可以对应设置屏下摄像头等感光元件。为了提高副屏区02’的透光率，副屏区02’的像素面积和/或像素密度可以小于主屏区01’的像素面积和/或像素密度。因此，由于主屏区01’和副屏区02’的像素面积和/或像素密度不同，所以主屏区01’的伽马调试结果不太适用于副屏区02’。
因此，为了保证副屏区的亮色度与主屏区的亮色度一致，通常可以分别对副屏区和主屏区进行伽马调试。而伽马调试(尤其是对于副屏区的伽马调试)的结果是否精准，主要因素是光学测量设备的探头与副屏区或主屏区的对位是否精准。
为了便于理解，不妨以副屏区为例。副屏区包括多个子像素，驱动芯片(驱动IC)通过信号线为副屏区中不同位置的子像素提供驱动信号，以驱动副屏区中的子像素发光。由于副屏区中不同位置的子像素与驱动芯片的距离不同，所以受信号线上压降(IR-drop)的影响，副屏区中不同位置的亮度是不同的，如近IC端和远IC端中的一者偏亮、另一者偏暗。而副屏区中心的亮度可以看作是副屏区中的近IC端的亮度和副屏区中的远IC端的亮度的平均值，因而副屏区中心的亮度最能够客观反映副屏区的平均亮度。因此，在对于副屏区进行伽马调试时，最好令探头的中心与副屏区的中心对位，这样采集的亮度值最能够客观反映副屏区的平均亮度，有利于提高伽马调试的准确性。
然而，经本申请的发明人发现，目前存在光学测量设备的探头与显示面板对位不精准的问题。例如，在对于副屏区进行伽马调试时，无法令探头的中心与副屏区的中心准确对位，导致最终伽马调试的准确性较差。例如，在一些相关技术中，需要调试人员手动调整探头的位置，进行手动对位，导致探头与显示面板对位的精准性较差，对位花费的时间较长。
鉴于发明人的上述研究发现，本申请实施例提供了一种显示面板的对位方法、显示面板的伽马调试方法及装置，能够解决相关技术中存在的光学测量设备的探头与显示面板对位不精准的技术问题。
本申请实施例的技术构思在于：控制显示面板的既定区域显示与探头尺寸相适配的对位图案，对位图案的亮度值小于既定区域周围其它区域的亮度值；控制探头从起始位置沿第一方向移动，并采集沿第一方向的第一移动路径上不同位置的多个第一亮度值，得到第一移动路径上最小的第一亮度值对应的第一坐标；控制探头沿第二方向移动，并采集沿第二方向 的第二移动路径上不同位置的多个第二亮度值，得到第二移动路径上最小的第二亮度值对应的第二坐标，第二方向与第一方向交叉；根据第一坐标和第二坐标，确定对位位置。这样，根据第一移动路径上最小的第一亮度值对应的第一坐标和第二移动路径上最小的第二亮度值对应的第二坐标，可以准确地确定出对位图案的中心坐标，进而可以实现探头中心与对位图案的中心的精准对位，提高对位的精准度。
下面首先对于本申请实施例提供的显示面板的对位方法进行说明。
图2为本申请实施例提供的显示面板的对位方法中对位图案的一种俯视示意图。图3为本申请实施例提供的显示面板的对位方法中对位图案的另一种俯视示意图。图4为本申请实施例提供的显示面板的对位方法的一种流程示意图。
如图4所示，本申请实施例提供的显示面板的对位方法可以包括以下步骤S101至S104。
S101、控制显示面板的既定区域显示与探头尺寸相适配的对位图案，对位图案的亮度值小于既定区域周围其它区域的亮度值。
如图2所示，在本申请实施例中，在S101中，可以控制显示面板10的既定区域显示与探头尺寸相适配的对位图案100。其中，探头尺寸可以理解为探头的镜头(横截面或称采光面)尺寸，探头为光学测量设备(如色彩分析仪)的探头。对位图案100与探头尺寸相适配可以理解为：显示面板10的既定区域显示的对位图案100的尺寸与探头尺寸完全相同，或者，显示面板10的既定区域显示的对位图案100的尺寸可以与探头的镜头的一部分尺寸完全相同。例如，以探头的镜头为圆形为例，在图2所示的实施例中，显示面板10的既定区域显示的对位图案100的尺寸与探头尺寸完全相同，即对位图案100可以为与探头尺寸相同的圆形。而在图3所示的实施例中，显示面板10的既定区域显示的对位图案100的尺寸可以与探头的镜头的一部分尺寸完全相同，即对位图案100可以为与探头尺寸相同的圆形的一部分。既定区域可以为预先设定的显示面板10中的部分区域，如显示面板10的副屏，或者，显示面板10的副屏及主屏的部分区域，本申请实施例对此不作限定。
需要说明的是，对位图案100的尺寸与探头尺寸相同，可以理解为在允许的误差内对位图案100的尺寸与探头尺寸相同。即，对位图案100的尺寸与探头尺寸的差值可以在允许的误差内，误差的大小具体可以根据实际情况灵活调整，本申请实施例对此不作限定。
继续参见图2或者图3，对位图案100的亮度值小于既定区域周围其它区域的亮度值，即对位图案100的亮度值小于显示面板10上对位图案100周围其它区域的亮度值，以便于后续根据亮暗变化确定对位图案100的中心坐标。例如，在一些实施例中，可以使得显示面板10的既定区域显示对位图案100，显示面板10上除既定区域之外的其他区域显示背景画面200，对位图案100的亮度值小于背景画面200的亮度值。示例性地，例如背景画面200为白色画面或其他浅颜色画面，对位图案100为黑色图案、灰色图案或其他深颜色图案。
S102、控制探头从起始位置沿第一方向移动，并采集沿第一方向的第一移动路径上不同位置的多个第一亮度值，得到第一移动路径上最小的第一亮度值对应的第一坐标。
图5为本申请实施例提供的显示面板的对位方法的一种操作示意图。如图5所示，第一方向可以为显示面板10的列方向Y，或者第一方向也可以为显示面板10的行方向X，本申请实施例对比不作限定。以第一方向为显示面板10的列方向Y为例，在S101中，可以控制探头500从起始位置P沿第一方向(如列方向Y)移动，即沿图5所示的第一移动路径s1移动。容易理解的是，至少部分对位图案100位于第一移动路径s1上，从而使得探头500沿第一移动路径s1移动时能够采集到对位图案100的亮度值。在一些具体的示例中，例如可以使得起始位置P与对位图案100的中心O在第二方向(如行方向X)上的最小距离L小于预设的第一距离阈值，从而使得至少部分对位图案100能够位于第一移动路径s1上。其中，第一距离阈值可以根据实际情况灵活设定，例如第一距离阈值可以小于对位图案100的半径。实际操作中，所述起始位置可以通过人眼简单确定便可。
在探头500沿第一方向移动的过程中，探头500可以采集沿第一方向的第一移动路径s1上不同位置的多个亮度值，为了便于区分，这里将探头500沿第一移动路径s1采集到的亮度值称作第一亮度值。示例性地，例如探头500在第一移动路径s1上每移动一段距离，便采集一次亮度值和探头500中心的坐标值，从而得到第一移动路径s1上不同位置的多个第一亮度值。
图6为本申请实施例提供的显示面板的对位方法的另一种操作示意图。如图6所示，假设对位图案100的中心O的坐标为(x1，y1)，第一方向可以为显示面板10的列方向Y。那么，当探头500的中心O’沿第一方向移动到纵坐标与对位图案100的中心O的纵坐标相等时，即探头500的中心O’位于y＝y1的直线上时，探头500与对位图案100的重叠面积最大，探头采集的亮度值最小，此时第一坐标(即探头500的中心O’的坐标)为(x2，y1)。也就是说，在得到第一移动路径s1上最小的第一亮度值对应的第一坐标之后，至少可以确定出对位图案100的中心O的其中一个坐标(如纵坐标y1)。
S103、控制探头沿第二方向移动，并采集沿第二方向的第二移动路径上不同位置的多个第二亮度值，得到第二移动路径上最小的第二亮度值对应的第二坐标，第二方向与第一方向交叉。
继续参见图6，第二方向可以为显示面板10的行方向X，或者第一方向也可以为显示面板10的列方向Y，本申请实施例对比不作限定。以第一方向为显示面板10的列方向Y，第二方向为显示面板10的行方向X为例，在S102中，可以控制探头500沿y＝y1或者y＝y1±Δy的直线(即第二方向)移动，其中，y1为第一坐标中的纵坐标y1，Δy可以根据实际情况灵活调整，Δy可以小于对位图案100的半径。
在探头500沿第二方向移动的过程中，探头500可以采集沿第二方向的第二移动路径s2上不同位置的多个亮度值，为了便于区分，这里将探头500沿第二移动路径s2采集到的亮度值称作第二亮度值。示例性地，例如探头500在第二移动路径s2上每移动一段距离，便采集一次亮度值和探头500中心的坐标值，从而得到第二移动路径s2上不同位置的多个第二亮度值。
图7为本申请实施例提供的显示面板的对位方法的又一种操作示意图。如图7所示，假设对位图案100的中心O的坐标为(x1，y1)，第一方向可以为显示面板10的列方向Y，第二方向可以为显示面板10的行方向X。那么，当探头500的中心O’沿第二方向移动到横坐标与对位图案100的中心O的横坐标相等时，即探头500的中心O’位于x＝x1的直线上时，探头500与对位图案100的重叠面积最大，探头采集的亮度值最小，此时第二坐标(即探头500的中心O’的坐标)为(x1，y1)或(x1，y1±Δy)。也就是说，在得到第二移动路径s2上最小的第二亮度值对应的第二坐标之后，至少可以确定出对 位图案100的中心O的另一个坐标(如横坐标x1)。
S104、根据第一坐标和第二坐标，确定对位位置。
示例性地，在得到第一坐标(x2，y1)和第二坐标(x1，y1)或(x1，y1±Δy)之后，例如可以根据第一坐标中的纵坐标y1和第二坐标中的横坐标x1，得到对位位置(x1，y1)。其中，对位位置即为对位图案100的中心O。
本申请实施例根据第一移动路径上最小的第一亮度值对应的第一坐标和第二移动路径上最小的第二亮度值对应的第二坐标，可以准确地确定出对位图案的中心坐标，进而可以实现探头与对位图案的精准对位，提高对位的精准度。
图8为本申请实施例提供的显示面板的对位方法的另一种流程示意图。如图8所示，根据本申请的一些实施例，可选地，在S102中，采集沿第一方向的第一移动路径上不同位置的多个第一亮度值，得到第一移动路径上最小的第一亮度值对应的第一坐标，具体可以包括以下步骤S801和S802。
S801、判断第一移动路径上第i个位置对应的第一亮度值是否大于第一移动路径上第i-1个位置对应的第一亮度值。其中，第i-1个位置为第i个位置的前一个位置(或称上一个位置)，i为大于1的正整数。
S802、当第i个位置对应的第一亮度值大于第i-1个位置对应的第一亮度值时，将第i-1个位置的坐标确定为第一坐标。
需要说明的是，第i个位置是第一移动路径上的任意位置。即，探头的中心每移动到一个位置，均可以将该位置作为上述的第i个位置，并执行上述步骤S801和S802。
结合图6所示，由于探头500的中心O’越靠近对位图案100的中心O，探头500与对位图案100的重叠面积越大，所以探头500在越靠近对位图案100的中心O的位置采集的亮度值越小。因此，当探头500采集的当前位置的亮度值比前一位置的亮度值大时，说明探头500的中心O’又从最靠近对位图案100的中心O的位置向偏离对位图案100的中心O移动，即当前位置的前一位置最靠近对位图案100的中心O(如与对位图案100的中心O重合)。如此一来，基于探头采集的亮度值由小变大的拐点，可以准确地确定出第一移动路径上最小的第一亮度值对应的第一坐标，进而准确地确定出对位图案的中心坐标。
类似地，如图9所示，根据本申请的一些实施例，可选地，在S103中，采集沿第二方向的第二移动路径上不同位置的多个第二亮度值，得到第二移动路径上最小的第二亮度值对应的第二坐标，具体可以包括以下步骤S901和S902。
S901、判断第二移动路径上第j个位置对应的第二亮度值是否大于第二移动路径上第j-1个位置对应的第二亮度值。其中，第j-1个位置为第j个位置的前一个位置(或称上一个位置)，j为大于1的正整数。
S902、当第j个位置对应的第二亮度值大于第j-1个位置对应的第二亮度值时，将第j-1个位置的坐标确定为第二坐标。
需要说明的是，第j个位置是第二移动路径上的任意位置。即，探头的中心每移动到一个位置，均可以将该位置作为上述的第j个位置，并执行上述步骤S901和S902。
结合图7所示，由于探头500的中心O’越靠近对位图案100的中心O，探头500与对位图案100的重叠面积越大，所以探头500在越靠近对位图案100的中心O的位置采集的亮度值越小。因此，当探头500采集的当前位置的亮度值比前一位置的亮度值大时，说明探头500的中心O’又从最靠近对位图案100的中心O的位置向偏离对位图案100的中心O移动，即当前位置的前一位置最靠近对位图案100的中心O(如与对位图案100的中心O重合)。如此一来，基于探头采集的亮度值由小变大的拐点，可以准确地确定出第二移动路径上最小的第一亮度值对应的第二坐标，进而结合第一坐标可以准确地确定出对位图案的中心坐标。
图10为本申请实施例提供的显示面板的对位方法的又一种流程示意图。如图10所示，根据本申请的一些实施例，可选地，在S802、当第i个位置对应的第一亮度值大于第i-1个位置对应的第一亮度值时，将第i-1个位置的坐标确定为第一坐标之前，显示面板的对位方法还可以包括以下步骤：
S1001、在第i个位置对应的第一亮度值大于第i-1个位置对应的第一亮度值的情况下，判断第一移动路径上第i+1个位置至第i+n个位置对应的第一亮度值是否均大于第一移动路径上第i-1个位置对应的第一亮度值。其中，第i+1个位置为第i个位置的后一个位置，第i+n个位置为第i个位置的后n个位置，n为正整数。示例性地，n可以等于1，也可以大于1。
相应地，S802具体可以包括以下步骤：当第i+1个位置至第i+n个位置对应的第一亮度值均大于第i-1个位置对应的第一亮度值时，将第i-1个位置的坐标确定为第一坐标。
如此一来，在第i个位置对应的第一亮度值大于第i-1个位置对应的第一亮度值的情况下，通过第i+1个位置至第i+n个位置对应的第一亮度值进行验证，即通过至少两个连续位置的第一亮度值对于第i-1个位置对应的第一亮度值进行验证，可以提高确定的第一坐标的准确性，进而提高最终确定的对位图案的中心坐标的准确性，有效避免误判。
同理，根据本申请的一些实施例，可选地，在S902、当第j个位置对应的第二亮度值大于第j-1个位置对应的第二亮度值时，将第j-1个位置的坐标确定为第二坐标之前，显示面板的对位方法还可以包括以下步骤：
在第j个位置对应的第二亮度值大于第j-1个位置对应的第二亮度值的情况下，判断第二移动路径上第j+1个位置至第j+n个位置对应的第二亮度值是否均大于第二移动路径上第j-1个位置对应的第二亮度值。其中，第j+1个位置为第j个位置的后一个位置，第j+n个位置为第j个位置的后n个位置，n为正整数。示例性地，n可以等于1，也可以等于1。
相应地，S902具体可以包括以下步骤：当第j+1个位置至第j+n个位置对应的第二亮度值均大于第j-1个位置对应的第二亮度值时，将第j-1个位置的坐标确定为第二坐标。
如此一来，在第j个位置对应的第二亮度值大于第j-1个位置对应的第二亮度值的情况下，通过第j+1个位置至第j+n个位置对应的第二亮度值进行验证，即通过至少两个连续位置的第二亮度值对于第j-1个位置对应的第二亮度值进行验证，可以提高确定的第二坐标的准确性，进而提高最终确定的对位图案的中心坐标的准确性，有效避免误判。
图11为本申请实施例提供的显示面板的对位方法的又一种流程示意图。如图11所示，根据本申请的一些实施例，可选地，在S104、根据第一坐标和第二坐标，确定对位位置之后，显示面板的对位方法还可以包括以下步骤：S105、控制探头移动到对位位置。如控制探头中心移动到对位图案的中心，从而实现对位。
图12为本申请实施例提供的显示面板的对位方法的又一种流程示意图。如图12所示，与图11所示实施例不同的是，根据本申请的另一些实施例，可选地，探头可以在确定第一坐标和第二坐标的同时可以进行分步对位。
具体而言，在将第i-1个位置的坐标确定为第一坐标之后，在S103控制探头沿第二方向移动之前，显示面板的对位 方法还可以包括以下步骤：
S121、控制探头返回第i-1个位置。
如前所述，第一移动路径上最小的第一亮度值对应的位置为第i-1个位置，第i-1个位置的坐标为第一坐标。而探头已经移动到第i个位置，因而可以控制探头再次返回第i-1个位置，例如使得探头的中心O’位于y＝y1的直线上，即使得探头的中心O’的纵坐标与对位图案100的中心O的纵坐标一致。
相应地，在得到第二移动路径上最小的第二亮度值对应的第二坐标之后，显示面板的对位方法还可以包括以下步骤：
S122、控制探头返回第j-1个位置。
如前所述，第二移动路径上最小的第二亮度值对应的位置为第j-1个位置，第j-1个位置的坐标为第二坐标。而探头已经移动到第j个位置，因而可以控制探头再次返回第j-1个位置。在S121中，由于已将探头的中心O’移动到y＝y1的直线上，所以第j-1个位置的坐标即为对位图案100的中心O的坐标(x1，y1)。那么，将探头的中心移动到第j-1个位置，即实现了探头的中心O’与对位图案100的中心O的对位。
如此一来，一边确定第一坐标和第二坐标，另一边对于探头进行分步对位，能够缩短探头的对位时间，提高对位过程的速率。
图13为本申请实施例提供的显示面板的对位方法的又一种流程示意图。如图13所示，根据本申请的一些实施例，可选地，本申请实施例提供的显示面板的对位方法还可以包括以下步骤S131至S133。
S131、控制探头沿第一方向反向移动，并采集第一反向移动路径上不同位置的多个第三亮度值，第一反向移动路径为沿第一方向反向移动的路径。
在沿第一方向反向移动的过程中，探头500可以采集第一反向移动路径s1’上不同位置的多个亮度值，为了便于区分，这里将探头500沿第一反向移动路径s1’采集到的亮度值称作第三亮度值。示例性地，例如探头500在第一反向移动路径s1’上每移动一段距离，便采集一次亮度值和探头500中心的坐标值，从而得到第一反向移动路径s1’上不同位置的多个第三亮度值。
S132、判断第一反向移动路径上第p个位置对应的第三亮度值是否大于第一反向移动路径上第p-1个位置对应的第三亮度值。其中，第p-1个位置为第p个位置的前一个位置，p为大于1的正整数。
S133、当第p个位置对应的第三亮度值大于第p-1个位置对应的第三亮度值时，判断第p-1个位置与第i-1个位置是否相同。
需要说明的是，理论上第p-1个位置与第i-1个位置应该是相同的，但是实际中第p-1个位置与第i-1个位置也可能存在一定偏差。
相应地，S802、当第i个位置对应的第一亮度值大于第i-1个位置对应的第一亮度值时，将第i-1个位置的坐标确定为第一坐标，具体可以包括以下步骤S134和S135。
S134、在第p-1个位置与第i-1个位置相同的情况下，将第i-1个位置的坐标确定为第一坐标。
S135、在第p-1个位置与第i-1个位置不相同的情况下，将第p-1个位置的坐标与第i-1个位置的坐标的平均值确定为第一坐标。
如此一来，通过控制探头沿第一方向反向移动得到第p-1个位置，并利用第p-1个位置对于第i-1个位置进行校准验证，能够提高确定的第一坐标的准确性，进而提高最终确定的对位图案的中心坐标的准确性，有效避免误判。
根据本申请的一些实施例，可选地，在S131中，可以是在发现亮度升高拐点时，立即沿第一方向反向移动。图14为本申请实施例提供的显示面板的对位方法的又一种操作示意图。如图14所示，以第一方向为显示面板10的列方向Y为例，例如当第i个位置对应的第一亮度值大于第i-1个位置对应的第一亮度值时，可以控制探头500沿第一方向反向(即第i个位置指向第i-1个位置的方向，虚线箭头标示方向)移动。即，发现亮度升高拐点，便沿第一方向反向移动。
如此一来，由于是在发现亮度升高拐点时，立即沿第一方向反向移动，而不继续沿第一方向正向移动，所以可以减少对位过程所用的时间，提高对位效率。
根据本申请的一些实施例，可选地，在S131中，可以是探头在到达预设的终点时，再沿第一方向反向移动。例如在一些示例中，可以预设终点的坐标为(xm，ym)，当探头到达终点(xm，ym)，再控制探头沿第一方向反向移动。例如在另一些示例中，可以预设起始位置与终点之间的第一距离，当探头从起始位置沿第一方向移动第一距离时，认为探头到达预设的终点，再控制探头沿第一方向反向移动。如此一来，可以对比起始位置与终点之间的多个相邻位置之间的亮度值，保证所确定的对位图案中心的准确度，进而保证对位的精准性。
图15为本申请实施例提供的显示面板的对位方法的又一种流程示意图。如图15所示，根据本申请的一些实施例，可选地，本申请实施例提供的显示面板的对位方法还可以包括以下步骤S151至S153。
S151、控制探头沿第二方向反向移动，并采集第二反向移动路径上不同位置的多个第四亮度值，第二反向移动路径为沿第二方向反向移动的路径。
类似的，在S151中，例如可以是在发现亮度升高拐点时，立即沿第二方向反向移动。或者，例如也可以是探头在到达预设的终点时，再沿第二方向反向移动，本申请实施例对此不作限定，具体实现过程请参见上文，在此不再赘述。
图16为本申请实施例提供的显示面板的对位方法的又一种操作示意图。如图16所示，以第二方向为显示面板10的行方向X为例，当第j个位置对应的第二亮度值大于第j-1个位置对应的第二亮度值时，可以控制探头500沿第二方向反向(即第j个位置指向第j-1个位置的方向，虚线箭头标示方向)移动。
在沿第二方向反向移动的过程中，探头500可以采集第二反向移动路径s2’上不同位置的多个亮度值，为了便于区分，这里将探头500沿第二反向移动路径s2’采集到的亮度值称作第四亮度值。示例性地，例如探头500在第二反向移动路径s2’上每移动一段距离，便采集一次亮度值和探头500中心的坐标值，从而得到第二反向移动路径s2’上不同位置的多个第四亮度值。
S152、判断第二反向移动路径上第q个位置对应的第四亮度值是否大于第二反向移动路径上第q-1个位置对应的第四亮度值。其中，第q-1个位置为第q个位置的前一个位置，q为大于1的正整数。
S153、当第q个位置对应的第四亮度值大于第q-1个位置对应的第四亮度值时，判断第q-1个位置与第j-1个位置是否相同。
需要说明的是，理论上第q-1个位置与第j-1个位置应该是相同的，但是实际中第q-1个位置与第j-1个位置也可能存在一定偏差。
相应地，S902、当第j个位置对应的第二亮度值大于第j-1个位置对应的第二亮度值时，将第j-1个位置的坐标确定为第二坐标，具体可以包括以下步骤S154和S155。
S154、在第q-1个位置与第j-1个位置相同的情况下，将第j-1个位置的坐标确定为第二坐标。
S155、在第q-1个位置与第j-1个位置不相同的情况下，将第q-1个位置的坐标与第j-1个位置的坐标的平均值确定为第二坐标。
如此一来，在第j个位置对应的第二亮度值大于第j-1个位置对应的第二亮度值的情况下，通过控制探头沿第二方向反向移动得到第q-1个位置，并利用第q-1个位置对于第j-1个位置进行校准验证，能够提高确定的第二坐标的准确性，进而提高最终确定的对位图案的中心坐标的准确性，有效避免误判。
图17为本申请实施例提供的显示面板的对位方法的又一种流程示意图。如图17所示，根据本申请的一些实施例，可选地，S101、控制探头从起始位置沿第一方向移动，具体可以包括以下步骤：
S171、判断第一移动路径上第x个位置对应的第一亮度值与第一移动路径上第x-1个位置对应的第一亮度值的大小关系。其中，第x-1个位置为第x个位置的前一个位置，x为正整数。
如图18所示，探头500还未与对位图案100交叠时，如探头500处于区域a时，探头500在不同位置采集的亮度值几乎不变。即，当第x个位置对应的第一亮度值等于第x-1个位置对应的第一亮度值时，说明探头还未与对位图案交叠，即探头500与对位图案100的中心距离还较远。而探头500开始与对位图案100交叠时，探头500采集的亮度值会降低。即，当第x个位置对应的第一亮度值小于第x-1个位置对应的第一亮度值时，说明探头500开始与对位图案100交叠，即探头已经靠近对位图案的中心。
S172、当第x个位置对应的第一亮度值等于第x-1个位置对应的第一亮度值时，控制探头以第一步进值和/或第一移动速度沿第一方向移动，直至第x个位置对应的第一亮度值小于第x-1个位置对应的第一亮度值。
S173、当第x个位置对应的第一亮度值小于第x-1个位置对应的第一亮度值时，控制探头以第二步进值和/或第二移动速度沿第一方向移动，直至得到第一移动路径上最小的第一亮度值对应的第一坐标。
其中，第一步进值大于第二步进值，第一移动速度大于第二移动速度。
如此一来，一方面，在探头距离对位图案的中心较远时，以较大的第一步进值和/或第一移动速度控制探头移动，可以提高对位速度，缩短对位时间；另一方面，在探头距离对位图案的中心较近时，以较小的第二步进值和/或第二移动速度控制探头移动，可以提高对位准确度，精准找寻到对位图案的中心。
在一些具体的示例中，可选地，第二步进值可以随时间的增加而递减，和/或，第二移动速度可以随时间的增加而递减。即，探头的中心越靠近对位图案的中心，控制探头移动的步进值越小和/或探头的移动速度越慢。
如此一来，由于探头的中心越靠近对位图案的中心，控制探头移动的步进值越小和/或探头的移动速度越慢，因而可以进一步提高找寻到对位图案的中心的精准度，有效避免因步进值较大或移动速度过快导致探头的中心跳过/越过对位图案的中心。
需要说明的是，在本申请的另一些示例中，第二步进值也可以随时间的增加而保持不变，和/或，第二移动速度也可以随时间的增加而保持不变。
图19为本申请实施例提供的显示面板的对位方法的又一种流程示意图。如图19所示，与图17所示实施例类似的，根据本申请的一些实施例，可选地，S102、根据第一坐标，控制探头沿第二方向移动，具体可以包括以下步骤S191至S193。
S191、判断第二移动路径上第y个位置对应的第二亮度值与第二移动路径上第y-1个位置对应的第二亮度值的大小关系。其中，第y-1个位置为第y个位置的前一个位置，y为正整数。
S192、当第y个位置对应的第二亮度值等于第y-1个位置对应的第二亮度值时，控制探头以第三步进值和/或第三移动速度沿第二方向移动，直至第y个位置对应的第二亮度值小于第y-1个位置对应的第二亮度值。
S193、当第y个位置对应的第二亮度值小于第y-1个位置对应的第二亮度值时，控制探头以第四步进值和/或第四移动速度沿第二方向移动，直至得到第二移动路径上最小的第二亮度值对应的第二坐标。
其中，第三步进值大于第四步进值，第三移动速度大于第四移动速度。
如此一来，一方面，在探头距离对位图案的中心较远时，以较大的第三步进值和/或第三移动速度控制探头移动，可以提高对位速度，缩短对位时间；另一方面，在探头距离对位图案的中心较近时，以较小的第四步进值和/或第四移动速度控制探头移动，可以提高对位准确度，精准找寻到对位图案的中心。
在一些具体的示例中，可选地，第四步进值可以随时间的增加而递减，和/或，第四移动速度可以随时间的增加而递减。即，探头的中心越靠近对位图案的中心，控制探头移动的步进值越小和/或探头的移动速度越慢。
如此一来，由于探头的中心越靠近对位图案的中心，控制探头移动的步进值越小和/或探头的移动速度越慢，因而可以进一步提高找寻到对位图案的中心的精准度，有效避免因步进值较大或移动速度过快导致探头的中心跳过/越过对位图案的中心。
需要说明的是，在本申请的另一些示例中，第四步进值也可以随时间的增加而保持不变，和/或，第四移动速度也可以随时间的增加而保持不变。
图20为本申请实施例提供的显示面板的一种俯视示意图。如图20所示，根据本申请的一些实施例，可选地，显示面板10可以包括第一显示区A1和第二显示区A2，第二显示区A2的透光率大于第一显示区A1的透光率。即，第一显示区A1为上文所述的主屏区，第二显示区A2为上文所述的副屏区。在探头尺寸大于第二显示区A2的尺寸时，如采用10mm口径的探头时，可以以第二显示区A2的中心o为对位图案100的中心O，基于第二显示区A2和靠近第二显示区A2的部分第一显示区A1显示对位图案100。示例性地，对位图案100可以为与探头尺寸相同的圆形，也可以为与探头尺寸相同的圆 形的一部分(如半圆形、四分之三圆形)。
图21为本申请实施例提供的显示面板的另一种俯视示意图。如图21所示，根据本申请的一些实施例，可选地，在探头尺寸小于或等于第二显示区A2的尺寸时，如采用2mm口径的探头时，可以以第二显示区A2的中心o为对位图案100的中心O，基于第二显示区A2显示对位图案100。示例性地，对位图案100可以为与探头尺寸相同的圆形，也可以为与探头尺寸相同的圆形的一部分(如半圆形、四分之三圆形)。
如此一来，本申请实施例可以适配不同尺寸的探头以及适配不同形状/不同尺寸的第二显示区，即适配多种应用场景。
继续参见图21，根据本申请的一些实施例，可选地，第二显示区A2可以包括透光区210，第一显示区A1可以包括围绕透光区210的过渡区220，透光区210和过渡区220均可以设置子像素。过渡区220设置有驱动器件(如晶体管)，透光区210未设置驱动器件。透光区210的中心可以与第二显示区A2的中心重合，过渡区220可以围绕透光区210设置，在探头尺寸小于或等于透光区210的尺寸时，可以以透光区210的中心o为对位图案100的中心O，基于透光区210显示对位图案100。
如此一来，可以保证探头的中心与透光区的中心对位，保证探头采集的亮度值均为透光区的亮度值，即提高探头采集的亮度值的准确性，有利于提高后续第二显示区的伽马调试结果的准确性。
如图21所示，可选地，透光区210的形状可以为矩形，第二显示区A2的形状也可以为矩形。在其他实施例中，透光区210的形状可以为圆形，第二显示区A2的形状也可以为圆形。当然，透光区210和第二显示区A2的形状也可以为其他形状，本申请实施例对此不作限定。
基于上述实施例提供的显示面板的对位方法，相应地，本申请实施例还提供了一种显示面板的伽马调试方法。
图22为本申请实施例提供的显示面板的伽马调试方法的一种操作示意图。图23为本申请实施例提供的显示面板的伽马调试方法的一种流程示意图。结合图22和图23所示，显示面板10包括第一显示区A1与第二显示区A2。第二显示区A2的透光率可以大于第一显示区A1的透光率。即，第一显示区A1为上文所述的主屏区，第二显示区A2为上文所述的副屏区。
本申请实施例提供的显示面板的伽马调试方法可以包括以下步骤S221至S223。
S221、控制探头移动至第一显示区，并对第一显示区进行伽马调试。
第一显示区A1可以显示目标灰阶的画面。其中，目标灰阶可以为预设的任意灰阶。在S221中，可以控制探头移动至第一显示区A1，采集第一显示区A1的实际亮度值。然后，根据第一显示区A1的实际亮度值与目标灰阶对应的目标亮度值的对比结果，调整第一显示区A1中红色子像素对应的数据电压值、绿色子像素对应的数据电压值和蓝色子像素对应的数据电压值中的至少一者，直至第一显示区A1的实际亮度值与目标灰阶对应的目标亮度值之间的差值小于预设的第一误差阈值。最后，得到调整后的第一显示区A1中红色子像素对应的数据电压值、绿色子像素对应的数据电压值和蓝色子像素对应的数据电压值，从而完成第一显示区A1的伽马调试。
需要说明的是，在对第一显示区A1的伽马调试时，在完成一个灰阶的伽马调试之后，第一显示区A1可以切换显示另一灰阶的画面，重复上述过程，从而完成另一灰阶的伽马调试。而且，在伽马调试时，可以选择多个灰阶作为绑点，对于绑点之外的其他灰阶，可以基于线性插值算法得到其他灰阶对应的第一显示区A1中红色子像素对应的数据电压值、绿色子像素对应的数据电压值和蓝色子像素对应的数据电压值。
S222、基于如上述实施例提供的显示面板的对位方法，将探头移动至对位位置，对位图案至少部分位于第二显示区内。
如图20所示，在探头尺寸大于第二显示区A2的尺寸时，可以以第二显示区A2的中心o为对位图案100的中心O，基于第二显示区A2和靠近第二显示区A2的部分第一显示区A1显示对位图案100。如图21所示，在探头尺寸小于或等于第二显示区A2的尺寸时，可以以第二显示区A2的中心o为对位图案100的中心O，基于第二显示区A2显示对位图案100。对位位置为对位图案100的中心O，位于第二显示区A2内。
在S222中，可以基于如上述实施例提供的显示面板的对位方法，将探头中心移动至对位图案100的中心O，完成对位。
S223、对第二显示区进行伽马调试。
如图24所示，在一些实施例中，当探头尺寸大于第二显示区A2的尺寸时，控制第二显示区A2显示目标灰阶的画面，而靠近第二显示区A2的部分第一显示区A1写黑。例如，靠近第二显示区A2的部分第一显示区A1仍然显示对位图案100。这样一来，可以有效避免探头采集到第一显示区A1的亮度值，提高采集的第二显示区A2的亮度值的准确性，进而保证伽马调试结果的准确性。
在另一些实施例中，当探头尺寸小于第二显示区A2的尺寸时，可以控制第二显示区A2显示目标灰阶的画面，靠近第二显示区A2的部分第一显示区A1无需写黑。
在S223中，对位完成后，可以采集第一显示区A2的实际亮度值。然后，根据第二显示区A2的实际亮度值与目标灰阶对应的目标亮度值的对比结果，调整第二显示区A2中红色子像素对应的数据电压值、绿色子像素对应的数据电压值和蓝色子像素对应的数据电压值中的至少一者，直至第二显示区A2的实际亮度值与目标灰阶对应的目标亮度值之间的差值小于预设的第一误差阈值。最后，得到调整后的第二显示区A2中红色子像素对应的数据电压值、绿色子像素对应的数据电压值和蓝色子像素对应的数据电压值，从而完成第二显示区A2的伽马调试。
需要说明的是，在对第二显示区A2的伽马调试时，在完成一个灰阶的伽马调试之后，第二显示区A2可以切换显示另一灰阶的画面，重复上述过程，从而完成另一灰阶的伽马调试。而且，在伽马调试时，可以选择多个灰阶作为绑点，对于绑点之外的其他灰阶，可以基于线性插值算法得到其他灰阶对应的第二显示区A2中红色子像素对应的数据电压值、绿色子像素对应的数据电压值和蓝色子像素对应的数据电压值。
本申请实施例的显示面板的伽马调试方法，显示面板以第二显示区的中心为对位图案的中心显示对位图案，根据第一移动路径上最小的第一亮度值对应的第一坐标和第二移动路径上最小的第二亮度值对应的第二坐标，可以准确地确定出对位图案的中心坐标，实现探头与第二显示区的精准对位，提高探头与第二显示区对位的精准度，进而提高第二显示区的伽马调试的准确度。此外，在对位过程中，无需人为干预，可以实现探头与对位图案的自动化对位。
基于上述实施例提供的显示面板的伽马调试方法，相应地，本申请实施例还提供了显示面板的伽马调试装置的具体实 现方式。
图25为本申请实施例提供的显示面板的伽马调试装置的一种结构示意图。本申请实施例提供的显示面板的伽马调试装置可以用于执行如上述实施例提供的显示面板的伽马调试方法。如图25所示，本申请实施例提供的显示面板的伽马调试装置2500可以包括工作台251、第一传送部252、第二传送部253、夹持部254、控制器(图中未示出)和探头500。其中，工作台251用于承载显示面板10。第一传送部252位于工作台251的至少一侧，且沿第一方向(如列方向Y)延伸。示例性地，第一传送部252位于工作台251的沿第二方向(如行方向X)相对的两侧。第二传送部253沿第二方向延伸且悬于工作台251上方，第二传送部253与第一传送部252连接，第二传送部253可沿第一方向相对第一传送部252移动，如第一传送部252工作时驱动第二传送部253沿第一方向移动，即图25所示的上下移动。夹持部254与第二传送部253连接，夹持部254可沿第二方向相对第二传送部253移动，如第二传送部253工作时驱动夹持部254沿第二方向移动，即图25所示的左右移动。探头500固定安装于夹持部254，即夹持部254夹持探头500。控制器与第一传送部252、第二传送部253及探头电连接。
具体而言，可以将探头500以垂直于显示面板所在平面的角度放置于夹持部254内，并令夹持部254将探头500夹紧。然后，控制器可以控制第一传送部252和第二传送部253，使得夹持部254和探头500可以上下左右移动。在探头500的移动过程中，可以控制探头500采集显示面板10的不同位置的亮度值，并采集探头500的坐标值。再然后，通过上述实施例提供的显示面板的对位方法，完成显示面板的对位。或者，通过上述实施例提供的显示面板的伽马调试方法，完成显示面板的伽马调试方法。
本申请实施例的显示面板的伽马调试装置，显示面板以第二显示区的中心为对位图案的中心显示对位图案，根据第一移动路径上最小的第一亮度值对应的第一坐标和第二移动路径上最小的第二亮度值对应的第二坐标，可以准确地确定出对位图案的中心坐标，实现探头与第二显示区精准对位，提高探头与第二显示区对位的精准度，进而提高第二显示区的伽马调试的准确度。此外，在对位过程中，无需人为干预，可以实现探头中心与对位图案的自动化对位。
图26为本申请实施例提供的显示面板的伽马调试装置的另一种结构示意图。如图26所示，根据本申请的一些实施例，可选地，工作台251上开设有第一凹槽261和第二凹槽262。第一凹槽261用于放置显示面板10，第二凹槽262位于第一凹槽261沿第一方向的一侧。本申请实施例提供的显示面板的伽马调试装置2500还可以包括发光部263，发光部263位于第二凹槽262内，发光部263呈条状且沿第二方向延伸设置。示例性地，发光部263包括但不限于灯具，如LED灯。
为了便于理解，下面结合图26所示的显示面板的伽马调试装置以及上述实施例提供的显示面板的伽马调试方法进行说明。
步骤一、控制探头移动至第一显示区，并对第一显示区进行伽马调试。
步骤二、显示面板以第二显示区的中心为对位图案的中心显示对位图案。
步骤三、发光部发光，并控制探头从起始位置沿第一方向移动，并采集沿第一方向的第一移动路径上不同位置的多个第一亮度值，得到第一移动路径上最小的第一亮度值对应的第一坐标。
步骤四、控制探头沿第二方向移动，并采集沿第二方向的第二移动路径上不同位置的多个第二亮度值，得到第二移动路径上最小的第二亮度值对应的第二坐标。
步骤五、控制探头移动到基于第一坐标和第二坐标确定的对位位置，发光部熄灭，第二显示区显示目标灰阶的画面，对于第二显示区进行伽马调试。
步骤六、完成第二显示区的伽马调试后，控制探头重新回到起始位置。
如此一来，通过开设第一凹槽放置显示面板，可以实现对于显示面板的定位，保证对位的准确性；通过在第一凹槽的靠近第二显示区的一侧开设第二凹槽，第二凹槽可以为探头的移动提供足够的移动空间，防止探头在对位时碰撞到第一凹槽的边缘；通过在第二凹槽内设置发光部，可以保证即便探头的一部分移动到第二凹槽，探头采集的亮度值也会出现由小变大的变化，保证对位的顺利进行。
根据本申请的一些实施例，可选地，第一凹槽261和第二凹槽262连通。
如此一来，第一凹槽与第二凹槽可以通过同一道工艺一体成型，有利于生产工艺的简化，降低显示面板的伽马调试装置的生产成本。
继续参见图26，根据本申请的一些实施例，可选地，工作台251上还可以开设有相对的第三凹槽264和第四凹槽265。第三凹槽264和第四凹槽265可以便于调试人员将显示面板10放置于第一凹槽261内，或者便于调试人员将显示面板10从第一凹槽261内取出。
根据本申请的一些实施例，可选地，第一传送部252包括但不限于电机(如步进电机)与传送机构的组合，或者导轨与可移动部件(如小车)的组合。第二传送部253包括但不限于电机(如步进电机)与传送机构的组合，或者导轨与可移动部件(如小车)的组合。
基于上述实施例提供的显示面板的对位方法或显示面板的伽马调试方法，相应地，本申请还提供了电子设备的具体实现方式。请参见以下实施例。
图27示出了本申请实施例提供的电子设备的硬件结构示意图。
电子设备可以包括处理器2701以及存储有计算机程序指令的存储器2702。
具体地，上述处理器2701可以包括中央处理器(Central Processing Unit，CPU)，或者特定集成电路(Application Specific Integrated Circuit，ASIC)，或者可以被配置成实施本申请实施例的一个或多个集成电路。
存储器2702可以包括用于数据或指令的大容量存储器。举例来说而非限制，存储器2702可包括硬盘驱动器(Hard Disk Drive，HDD)、软盘驱动器、闪存、光盘、磁光盘、磁带或通用串行总线(Universal Serial Bus，USB)驱动器或者两个或更多个以上这些的组合。在一个示例中，存储器2702可以包括可移除或不可移除(或固定)的介质，或者存储器2702是非易失性固态存储器。存储器2702可在综合网关容灾设备的内部或外部。
在一个示例中，存储器2702可以是只读存储器(Read Only Memory，ROM)。在一个示例中，该ROM可以是掩模编程的ROM、可编程ROM(PROM)、可擦除PROM(EPROM)、电可擦除PROM(EEPROM)、电可改写ROM (EAROM)或闪存或者两个或更多个以上这些的组合。
存储器2702可以包括只读存储器(ROM)，随机存取存储器(RAM)，磁盘存储介质设备，光存储介质设备，闪存设备，电气、光学或其他物理/有形的存储器存储设备。因此，通常，存储器包括一个或多个编码有包括计算机可执行指令的软件的有形(非暂态)计算机可读存储介质(例如，存储器设备)，并且当该软件被执行(例如，由一个或多个处理器)时，其可操作来执行参考根据本申请的一方面的方法所描述的操作。
处理器2701通过读取并执行存储器2702中存储的计算机程序指令，以实现上述显示面板的对位方法或显示面板的伽马调试方法中的方法/步骤，并达到上述显示面板的对位方法或显示面板的伽马调试方法执行其方法/步骤达到的相应技术效果，为简洁描述在此不再赘述。
在一个示例中，电子设备还可包括通信接口2703和总线2710。其中，如图27所示，处理器2701、存储器2702、通信接口2703通过总线2710连接并完成相互间的通信。
通信接口2703，主要用于实现本申请实施例中各模块、装置、单元和/或设备之间的通信。
总线2710包括硬件、软件或两者，将电子设备的部件彼此耦接在一起。举例来说而非限制，总线可包括加速图形端口(Accelerated Graphics Port，AGP)或其他图形总线、增强工业标准架构(Extended Industry Standard Architecture，EISA)总线、前端总线(Front Side Bus，FSB)、超传输(Hyper Transport，HT)互连、工业标准架构(Industry Standard Architecture，ISA)总线、无限带宽互连、低引脚数(LPC)总线、存储器总线、微信道架构(MCA)总线、外围组件互连(PCI)总线、PCI-Express(PCI-X)总线、串行高级技术附件(SATA)总线、视频电子标准协会局部(VLB)总线或其他合适的总线或者两个或更多个以上这些的组合。在合适的情况下，总线2710可包括一个或多个总线。尽管本申请实施例描述和示出了特定的总线，但本申请考虑任何合适的总线或互连。
另外，结合上述实施例中的显示面板的对位方法或显示面板的伽马调试方法，本申请实施例可提供一种计算机可读存储介质来实现。该计算机可读存储介质上存储有计算机程序指令；该计算机程序指令被处理器执行时实现上述实施例中的任意一种显示面板的对位方法或显示面板的伽马调试方法。计算机可读存储介质的示例包括非暂态计算机可读存储介质，如电子电路、半导体存储器设备、ROM、随机存取存储器、闪存、可擦除ROM(EROM)、软盘、CD-ROM、光盘、硬盘。
需要明确的是，本申请并不局限于上文所描述并在图中示出的特定配置和处理。为了简明起见，这里省略了对已知方法的详细描述。在上述实施例中，描述和示出了若干具体的步骤作为示例。但是，本申请的方法过程并不限于所描述和示出的具体步骤，本领域的技术人员可以在领会本申请的精神后，作出各种改变、修改和添加，或者改变步骤之间的顺序。
以上所述的结构框图中所示的功能块可以实现为硬件、软件、固件或者它们的组合。当以硬件方式实现时，其可以例如是电子电路、专用集成电路(Application Specific Integrated Circuit，ASIC)、适当的固件、插件、功能卡等等。当以软件方式实现时，本申请的元素是被用于执行所需任务的程序或者代码段。程序或者代码段可以存储在机器可读介质中，或者通过载波中携带的数据信号在传输介质或者通信链路上传送。“机器可读介质”可以包括能够存储或传输信息的任何介质。机器可读介质的例子包括电子电路、半导体存储器设备、ROM、闪存、可擦除ROM(EROM)、软盘、CD-ROM、光盘、硬盘、光纤介质、射频(Radio Frequency，RF)链路，等等。代码段可以经由诸如因特网、内联网等的计算机网络被下载。
还需要说明的是，本申请中提及的示例性实施例，基于一系列的步骤或者装置描述一些方法或系统。但是，本申请不局限于上述步骤的顺序，也就是说，可以按照实施例中提及的顺序执行步骤，也可以不同于实施例中的顺序，或者若干步骤同时执行。
上面参考根据本申请的实施例的方法、装置(系统)和计算机程序产品的流程图和/或框图描述了本申请的各方面。应当理解，流程图和/或框图中的每个方框以及流程图和/或框图中各方框的组合可以由计算机程序指令实现。这些计算机程序指令可被提供给通用计算机、专用计算机、或其它可编程数据处理装置的处理器，以产生一种机器，使得经由计算机或其它可编程数据处理装置的处理器执行的这些指令使能对流程图和/或框图的一个或多个方框中指定的功能/动作的实现。这种处理器可以是但不限于是通用处理器、专用处理器、特殊应用处理器或者现场可编程逻辑电路。还可理解，框图和/或流程图中的每个方框以及框图和/或流程图中的方框的组合，也可以由执行指定的功能或动作的专用硬件来实现，或可由专用硬件和计算机指令的组合来实现。
以上所述，仅为本申请的具体实施方式，所属领域的技术人员可以清楚地了解到，为了描述的方便和简洁，上述描述的系统、模块和单元的具体工作过程，可以参考前述方法实施例中的对应过程，在此不再赘述。应理解，本申请的保护范围并不局限于此，任何熟悉本技术领域的技术人员在本申请揭露的技术范围内，可轻易想到各种等效的修改或替换，这些修改或替换都应涵盖在本申请的保护范围之内。

Claims (10)

  1. 一种显示面板的对位方法，包括：控制显示面板的既定区域显示与探头尺寸相适配的对位图案，所述对位图案的亮度值小于既定区域周围其它区域的亮度值；
    控制所述探头从起始位置沿第一方向移动，并采集沿所述第一方向的第一移动路径上不同位置的多个第一亮度值，得到所述第一移动路径上最小的第一亮度值对应的第一坐标；
    控制所述探头沿第二方向移动，并采集沿所述第二方向的第二移动路径上不同位置的多个第二亮度值，得到所述第二移动路径上最小的第二亮度值对应的第二坐标，所述第二方向与所述第一方向交叉；
    根据所述第一坐标和所述第二坐标，确定对位位置。
  2. 根据权利要求1所述的对位方法，其中，所述采集沿所述第一方向的第一移动路径上不同位置的多个第一亮度值，得到所述第一移动路径上最小的第一亮度值对应的第一坐标，具体包括：
    判断所述第一移动路径上第i个位置对应的第一亮度值是否大于所述第一移动路径上第i-1个位置对应的第一亮度值，所述第i-1个位置为所述第i个位置的前一个位置，i为正整数；
    当所述第i个位置对应的第一亮度值大于所述第i-1个位置对应的第一亮度值时，将所述第i-1个位置的坐标确定为所述第一坐标；
    所述采集沿所述第二方向的第二移动路径上不同位置的多个第二亮度值，得到所述第二移动路径上最小的第二亮度值对应的第二坐标，具体包括：
    判断所述第二移动路径上第j个位置对应的第二亮度值是否大于所述第二移动路径上第j-1个位置对应的第二亮度值，所述第j-1个位置为所述第j个位置的前一个位置，j为正整数；
    当所述第j个位置对应的第二亮度值大于所述第j-1个位置对应的第二亮度值时，将所述第j-1个位置的坐标确定为所述第二坐标。
  3. 根据权利要求2所述的对位方法，其中，在将所述第i-1个位置的坐标确定为所述第一坐标之前，所述对位方法还包括：
    在所述第i个位置对应的第一亮度值大于所述第i-1个位置对应的第一亮度值的情况下，判断所述第一移动路径上第i+1个位置至第i+n个位置对应的第一亮度值是否均大于所述第一移动路径上第i-1个位置对应的第一亮度值，所述第i+1个位置为所述第i个位置的后一个位置，所述第i+n个位置为所述第i个位置的后n个位置，n为正整数；
    所述将所述第i-1个位置的坐标确定为所述第一坐标，具体包括：
    当所述第i+1个位置至所述第i+n个位置对应的第一亮度值均大于所述第i-1个位置对应的第一亮度值时，将所述第i-1个位置的坐标确定为所述第一坐标。
  4. 根据权利要求2或3所述的对位方法，其中，在控制所述探头沿第二方向移动之前，所述对位方法还包括：
    控制所述探头返回所述第i-1个位置；
    在所述得到所述第二移动路径上最小的第二亮度值对应的第二坐标之后，所述方法还包括：
    控制所述探头返回所述第j-1个位置。
  5. 根据权利要求2所述的对位方法，其中，所述对位方法还包括：
    控制所述探头沿所述第一方向反向移动，并采集第一反向移动路径上不同位置的多个第三亮度值，所述第一反向移动路径为沿所述第一方向反向移动的路径；
    判断所述第一反向移动路径上第p个位置对应的第三亮度值是否大于所述第一反向移动路径上第p-1个位置对应的第三亮度值，所述第p-1个位置为所述第p个位置的前一个位置，p为正整数；
    当所述第p个位置对应的第三亮度值大于所述第p-1个位置对应的第三亮度值时，判断所述第p-1个位置与所述第i-1个位置是否相同；
    所述当所述第i个位置对应的第一亮度值大于所述第i-1个位置对应的第一亮度值时，将所述第i-1个位置的坐标确定为所述第一坐标，具体包括：
    在所述第p-1个位置与所述第i-1个位置相同的情况下，将所述第i-1个位置的坐标确定为所述第一坐标；
    在所述第p-1个位置与所述第i-1个位置不相同的情况下，将所述第p-1个位置的坐标与所述第i-1个位置的坐标的平均值确定为所述第一坐标。
  6. 根据权利要求1所述的对位方法，其中，所述控制所述探头从起始位置沿第一方向移动，具体包括：
    判断所述第一移动路径上第x个位置对应的第一亮度值与所述第一移动路径上第x-1个位置对应的第一亮度值的大小关系，所述第x-1个位置为所述第x个位置的前一个位置，x为正整数；
    当所述第x个位置对应的第一亮度值等于所述第x-1个位置对应的第一亮度值时，控制所述探头以第一步进值和/或第一移动速度沿所述第一方向移动，直至所述第x个位置对应的第一亮度值小于所述第x-1个位置对应的第一亮度值；
    当所述第x个位置对应的第一亮度值小于所述第x-1个位置对应的第一亮度值时，控制所述探头以第二步进值和/或第二移动速度沿所述第一方向移动，直至得到所述第一移动路径上最小的第一亮度值对应的第一坐标；其中，所述第一步进值大于所述第二步进值，所述第一移动速度大于所述第二移动速度。
  7. 根据权利要求1所述的对位方法，其中，所述显示面板包括第一显示区和第二显示区，所述第二显示区的透光率 大于所述第一显示区的透光率；
    在所述探头尺寸大于所述第二显示区的尺寸时，以所述第二显示区的中心为所述对位图案的中心，基于所述第二显示区和靠近所述第二显示区的部分所述第一显示区显示所述对位图案；
    在所述探头尺寸小于或等于所述第二显示区的尺寸时，以所述第二显示区的中心为所述对位图案的中心，基于所述第二显示区显示所述对位图案；
    优选地，所述第二显示区包括透光区，所述第一显示区包括围绕所述透光区的过渡区，所述过渡区设置有驱动器件，所述透光区未设置所述驱动器件；在所述探头尺寸小于或等于所述透光区的尺寸时，以所述透光区的中心为所述对位图案的中心，基于所述透光区显示所述对位图案。
  8. 一种显示面板的伽马调试方法，所述显示面板包括第一显示区与第二显示区，其中，包括：
    控制所述探头移动至所述第一显示区，并对所述第一显示区进行伽马调试；
    基于如权利要求1至7中任一项所述的显示面板的对位方法，将所述探头移动至所述对位位置，所述对位图案至少部分位于所述第二显示区内；
    对所述第二显示区进行伽马调试。
  9. 一种显示面板的伽马调试装置，用于执行如权利要求8所述的显示面板的伽马调试方法，其中，包括：
    工作台，用于承载所述显示面板；
    第一传送部，位于所述工作台的至少一侧，且沿第一方向延伸；
    第二传送部，所述第二传送部沿第二方向延伸且悬于所述工作台上方，所述第二传送部与所述第一传送部连接，且所述第二传送部可沿第一方向相对所述第一传送部移动；
    夹持部，与所述第二传送部连接，且所述夹持部可沿第二方向相对所述第二传送部移动；
    探头，固定安装于所述夹持部；
    控制器，与所述第一传送部、所述第二传送部及探头连接。
  10. 根据权利要求9所述的装置，
    所述工作台上开设有第一凹槽和第二凹槽，所述第一凹槽用于放置所述显示面板，所述第二凹槽位于所述第一凹槽沿所述第一方向的一侧；
    所述伽马调试装置还包括发光部，所述发光部位于所述第二凹槽内，所述发光部呈条状且沿所述第二方向延伸设置；
    优选地，所述第一凹槽与所述第二凹槽连通。
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