WO2023221294A1 - Method for identifying ultraviolet radiation aging resistance degree of coating on insulator - Google Patents

Method for identifying ultraviolet radiation aging resistance degree of coating on insulator Download PDF

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WO2023221294A1
WO2023221294A1 PCT/CN2022/108448 CN2022108448W WO2023221294A1 WO 2023221294 A1 WO2023221294 A1 WO 2023221294A1 CN 2022108448 W CN2022108448 W CN 2022108448W WO 2023221294 A1 WO2023221294 A1 WO 2023221294A1
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sample
score
coating
preset
resistance
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PCT/CN2022/108448
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French (fr)
Chinese (zh)
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张爱文
万民涛
秦雪峰
刘�文
赵云涛
曹博然
王飞鹏
何杰
叶剑鹏
李剑
王强
黄正勇
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中国中原对外工程有限公司
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N13/00Investigating surface or boundary effects, e.g. wetting power; Investigating diffusion effects; Analysing materials by determining surface, boundary, or diffusion effects
    • G01N13/02Investigating surface tension of liquids
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N17/00Investigating resistance of materials to the weather, to corrosion, or to light
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N21/3563Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing solids; Preparation of samples therefor
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N13/00Investigating surface or boundary effects, e.g. wetting power; Investigating diffusion effects; Analysing materials by determining surface, boundary, or diffusion effects
    • G01N13/02Investigating surface tension of liquids
    • G01N2013/0208Investigating surface tension of liquids by measuring contact angle
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N2021/3595Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using FTIR
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02EREDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E10/00Energy generation through renewable energy sources
    • Y02E10/50Photovoltaic [PV] energy

Definitions

  • the present invention relates to the field of insulator coating evaluation, and specifically relates to a method for identifying the ultraviolet radiation aging resistance of a coating on an insulator.
  • the silicone rubber coating on the surface of the insulator will gradually age during operation. This process will cause the siloxane molecular chain to break, cross-link and oxidize the side chain groups, generate hydrophilic products such as silanol, reduce the hydrophobicity of the coating, and accumulate As the amount of pollution increases, the risk of flashover along the surface increases. At the same time, small molecule products produced by molecular chain breakage will also be washed away from the coating surface by rain or cleaning agents, destroying the surface integrity of the coating, exposing the inorganic fillers inside the coating, increasing the surface roughness of the coating, and further Increase the amount of dirt accumulated and reduce the insulation performance.
  • the purpose of the present invention is to provide a method for identifying the UV radiation aging resistance of a coating on an insulator to solve at least one drawback of the prior art.
  • the present invention provides a method for identifying the UV radiation aging resistance of a coating on an insulator, including:
  • Samples are obtained by taking focused samples from the coating surface on the insulator to be identified;
  • the characteristic absorption peak height H t of the sample is determined based on the heights of the four absorption peaks, and the characteristic absorption peak height H t of the sample is determined based on the preset height.
  • the standard characteristic absorption peak height H s determines the chemical bond score C 2 of the sample;
  • the aging degree of the sample is determined based on the total UV radiation resistance score of the sample.
  • the method further includes: cleaning the sample piece with absolute ethanol before the hydrophobicity test.
  • performing a hydrophobicity test on the sample piece and determining the static contact angle of the sample piece includes: performing a preset number of measurements on the sample piece after the hydrophobicity test; and taking the measurement results of the preset number of times. Mean; determine the mean as the static contact angle of the sample.
  • the preset angle is 80 degrees.
  • the preset height corresponding to the absorption peak is 10% of its corresponding preset standard absorption peak height.
  • the method for determining the characteristic absorption peak height H t of the sample is:
  • the method for determining the chemical bond score C 2 of the sample is:
  • the total ultraviolet radiation resistance score C of the sample is the weighted average of the hydrophobicity score C 1 and the chemical bond score C 2 .
  • determining the aging degree of the sample based on the total score of the sample's resistance to ultraviolet radiation includes: comparing the total score of resistance to ultraviolet radiation with a preset score; if the total score of resistance to ultraviolet radiation If the total score is less than the preset score, the life of the sample is determined to be terminated; if the total score of UV resistance is not less than the preset score, the total score of UV resistance is used as the sample. The basis for identification of the aging resistance to UV radiation.
  • the method of the present invention for identifying the UV radiation aging resistance of a coating on an insulator has the following beneficial effects:
  • the method used in the present invention takes into account both micro and macro multi-level indicators. Compared with the previous single indicator evaluation method, it is more comprehensive and can improve the accuracy of judging the UV radiation resistance of the coating on the insulator, and effectively identify the coating on the insulator. It can reduce the aging of ultraviolet radiation, reduce the probability of pollution flashover, and improve the practical safety of silicone rubber-coated insulators;
  • the method used in the present invention can effectively compare the UV radiation resistance of different types of silicone rubber coatings by standardizing the performance indicators of the silicone rubber coating;
  • the method used in the present invention combines the continuous score evaluation system with the graded judgment system, which can make the judgment results more consistent with the actual engineering requirements for the performance of silicone rubber coatings;
  • the method used in the present invention determines the remaining ultraviolet radiation resistance of the silicone rubber coating, and has a guiding role in supplementary spraying of the coating and other work.
  • Figure 1 is an exemplary flow chart of a method for identifying the UV radiation aging resistance of a coating on an insulator according to an embodiment of the present invention
  • Figure 2 is an infrared spectrum diagram of No. 1 insulator and No. 2 insulator according to an embodiment of the present invention.
  • the purpose of this application is to identify the UV radiation aging resistance of the coating on the insulator to solve the shortcomings of the existing methods. It has good application prospects and very important practical significance.
  • the overall concept of this application is: first, focus on sampling the coating surface on the insulator to be identified to obtain a sample; then conduct a hydrophobicity test and Fourier transform infrared spectrum test on the sample, and determine the static contact angle and the height of different absorption peaks. It is also used to judge the UV radiation resistance of the sample.
  • FIG. 1 is an exemplary flow chart of a method for identifying the UV radiation aging resistance of a coating on an insulator according to an embodiment of the present invention.
  • samples can be obtained by focusing on sampling the coating surface on the insulator to be identified.
  • samples may be taken from the upper surface of the uppermost insulator that has been exposed to ultraviolet irradiation for the longest time and with the highest intensity.
  • a metal wire can be used to ground the charge to release the charge, and then the most contaminated or roughest part of the upper surface is selected for sampling.
  • a square sample with a size of 10mm*10mm can be taken.
  • the size of the sampled piece can also be other values, and the shape of the sampled piece can also be other shapes besides square, such as rectangle, circle, etc.
  • a hydrophobicity test can be performed on the sample piece to determine the static contact angle ⁇ t of the sample piece.
  • the result of one measurement can be used as the static contact angle of the sample.
  • a preset number of measurements can be performed on the sample piece after the hydrophobicity test, and then the measurement results of the preset number of times are averaged, and then the average value is determined as the static contact angle of the sample piece.
  • the preset number of times may be 2, 3, 4, 5, 6, 7, 8, etc.
  • the sample may be cleaned first before performing the hydrophobicity test.
  • the cleaning material used can be absolute ethanol or other materials. After cleaning, it can be left for a period of time (for example, 24 hours), and the hydrophobicity test can be performed again after the hydrophobicity is fully restored.
  • the sample can be placed on the sample stage, and the tilt angle of the sample stage can be adjusted to make the surface of the sample horizontal. Then, a precision injector can be used to drop 5 ⁇ L of deionized water onto the surface of the sample, and then the test can be adjusted. The focal length of the instrument camera is adjusted to make the water droplet outline as clear as possible, and finally the static contact angle measurement software is used to read the static contact angle of the sample.
  • step 103 it may be determined whether the static contact angle ⁇ t is lower than a preset angle.
  • the preset angle can be any value between 70 degrees and 90 degrees or any value with a height of 90 degrees, such as 70 degrees, 71 degrees, 72 degrees, 73 degrees, 74 degrees, 75 degrees, 76 degrees, 77 degrees, 78 degrees, 79 degrees, 80 degrees, 81 degrees, 82 degrees, 83 degrees, 84 degrees, 85 degrees, 86 degrees, 87 degrees, 88 degrees, 89 degrees, 90, etc.
  • step 104 it can be determined that the sample piece has lost its ability to withstand ultraviolet radiation, that is, the life of the sample piece has ended.
  • the hydrophobicity score C of the sample can be determined based on the static contact angle ⁇ t and the preset standard static contact angle ⁇ s. 1 .
  • the standard static contact angle ⁇ s represents the static contact angle of the standard new sample.
  • the hydrophobicity score C 1 of the sample can be determined according to Equation 1.
  • C1 is the hydrophobicity score of the sample
  • ⁇ t is the static contact angle measured by the sample
  • ⁇ s is the standard new sample (that is, the same coating of the same insulator without any ultraviolet radiation or other physical and chemical changes) The static contact angle of the sample below).
  • the hydrophobicity score C 1 may be rounded to two decimal places.
  • the hydrophobicity score of the sample is an indication of the sample's ability to withstand UV radiation on a macroscopic level.
  • step 106 Fourier transform infrared spectrum testing can be performed on the sample to determine the heights of the four absorption peaks of Si-O-Si, Si(CH 3 ) 2 , Si-CH 3 and CH 3 (CH) in the infrared spectrum. They are recorded as H Si-O-Si , H Si(CH3)2 , H Si-CH3 and H CH3(CH) respectively.
  • step 106 can be performed at the same time as step 102, or step 102 can be performed first and then step 106, or step 106 can be performed first and then step 102. There is no limitation here.
  • step 107 it may be determined whether the height of any one of the four absorption peaks is less than its corresponding preset height.
  • Each absorption peak corresponds to a preset height.
  • the preset height corresponding to each absorption peak may be the preset standard absorption peak height corresponding to the absorption peak multiplied by a ratio. The proportion may be 10%, 15%, 20%, etc. or any other value.
  • the height of the standard absorption peak is the four absorption peaks of Si-O-Si, Si(CH 3 ) 2 , Si-CH 3 and CH 3 (CH) in the infrared spectrum of the new standard sample when performing Fourier transform infrared spectroscopy testing. the height of.
  • step 104 it can be determined that the sample has lost its ability to withstand ultraviolet radiation, that is, its life has expired.
  • the characteristic absorption peak height H of the sample can be determined based on the heights of the four absorption peaks. t , and determine the chemical bond score C 2 of the sample according to the preset standard characteristic absorption peak height H s .
  • the standard characteristic absorption peak height H s may represent the sum or weighted sum of the standard absorption peak heights of the four absorption peaks of the sample.
  • the chemical bond score of the sample is an indication of the sample's ability to withstand UV radiation at a microscopic level.
  • the characteristic absorption peak height H t of the sample can be determined according to Equation 2:
  • the characteristic absorption peak height H t of the sample may be a weighted sum of the heights of the four absorption peaks.
  • the chemical bond score C2 of the sample can be determined according to Equation 3:
  • the UV radiation resistance total score C of the sample can be determined based on the hydrophobicity score C 1 and the chemical bond score C 2 .
  • the total ultraviolet radiation resistance score C of the sample can be determined according to Equation 4:
  • the total ultraviolet radiation resistance score C of the sample can also be determined by summing the hydrophobicity score C 1 and the chemical bond score C 2 with other weights.
  • the aging degree of the sample may be determined based on the total ultraviolet radiation resistance score C of the sample. In some embodiments, if the total ultraviolet radiation resistance score C of the sample is lower than a preset score, it can be determined that the sample has lost its ability to withstand ultraviolet radiation, that is, the life of the sample has ended. If the total UV radiation resistance score C of the sample is not lower than the preset score, the high or low score of C will be used as the basis for judging the level of UV radiation resistance. The higher the C, the stronger the remaining ability of the sample to withstand UV radiation, that is, the less severe the degree of aging; conversely, the smaller the C, the weaker the remaining ability of the sample to withstand UV radiation, that is, the more serious the degree of aging. In some implementations, the preset score may be 30 points, 35 points, 40 points, or any other value less than 50 points.
  • This example is to test the ultraviolet radiation resistance of the silicone rubber coating of a suspended insulator in a coastal area of a country.
  • the insulator has been used for 13 months.
  • the No. 1 and No. 4 insulators suspended at the highest point among the insulator samples are selected.
  • the specific operations include : The operator puts on nitrile gloves, places the grounding wire on the surface of the insulator, and releases the residual charges of the two insulators; selects the most contaminated area on the upper surface of the insulator, draws a 10mm*10mm sampling area with a pencil, and uses a blade to Cut the sample piece from the surface of the insulator; clean the sample piece removed from the insulator with absolute ethanol to remove dirt, place it on a flat and clean ceramic base, and dry it in a dark place for 24 hours; place the sample piece on the sample stage and adjust The tilt angle of the sample stage makes the surface of the sample horizontal; use a precision injector to drop 5 ⁇ L deionized water on the surface of the sample; adjust the focus of the tester camera to make the water droplet outline as clear as possible; use static contact angle measurement software to read out the static state of the sample The contact angle was measured three times continuously. The measurement results are shown in Table 1.
  • test results are processed (for example, the methods described in steps 105 and 108), and the hydrophobicity score (ie, macro-level score) of No. 1 insulator is 94.92 points, and the chemical bond score (ie, micro-level score) is 72.66 points.
  • the total score is 83.8 points;
  • the hydrophobicity score (i.e., macro-level score) of No. 4 insulator is 95.24 points,
  • the chemical bond score i.e., micro-level score
  • the total score is 82.9 points.

Abstract

A method for identifying an ultraviolet radiation aging resistance degree of a coating on an insulator, comprising: carrying out focused sampling from a surface of a coating on an insulator to be identified to obtain a sample; carrying out a hydrophobicity test on the sample and determining a static contact angle of the sample; determining a hydrophobicity score according to the static contact angle of the sample; carrying out a Fourier transform infrared spectroscopy test on the sample and determining the heights of four absorption peaks Si-O-Si, Si(CH3)2, Si-CH3 and CH3(C-H) of the infrared spectrum; determining a chemical bond score; and jointly determining a total score of ultraviolet radiation resistance of the sample according to the hydrophobicity score and the chemical bond score, so as to determine an aging degree of the sample. According to the method, microscopic and macroscopic multi-level indexes are considered at the same time, the differentiation precision on ultraviolet radiation resistance of a coating on an insulator can be improved, and an ultraviolet radiation aging condition of the coating on the insulator is effectively identified.

Description

一种鉴别绝缘子上的涂层耐紫外辐照老化程度的方法A method for identifying the UV radiation aging resistance of coatings on insulators 技术领域Technical field
本发明涉及绝缘子涂层评测领域,具体涉及一种鉴别绝缘子上的涂层耐紫外辐照老化的方法。The present invention relates to the field of insulator coating evaluation, and specifically relates to a method for identifying the ultraviolet radiation aging resistance of a coating on an insulator.
背景技术Background technique
绝缘子表面的硅橡胶涂层在运行过程中会逐渐老化,该过程会使硅氧烷分子链断裂与侧链基团交联和氧化,生成硅醇等亲水产物,降低涂层憎水性,积污量增加,沿面闪络风险上升。与此同时,分子链断裂产生的小分子产物还会被雨水或清洗剂从涂层表面洗去,破坏涂层表面完整性,使得涂层内部的无机填料裸露,增加涂层表面粗糙度,进一步增加积污量进而降低绝缘性能。目前常用的静态接触角变化、表面元素含量变化、微观基团含量变化等单一指标分级评测方法原理较为简单,操作上难度较低,但存在指标考察不全与误判率较高的问题,对硅橡胶涂层耐辐照能力的判断效果并不理想。因此需要提出一种更加理想的鉴别绝缘子上的涂层耐紫外辐照老化程度的方法。The silicone rubber coating on the surface of the insulator will gradually age during operation. This process will cause the siloxane molecular chain to break, cross-link and oxidize the side chain groups, generate hydrophilic products such as silanol, reduce the hydrophobicity of the coating, and accumulate As the amount of pollution increases, the risk of flashover along the surface increases. At the same time, small molecule products produced by molecular chain breakage will also be washed away from the coating surface by rain or cleaning agents, destroying the surface integrity of the coating, exposing the inorganic fillers inside the coating, increasing the surface roughness of the coating, and further Increase the amount of dirt accumulated and reduce the insulation performance. Currently, the commonly used single index grading evaluation methods such as changes in static contact angle, changes in surface element content, and changes in microscopic group content are relatively simple in principle and low in operational difficulty. However, there are problems with incomplete inspection of indicators and a high misjudgment rate. For silicon The effect of judging the radiation resistance of rubber coatings is not ideal. Therefore, it is necessary to propose a more ideal method for identifying the UV radiation aging resistance of coatings on insulators.
发明内容Contents of the invention
鉴于以上所述现有技术的缺点,本发明的目的在于提供一种鉴别绝缘子上的涂层耐紫外辐照老化程度的方法,用于解决现有技术中的至少一个缺陷。In view of the above-mentioned shortcomings of the prior art, the purpose of the present invention is to provide a method for identifying the UV radiation aging resistance of a coating on an insulator to solve at least one drawback of the prior art.
为实现上述目的及其他相关目的,本发明提供一种鉴别绝缘子上的涂层耐紫外辐照老化程度的方法,包括:In order to achieve the above objects and other related objects, the present invention provides a method for identifying the UV radiation aging resistance of a coating on an insulator, including:
从待鉴别的绝缘子上的涂层表面重点取样得到样片;Samples are obtained by taking focused samples from the coating surface on the insulator to be identified;
对所述样片进行憎水性测试,确定所述样片的静态接触角θ tConduct a hydrophobicity test on the sample piece to determine the static contact angle θ t of the sample piece;
判断所述静态接触角θ t是否低于预设角度; Determine whether the static contact angle θ t is lower than a preset angle;
如果所述静态接触角θ t低于所述预设角度,则判定所述样片寿命终止; If the static contact angle θ t is lower than the preset angle, it is determined that the life of the sample is terminated;
如果所述静态接触角θ t不低于所述预设角度,则根据所述静态接触角θ t和预设标准静态接触角θ s确定所述样片的憎水性得分C 1If the static contact angle θ t is not lower than the preset angle, determine the hydrophobicity score C 1 of the sample based on the static contact angle θ t and the preset standard static contact angle θ s ;
对所述样片进行傅里叶红外光谱测试,确定红外光谱Si-O-Si、Si(CH 3) 2、Si-CH 3和CH 3(C-H)四种吸收峰的高度,分别记为H Si-O-Si、H Si(CH3)2、H Si-CH3和H CH3(C-H)Fourier transform infrared spectrum testing was performed on the sample to determine the heights of the four absorption peaks of Si-O-Si, Si(CH 3 ) 2 , Si-CH 3 and CH 3 (CH) in the infrared spectrum, which were recorded as H Si respectively. -O-Si , H Si(CH3)2 , H Si-CH3 and H CH3(CH) ;
判断所述四种吸收峰中的任意一个吸收峰高度是否小于其对应的预设高度,每个吸收峰对应一个预设高度;Determine whether the height of any one of the four absorption peaks is less than its corresponding preset height, and each absorption peak corresponds to a preset height;
如果所述四种吸收峰中的任意一个吸收峰高度小于其对应的预设高度,则判定所述样片 寿命终止;If the height of any one of the four absorption peaks is less than its corresponding preset height, it is determined that the life of the sample is terminated;
如果所述四种吸收峰中的任意一个吸收峰高度均不小于其对应的预设高度,则根据所述四种吸收峰的高度确定所述样片的特征吸收峰高度H t,并根据预设的标准特征吸收峰高度H s确定所述样片的化学键得分C 2If the height of any one of the four absorption peaks is not less than its corresponding preset height, then the characteristic absorption peak height H t of the sample is determined based on the heights of the four absorption peaks, and the characteristic absorption peak height H t of the sample is determined based on the preset height. The standard characteristic absorption peak height H s determines the chemical bond score C 2 of the sample;
根据所述憎水性得分C 1和所述化学键得分C 2,确定所述样片的耐紫外辐照总分C; According to the hydrophobicity score C 1 and the chemical bond score C 2 , determine the total ultraviolet radiation resistance score C of the sample;
根据所述样片的耐紫外辐照总分确定所述样片的老化程度。The aging degree of the sample is determined based on the total UV radiation resistance score of the sample.
可选地,所述方法还包括:在憎水性测试之前对所述样片使用无水乙醇进行清洗。Optionally, the method further includes: cleaning the sample piece with absolute ethanol before the hydrophobicity test.
可选地,所述对所述样片进行憎水性测试,确定所述样片的静态接触角包括:对进行憎水性测试后的样片进行预设次数的测量;对所述预设次数的测量结果取均值;将所述均值确定为所述样片的静态接触角。Optionally, performing a hydrophobicity test on the sample piece and determining the static contact angle of the sample piece includes: performing a preset number of measurements on the sample piece after the hydrophobicity test; and taking the measurement results of the preset number of times. Mean; determine the mean as the static contact angle of the sample.
可选地,所述预设角度为80度。Optionally, the preset angle is 80 degrees.
可选地,所述吸收峰对应的预设高度为其对应的预设的标准吸收峰高度的10%。Optionally, the preset height corresponding to the absorption peak is 10% of its corresponding preset standard absorption peak height.
可选地,所述样片的特征吸收峰高度H t的确定方法为: Optionally, the method for determining the characteristic absorption peak height H t of the sample is:
Figure PCTCN2022108448-appb-000001
Figure PCTCN2022108448-appb-000001
可选地,所述样片的化学键得分C 2的确定方法为: Optionally, the method for determining the chemical bond score C 2 of the sample is:
Figure PCTCN2022108448-appb-000002
Figure PCTCN2022108448-appb-000002
可选地,所述样片的耐紫外辐照总分C为所述憎水性得分C 1和所述化学键得分C 2的加权平均值。 Optionally, the total ultraviolet radiation resistance score C of the sample is the weighted average of the hydrophobicity score C 1 and the chemical bond score C 2 .
可选地,所述样片的耐紫外辐照总分C的确定方法为C=0.5C 1+0.5C 2Optionally, the method for determining the total ultraviolet radiation resistance score C of the sample is C=0.5C 1 +0.5C 2 .
可选地,所述根据所述样片的耐紫外辐照总分确定所述样片的老化程度包括:将所述耐紫外辐照总分与一预设分数进行比较;如果所述耐紫外辐照总分小于所述预设分数,则判定所述样片寿命终止;如果所述耐紫外辐照总分不小于所述预设分数,则以所述耐紫外辐照总分的高低作为所述样片的耐紫外辐照老化程度的鉴定依据。Optionally, determining the aging degree of the sample based on the total score of the sample's resistance to ultraviolet radiation includes: comparing the total score of resistance to ultraviolet radiation with a preset score; if the total score of resistance to ultraviolet radiation If the total score is less than the preset score, the life of the sample is determined to be terminated; if the total score of UV resistance is not less than the preset score, the total score of UV resistance is used as the sample. The basis for identification of the aging resistance to UV radiation.
如上所述,本发明的一种鉴别绝缘子上的涂层耐紫外辐照老化程度的方法,具有以下有益效果:As mentioned above, the method of the present invention for identifying the UV radiation aging resistance of a coating on an insulator has the following beneficial effects:
1、本发明使用的方法同时考虑了微观与宏观多层面指标,相比以往单一指标评测方法,考虑更加全面,能够提高绝缘子上涂层的耐紫外辐照能力的判别精度,有效鉴别绝缘子上涂层紫外辐照老化情况,同时可以降低污闪概率,提升硅橡胶涂覆绝缘子的实用安全性;1. The method used in the present invention takes into account both micro and macro multi-level indicators. Compared with the previous single indicator evaluation method, it is more comprehensive and can improve the accuracy of judging the UV radiation resistance of the coating on the insulator, and effectively identify the coating on the insulator. It can reduce the aging of ultraviolet radiation, reduce the probability of pollution flashover, and improve the practical safety of silicone rubber-coated insulators;
2、本发明使用的方法通过将硅橡胶涂层的性能指标规范化,可以有效对比不同种类的硅 橡胶涂层耐紫外辐照能力;2. The method used in the present invention can effectively compare the UV radiation resistance of different types of silicone rubber coatings by standardizing the performance indicators of the silicone rubber coating;
3、本发明使用的方法将连续性的分数评价体系与分级判定体系结合,可以使判断结果与工程实际对硅橡胶涂层性能的要求更加贴合;3. The method used in the present invention combines the continuous score evaluation system with the graded judgment system, which can make the judgment results more consistent with the actual engineering requirements for the performance of silicone rubber coatings;
4、本发明使用的方法通过对硅橡胶涂层剩余耐紫外辐照能力进行判定,对涂层补充喷涂等工作具有指导作用。4. The method used in the present invention determines the remaining ultraviolet radiation resistance of the silicone rubber coating, and has a guiding role in supplementary spraying of the coating and other work.
附图说明Description of the drawings
图1是根据本发明的一个实施例所示的鉴别绝缘子上的涂层耐紫外辐照老化程度的方法的示例性流程图;Figure 1 is an exemplary flow chart of a method for identifying the UV radiation aging resistance of a coating on an insulator according to an embodiment of the present invention;
图2是根据本发明的一个实施例所示的1号绝缘子和2号绝缘子红外光谱图。Figure 2 is an infrared spectrum diagram of No. 1 insulator and No. 2 insulator according to an embodiment of the present invention.
具体实施方式Detailed ways
以下通过特定的具体实例说明本发明的实施方式,本领域技术人员可由本说明书所揭露的内容轻易地了解本发明的其他优点与功效。本发明还可以通过另外不同的具体实施方式加以实施或应用,本说明书中的各项细节也可以基于不同观点与应用,在没有背离本发明的精神下进行各种修饰或改变。需说明的是,在不冲突的情况下,以下实施例及实施例中的特征可以相互组合。The following describes the embodiments of the present invention through specific examples. Those skilled in the art can easily understand other advantages and effects of the present invention from the content disclosed in this specification. The present invention can also be implemented or applied through other different specific embodiments. Various details in this specification can also be modified or changed in various ways based on different viewpoints and applications without departing from the spirit of the present invention. It should be noted that, as long as there is no conflict, the following embodiments and the features in the embodiments can be combined with each other.
需要说明的是,以下实施例中所提供的图示仅以示意方式说明本发明的基本构想,遂图式中仅显示与本发明中有关的组件而非按照实际实施时的组件数目、形状及尺寸绘制,其实际实施时各组件的型态、数量及比例可为一种随意的改变,且其组件布局型态也可能更为复杂。It should be noted that the diagrams provided in the following embodiments only illustrate the basic concept of the present invention in a schematic manner, and the drawings only show the components related to the present invention and do not follow the number, shape and number of components during actual implementation. Dimension drawing, in actual implementation, the type, quantity and proportion of each component can be arbitrarily changed, and the component layout type may also be more complex.
本申请以鉴别绝缘子上的涂层耐紫外辐照老化程度为目的,以解决现有方法的不足,具有良好的应用前景和十分重要的现实意义。The purpose of this application is to identify the UV radiation aging resistance of the coating on the insulator to solve the shortcomings of the existing methods. It has good application prospects and very important practical significance.
本申请的总体构思为:首先从待鉴别的绝缘子上的涂层表面重点取样得到样片;接着对样片进行憎水性测试和傅里叶红外光谱测试,通过确定静态接触角以及不同吸收峰的高度来同时用于判断样片的耐紫外辐照能力。The overall concept of this application is: first, focus on sampling the coating surface on the insulator to be identified to obtain a sample; then conduct a hydrophobicity test and Fourier transform infrared spectrum test on the sample, and determine the static contact angle and the height of different absorption peaks. It is also used to judge the UV radiation resistance of the sample.
图1是根据本发明的一个实施例所示的鉴别绝缘子上的涂层耐紫外辐照老化程度的方法的示例性流程图。FIG. 1 is an exemplary flow chart of a method for identifying the UV radiation aging resistance of a coating on an insulator according to an embodiment of the present invention.
在步骤101可以从待鉴别的绝缘子上的涂层表面重点取样得到样片。在一些实施例中,可以从受紫外辐照时间最长且强度最高的最上层绝缘子的上表面取样。在一些实施例中,在取样前,可以使用金属导线接地的方法释放电荷,再从上表面选取积污最严重或表面最粗糙的部分进行取样。在一些实施例中,可以取大小为10mm*10mm的正方形样品1片。在其他 实施例中,所取样片的尺寸还可以是其他数值,所取样片的形状也可以是除正方形以外的其他形状,例如,长方形、圆形等。In step 101, samples can be obtained by focusing on sampling the coating surface on the insulator to be identified. In some embodiments, samples may be taken from the upper surface of the uppermost insulator that has been exposed to ultraviolet irradiation for the longest time and with the highest intensity. In some embodiments, before sampling, a metal wire can be used to ground the charge to release the charge, and then the most contaminated or roughest part of the upper surface is selected for sampling. In some embodiments, a square sample with a size of 10mm*10mm can be taken. In other embodiments, the size of the sampled piece can also be other values, and the shape of the sampled piece can also be other shapes besides square, such as rectangle, circle, etc.
在步骤102,可以对所述样片进行憎水性测试,确定所述样片的静态接触角θ t。在一些实施例中,可以将一次测量的结果作为所述样片的静态接触角。在一些实施例中,可以对进行憎水性测试后的样片进行预设次数的测量,然后对所述预设次数的测量结果取均值,再将所述均值确定为所述样片的静态接触角。所述预设次数可以是2、3、4、5、6、7、8等。 In step 102, a hydrophobicity test can be performed on the sample piece to determine the static contact angle θ t of the sample piece. In some embodiments, the result of one measurement can be used as the static contact angle of the sample. In some embodiments, a preset number of measurements can be performed on the sample piece after the hydrophobicity test, and then the measurement results of the preset number of times are averaged, and then the average value is determined as the static contact angle of the sample piece. The preset number of times may be 2, 3, 4, 5, 6, 7, 8, etc.
在一些实施例中,在进行憎水性测试之前还可以首先对样片进行清洗。使用的清洗材料可以是无水乙醇或其他材料。在进行清洗之后还可以放置一段时间(例如,24小时),等憎水性充分恢复之后再进行憎水性测试。在一些实施例中,可以将样片放置在样品台上,调节样品台的倾斜角度,使样片表面水平,接着,可以使用精准加样器,向样片表面滴加5μL的去离子水,然后调节测试仪摄像头焦距,使得水滴轮廓尽可能清晰,最后使用静态接触角测量软件读出样片静态接触角。In some embodiments, the sample may be cleaned first before performing the hydrophobicity test. The cleaning material used can be absolute ethanol or other materials. After cleaning, it can be left for a period of time (for example, 24 hours), and the hydrophobicity test can be performed again after the hydrophobicity is fully restored. In some embodiments, the sample can be placed on the sample stage, and the tilt angle of the sample stage can be adjusted to make the surface of the sample horizontal. Then, a precision injector can be used to drop 5 μL of deionized water onto the surface of the sample, and then the test can be adjusted. The focal length of the instrument camera is adjusted to make the water droplet outline as clear as possible, and finally the static contact angle measurement software is used to read the static contact angle of the sample.
在步骤103,可以判断所述静态接触角θ t是否低于预设角度。所述预设角度可以是70度到90度之间的任意值或高度90度的任意值,如70度、71度、72度、73度、74度、75度、76度、77度、78度、79度、80度、81度、82度、83度、84度、85度、86度、87度、88度、89度、90等。 In step 103, it may be determined whether the static contact angle θ t is lower than a preset angle. The preset angle can be any value between 70 degrees and 90 degrees or any value with a height of 90 degrees, such as 70 degrees, 71 degrees, 72 degrees, 73 degrees, 74 degrees, 75 degrees, 76 degrees, 77 degrees, 78 degrees, 79 degrees, 80 degrees, 81 degrees, 82 degrees, 83 degrees, 84 degrees, 85 degrees, 86 degrees, 87 degrees, 88 degrees, 89 degrees, 90, etc.
如果判断所述静态接触角θ t低于所述预设角度,则在步骤104,可以判定所述样片失去耐紫外辐照能力,即样片寿命终止。 If it is determined that the static contact angle θ t is lower than the preset angle, then in step 104, it can be determined that the sample piece has lost its ability to withstand ultraviolet radiation, that is, the life of the sample piece has ended.
如果判断所述静态接触角θ t不低于所述预设角度,则在步骤105,可以根据所述静态接触角θ t和预设标准静态接触角θ s确定所述样片的憎水性得分C 1。所述标准静态接触角θ s表示标准新样品的静态接触角。在一些实施例中,所述样片的憎水性得分C 1可以根据式1确定。 If it is determined that the static contact angle θ t is not lower than the preset angle, then in step 105, the hydrophobicity score C of the sample can be determined based on the static contact angle θ t and the preset standard static contact angle θ s. 1 . The standard static contact angle θ s represents the static contact angle of the standard new sample. In some embodiments, the hydrophobicity score C 1 of the sample can be determined according to Equation 1.
Figure PCTCN2022108448-appb-000003
Figure PCTCN2022108448-appb-000003
其中,C1为所述样片的憎水性得分,θ t为样品测得的静态接触角,θ s为标准新样品(即相同绝缘子的相同涂层在未经过任何紫外线辐照或其他物理化学变化情况下的样本)的静态接触角。在一些实施例中,可以对憎水性得分C 1保留两位小数。所述样片的憎水性得分是样本在宏观层面上对耐紫外辐照的能力的表征。 Among them, C1 is the hydrophobicity score of the sample, θ t is the static contact angle measured by the sample, θ s is the standard new sample (that is, the same coating of the same insulator without any ultraviolet radiation or other physical and chemical changes) The static contact angle of the sample below). In some embodiments, the hydrophobicity score C 1 may be rounded to two decimal places. The hydrophobicity score of the sample is an indication of the sample's ability to withstand UV radiation on a macroscopic level.
在步骤106,可以对所述样片进行傅里叶红外光谱测试,确定红外光谱Si-O-Si、Si(CH 3) 2、Si-CH 3和CH 3(C-H)四种吸收峰的高度,分别记为H Si-O-Si、H Si(CH3)2、H Si-CH3和H CH3(C-H)In step 106, Fourier transform infrared spectrum testing can be performed on the sample to determine the heights of the four absorption peaks of Si-O-Si, Si(CH 3 ) 2 , Si-CH 3 and CH 3 (CH) in the infrared spectrum. They are recorded as H Si-O-Si , H Si(CH3)2 , H Si-CH3 and H CH3(CH) respectively.
在一些实施例中,可以打开傅里叶红外光谱仪与上位控制机并对仪器进行初始化,然后 将空白片放在测试仪的样品台上,对准分数器的出口,接着,点击背景按钮,测试背景光谱,然后将空白片换位待测样本,选择测试模式,从而测试红外光谱,最后标出红外光谱图上的设计特征峰,还可以对测试结果进一步保存。In some embodiments, you can turn on the Fourier transform infrared spectrometer and the host controller and initialize the instrument, then place the blank piece on the sample stage of the tester, align it with the outlet of the fractionator, and then click the background button to test. background spectrum, then replace the blank piece with the sample to be tested, select the test mode to test the infrared spectrum, and finally mark the design characteristic peaks on the infrared spectrum, and the test results can be further saved.
需要注意的是,步骤106可以是和步骤102同时进行的,也可以是先执行步骤102再执行步骤106,也可以先执行步骤106再执行步骤102,这里不做限制。It should be noted that step 106 can be performed at the same time as step 102, or step 102 can be performed first and then step 106, or step 106 can be performed first and then step 102. There is no limitation here.
在步骤107,可以判断所述四种吸收峰中的任意一个吸收峰高度是否小于其对应的预设高度。每个吸收峰均对应一个预设高度。在一些实施例中,每个吸收峰对应的预设高度可以是该吸收峰对应的预设的标准吸收峰高度乘以一个比例。所述比例可以是10%、15%、20%等或其他任意数值。所述标准吸收峰高度是标准新样品的在进行傅里叶红外光谱测试时,红外光谱Si-O-Si、Si(CH 3) 2、Si-CH 3和CH 3(C-H)四种吸收峰的高度。 In step 107, it may be determined whether the height of any one of the four absorption peaks is less than its corresponding preset height. Each absorption peak corresponds to a preset height. In some embodiments, the preset height corresponding to each absorption peak may be the preset standard absorption peak height corresponding to the absorption peak multiplied by a ratio. The proportion may be 10%, 15%, 20%, etc. or any other value. The height of the standard absorption peak is the four absorption peaks of Si-O-Si, Si(CH 3 ) 2 , Si-CH 3 and CH 3 (CH) in the infrared spectrum of the new standard sample when performing Fourier transform infrared spectroscopy testing. the height of.
如果判断所述四种吸收峰中的任意一个吸收峰高度小于其对应的预设高度,则在步骤104,可以判定所述样片失去耐紫外辐照能力,即寿命终止。If it is determined that the height of any one of the four absorption peaks is less than its corresponding preset height, then in step 104, it can be determined that the sample has lost its ability to withstand ultraviolet radiation, that is, its life has expired.
如果判断所述四种吸收峰中的任意一个吸收峰高度均不小于其对应的预设高度,则在步骤108,可以根据所述四种吸收峰的高度确定所述样片的特征吸收峰高度H t,并根据预设的标准特征吸收峰高度H s确定所述样片的化学键得分C 2。在一些实施例中,所述标准特征吸收峰高度H s可以表示样片的四种吸收峰的标准吸收峰高度的和或加权求和值。所述样片的化学键得分是样片在微观层面上对耐紫外辐照的能力的表征。 If it is determined that the height of any one of the four absorption peaks is not less than its corresponding preset height, then in step 108, the characteristic absorption peak height H of the sample can be determined based on the heights of the four absorption peaks. t , and determine the chemical bond score C 2 of the sample according to the preset standard characteristic absorption peak height H s . In some embodiments, the standard characteristic absorption peak height H s may represent the sum or weighted sum of the standard absorption peak heights of the four absorption peaks of the sample. The chemical bond score of the sample is an indication of the sample's ability to withstand UV radiation at a microscopic level.
在一些实施例中,所述样片的特征吸收峰高度H t可以根据式2确定: In some embodiments, the characteristic absorption peak height H t of the sample can be determined according to Equation 2:
Figure PCTCN2022108448-appb-000004
Figure PCTCN2022108448-appb-000004
在一些实施例中,所述样片的特征吸收峰高度H t可以是所述四种吸收峰的高度的加权求和值。 In some embodiments, the characteristic absorption peak height H t of the sample may be a weighted sum of the heights of the four absorption peaks.
在一些实施例中,所述样片的化学键得分C 2可以根据式3确定: In some embodiments, the chemical bond score C2 of the sample can be determined according to Equation 3:
Figure PCTCN2022108448-appb-000005
Figure PCTCN2022108448-appb-000005
在步骤109,可以根据所述憎水性得分C 1和所述化学键得分C 2,确定所述样片的耐紫外辐照总分C。 In step 109, the UV radiation resistance total score C of the sample can be determined based on the hydrophobicity score C 1 and the chemical bond score C 2 .
在一些实施例中所述样片的耐紫外辐照总分C可以根据式4确定:In some embodiments, the total ultraviolet radiation resistance score C of the sample can be determined according to Equation 4:
C=0.5C 1+0.5C 2。                              (式4) C=0.5C 1 +0.5C 2 . (Formula 4)
在一些实施例中,所述样片的耐紫外辐照总分C的确定还可以是将憎水性得分C 1和所述化学键得分C 2以其他权重进行求和。 In some embodiments, the total ultraviolet radiation resistance score C of the sample can also be determined by summing the hydrophobicity score C 1 and the chemical bond score C 2 with other weights.
在步骤110,可以根据所述样片的耐紫外辐照总分C确定所述样片的老化程度。在一些实施例中,如果样片的耐紫外辐照总分C低于预设分数,则可以判定样片失去耐紫外辐照能力,即样片寿命终止。如果样片的耐紫外辐照总分C不低于所述预设分数,则以C的高低分数作为耐紫外辐照能力高低的判断依据。C越高,则说明样片剩余的耐紫外辐照能力越强,也就是老化程度越不严重;反之,C越小,则说明样片剩余的耐紫外辐照能力越弱,即老化程度越严重。在一些实施中,所述预设分数可以是30分、35分、40分或其他任一小于50分的值。In step 110, the aging degree of the sample may be determined based on the total ultraviolet radiation resistance score C of the sample. In some embodiments, if the total ultraviolet radiation resistance score C of the sample is lower than a preset score, it can be determined that the sample has lost its ability to withstand ultraviolet radiation, that is, the life of the sample has ended. If the total UV radiation resistance score C of the sample is not lower than the preset score, the high or low score of C will be used as the basis for judging the level of UV radiation resistance. The higher the C, the stronger the remaining ability of the sample to withstand UV radiation, that is, the less severe the degree of aging; conversely, the smaller the C, the weaker the remaining ability of the sample to withstand UV radiation, that is, the more serious the degree of aging. In some implementations, the preset score may be 30 points, 35 points, 40 points, or any other value less than 50 points.
以下示出具体的实施例用于说明本发明的技术方案。Specific examples are shown below to illustrate the technical solutions of the present invention.
本例为测试某国滨海地区悬挂式绝缘子硅橡胶涂层的耐紫外辐照能力,该绝缘子已使用时间为13个月;挑选绝缘子样品中悬挂在最高处的1号与4号绝缘子,具体操作包括:操作人员戴上丁腈手套,将接地导线置于绝缘子表面,释放两绝缘子的残余电荷;在绝缘子上表面选取积污最严重的的区域,用铅笔画出10mm*10mm的取样区,使用刀片将样片从绝缘子表面切下;将从绝缘子上取下的样片用无水乙醇清洗,去除污秽,置于平整干净的陶瓷基底上,并于避光处干燥24h;将样片放置在样品台上,调节样品台的倾斜角度,使样片表面水平;使用精准加样器,向样片表面滴加5μL去离子水;调节测试仪摄像头焦距,使水滴轮廓尽可能清晰;使用静态接触角测量软件读出样片静态接触角,连续测量3次,测量结果见表1。This example is to test the ultraviolet radiation resistance of the silicone rubber coating of a suspended insulator in a coastal area of a country. The insulator has been used for 13 months. The No. 1 and No. 4 insulators suspended at the highest point among the insulator samples are selected. The specific operations include : The operator puts on nitrile gloves, places the grounding wire on the surface of the insulator, and releases the residual charges of the two insulators; selects the most contaminated area on the upper surface of the insulator, draws a 10mm*10mm sampling area with a pencil, and uses a blade to Cut the sample piece from the surface of the insulator; clean the sample piece removed from the insulator with absolute ethanol to remove dirt, place it on a flat and clean ceramic base, and dry it in a dark place for 24 hours; place the sample piece on the sample stage and adjust The tilt angle of the sample stage makes the surface of the sample horizontal; use a precision injector to drop 5 μL deionized water on the surface of the sample; adjust the focus of the tester camera to make the water droplet outline as clear as possible; use static contact angle measurement software to read out the static state of the sample The contact angle was measured three times continuously. The measurement results are shown in Table 1.
样片Samples 参考标准样片Reference standard samples 1号绝缘子No. 1 insulator 4号绝缘子No. 4 insulator
第一次测试first test 110.4110.4 109.8109.8 110.8110.8
第二次测试second test 112.3112.3 110.3110.3 110.1110.1
第三次测试third test 111.8111.8 109.5109.5 109.1109.1
均值(保留一位小数)Mean (rounded to one decimal place) 111.5111.5 109.9109.9 110.0110.0
表1Table 1
接着,用无纺布擦去样片表面水滴;打开傅里叶红外光谱测试仪与上位控制机并初始化仪器;由于本次测试使用仪器自动化程度更高,无需测试背景光谱,因此直接将样片放在测试仪的样品台上,对准分束器的出光口,选择测试模式,测试红外光谱,1号绝缘子和4号绝缘子红外光谱图如图2所示。1号绝缘子和4号绝缘子的关键特征峰高度如表2所示。Next, wipe off the water droplets on the surface of the sample with a non-woven cloth; turn on the Fourier transform infrared spectrometer tester and the host controller and initialize the instrument; since the instrument used in this test is more automated, there is no need to test the background spectrum, so the sample is directly placed on On the sample stage of the tester, align it with the light outlet of the beam splitter, select the test mode, and test the infrared spectrum. The infrared spectra of No. 1 insulator and No. 4 insulator are shown in Figure 2. The key characteristic peak heights of No. 1 insulator and No. 4 insulator are shown in Table 2.
样片Samples 参考标准样片Reference standard samples 1号绝缘子No. 1 insulator 4号绝缘子No. 4 insulator
Si-O-SiSi-O-Si 1.075751.07575 0.845060.84506 0.923590.92359
Si(CH 3) 2 Si(CH 3 ) 2 1.148771.14877 0.738680.73868 0.671330.67133
Si-CH 3 Si-CH 3 0.400630.40063 0.36940.3694 0.308280.30828
CH 3(C-H) CH 3 (CH) 0.096290.09629 0.098660.09866 0.095950.09595
表2Table 2
最后,对测试结果进行处理(例如步骤105和步骤108中描述的方法),得到1号绝缘子的憎水性得分(即宏观层面得分)为94.92分,化学键得分(即微观层面得分)为72.66分,总得分为83.8分;4号绝缘子的憎水性得分(即宏观层面得分)为95.24分,化学键得分(即微观层面得分)为70.51分,总得分为82.9分。Finally, the test results are processed (for example, the methods described in steps 105 and 108), and the hydrophobicity score (ie, macro-level score) of No. 1 insulator is 94.92 points, and the chemical bond score (ie, micro-level score) is 72.66 points. The total score is 83.8 points; the hydrophobicity score (i.e., macro-level score) of No. 4 insulator is 95.24 points, the chemical bond score (i.e., micro-level score) is 70.51 points, and the total score is 82.9 points.
由测试结果可知,两种绝缘子耐紫外辐照能力良好,即老化不严重,综合性能衰退不明显。It can be seen from the test results that the two insulators have good UV radiation resistance, that is, the aging is not serious and the overall performance decline is not obvious.
以上所述实施例仅是为充分说明本发明而所举的较佳的实施例,本发明的保护范围不限于此。本技术领域的技术人员在本发明基础上所作的等同替代或变换,均在本发明的保护范围之内。本发明的保护范围以权利要求书为准。The above-described embodiments are only preferred embodiments to fully illustrate the present invention, and the protection scope of the present invention is not limited thereto. Equivalent substitutions or transformations made by those skilled in the art on the basis of the present invention are within the protection scope of the present invention. The protection scope of the present invention shall be determined by the claims.

Claims (10)

  1. 一种鉴别绝缘子上的涂层耐紫外辐照老化程度的方法,其特征在于,包括:A method for identifying the UV radiation aging resistance of coatings on insulators, which is characterized by including:
    从待鉴别的绝缘子上的涂层表面重点取样得到样片;Samples are obtained by taking focused samples from the coating surface on the insulator to be identified;
    对所述样片进行憎水性测试,确定所述样片的静态接触角θ tConduct a hydrophobicity test on the sample piece to determine the static contact angle θ t of the sample piece;
    判断所述静态接触角θ t是否低于预设角度; Determine whether the static contact angle θ t is lower than a preset angle;
    如果所述静态接触角θ t低于所述预设角度,则判定所述样片寿命终止; If the static contact angle θ t is lower than the preset angle, it is determined that the life of the sample is terminated;
    如果所述静态接触角θ t不低于所述预设角度,则根据所述静态接触角θ t和预设标准静态接触角θ s确定所述样片的憎水性得分C 1If the static contact angle θ t is not lower than the preset angle, determine the hydrophobicity score C 1 of the sample based on the static contact angle θ t and the preset standard static contact angle θ s ;
    对所述样片进行傅里叶红外光谱测试,确定红外光谱Si-O-Si、Si(CH 3) 2、Si-CH 3和CH 3(C-H)四种吸收峰的高度,分别记为H Si-O-Si、H Si(CH3)2、H Si-CH3和H CH3(C-H)Fourier transform infrared spectrum testing was performed on the sample to determine the heights of the four absorption peaks of Si-O-Si, Si(CH 3 ) 2 , Si-CH 3 and CH 3 (CH) in the infrared spectrum, which were recorded as H Si respectively. -O-Si , H Si(CH3)2 , H Si-CH3 and H CH3(CH) ;
    判断所述四种吸收峰中的任意一个吸收峰高度是否小于其对应的预设高度,每个吸收峰对应一个预设高度;Determine whether the height of any one of the four absorption peaks is less than its corresponding preset height, and each absorption peak corresponds to a preset height;
    如果所述四种吸收峰中的任意一个吸收峰高度小于其对应的预设高度,则判定所述样片寿命终止;If the height of any one of the four absorption peaks is less than its corresponding preset height, it is determined that the life of the sample is terminated;
    如果所述四种吸收峰中的任意一个吸收峰高度均不小于其对应的预设高度,则根据所述四种吸收峰的高度确定所述样片的特征吸收峰高度H t,并根据预设的标准特征吸收峰高度H s确定所述样片的化学键得分C 2If the height of any one of the four absorption peaks is not less than its corresponding preset height, then the characteristic absorption peak height H t of the sample is determined based on the heights of the four absorption peaks, and the characteristic absorption peak height H t of the sample is determined based on the preset height. The standard characteristic absorption peak height H s determines the chemical bond score C 2 of the sample;
    根据所述憎水性得分C 1和所述化学键得分C 2,确定所述样片的耐紫外辐照总分C; According to the hydrophobicity score C 1 and the chemical bond score C 2 , determine the total ultraviolet radiation resistance score C of the sample;
    根据所述样片的耐紫外辐照总分确定所述样片的老化程度。The aging degree of the sample is determined based on the total UV radiation resistance score of the sample.
  2. 根据权利要求1所述的鉴别绝缘子上的涂层耐紫外辐照老化程度的方法,其特征在于,所述方法还包括:在憎水性测试之前对所述样片使用无水乙醇进行清洗。The method for identifying the ultraviolet radiation aging resistance of a coating on an insulator according to claim 1, characterized in that the method further includes: cleaning the sample piece with absolute ethanol before the hydrophobicity test.
  3. 根据权利要求1所述的鉴别绝缘子上的涂层耐紫外辐照老化程度的方法,其特征在于,所述对所述样片进行憎水性测试,确定所述样片的静态接触角包括:The method for identifying the UV radiation aging resistance of a coating on an insulator according to claim 1, characterized in that said performing a hydrophobicity test on the sample piece and determining the static contact angle of the sample piece includes:
    对进行憎水性测试后的样片进行预设次数的测量;Measure the sample pieces after the hydrophobicity test for a preset number of times;
    对所述预设次数的测量结果取均值;Average the measurement results of the preset number of times;
    将所述均值确定为所述样片的静态接触角。The mean value was determined as the static contact angle of the coupon.
  4. 根据权利要求1所述的鉴别绝缘子上的涂层耐紫外辐照老化程度的方法,其特征在于,所述预设角度为80度。The method for identifying the UV radiation aging resistance of a coating on an insulator according to claim 1, wherein the preset angle is 80 degrees.
  5. 根据权利要求1所述的鉴别绝缘子上的涂层耐紫外辐照老化程度的方法,其特征在于,所 述吸收峰对应的预设高度为其对应的预设的标准吸收峰高度的10%。The method for identifying the UV radiation aging resistance of a coating on an insulator according to claim 1, wherein the preset height corresponding to the absorption peak is 10% of the corresponding preset standard absorption peak height.
  6. 根据权利要求1所述的鉴别绝缘子上的涂层耐紫外辐照老化程度的方法,其特征在于,所述样片的特征吸收峰高度H t确定方法为: The method for identifying the UV radiation aging resistance of a coating on an insulator according to claim 1, characterized in that the method for determining the characteristic absorption peak height H t of the sample is:
    Figure PCTCN2022108448-appb-100001
    Figure PCTCN2022108448-appb-100001
  7. 根据权利要求1所述的鉴别绝缘子上的涂层耐紫外辐照老化程度的方法,其特征在于,所述样片的化学键得分C 2的确定方法为: The method for identifying the UV radiation aging resistance of a coating on an insulator according to claim 1, characterized in that the method for determining the chemical bond score C2 of the sample is:
    Figure PCTCN2022108448-appb-100002
    Figure PCTCN2022108448-appb-100002
  8. 根据权利要求1所述的鉴别绝缘子上的涂层耐紫外辐照老化程度的方法,其特征在于,所述样片的耐紫外辐照总分C为所述憎水性得分C 1和所述化学键得分C 2的加权平均值。 The method for identifying the UV radiation aging resistance of a coating on an insulator according to claim 1, characterized in that the UV radiation resistance total score C of the sample is the hydrophobicity score C 1 and the chemical bond score Weighted average of C 2 .
  9. 根据权利要求8所述的鉴别绝缘子上的涂层耐紫外辐照老化程度的方法,其特征在于,所述样片的耐紫外辐照总分C的确定方法为C=0.5C 1+0.5C 2The method for identifying the UV radiation resistance aging degree of the coating on the insulator according to claim 8, characterized in that the determination method of the UV radiation resistance total score C of the sample is C=0.5C 1 +0.5C 2 .
  10. 根据权利要求1所述的鉴别绝缘子上的涂层耐紫外辐照老化程度的方法,其特征在于,所述根据所述样片的耐紫外辐照总分确定所述样片的老化程度包括:The method for identifying the aging degree of ultraviolet radiation resistance of a coating on an insulator according to claim 1, wherein determining the aging degree of the sample piece based on the total ultraviolet radiation resistance score of the sample piece includes:
    将所述耐紫外辐照总分与一预设分数进行比较;Compare the total ultraviolet radiation resistance score with a preset score;
    如果所述耐紫外辐照总分小于所述预设分数,则判定所述样片寿命终止;If the total UV radiation resistance score is less than the preset score, it is determined that the life of the sample piece has been terminated;
    如果所述耐紫外辐照总分不小于所述预设分数,则以所述耐紫外辐照总分的高低作为所述样片的耐紫外辐照老化程度的鉴定依据。If the total UV radiation resistance score is not less than the preset score, the level of the UV radiation resistance total score will be used as the basis for identification of the UV radiation aging resistance of the sample.
PCT/CN2022/108448 2022-05-20 2022-07-28 Method for identifying ultraviolet radiation aging resistance degree of coating on insulator WO2023221294A1 (en)

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