WO2023199870A1 - Plaque de réfraction d'ondes radio - Google Patents

Plaque de réfraction d'ondes radio Download PDF

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Publication number
WO2023199870A1
WO2023199870A1 PCT/JP2023/014446 JP2023014446W WO2023199870A1 WO 2023199870 A1 WO2023199870 A1 WO 2023199870A1 JP 2023014446 W JP2023014446 W JP 2023014446W WO 2023199870 A1 WO2023199870 A1 WO 2023199870A1
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WIPO (PCT)
Prior art keywords
resonator
conductor
radio wave
unit structure
reference conductor
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PCT/JP2023/014446
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English (en)
Japanese (ja)
Inventor
信樹 平松
博道 吉川
正道 米原
Original Assignee
京セラ株式会社
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Priority claimed from JP2022065351A external-priority patent/JP2022165403A/ja
Application filed by 京セラ株式会社 filed Critical 京セラ株式会社
Publication of WO2023199870A1 publication Critical patent/WO2023199870A1/fr

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    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01Q—ANTENNAS, i.e. RADIO AERIALS
    • H01Q15/00—Devices for reflection, refraction, diffraction or polarisation of waves radiated from an antenna, e.g. quasi-optical devices
    • H01Q15/02—Refracting or diffracting devices, e.g. lens, prism

Definitions

  • the present disclosure relates to a radio wave refracting plate.
  • Patent Document 1 describes a technique for refracting radio waves by changing the parameters of each element in a structure in which resonator elements are arranged.
  • a radio wave refracting plate includes a plurality of unit structures arranged in a first surface direction and a reference conductor serving as a reference potential of the plurality of unit structures, and the plurality of unit structures include a resonant circuit. Represented by three or more equivalent circuits.
  • the radio wave refracting plate includes a plurality of unit structures arranged in a first surface direction, and a reference conductor serving as a reference potential of the plurality of unit structures, and the plurality of unit structures are connected to the first
  • the device includes three or more resonators extending in a plane direction, and a connecting portion including the reference conductor and connecting the resonators magnetically or capacitively between the resonators.
  • the radio wave refracting plate includes a plurality of unit structures arranged in a first surface direction, and a reference conductor serving as a reference potential of the plurality of unit structures, and the plurality of unit structures are connected to the first a first resonator that extends in the plane direction; a second resonator that is separated from the first resonator in the first direction and extends in the first plane direction; and a connecting portion that magnetically or capacitively connects the two resonators.
  • a radio wave refracting plate includes a plurality of unit structures arranged in a first surface direction and a reference conductor serving as a reference potential connected throughout the plurality of structures, and includes a reference conductor that serves as a reference potential and is connected across the plurality of structures. It has a first resonator as an input and coupled thereto, and a second resonator as an output and coupled with the electromagnetic wave to free space, and the first resonator and the second resonator are arranged in the stacking direction. It is electromagnetically coupled to one or more arranged third resonators, and the main coupling is subordinately coupled between the resonators, and the reference conductor provides coupling and frequency adjustment. It is expressed as an equivalent circuit characterized by what has been done.
  • FIG. 1 is a diagram for explaining the outline of a radio wave refraction plate according to each embodiment.
  • FIG. 2 is a diagram showing a configuration example of the radio wave refraction plate according to the first embodiment.
  • FIG. 3 is a diagram for explaining the amount of phase change of a unit structure.
  • FIG. 4 is a diagram showing a configuration example of a radio wave refraction plate according to the second embodiment.
  • FIG. 5 is a diagram showing a configuration example of a radio wave refraction plate according to the third embodiment.
  • FIG. 6 is a diagram showing a configuration example of a unit structure according to the fourth embodiment.
  • FIG. 7 is a graph showing the frequency characteristics of the unit structure according to the fourth embodiment.
  • FIG. 8 is a graph showing the amount of phase change of the unit structure according to the fourth embodiment.
  • FIG. 9 is a diagram illustrating a configuration example of a unit structure according to the fifth embodiment.
  • FIG. 10 is a graph showing the frequency characteristics of the unit structure according to the fifth embodiment.
  • FIG. 11 is a graph showing the amount of phase change of the unit structure according to the fifth embodiment.
  • FIG. 12 is a diagram schematically showing a configuration example of a unit structure according to the sixth embodiment.
  • FIG. 13 is a graph showing the frequency characteristics of the unit structure according to the sixth embodiment.
  • FIG. 14 is a graph showing the frequency characteristics of the unit structure according to the sixth embodiment.
  • FIG. 15 is a diagram illustrating a configuration example of a unit structure according to the seventh embodiment.
  • FIG. 16 is a graph showing the frequency characteristics of the unit structure according to the seventh embodiment.
  • FIG. 17 is a graph showing the amount of phase change of a unit structure according to a modification of the seventh embodiment.
  • FIG. 18 is a diagram showing a configuration example of a unit structure according to the eighth embodiment.
  • FIG. 19 is a graph showing the frequency characteristics of the unit structure according to the eighth embodiment.
  • FIG. 20 is a diagram for explaining the direction of refraction of radio waves by the radio wave refraction plate.
  • FIG. 21 is a diagram illustrating a configuration example of a unit structure according to the ninth embodiment.
  • FIG. 22A is a diagram illustrating a configuration example of a first resonator according to the ninth embodiment.
  • FIG. 22B is a diagram illustrating a configuration example of the first reference conductor according to the ninth embodiment.
  • FIG. 22C is a diagram showing a configuration example of the third resonator according to the ninth embodiment.
  • FIG. 22D is a diagram illustrating a configuration example of the second reference conductor according to the ninth embodiment.
  • FIG. 22E is a diagram showing a configuration example of the fourth resonator according to the ninth embodiment.
  • FIG. 22F is a diagram illustrating a configuration example of the third reference conductor according to the ninth embodiment.
  • FIG. 22G is a diagram showing a configuration example of the second resonator according to the ninth embodiment.
  • FIG. 23 is a diagram for explaining the direction of refraction of radio waves by the radio wave refraction plate according to the ninth embodiment.
  • FIG. 24 is a diagram illustrating a configuration example of a reference conductor according to a first modification of the ninth embodiment.
  • FIG. 24 is a diagram illustrating a configuration example of a reference conductor according to a first modification of the ninth embodiment.
  • FIG. 25 is a diagram illustrating a configuration example of a unit structure according to a first modification of the ninth embodiment.
  • FIG. 26 is a diagram illustrating a configuration example of a reference conductor according to a second modification of the ninth embodiment.
  • FIG. 27 is a diagram illustrating a configuration example of a unit structure according to a second modification of the ninth embodiment.
  • FIG. 28 is a diagram illustrating a configuration example of a reference conductor according to a third modification of the ninth embodiment.
  • FIG. 29 is a diagram illustrating a configuration example of a unit structure according to a third modification of the ninth embodiment.
  • FIG. 30 is a diagram illustrating a configuration example of a reference conductor according to a fourth modification of the ninth embodiment.
  • FIG. 31 is a diagram illustrating a configuration example of a unit structure according to a fourth modification of the ninth embodiment.
  • FIG. 32 is a diagram illustrating a configuration example of a reference conductor according to a fifth modification of the ninth embodiment.
  • FIG. 33 is a diagram illustrating a configuration example of a unit structure according to a fifth modification of the ninth embodiment.
  • FIG. 34 is a diagram illustrating a configuration example of a reference conductor according to a sixth modification of the ninth embodiment.
  • FIG. 35 is a diagram illustrating a configuration example of a unit structure according to a sixth modification of the ninth embodiment.
  • FIG. 36 is a diagram illustrating a configuration example of a resonator according to a sixth modification of the ninth embodiment.
  • FIG. 37 is a diagram illustrating a configuration example of a resonator according to a seventh modification of the ninth embodiment.
  • FIG. 38 is a diagram showing a configuration example of a unit structure according to the tenth embodiment.
  • FIG. 39 is a diagram showing a configuration example of a unit structure according to the tenth embodiment.
  • FIG. 40 is a diagram illustrating a configuration example of a unit structure according to the eleventh embodiment.
  • FIG. 41 is a diagram showing a schematic configuration example of a unit structure according to the eleventh embodiment.
  • FIG. 42 is a diagram showing a configuration example of a unit structure according to the twelfth embodiment.
  • FIG. 43 is a cross-sectional view of a configuration example of a unit structure according to the twelfth embodiment.
  • FIG. 44 is a diagram illustrating a configuration example of a unit structure according to the first modification of the twelfth embodiment.
  • FIG. 45 is a cross-sectional view of a configuration example of a unit structure according to a first modification of the twelfth embodiment.
  • FIG. 46 is a cross-sectional view of a configuration example of a unit structure according to the thirteenth embodiment.
  • FIG. 47 is a diagram illustrating a configuration example of a unit structure according to the fourteenth embodiment.
  • FIG. 48 is a diagram for explaining a configuration example of a bonding layer according to the fourteenth embodiment.
  • FIG. 49 is a graph showing the frequency characteristics of the unit structure according to the fourteenth embodiment.
  • FIG. 50 is a graph showing the amount of phase change of the unit structure according to the fourteenth embodiment.
  • FIG. 51 is a diagram showing a configuration example of a unit structure according to the fourteenth embodiment.
  • FIG. 52 is a graph showing the frequency characteristics of a unit structure according to a modification
  • an XYZ orthogonal coordinate system is set, and the positional relationship of each part will be explained with reference to this XYZ orthogonal coordinate system.
  • the direction parallel to the X-axis in the horizontal plane is the X-axis direction
  • the direction parallel to the Y-axis in the horizontal plane perpendicular to the X-axis is the Y-axis direction
  • the direction parallel to the Z-axis orthogonal to the horizontal plane is the Z-axis direction. do.
  • a plane including the X axis and the Y axis is appropriately referred to as an XY plane
  • a plane including the X axis and the Z axis is appropriately referred to as an XZ plane
  • a plane including the Y axis and the Z axis is appropriately referred to as a YZ plane.
  • the XY plane is parallel to the horizontal plane.
  • the XY plane, the XZ plane, and the YZ plane are orthogonal to each other.
  • FIG. 1 is a diagram for explaining the outline of a radio wave refraction plate according to each embodiment.
  • the radio wave refraction plate 1 includes a plurality of unit structures 10 and a substrate 12.
  • the plurality of unit structures 10 are arranged in the XY plane direction, and the XY plane direction may also be called the first plane direction. That is, the plurality of unit structures 10 are two-dimensionally lined up. In this embodiment, each of the plurality of unit structures 10 has a resonant structure.
  • the structure of the unit structure 10 will be described later.
  • the substrate 12 may be, for example, a dielectric substrate made of a dielectric material. That is, in this embodiment, the radio wave refraction plate 1 is configured by two-dimensionally arranging a plurality of unit structures 10 having a resonant structure on a substrate 12 made of a dielectric material.
  • FIG. 2 is a diagram showing a configuration example of the radio wave refraction plate according to the first embodiment.
  • the radio wave refracting plate 1A includes a plurality of unit structures 10A, a plurality of unit structures 10B, a plurality of unit structures 10C, and a plurality of unit structures 10D.
  • the unit structures 10A, 10B, 10C, and 10D are two-dimensionally arranged on the XY plane.
  • the unit structures 10A, 10B, 10C, and 10D are arranged in a grid on the XY plane.
  • two adjacent unit structures in the X direction or the Y direction which is the in-plane direction of the 6) so that a phase difference occurs in the phase of the electromagnetic waves emitted from the electromagnetic waves.
  • a plurality of unit structures 10A are lined up in the first row along the Y direction of the radio wave refraction plate 1A.
  • a plurality of unit structures 10B are lined up in the second row along the Y direction of the radio wave refracting plate 1A.
  • a plurality of unit structures 10C are lined up in the third row along the Y direction of the radio wave refracting plate 1A.
  • a plurality of unit structures 10D are lined up in the fourth row along the Y direction of the radio wave refracting plate 1A.
  • a plurality of unit structures 10A are lined up in the fifth row along the Y direction of the radio wave refracting plate 1A.
  • a plurality of unit structures 10B are lined up in the sixth row along the Y direction of the radio wave refracting plate 1A.
  • a plurality of unit structures 10C are lined up in the seventh row along the Y direction of the radio wave refracting plate 1A.
  • a plurality of unit structures 10D are lined up in the eighth row along the Y direction of the radio wave refracting plate 1A.
  • the unit structure 10A and the unit structure 10B are arranged adjacent to each other in the X direction.
  • the unit structure 10B and the unit structure 10C are arranged adjacent to each other in the X direction.
  • the unit structure 10C and the unit structure 10D are arranged adjacent to each other in the X direction.
  • the unit structure 10D and the unit structure 10A are arranged adjacent to each other in the X direction.
  • the unit structure 10A, the unit structure 10B, the unit structure 10C, and the unit structure 10D each have different lengths of connection lines 20 (see FIG. 6).
  • the connection lines 20 are configured to become longer in the order of unit structure 10A, unit structure 10B, unit structure 10C, and unit structure 10D. That is, the unit structure 10A, the unit structure 10B, the unit structure 10C, and the unit structure 10D each change the phase of the electromagnetic wave incident on the first resonator 14 and emit it from the second resonator 16. It is configured.
  • FIG. 3 is a diagram for explaining the amount of phase change of a unit structure.
  • FIG. 3 shows the amount of change in phase in the X-axis direction. Specifically, FIG. 3 shows an example in which a plane wave that has arrived at the radio wave refraction plate 1A is refracted and emitted as a plane wave. Point P1 indicates the phase of the incident electromagnetic wave, and the amount of phase change is 0°.
  • Point P2 indicates the amount of phase change of the first unit structure 10A in the X-axis direction, and the amount of phase change is 90°.
  • Point P3 indicates the amount of phase change of the first unit structure 10B in the X-axis direction, and the amount of phase change is 180°.
  • Point P4 indicates the amount of phase change of the first unit structure 10C in the X-axis direction, and the amount of phase change is 270°.
  • Point P5 indicates the amount of phase change of the first unit structure 10D in the X-axis direction, and the amount of phase change is 360°.
  • Point P6, point P7, point P8, and point P9 indicate the amount of phase change of the second unit structure 10A, unit structure 10B, unit structure 10C, and unit structure 10D, respectively.
  • the phase change amounts of the second unit structure 10A, unit structure 10B, unit structure 10C, and unit structure 10D are 450°, 540°, 630°, and 720°, respectively. That is, in this embodiment, four unit structures, ie, a unit structure 10A, a unit structure 10B, a unit structure 10C, and a unit structure 10D, are configured to change the phase of the electromagnetic wave arriving at the radio wave refracting plate 1A by 360 degrees. has been done.
  • the unit structure 10 can be called a unit cell.
  • each of unit structures 10A, 10B, 10C, and 10D may be called a unit cell.
  • a repeating unit in which a plurality of unit cells with different structures are lined up can be called a supercell.
  • the arrangement of unit structures 10A, 10B, 10C, and 10D can be called a supercell.
  • a supercell may have features such as a phase change of 0° to 360°.
  • the radio wave refracting plate 1 can be made large in area by forming supercells into one unit. Note that the unit of phase change that can become a supercell is not limited to 0° to 360°, but can be from 0° to 360° ⁇ n times (where n is a natural number).
  • the phase difference with respect to the reference unit structure increases as the unit progresses in the X direction or the ⁇ X direction. It is configured as follows.
  • the phase difference is such that the phase advances or slows down by the first phase difference (for example, 90°) each time it advances in the X direction or -X direction. It is composed of
  • the interval between adjacent unit structures is d
  • the difference in the amount of phase change between adjacent units is ⁇
  • the angle at which the electromagnetic waves that have arrived at the radio wave refraction plate 1A is refracted is ⁇
  • the gradient of the phase change amount is described as being in the X-axis direction, but the present disclosure is not limited thereto.
  • the direction of refraction can be arbitrarily designed by setting the gradient of the amount of phase change in an arbitrary direction. Further, in the example shown in FIG.
  • the phase change amount is described as being changed linearly, but the present disclosure is not limited thereto.
  • the plane wave that has arrived at the radio wave refraction plate 1A can be converged or diffused at an arbitrary location.
  • phase difference between the electromagnetic waves emitted by two unit structures adjacent in the X-axis direction is 90°, but the present disclosure is not limited thereto.
  • the phase difference between the electromagnetic waves emitted by two adjacent unit structures may be, for example, 30°, 45°, or 60°. That is, the phase difference between the electromagnetic waves emitted by two adjacent unit structures may be arbitrary.
  • the phase difference between the electromagnetic waves emitted by the unit structure 10A and the unit structure 10B, the phase difference between the electromagnetic waves emitted by the unit structure 10B and the unit structure 10C, and the phase difference between the electromagnetic waves emitted by the unit structure 10C and the unit structure 10D are
  • the phase difference between the emitted electromagnetic waves and the phase difference between the electromagnetic waves emitted by the unit structure 10D and the unit structure 10A are the same at 90°, but the present disclosure is not limited thereto.
  • the phase difference between the electromagnetic waves emitted by the unit structure 10D and the unit structure 10A may be different from each other.
  • the phase difference between the electromagnetic waves emitted by the unit structure 10D and the unit structure 10A may be set depending on the design, usage, etc.
  • a plurality of unit structures having different lengths of the connecting lines 20 are two-dimensionally arranged so that the phase of the arriving electromagnetic waves is changed by 360 degrees.
  • the area of the radio wave refraction plate 1A can be increased by repeating the array set so as to change the phase of the arriving electromagnetic wave by 360 degrees.
  • the communicable area can be expanded by refracting radio waves using the radio wave refraction plate 1A to increase the radio field strength in places where communication is not possible due to weak radio field strength.
  • the communicable area can be further expanded. Further, since the gain can be increased as the area of the radio wave refraction plate 1A is increased, the gain can be further improved by refracting the radio waves so as to converge on a predetermined location.
  • a unit structure 10A, a unit structure 10B, a unit structure 10C, and a unit structure 10D which have different lengths of connection lines connecting the first resonator 14 and the second resonator 16, are used.
  • the amount of phase change is changed by dimensionally arranging them in a grid pattern.
  • the area of the first resonator 14 and the second resonator 16 can be reduced without changing the length of the connection line connecting the first resonator 14 and the second resonator 16.
  • the phase change amount By changing the phase change amount, the amount of phase change is changed.
  • FIG. 4 is a diagram showing a configuration example of a radio wave refraction plate according to the second embodiment.
  • the radio wave refracting plate 1B includes a plurality of unit structures 10E, a plurality of unit structures 10F, a plurality of unit structures 10G, and a plurality of unit structures 10H.
  • the unit structures 10E, 10F, 10G, and 10H are two-dimensionally arranged on the XY plane.
  • the unit structures 10E, 10F, 10G, and 10H are arranged in a grid on the XY plane.
  • the unit structure 10E, the unit structure 10F, the unit structure 10G, and the unit structure 10H are each configured to change the phase of the electromagnetic wave incident on the first resonator 14 and output it from the second resonator 16. ing.
  • two adjacent unit structures in the X direction or the Y direction, which is the in-plane direction of the The structure is such that a phase difference occurs.
  • a plurality of unit structures 10E are lined up in the first row along the Y direction of the radio wave refraction plate 1B.
  • a plurality of unit structures 10F are lined up in the second row along the Y direction of the radio wave refracting plate 1B.
  • a plurality of unit structures 10G are lined up in the third row along the Y direction of the radio wave refracting plate 1B.
  • a plurality of unit structures 10H are lined up in the fourth row along the Y direction of the radio wave refracting plate 1B.
  • a plurality of unit structures 10E are lined up in the fifth row along the Y direction of the radio wave refracting plate 1B.
  • a plurality of unit structures 10F are lined up in the sixth row along the Y direction of the radio wave refracting plate 1B.
  • a plurality of unit structures 10G are lined up in the seventh row along the Y direction of the radio wave refracting plate 1B.
  • a plurality of unit structures 10H are lined up in the eighth row along the Y direction of the radio wave refracting plate 1B.
  • the unit structure 10E, the unit structure 10F, the unit structure 10G, and the unit structure 10H have different areas of the first resonator 14 and the second resonator 16, respectively.
  • the areas of the first resonator 14 and the second resonator 16 are configured to increase in the order of unit structure 10E, unit structure 10F, unit structure 10G, and unit structure 10H. That is, the unit structure 10E, the unit structure 10F, the unit structure 10G, and the unit structure 10H each have different resonance frequencies. That is, in the second embodiment, in the radio wave refraction plate 1B, the amount of phase change is changed by changing the resonance frequency depending on the position where each unit structure is arranged.
  • each unit structure ie, a unit structure 10E, a unit structure 10F, a unit structure 10G, and a unit structure 10H, adjust the phase of the electromagnetic wave incident on the radio wave refraction plate 1B. It is configured to change 360°.
  • the phase difference between two adjacent ones in the radio wave refracting plate 1B is the same as that shown in FIG. 3, so the explanation will be omitted.
  • a plurality of unit structures in which the first resonator 14 and the second resonator 16 have different areas are two-dimensionally arranged so that the phase of the arriving electromagnetic wave is changed by 360°.
  • the area of the radio wave refraction plate 1B can be increased by repeating the array set so as to change the phase of the arriving electromagnetic wave by 360°.
  • a radio wave refracting plate is constructed by arranging a plurality of unit structures with different path lengths of the connection line 20, and in the second embodiment, a plurality of units with different areas of the first resonator 14 and the second resonator 16 are arranged.
  • the radio wave refracting plate is configured by arranging the structures, the present disclosure is not limited thereto. In the present disclosure, the first embodiment and the second embodiment may be combined.
  • the present disclosure when each unit structure is arranged two-dimensionally, the path length of the connection line 20 is changed depending on the position where the unit structures are arranged, and the first resonator 14 and the second resonator 16 You may change the area of Thereby, the present disclosure can design a radio wave refraction plate with a higher degree of freedom.
  • the amount of phase change is controlled by changing the path length of the connection line 20, and in the second embodiment, the amount of phase change is controlled by changing the areas of the first resonator 14 and the second resonator 16.
  • the present disclosure is not limited thereto.
  • the amount of phase change may be controlled by changing the distance between the first resonator 14 and the reference conductor 18 and the distance between the second resonator 16 and the reference conductor 18. In this case, the distance between the first resonator 14 and the reference conductor 18 and the distance between the second resonator 16 and the reference conductor 18 may be the same or different.
  • FIG. 5 is a diagram showing a configuration example of a radio wave refraction plate according to the third embodiment.
  • the radio wave refracting plate 1C includes a plurality of unit structures 10E, a plurality of unit structures 10F, a plurality of unit structures 10G, and a plurality of unit structures 10H.
  • the unit structure 10E, the unit structure 10F, the unit structure 10G, and the unit structure 10H are different from the radio wave refraction plate 1B shown in FIG. 4 in that they are arranged radially in the XY plane.
  • two adjacent unit structures in the X direction or the Y direction, which is the in-plane direction of the The structure is such that a phase difference occurs.
  • the first row along the Y direction of the radio wave refracting plate 1C includes unit structure 10G, unit structure 10H, unit structure 10G, unit structure 10F, unit structure 10F, unit structure 10G, unit structure 10H. , and the unit structure 10G are arranged in this order.
  • the second row along the Y direction of the radio wave refracting plate 1C includes unit structure 10H, unit structure 10F, unit structure 10H, unit structure 10G, unit structure 10G, unit structure 10H, unit structure 10F. , and the unit structures 10H are arranged in this order.
  • the third row along the Y direction of the radio wave refracting plate 1C includes unit structure 10G, unit structure 10H, unit structure 10G, unit structure 10F, unit structure 10F, unit structure 10G, unit structure 10H. , and the unit structure 10G are arranged in this order.
  • the fourth row along the Y direction of the radio wave refracting plate 1C includes unit structure 10F, unit structure 10G, unit structure 10F, unit structure 10E, unit structure 10E, unit structure 10F, unit structure 10G. , and the unit structure 10F are arranged in this order.
  • the fifth row along the Y direction of the radio wave refracting plate 1C includes unit structure 10F, unit structure 10G, unit structure 10F, unit structure 10E, unit structure 10E, unit structure 10F, unit structure 10G. , and the unit structure 10F are arranged in this order.
  • the sixth row along the Y direction of the radio wave refracting plate 1C includes unit structure 10G, unit structure 10H, unit structure 10G, unit structure 10F, unit structure 10F, unit structure 10G, unit structure 10H. , and the unit structure 10G are arranged in this order.
  • the seventh row along the Y direction of the radio wave refracting plate 1C includes unit structure 10H, unit structure 10F, unit structure 10H, unit structure 10G, unit structure 10G, unit structure 10H, unit structure 10F. , and the unit structures 10H are arranged in this order.
  • the 8th row along the Y direction of the radio wave refracting plate 1C includes unit structure 10G, unit structure 10H, unit structure 10G, unit structure 10F, unit structure 10F, unit structure 10G, unit structure 10H. , and the unit structure 10G are arranged in this order.
  • the area of the first resonator 14 and the second resonator 16 is the largest among the unit structures 10E, 10F, 10G, and 10H.
  • Four small unit structures 10E are lined up.
  • a unit structure 10F, a unit structure 10G, and a unit structure 10H are arranged radially around the four unit structures 10E.
  • four unit structures, unit structure 10E, unit structure 10F, unit structure 10G, and unit structure 10H are used to change the phase of the electromagnetic wave incident on the radio wave refraction plate 1C by 360 degrees. It is configured.
  • the radio wave refracting plate 1C has a phase difference between the adjacent unit structures when the electromagnetic waves incident on the first resonator 14 exit from the second resonator 16 in the first radiation direction which is the in-plane direction of the XY plane. (for example, 90°).
  • the radio wave refracting plate 1C changes the reference unit structure (for example, the unit structure 10E).
  • the radio wave refracting plate 1C generates a second phase difference (for example, 90 ) is configured to advance or slow down.
  • FIG. 6 is a diagram showing the configuration of a unit structure according to the fourth embodiment.
  • the unit structure 10 includes a first resonator 14, a second resonator 16, a reference conductor 18, and a connection line 20.
  • the first resonators 14 can be arranged in the substrate 12 so as to spread out in the XY plane.
  • the first resonator 14 may be formed of a conductor.
  • the first resonator 14 may be a rectangular patch conductor, for example. In the example shown in FIG. 6, the first resonator 14 is shown as a rectangular patch conductor, but the present disclosure is not limited thereto.
  • the shape of the first resonator 14 may be, for example, a linear shape, a circular shape, a loop shape, or a polygonal shape other than a rectangular shape. That is, the shape of the first resonator 14 can be arbitrarily changed depending on the design.
  • the first resonator 14 is configured to resonate with electromagnetic waves received from the +Z-axis direction.
  • the first resonator 14 is configured to radiate electromagnetic waves when resonating.
  • the first resonator 14 is configured to radiate electromagnetic waves in the +Z-axis direction when resonating.
  • the second resonators 16 can be arranged on the substrate 12 at positions apart from the first resonators 14 in the Z-axis direction so as to spread out on the XY plane.
  • the second resonator 16 may be, for example, a rectangular patch conductor. In the example shown in FIG. 6, the second resonator 16 is shown as a rectangular patch conductor, but the present disclosure is not limited thereto.
  • the shape of the second resonator 16 may be, for example, a linear shape, a circular shape, a loop shape, or a polygonal shape other than a rectangular shape. That is, the shape of the second resonator 16 can be arbitrarily changed depending on the design.
  • the shape of the second resonator 16 may be the same as or different from the shape of the first resonator 14.
  • the area of the second resonator 16 may be the same as that of the first resonator 14, or may be different.
  • the second resonator 16 is configured to radiate electromagnetic waves when resonating.
  • the second resonator 16 is configured to radiate electromagnetic waves in the ⁇ Z-axis direction, for example.
  • the second resonator 16 is configured to radiate electromagnetic waves in the ⁇ Z-axis direction when resonating.
  • the second resonator 16 is configured to resonate by receiving electromagnetic waves from the ⁇ Z-axis direction.
  • the second resonator 16 may be configured to resonate in a phase different from that of the first resonator 14.
  • the second resonator 16 may be configured to resonate in a direction different from the resonance direction of the first resonator 14 in the XY plane direction.
  • the second resonator 16 may be configured to resonate in the Y-axis direction.
  • the resonance direction of the second resonator 16 may be configured to change over time in the XY plane direction in accordance with the change over time of the resonance direction of the first resonator 14.
  • the second resonator 16 may be configured to radiate the electromagnetic wave received by the first resonator 14 in which the first frequency band is attenuated.
  • the reference conductor 18 may be arranged between the first resonator 14 and the second resonator 16 on the substrate 12.
  • the reference conductor 18 may be located at the center of the first resonator 14 and the second resonator 16 in the substrate 12, for example, but the present disclosure is not limited thereto.
  • the reference conductor 18 may be located at a different distance from the first resonator 14 and from the second resonator 16, for example.
  • the reference conductor 18 has a through hole 18a through which the connection line 20 passes.
  • the reference conductor 18 is configured to surround at least a portion of the connection line 20.
  • the connection line 20 may be formed of a conductor.
  • the connection line 20 is located between the first resonator 14 and the second resonator 16 in the Z-axis direction.
  • the Z-axis direction may also be called a first direction.
  • the connection line 20 may be connected to each of the first resonator 14 and the second resonator 16.
  • the connection line 20 passes through the through hole 18a but does not contact the reference conductor 18.
  • the connection line 20 may be configured to be magnetically or capacitively connected to each of the first resonator 14 and the second resonator 16, for example.
  • the connection line 20 may be configured to be electrically connected to each of the first resonator 14 and the second resonator 16, for example.
  • connection line 20 is connected to a side of the first resonator 14 parallel to the X-axis direction, and is connected to a side of the second resonator 16 parallel to the X-axis direction.
  • the connection line 20 may be a path parallel to the Z-axis direction.
  • the connecting line 20 may be a third resonator. That is, the unit structure 10 can be expressed as an equivalent circuit including three LC resonant circuits.
  • the unit structure 10 may have a configuration expressed by an equivalent circuit including three or more LC resonant circuits. In other words, the unit structure 10 may include three or more resonators.
  • the connecting line 20 is located between each resonator.
  • the connection line 20 is configured to connect each resonator magnetically or capacitively.
  • the unit structure 10 is configured to combine the first resonator 14 and the second resonator 16 by magnetically or capacitively connecting them, or electrically connecting them. By combining the three resonators, the unit structure 10 is configured such that the high frequency excited by the electromagnetic wave incident on the first resonator 14 is transmitted through the composite resonator.
  • the unit structure 10 can perform one or more functions of a phase shift, a bandpass filter, a highpass filter, and a lowpass filter depending on the transmission characteristics of the composite resonator.
  • the unit structure 10 is configured to change the phase of the electromagnetic wave incident on the first resonator 14 and output it from the second resonator 16.
  • the amount of phase change changes depending on the length of the connection line 20.
  • the amount of phase change also changes depending on the area of the first resonator 14 or the second resonator 16.
  • FIG. 7 is a graph showing the frequency characteristics of the unit structure according to the fourth embodiment.
  • FIG. 7 shows a graph G1 and a graph G2.
  • Graph G1 shows the transmission coefficient.
  • Graph G2 shows the reflection coefficient.
  • the insertion loss in the region from around 21.00 GHz to around 28.00 GHz is -3 dB or more, indicating good transmission characteristics.
  • Graph G2 shows that the reflection coefficient in the region from around 21.00 GHz to around 28.00 GHz is low. That is, the unit structure 10 shown in FIG. 6 has good transmission characteristics over a wide range from around 21.00 GHz to around 28.00 GHz.
  • FIG. 8 is a graph showing the amount of phase change of the unit structure according to the fourth embodiment.
  • the horizontal axis shows the frequency [GHz]
  • the vertical axis shows the amount of phase change [deg].
  • Graph G3 is shown in FIG.
  • Graph G3 shows the amount of shift in the phase of electromagnetic waves when the electromagnetic waves incident on the first resonator 14 are emitted from the second resonator 16.
  • the unit structure 10 is configured such that when an electromagnetic wave with a frequency of around 20.80 GHz enters the first resonator 14, the phase of the electromagnetic wave is shifted by approximately ⁇ 38° and the wave is emitted from the second resonator 16. .
  • the unit structure 10 is configured such that when an electromagnetic wave with a frequency of around 28.00 GHz enters the first resonator 14, the phase of the electromagnetic wave is shifted by about 135° and the electromagnetic wave is emitted from the second resonator 16. That is, the unit structure 10 can be used as a spatial filter that changes the phase of electromagnetic waves.
  • the radio wave refraction plate according to each embodiment can be configured.
  • FIG. 9 is a diagram schematically showing a configuration example of a unit structure according to the fifth embodiment.
  • the unit structure 10a differs from the unit structure 10 shown in FIG. 6 in that the connection line 20 is not a linear path parallel to the Z-axis direction.
  • the connection line 20 of the unit structure 10a includes a first path section 20a, a second path section 20b, a third path section 20c, a fourth path section 20d, and a fifth path section 20e. This differs from the unit structure 10 shown in FIG. 6 in this point.
  • the first path portion 20a may be a path parallel to the Z-axis direction, with one end connected to the first resonator 14 and the other end located between the first resonator 14 and the reference conductor 18.
  • the second path section 20b may be a path parallel to the XY plane, with one end connected to the other end of the first path section 20a and the other end located between the first resonator 14 and the reference conductor 18.
  • the third path section 20c may be a path parallel to the Z-axis direction, with one end connected to the other end of the second path section 20b and the other end located between the second resonator 16 and the reference conductor 18. .
  • the third path portion 20c passes through the through hole 18a of the reference conductor 18.
  • the third path portion 20c is not in contact with the reference conductor 18.
  • the fourth path section 20d may be a path parallel to the XY plane, with one end connected to the other end of the third path section 20c and the other end located between the second resonator 16 and the reference conductor 18.
  • the fifth path portion 20e may be a path parallel to the Z-axis direction, with one end connected to the fourth path portion 20d and the other end connected to the fifth path portion 20e.
  • connection line 20 is described as including five routes from the first route section 20a to the fifth route section 20e, but this is an example and does not limit the present disclosure.
  • the number of paths included in the connection line 20 may be greater than or less than five.
  • the plurality of path sections may also be referred to as sub-resonators.
  • the connection line 20 may have, for example, a curved bent part.
  • the unit structure 10a is configured to change the phase of the electromagnetic wave incident on the first resonator 14 and output it from the second resonator 16.
  • the amount of phase change changes depending on the length of the connection line 20.
  • the amount of phase change also changes depending on the area of the first resonator 14 or the second resonator 16.
  • FIG. 10 is a graph showing the frequency characteristics of the unit structure according to the fifth embodiment.
  • FIG. 10 shows a graph G4 and a graph G5.
  • Graph G4 shows the transmission coefficient.
  • Graph G5 shows the reflection coefficient.
  • the insertion loss in the region from around 22.00 GHz to around 31.40 GHz is -3 dB or more, indicating good transmission characteristics.
  • Graph G5 shows that the reflection coefficient in the region from around 22.00 GHz to around 31.40 GHz is low. That is, the unit structure 10a shown in FIG. 9 has good transmission characteristics over a wide range from around 22.00 GHz to around 31.40 GHz.
  • FIG. 11 is a graph showing the amount of phase change of the unit structure according to the fifth embodiment.
  • FIG. 11 shows a graph G6.
  • Graph G6 shows the amount of shift in the phase of electromagnetic waves when the electromagnetic waves incident on the first resonator 14 are emitted from the second resonator 16.
  • the unit structure 10A is configured such that when an electromagnetic wave with a frequency of around 22.00 GHz enters the first resonator 14, the phase of the electromagnetic wave is shifted by approximately ⁇ 65° and the wave is emitted from the second resonator 16. .
  • the unit structure 10 is configured such that when an electromagnetic wave with a frequency of around 31.40 GHz enters the first resonator 14, the phase of the electromagnetic wave is shifted by approximately -5° and the wave is emitted from the second resonator 16. . That is, the unit structure 10a can be used as a spatial filter that changes the phase of electromagnetic waves. By arranging such unit structures 10a two-dimensionally, the radio wave refraction plate according to each embodiment can be configured.
  • FIG. 12 is a diagram schematically showing a configuration example of a unit structure according to the sixth embodiment.
  • the unit structure 10b differs from the unit structure 10 shown in FIG. 2 in that it includes a connection line 20A and a connection line 20B.
  • the reference conductor 18 has a through hole 18a and a through hole 18b.
  • the through hole 18a is a through hole through which the connection line 20A passes.
  • the through hole 18b is a through hole through which the connection line 20B passes.
  • the connection line 20A may be formed of a conductor.
  • the connection line 20A is located between the first resonator 14 and the second resonator 16 in the Z-axis direction.
  • the connection line 20A is connected to each of the first resonator 14 and the second resonator 16.
  • the connection line 20A has one end connected to a side parallel to the Y-axis direction of the first resonator 14, and the other end connected to a side parallel to the Y-axis direction of the second resonator 16.
  • the connection line 20A passes through the through hole 18a, but does not contact the reference conductor 18.
  • connection line 20B may be formed of a conductor.
  • the connection line 20B is located between the first resonator 14 and the second resonator 16 in the Z-axis direction.
  • the connection line 20B is connected to each of the first resonator 14 and the second resonator 16.
  • the connection line 20B has one end connected to a side parallel to the X-axis direction of the first resonator 14, and the other end connected to a side parallel to the X-axis direction of the second resonator 16.
  • the connection line 20B passes through the through hole 18b, but does not contact the reference conductor 18.
  • FIG. 13 and FIG. 14 are graphs showing the frequency characteristics of the unit structure according to the sixth embodiment.
  • FIG. 13 shows a graph G7 and a graph G8.
  • Graph G7 shows the transmission coefficient of electromagnetic waves incident in the X-axis direction and emitted in the X-axis direction.
  • Graph G8 shows the reflection coefficient.
  • the insertion loss in the region from around 21.00 GHz to around 28.00 GHz is about -3 dB or more, indicating good transmission characteristics.
  • Graph G8 shows that the reflection coefficient is low in the region from around 21.00 GHz to around 28.00 GHz. That is, the unit structure 10b shown in FIG. 12 has good transmission characteristics over a wide range from around 21.00 GHz to around 28.00 GHz.
  • FIG. 14 shows a graph G9.
  • Graph G9 shows the transmission coefficient of electromagnetic waves incident in the Y-axis direction and emitted in the Y-axis direction. As shown in graph G9, the transmission coefficient when electromagnetic waves incident from the Y-axis direction are emitted in the Y-axis direction is good, with an insertion loss of about -3 dB or more in the region from around 21.00 GHz to around 28.00 GHz. It shows excellent transmission characteristics.
  • the unit structure 10b has a good transmission coefficient of electromagnetic waves from the X-axis direction to the X-axis direction and from the Y-axis direction to the Y-axis direction. That is, the unit structure 10b has the properties of both a function as a spatial filter and a function of transmitting light almost independent of polarization.
  • the radio wave refraction plate according to each embodiment can be configured.
  • FIG. 15 is a diagram showing the configuration of a unit structure according to the seventh embodiment.
  • the unit structure 10c includes a substrate 12, a first resonator 14, a second resonator 16, a reference conductor 18, a connection line 20, and a third resonator 22.
  • the unit structure 10c differs from the unit structure 10 shown in FIG. 2 in that it includes a third resonator 22.
  • the reference conductor 18 has an opening 18c for arranging the third resonators 22.
  • the third resonator 22 may be arranged between the first resonator 14 and the second resonator 16 in the Z-axis direction.
  • the third resonator 22 may be within the opening 18c of the reference conductor 18.
  • the third resonator 22 may be within the opening 18c so as not to contact the reference conductor 18.
  • the third resonator 22 may be configured integrally with the connection line 20.
  • the third resonator 22 may be configured to be magnetically or capacitively connected to each of the first resonator 14 and the second resonator 16, for example. That is, the third resonator 22 is surrounded by the reference conductor 18.
  • the third resonator 22 is capacitively connected to the reference conductor 18 .
  • the length of at least one side of the first resonator 14 is ⁇ /2
  • the length of at least one side of the second resonator 16 is ⁇ /2
  • the length of at least one side of the third resonator 22 is set to ⁇ /4.
  • FIG. 16 is a graph showing the frequency characteristics of the unit structure according to the seventh embodiment.
  • FIG. 16 shows a graph G10 and a graph G11.
  • Graph G10 shows the transmission coefficient from the X-axis direction to the X-axis direction.
  • Graph G11 shows the reflection coefficient of electromagnetic waves incident in the X-axis direction.
  • the insertion loss in the region from around 18.00 GHz to around 28.00 GHz is -2 dB or more, indicating good transmission characteristics.
  • Graph G11 shows that the reflection coefficient in the region from around 18.00 GHz to around 28.00 GHz is low.
  • unit structure 10c is configured to have steeper attenuation characteristics in a higher frequency band than unit structure 10 shown in FIG. That is, the unit structure 10c shown in FIG. 15 has good transmission characteristics over a wide range from around 18.00 GHz to around 28.00 GHz.
  • FIG. 17 is a graph showing the amount of phase change of the unit structure according to the seventh embodiment.
  • FIG. 17 shows a graph G12.
  • Graph G12 shows the amount of shift in the phase of electromagnetic waves when the electromagnetic waves incident on the first resonator 14 are emitted from the second resonator 16. For example, in the unit structure 10c, when an electromagnetic wave with a frequency of around 18.00 GHz is incident on the first resonator 14, the phase of the electromagnetic wave is shifted by about ⁇ 37° and the electromagnetic wave is emitted from the second resonator 16.
  • the electromagnetic wave when an electromagnetic wave with a frequency of around 27.50 GHz is incident on the first resonator 14, the electromagnetic wave is output from the second resonator 16 with a phase shift of about ⁇ 40°. That is, even if the unit structure 10c includes a plurality of resonators, it can be configured to shift the phase of the arriving electromagnetic wave.
  • the radio wave refraction plate By arranging such unit structures 10c two-dimensionally, the radio wave refraction plate according to each embodiment can be configured.
  • FIG. 18 is a diagram showing a configuration example of a unit structure according to the eighth embodiment.
  • the unit structure 10d includes a first resonator 14A, a second resonator 16A, a reference conductor 18, a connection line 20A, a connection line 20B, a connection line 20C, and a third resonator. 22, a first auxiliary reference conductor 24, and a second auxiliary reference conductor 26.
  • the first resonator 14A differs from the first resonator 14 shown in FIG. 2 in that the length of at least one side is set to ⁇ /4.
  • the second resonator 16A differs from the second resonator 16 shown in FIG. 2 in that the length of at least one side is set to ⁇ /4.
  • the first resonator 14A is configured to resonate by receiving electromagnetic waves from the +Z-axis direction.
  • the first resonator 14A is configured to radiate electromagnetic waves when resonating.
  • the first resonator 14A is configured to radiate electromagnetic waves in the +Z-axis direction when resonating.
  • the second resonator 16A is configured to radiate electromagnetic waves when resonating.
  • the second resonator 16A is configured to radiate electromagnetic waves in the ⁇ Z-axis direction when resonating.
  • the second resonator 16A is configured to resonate by receiving electromagnetic waves from the ⁇ Z-axis direction.
  • the second resonator 16A may be configured to resonate in a phase different from that of the first resonator 14A.
  • the second resonator 16A may be configured to resonate in a direction different from the resonance direction of the first resonator 14A in the XY plane direction.
  • the second resonator 16A may be configured to resonate in the Y-axis direction.
  • the resonance direction of the second resonator 16A may be configured to change over time with respect to the resonance direction of the first resonator 14A in the XY plane direction.
  • the second resonator 16A may be configured to attenuate and radiate the electromagnetic wave, the first frequency band, received by the first resonator 14A.
  • the third resonator 22 may be arranged between the first resonator 14A and the second resonator 16A in the Z-axis direction.
  • the third resonator 22 may be within the opening 18a of the reference conductor 18.
  • the third resonator 22 may be within the opening 18a so as not to contact the reference conductor 18. That is, the third resonator 22 is surrounded by the reference conductor 18.
  • the first auxiliary reference conductor 24 may be arranged between the first resonator 14A and the reference conductor 18.
  • the first auxiliary reference conductor 24 may be formed of a conductor.
  • the second auxiliary reference conductor 26 may be arranged between the second resonator 16A and the reference conductor 18.
  • the second auxiliary reference conductor 26 may be formed of a conductor.
  • connection line 20A, the connection line 20B, and the connection line 20C is electromagnetically connected to the first resonator 14A.
  • the other ends of the connection line 20A, the connection line 20B, and the connection line 20C are each electromagnetically connected to the second resonator 16A.
  • the connection line 20A, the connection line 20B, and the connection line 20C are electromagnetically connected to the reference conductor 18, the first auxiliary reference conductor 24, and the second auxiliary reference conductor 26, respectively.
  • FIG. 19 is a graph showing the frequency characteristics of the unit structure according to the eighth embodiment.
  • FIG. 19 shows a graph G13 and a graph G14.
  • Graph G13 shows the transmission coefficient.
  • Graph G14 shows the reflection coefficient.
  • the insertion loss in the region from around 18.00 GHz to around 27.00 GHz is -3 dB or more, indicating good transmission characteristics.
  • Graph G14 shows that the reflection coefficient in the region from around 18.00 GHz to around 27.00 GHz is low. That is, the unit structure 10d shown in FIG. 18 has good transmission characteristics over a wide range from around 18.00 GHz to around 27.00 GHz.
  • FIG. 20 is a diagram for explaining the direction of refraction of radio waves by the radio wave refraction plate.
  • FIG. 20 shows the radio wave refraction plate 1.
  • the radio wave refraction plate 1 includes a plurality of unit structures 10.
  • the radio wave refracting plate 1 generally has polarization dependence. In the case of a communication system using horizontally polarized waves and vertically polarized waves, the radio wave refracting plate 1 receives horizontally polarized waves 50 and vertically polarized waves 52 . In this case, the horizontally polarized wave 50 and the vertically polarized wave 52 are not refracted in the same direction. For example, only the vertically polarized wave 52 is refracted by the radio wave refracting plate 1, and the horizontally polarized wave 50 is transmitted through the radio wave refracting plate 1. In this case, the presence of the radio wave refraction plate 1 may reduce received power.
  • FIG. 21 is a diagram illustrating a configuration example of a unit structure according to the ninth embodiment.
  • the unit structure 10e includes a substrate 12, a first resonator 14B, a second resonator 16B, a third resonator 28, a fourth resonator 30, and a first reference conductor 40. , a second reference conductor 42, and a third reference conductor 44.
  • the unit structure 10e has a seven-layer structure in which conductors are laminated in seven layers.
  • the unit structure 10e includes, from the bottom, the second resonator 16B, the third reference conductor 44, the fourth resonator 30, the second reference conductor 42, the third resonator 28, the first reference conductor 40, and the first resonator 14B. Laminated.
  • the unit structure 10e has four-fold rotational symmetry in the XY plane.
  • FIG. 22A is a diagram showing a configuration example of the first resonator 14B according to the ninth embodiment.
  • the first resonator 14B extends in the XY plane.
  • the first resonator 14B is formed, for example, in the shape of a square patch. That is, the first resonator 14B has four-fold rotational symmetry in the XY plane.
  • the first resonator 14B is not in contact with the end of the substrate 12.
  • the size of the first resonator 14B can be arbitrarily changed depending on the design.
  • the layer in which the first resonator 14B is formed may also be referred to as a first layer.
  • a first reference conductor 40 is formed in the layer one layer below the layer in which the first resonator 14B is formed.
  • FIG. 22B is a diagram showing a configuration example of the first reference conductor 40 according to the ninth embodiment. As shown in FIG. 22B, the first reference conductor 40 extends in the XY plane.
  • the first reference conductor 40 has a square shape.
  • the first reference conductor 40 has a gap 40a, a gap 40b, a gap 40c, and a gap 40d.
  • the gap 40a is formed, for example, at the upper left corner of the first reference conductor 40.
  • the gap 40b is formed, for example, at the upper right corner of the first reference conductor 40.
  • the gap 40c is formed, for example, at the lower left corner of the first reference conductor 40.
  • the gap 40d is formed, for example, at the lower right corner of the first reference conductor 40.
  • the void 40a, the void 40b, the void 40c, and the void 40d may be formed in the same square shape, for example.
  • the first reference conductor 40 has a gap 40a to a gap 40d so as to have four-fold rotational symmetry.
  • the sizes of the gaps 40a to 40d can be changed arbitrarily depending on the design.
  • the layer in which the first reference conductor 40 is formed may also be called a second layer.
  • FIG. 22C is a diagram showing a configuration example of the third resonator 28 according to the ninth embodiment.
  • the third resonator 28 extends in the XY plane.
  • the third resonator 28 is formed, for example, in the shape of a square patch. That is, the third resonator 28 has four-fold rotational symmetry in the XY plane.
  • the third resonator 28 is not in contact with the edge of the substrate 12.
  • Third resonator 28 may be different in size from first resonator 14B.
  • the third resonator 28 is, for example, smaller than the first resonator 14B.
  • the size of the third resonator 28 can be arbitrarily changed depending on the design.
  • the first resonator 14B and the third resonator 28 are magnetically or capacitively connected via the air gap 40a to the air gap 40d.
  • the layer in which the third resonator 28 is formed may also be referred to as a third layer.
  • FIG. 22D is a diagram showing a configuration example of the second reference conductor 42 according to the ninth embodiment.
  • the second reference conductor 42 extends in the XY plane.
  • the second reference conductor 42 has a square shape.
  • the second reference conductor 42 has a gap 42a, a gap 42b, a gap 42c, and a gap 42d.
  • the gap 42a is formed, for example, at the upper left corner of the second reference conductor 42.
  • the gap 42b is formed, for example, at the upper right corner of the second reference conductor 42.
  • the gap 42c is formed, for example, at the lower left corner of the second reference conductor 42.
  • the gap 42d is formed, for example, at the lower right corner of the second reference conductor 42.
  • the void 40a, the void 40b, the void 40c, and the void 40d may be formed in the same square shape, for example.
  • the second reference conductor 42 has a gap 42a to a gap 42d so as to have four-fold rotational symmetry.
  • the voids 42a to 42d may have different sizes from the voids 40a to 40d of the first reference conductor 40, respectively.
  • the sizes of the gaps 42a to 42d are, for example, larger than the gaps 40a to 40d of the first reference conductor 40, respectively.
  • the sizes of the gaps 42a to 42d can be changed arbitrarily depending on the design.
  • the layer in which the second reference conductor 42 is formed may also be called a fourth layer.
  • the fourth resonator 30 is formed in the layer one layer below the layer in which the second reference conductor 42 is formed.
  • FIG. 22E is a diagram showing a configuration example of the fourth resonator 30 according to the ninth embodiment.
  • the fourth resonator 30 extends in the XY plane.
  • the fourth resonator 30 has a square patch shape. That is, the fourth resonator 30 has four-fold rotational symmetry in the XY plane.
  • the fourth resonator 30 is not in contact with the edge of the substrate 12.
  • the fourth resonator 30 has the same shape as the third resonator 28 shown in FIG. 22C.
  • the third resonator 28 and the fourth resonator 30 are magnetically or capacitively connected via the air gap 42a to the air gap 42d.
  • the layer in which the fourth resonator 30 is formed may also be called a fifth layer.
  • a third reference conductor 44 is formed in the layer one layer below the layer in which the fourth resonator 30 is formed.
  • FIG. 22F is a diagram showing a configuration example of the third reference conductor 44 according to the ninth embodiment. As shown in FIG. 22F, the third reference conductor 44 extends in the XY plane. The third reference conductor 44 has a square shape. The third reference conductor 44 has a gap 44a, a gap 44b, a gap 44c, and a gap 44d. The third reference conductor 44 has the same shape as the second reference conductor 42 shown in FIG. 22B. The layer in which the third reference conductor 44 is formed may also be referred to as the sixth layer.
  • FIG. 22G is a diagram showing a configuration example of the second resonator 16B according to the ninth embodiment.
  • the second resonator 16B extends in the XY plane.
  • the second resonator 16B is formed, for example, in the shape of a square patch. That is, the second resonator 16B has four-fold rotational symmetry in the XY plane.
  • the second resonator 16B has the same shape as the first resonator 14B shown in FIG. 22A.
  • the second resonator 16B and the fourth resonator 30 are magnetically or capacitively connected via the air gap 44a to the air gap 44d.
  • the layer in which the second resonator 16B is formed is also called the seventh layer.
  • a resonator in an odd numbered layer, and a reference conductor may be formed in an even numbered layer.
  • the first resonator 14B and the third resonator 28 are magnetically or capacitively connected at four-fold rotationally symmetrical positions.
  • the third resonator 28 and the fourth resonator 30 are magnetically or capacitively connected at four-fold rotationally symmetrical positions.
  • the second resonator 16B and the fourth resonator 30 are magnetically or capacitively connected at four-fold rotationally symmetrical positions. Therefore, the unit structure 10e operates as a filter for both horizontally polarized waves and vertically polarized waves.
  • FIG. 23 is a diagram for explaining the direction of refraction of radio waves by the radio wave refraction plate according to the ninth embodiment.
  • FIG. 23 shows a radio wave refraction plate 1D according to the ninth embodiment.
  • the radio wave refracting plate 1D includes a plurality of unit structures 10e. As shown in FIG. 23, the radio wave refracting plate 1D receives horizontally polarized waves 50 and vertically polarized waves 52 received from a base station or the like in the same direction. In this case, the horizontally polarized wave 50 and the vertically polarized wave 52 are refracted in the same direction. Therefore, in the ninth embodiment, high received power can be obtained in the refraction direction of the radio wave refraction plate 1D.
  • the unit structure 10e has been described as having four-fold rotational symmetry, but the present disclosure is not limited thereto.
  • the unit structure of the present disclosure may have N (N is an integer of 3 or more) rotational symmetry.
  • each reference conductor has been described as having voids formed at the four corners of a square patch-shaped conductor.
  • the present disclosure is not limited thereto.
  • FIG. 24 is a diagram illustrating a configuration example of a reference conductor according to a first modification of the ninth embodiment.
  • the reference conductor 60 may be formed in a square shape.
  • the reference conductor 60 has a gap 60a, a gap 60b, a gap 60c, and a gap 60d.
  • the void 60a may be formed at the upper center of the reference conductor 60.
  • the void 60b may be formed at the center right part of the reference conductor 60.
  • the void 60c may be formed at the lower center of the reference conductor 60.
  • the void 60d may be formed at the center left part of the reference conductor 60.
  • the voids 60a to 60d may each be formed in the same rectangular shape.
  • the reference conductor 60 has four-fold rotational symmetry in the XY plane.
  • FIG. 25 is a diagram illustrating a configuration example of a unit structure according to the first modification of the ninth embodiment.
  • the unit structure 10f includes a substrate 12, a first resonator 14B, a second resonator 16B, a third resonator 28, a reference conductor 60-1, and a reference conductor 60-2. ,including.
  • the second resonator 16B, the reference conductor 60-2, the third resonator 28, the reference conductor 60-1, and the first resonator 14B are stacked in this order from the bottom.
  • the substrate 12, the first resonator 14B, the second resonator 16B, the third resonator 28, the reference conductor 60-1, and the reference conductor 60-2 each extend in the XY plane.
  • the unit structure 10f has four-fold rotational symmetry in the XY plane.
  • the reference conductor 60-1 and the reference conductor 60-2 have the same configuration as the reference conductor 60 shown in FIG. In FIG. 25, the first resonator 14B and the third resonator 28 are magnetically or capacitively connected via the air gap 60a to the air gap 60d of the reference conductor 60-1.
  • the second resonator 16B and the third resonator 28 are magnetically or capacitively connected via the air gap 60a to the air gap 60d of the reference conductor 60-2.
  • the unit structure 10f has four-fold rotational symmetry in the XY plane.
  • FIG. 26 is a diagram illustrating a configuration example of a reference conductor according to a second modification of the ninth embodiment.
  • the reference conductor 62 includes a center conductor 62-1 and a surrounding conductor 62-2.
  • the center conductor 62-1 may be formed into a square shape.
  • the surrounding conductor 62-2 may be formed into a square shape.
  • the surrounding conductor 62-2 has a gap 62a in the center.
  • the void 62a may be formed in a square shape.
  • the center conductor 62-1 may be located at the center within the void 62a.
  • the reference conductor 62 has four-fold rotational symmetry in the XY plane.
  • FIG. 27 is a diagram illustrating a configuration example of a unit structure according to a second modification of the ninth embodiment.
  • the unit structure 10g includes a substrate 12, a first resonator 14B, a second resonator 16B, and a reference conductor 62.
  • the second resonator 16B, the reference conductor 62, and the first resonator 14B are stacked in this order from the bottom.
  • the first resonator 14B and the second resonator 16B are magnetically or capacitively connected via the air gap 62a of the reference conductor 62.
  • the unit structure 10g has four-fold rotational symmetry in the XY plane.
  • FIG. 28 is a diagram illustrating a configuration example of a reference conductor according to a third modification of the ninth embodiment.
  • the reference conductor 64 includes a center conductor 64-1 and a surrounding conductor 64-2.
  • the center conductor 64-1 may be formed in a cross shape.
  • the surrounding conductor 64-2 may be formed into a square shape.
  • the surrounding conductor 64-2 has a gap 64a in the center.
  • the void 64a may be formed in a square shape.
  • the center conductor 64-1 may be located at the center within the void 64a.
  • the reference conductor 64 has four-fold rotational symmetry in the XY plane.
  • FIG. 29 is a diagram showing a configuration example of a unit structure according to a third modification of the ninth embodiment.
  • the unit structure 10h includes a substrate 12, a first resonator 14B, a second resonator 16B, and a reference conductor 64.
  • the second resonator 16B, the reference conductor 64, and the first resonator 14B are stacked in this order from the bottom.
  • the first resonator 14B, the second resonator 16B, and the reference conductor 64 extend in the XY plane.
  • the first resonator 14B and the second resonator 16B are magnetically or capacitively connected via the air gap 64a of the reference conductor 64.
  • the unit structure 10h has four-fold rotational symmetry in the XY plane.
  • FIG. 30 is a diagram illustrating a configuration example of a reference conductor according to a fourth modification of the ninth embodiment.
  • the reference conductor 66 includes a surrounding conductor 66-1, an upper conductor 66-2, a right conductor 66-3, a lower conductor 66-4, and a left conductor 66-5. include.
  • the surrounding conductor 66-1 may be formed into a square frame shape.
  • the surrounding conductor 66-1 has a square void 66a.
  • the upper conductor 66-2 may be formed at the center of the upper side of the surrounding conductor 66-1 within the gap 66a.
  • the right conductor 66-3 may be formed in the center of the right side of the surrounding conductor 66-1 within the gap 66a.
  • the lower conductor 66-4 may be formed at the center of the lower side of the surrounding conductor 66-1 within the gap 66a.
  • the left conductor 66-5 may be formed at the center of the left side of the surrounding conductor 66-1 within the gap 66a.
  • the upper conductor 66-2, the right conductor 66-3, the lower conductor 66-4, and the left conductor 66-5 may be formed in the same shape.
  • the upper conductor 66-2, the right conductor 66-3, the lower conductor 66-4, and the left conductor 66-5 may be formed into a rectangular shape, for example.
  • the reference conductor 66 has four-fold rotational symmetry in the XY plane.
  • FIG. 31 is a diagram showing a configuration example of a unit structure according to a fourth modification of the ninth embodiment.
  • the unit structure 10i includes a substrate 12, a first resonator 14B, a second resonator 16B, and a reference conductor 66.
  • the second resonator 16B, the reference conductor 66, and the first resonator 14B are stacked in this order from the bottom.
  • the first resonator 14B and the second resonator 16B are magnetically or capacitively connected via the air gap 66a of the reference conductor 66.
  • the unit structure 10i has four-fold rotational symmetry in the XY plane.
  • FIG. 32 is a diagram illustrating a configuration example of a reference conductor according to a fifth modification of the ninth embodiment.
  • the reference conductor 68 includes a surrounding conductor 68-1, an upper conductor 68-2, a right conductor 68-3, a lower conductor 68-4, and a left conductor 68-5.
  • the surrounding conductor 68-1 may be formed into a square frame shape.
  • the surrounding conductor 68-1 has a square void 68a.
  • the reference conductor 68 has a T-shape including a surrounding conductor 68-1, an upper conductor 68-2, a right conductor 68-3, a lower conductor 68-4, and a left conductor 68-5. This differs from the reference conductor 66 shown in FIG. 30 in this point.
  • FIG. 33 is a diagram illustrating a configuration example of a unit structure according to a fifth modification of the ninth embodiment.
  • the unit structure 10j includes a substrate 12, a first resonator 14B, a second resonator 16B, and a reference conductor 68.
  • the second resonator 16B, the reference conductor 68, and the first resonator 14B are stacked in this order from the bottom.
  • the first resonator 14B, the second resonator 16B, and the reference conductor 68 extend in the XY plane.
  • the first resonator 14B and the second resonator 16B are magnetically or capacitively connected via the gap 68a of the reference conductor 68.
  • the unit structure 104 has four-fold rotational symmetry in the XY plane.
  • FIG. 34 is a diagram illustrating a configuration example of a reference conductor according to a sixth modification of the ninth embodiment.
  • the reference conductor 70 includes a frame conductor 70-1 and a frame conductor 70-2.
  • the frame conductor 70-1 may be formed into a square frame shape.
  • the frame conductor 70-1 has a square void 70a.
  • Frame conductor 70-2 may be formed within void 70a.
  • the frame conductor 70-2 may be formed into a square frame shape.
  • the frame conductor 70-2 has a square-shaped void 70b. In the XY plane, the center of the void 70a and the center of the void 70b may coincide.
  • the reference conductor 70 has four-fold rotational symmetry in the XY plane.
  • FIG. 35 is a diagram illustrating a configuration example of a unit structure according to a sixth modification of the ninth embodiment.
  • the unit structure 10k includes a substrate 12, a first resonator 14C, a second resonator 16C, and a reference conductor 70.
  • the second resonator 16C, the reference conductor 70, and the first resonator 14C are stacked in this order from the bottom.
  • the first resonator 14C, the second resonator 16C, and the reference conductor 70 extend in the XY plane.
  • the first resonator 14C is formed in a square shape.
  • the first resonator 14C is formed into a frame shape.
  • the second resonator 16C is formed in a square shape.
  • the second resonator 16C is formed into a frame shape.
  • the first resonator 14C and the second resonator 16C have the same shape.
  • FIG. 36 is a diagram illustrating a configuration example of a resonator according to a sixth modification of the ninth embodiment. As shown in FIG. 36, the first resonator 14C has a square frame shape. That is, the shape of the resonator formed in the odd-numbered layer of the present disclosure is not limited to a square shape.
  • the first resonator 14C and the second resonator 16C are configured to be magnetically or capacitively connected via a gap 70a and a gap 70b.
  • FIG. 37 is a diagram illustrating a configuration example of a resonator according to a seventh modification of the ninth embodiment.
  • the first resonator 14D may be formed in a triangular shape.
  • the first resonator 14D has three-fold rotational symmetry. That is, in the present disclosure, the resonator may be formed into an N (N is an integer of 3 or more) polygon shape or a circular shape.
  • FIG. 38 and FIG. 39 are diagrams showing a configuration example of a unit structure according to the tenth embodiment. 38 and 39 are views of the unit structure 10l and the unit structure 10m, respectively, viewed from above.
  • the substrate 12A is formed in a hexagonal shape when viewed from above. That is, the unit structure 10l is a hexagonal prism.
  • the first resonator 14E may be formed in a hexagonal shape. That is, the unit structure according to the tenth embodiment may be formed into a polygon. Specifically, the unit structure according to the tenth embodiment may be formed into an N (N is an integer of 3 or more) polygon.
  • the substrate 12B is formed into a circular shape when viewed from above. That is, the unit structure 10m is a cylinder. In this case, the first resonator 14F may be formed in a circular shape.
  • the configuration of the unit structure is not limited to a square prism, but can have various shapes.
  • FIG. 40 is a diagram illustrating a configuration example of a unit structure according to the eleventh embodiment.
  • the unit structure 10n includes a connection line 20, a connection conductor 80, a connection conductor 82, a variable capacitor 90, and a variable capacitor 92. It is different from 10a.
  • connection conductor 80 may be formed on the same surface as the first resonator 14.
  • the connecting conductor 80 is smaller than the first resonator 14 .
  • the connection conductor 80 can be lined up with the first resonator 14 with a gap therebetween.
  • connection conductor 82 may be formed on the same surface as the second resonator 16.
  • the connecting conductor 82 is smaller than the second resonator 16 .
  • the connection conductor 82 may be arranged with a gap between the second resonator 16 and the second resonator 16 .
  • the variable capacitance element 90 may be placed in the gap between the first resonator 14 and the connection conductor 80.
  • the variable capacitance element 90 may have one end connected to the first resonator 14 and the other end connected to the connection conductor 80.
  • the variable capacitance element 90 is, for example, a varactor diode, but is not limited to this.
  • variable capacitance element 92 may be placed in the gap between the second resonator 16 and the connection conductor 82.
  • the variable capacitance element 92 may have one end connected to the second resonator 16 and the other end connected to the connection conductor 82.
  • the variable capacitance element 92 is, for example, a varactor diode, but is not limited to this.
  • variable capacitance element 90 and the variable capacitance element 92 do not necessarily need to be arranged. At least one of the variable capacitance element 90 and the variable capacitance element 92 may be disposed.
  • connection line 20 is connected to the connection conductor 80, and the other end of the connection line 20 is connected to the connection conductor 82.
  • the connection line 20 may be a line parallel to the Z-axis direction.
  • the reference conductor 18 has a through hole 18a and a through hole 18b through which the connection line 20 passes.
  • variable capacitance element 91 and the variable capacitance element 92 are arranged so as to connect the first resonator 14 and the second resonator 16.
  • FIG. 41 is a diagram showing a schematic configuration example of a unit structure according to the eleventh embodiment.
  • a variable capacitor C is connected between the first resonator 14 and the second resonator 16.
  • the refraction angle, convergence degree, transmittance, etc. of radio waves may change. That is, by connecting a variable capacitor C between the first resonator 14 and the second resonator 16 and dynamically controlling the capacitance, the refraction angle, convergence degree, transmittance, etc. of radio waves can be dynamically adjusted. It becomes possible to control.
  • the unit structure 10n shifts the phase of electromagnetic waves near 27.75 GHz by about 28 degrees. It shall be. In this case, for example, if the capacitance connected between the first resonator 14 and the second resonator 16 is changed to 14 fF, the phase shift of the electromagnetic wave near 27.75 GHz of the unit structure 10n will be -33 It changes by about °.
  • the capacitance between the first resonator 14 and the second resonator 16 can be controlled by controlling the voltage applied to the variable capacitance element 90 and the variable capacitance element 92.
  • the voltage applied to the variable capacitance element 90 and the variable capacitance element 92 may be reduced. can be controlled to change the refraction angle, degree of convergence, transmittance, etc. of radio waves.
  • the voltages applied to the variable capacitance element 90 and the variable capacitance element 92 may be set automatically, for example, by a control device (not shown) based on the reception sensitivity of the receiver, or may be set manually.
  • the unit structure is changed by changing the voltage applied to the variable capacitance element 90 and the variable capacitance element 92 connected between the first resonator 14 and the second resonator 16.
  • the resonant frequency of 10n can be controlled.
  • the eleventh embodiment can dynamically control the refraction angle, convergence degree, and transmittance of radio waves.
  • variable capacitance element 90 and the variable capacitance element 92 are connected between the first resonator 14 and the second resonator 16.
  • a variable inductor may be connected between the first resonator 14 and the second resonator 16.
  • the first resonator 14 and the second resonator 16 are connected magnetically or capacitively. Therefore, depending on the balance of magnetic coupling and capacitive coupling between the first resonator 14 and the second resonator 16, a variable capacitance element is inserted between the first resonator 14 and the second resonator 16. Alternatively, you can connect a variable inductor.
  • FIG. 42 is a diagram showing a configuration example of a unit structure according to the twelfth embodiment.
  • FIG. 43 is a cross-sectional view of a configuration example of a unit structure according to the twelfth embodiment.
  • the unit structure 10o includes a substrate 12, a first resonator 14, a second resonator 16, a variable capacitance element 90, a variable capacitance element 92, a variable capacitance element 94, and a variable capacitance element 90.
  • the second resonator 16 In the unit structure 10o, the second resonator 16, the second reference conductor 102, the first reference conductor 100, and the first resonator 14 are stacked in this order from the bottom.
  • the first reference conductor 100 extends in the XY plane.
  • the first reference conductor 100 is formed in a square shape.
  • the first reference conductor 100 has a rectangular gap 100a.
  • a rectangular third resonator 110 is formed in the air gap 100a.
  • the second reference conductor 102 extends in the XY plane.
  • the second reference conductor 102 is formed into a square shape.
  • the second reference conductor 102 has a rectangular gap 102a.
  • a rectangular fourth resonator 112 is formed in the air gap 102a.
  • the third resonator 110 is connected to the first reference conductor 100.
  • the third resonator 110 extends from the connection part with the first reference conductor 100 toward the ⁇ X direction.
  • the unit structure 10o has a gap between the remaining three sides of the third resonator 110 and the first reference conductor 100.
  • the first reference conductor 100 and the third resonator 110 are magnetically or capacitively connected through a gap.
  • the fourth resonator 112 extends from the connection part with the second reference conductor 102 in the X direction.
  • the second reference conductor 102 and the fourth resonator 112 have a structure in which the first reference conductor 100 and the third resonator 110 are rotated by 180 degrees in the XY plane.
  • the unit structure 10o has a gap between the remaining three sides of the fourth resonator 112 and the second reference conductor 102.
  • the second reference conductor 102 and the fourth resonator 112 are magnetically or capacitively connected through a gap.
  • connection line 120 and the connection line 122 are located between the first resonator 14 and the first reference conductor 100.
  • connection line 120 connects the first resonator 14 and the first reference conductor 100 magnetically or capacitively. One end of the connection line 120 is connected to the first resonator 14 , and the other end of the connection line 120 is connected to the first reference conductor 100 . Note that there may be two or more connection lines that magnetically or capacitively connect the first resonator 14 and the first reference conductor 100.
  • connection line 122 connects the first resonator 14 and the third resonator 110 magnetically or capacitively.
  • One end of the connection line 122 is connected to the first resonator 14
  • the other end of the connection line 122 is connected to the third resonator 110 .
  • connection line 124 and the connection line 126 are located between the second resonator 16 and the second reference conductor 102.
  • connection line 124 connects the second resonator 16 and the fourth resonator 112 magnetically or capacitively. One end of the connection line 124 is connected to the second resonator 16, and the other end of the connection line 124 is connected to the fourth resonator 112. Note that there may be two or more connection lines that magnetically or capacitively connect the second resonator 16 and the fourth resonator 112.
  • connection line 126 connects the second resonator 16 and the second reference conductor 102 magnetically or capacitively. One end of the connection line 126 is connected to the second resonator 16, and the other end of the connection line 126 is connected to the second reference conductor 102. Note that there may be two or more connection lines that magnetically or capacitively connect the second resonator 16 and the second reference conductor 102.
  • variable capacitance element 90 is arranged between the first resonator 14 and the first reference conductor 100.
  • the variable capacitance element 90 is arranged, for example, at a connection portion between the first reference conductor 100 and the connection line 120.
  • variable capacitance element 92 is arranged in the gap between the first reference conductor 100 and the third resonator 110.
  • the variable capacitance element 92 is arranged, for example, in a gap between the first reference conductor 100 and a side of the third resonator 110 that is opposite to the side connected to the first reference conductor 100 .
  • variable capacitance element 94 is arranged in the gap between the second reference conductor 102 and the fourth resonator 112.
  • the variable capacitance element 94 is arranged, for example, in a gap between the second reference conductor 102 and a side of the fourth resonator 112 that is opposite to the side connected to the second reference conductor 102 .
  • variable capacitance element 96 is arranged between the second resonator 16 and the second reference conductor 102.
  • the variable capacitance element 96 is arranged, for example, at a connection portion between the second reference conductor 102 and the connection line 126.
  • variable capacitance element is connected between each resonator and each reference conductor in the unit structure 10o.
  • the twelfth embodiment by applying a voltage to each of the variable capacitance elements 90 to 96, the capacitance between each resonator and each reference conductor changes, so the resonant frequency of the unit structure 10o is changed. It can be changed. Thereby, the twelfth embodiment can dynamically control the refraction angle, degree of convergence, and transmittance of radio waves.
  • the unit structure 10o shifts the phase of electromagnetic waves near 22.50 GHz by about ⁇ 67° when the variable capacitance elements 90 and 96 are not connected.
  • the capacitance from the variable capacitance element 90 to the variable capacitance element 96 is changed to 0.005 pF (pico Farad)
  • the phase shift amount of the electromagnetic wave near 22.50 GHz of the unit structure 10o changes to about -114°.
  • the capacitance of the variable capacitance elements 90 to 96 is not limited to 0.005 pF, and may be arbitrarily changed according to the design.
  • the capacitance between the resonators can be changed by changing the voltage applied to the variable capacitance element connected between each resonator and each reference conductor.
  • the twelfth embodiment can dynamically control the refraction angle, degree of convergence, and transmittance of radio waves.
  • FIG. 44 is a diagram illustrating a configuration example of a unit structure according to the first modification of the twelfth embodiment.
  • FIG. 45 is a cross-sectional view of a configuration example of a unit structure according to a first modification of the twelfth embodiment.
  • the third resonator 110 and the fourth resonator 112 are configured to face each other. It is different from the unit structure 10o. That is, the unit structure 10p has a configuration in which the second reference conductor 102 and the fourth resonator 11 of the unit structure 10o shown in FIGS. 42 and 43 are rotated by 180 degrees in the XY plane.
  • the refraction angle, convergence degree, and transmittance of radio waves are dynamically controlled. be able to.
  • the unit structure 10p shifts the phase of electromagnetic waves near 22.50 GHz by about ⁇ 102° when the variable capacitance elements 90 and 96 are not connected.
  • the capacitance from the variable capacitance element 90 to the variable capacitance element 96 is changed to 0.005 pF (pico Farad)
  • the phase shift amount of the electromagnetic wave near 22.50 GHz of the unit structure 10p changes to about -143°.
  • the capacitance of the variable capacitance elements 90 to 96 is not limited to 0.005 pF, and may be arbitrarily changed according to the design.
  • the resonant frequency of the unit structure 10o is changed, so that the refraction angle of the radio wave refraction plate, etc. It was explained as a change.
  • the method of changing the resonant frequency of the unit structure 10o is not limited to this.
  • a part of the first reference conductor 100 or the second reference conductor 102 is may be trimmed.
  • the strength of the magnetic or capacitive connection between the first reference conductor 100 and the third resonator 110 changes, so that the resonant frequency of the unit structure 10o can also be changed.
  • each variable capacitance element is connected between each resonator.
  • a variable inductor may be connected between each resonator.
  • Each resonator is connected magnetically or capacitively. Therefore, a variable capacitance element or a variable inductor may be connected between each resonator depending on the balance between magnetic coupling and capacitive coupling of each resonator.
  • the resonance frequency is changed by connecting the variable capacitance element between the resonators or between the resonator and the reference conductor.
  • a liquid crystal may be inserted between the reference conductors.
  • FIG. 46 is a cross-sectional view of a configuration example of a unit structure according to the thirteenth embodiment.
  • the unit structure 10q includes a substrate 12, a first resonator 14, a second resonator 16, a variable capacitance element 90, a variable capacitance element 92, a variable capacitance element 94, and a variable capacitance element 90.
  • the unit structure 10q is the same as the unit structure 10o shown in FIGS. 42 and 43, except that it includes the variable permittivity material 130, so a description thereof will be omitted.
  • variable permittivity material 130 is inserted between the first reference conductor 100 and the second reference conductor 102.
  • the variable permittivity material 130 is a material whose permittivity changes when a voltage is applied. Examples of the variable permittivity material 130 include, but are not limited to, liquid crystal.
  • the resonant frequency of the unit structure 10q can be changed by applying a voltage to the variable permittivity material 130 to change the permittivity. That is, in the thirteenth embodiment, by controlling the dielectric constant of the variable permittivity material 130, the resonance frequency of the dielectric constant of the unit structure 10q can be controlled.
  • the thirteenth embodiment changes the resonant frequency of the unit structure 10q by changing the dielectric constant of the variable permittivity material 130 inserted between the first reference conductor 100 and the second reference conductor 102. It can be changed. As a result, the thirteenth embodiment can dynamically control the refraction angle, convergence degree, and transmittance of radio waves.
  • the dielectric constant variable material 130 is inserted between the first reference conductor 100 and the second reference conductor 102 to change the dielectric constant.
  • the configuration for changing the dielectric constant is not limited to this.
  • the substrate 12 may be made of a variable dielectric constant material such as liquid crystal.
  • a voltage can be applied to the substrate 12 to change the dielectric constant.
  • the resonant frequency of the unit structure 10q can be changed.
  • the modification of the thirteenth embodiment it becomes possible to dynamically control the refraction angle, convergence degree, and transmittance of radio waves.
  • FIG. 47 is a diagram showing a configuration example of a unit structure according to the fourteenth embodiment.
  • the unit structure 10r includes a first dielectric layer 140, a second dielectric layer 142, a third dielectric layer 144, a fourth dielectric layer 146, and a first reference conductor 150. , a second reference conductor 152, a third reference conductor 154, a first floating conductor 160, a second floating conductor 162, and a third floating conductor 164.
  • the first reference conductor 150 and the first floating conductor 160 are formed in the same layer.
  • the second reference conductor 152 and the second floating conductor 162 are formed in the same layer.
  • the third reference conductor 154 and the third floating conductor 164 are formed in the same layer.
  • the unit structure 10r includes, from the bottom, a fourth dielectric layer 146, a third reference conductor 154 and a third floating conductor 164, a third dielectric layer 144, a second reference conductor 152 and a second floating conductor 162, and a second dielectric layer.
  • the layer 142, the first reference conductor 150, and the first floating conductor 160 are laminated in this order.
  • the first dielectric layer 140 is formed as the top layer.
  • the first dielectric layer 140 extends in the XY plane.
  • First dielectric layer 140 is part of substrate 12 .
  • the dielectric constant, thickness, etc. of the first dielectric layer 140 can be arbitrarily changed depending on the design.
  • a first reference conductor 150 and a first floating conductor 160 are formed in the layer one layer below the first dielectric layer 140.
  • the first reference conductor 150 and the first floating conductor 160 may also be referred to as a bonding layer.
  • FIG. 48 is a diagram for explaining a configuration example of a bonding layer according to the fourteenth embodiment.
  • the first reference conductor 150 extends in the XY plane.
  • the first reference conductor 150 may be formed into a square frame shape.
  • the first reference conductor 150 has a square void 150a.
  • the size of the void 150a can be arbitrarily changed depending on the design.
  • the first floating conductor 160 is arranged in the air gap 150a.
  • the first reference conductor 150 may also be called a first frame-shaped conductor.
  • the first floating conductor 160 spreads in the XY plane.
  • the first floating conductor 160 includes, for example, a conductor 160a, a conductor 160b, a conductor 160c, a conductor 160d, a conductor 160e, a conductor 160f, a conductor 160g, a conductor 160h, and a conductor 160i.
  • Conductors 160a to 160i spread in the XY plane.
  • Conductors 160a to 160i may be square patch conductors.
  • the conductors 160a to 160i may be arranged in a square shape.
  • the first floating conductor 160 has a structure in which one square conductor is equally divided into nine parts.
  • a gap is formed between the conductor 160a and the first reference conductor 150.
  • a gap is formed between the conductor 160a and the conductor 160b.
  • a gap is formed between the conductor 160a and the conductor 160d.
  • the conductor 160a and the conductor 160b are connected magnetically or capacitively.
  • the conductor 160a and the conductor 160d are connected magnetically or capacitively.
  • a gap is formed between the conductor 160b and the first reference conductor 150.
  • a gap is formed between the conductor 160b and the conductor 160c.
  • a gap is formed between the conductor 160b and the conductor 160e.
  • the conductor 160b and the conductor 160c are connected magnetically or capacitively.
  • the conductor 160b and the conductor 160e are connected magnetically or capacitively.
  • a gap is formed between the conductor 160c and the first reference conductor 150.
  • a gap is formed between the conductor 160c and the conductor 160f.
  • the conductor 160c and the conductor 160f are connected magnetically or capacitively.
  • a gap is formed between the conductor 160d and the first reference conductor 150.
  • a gap is formed between the conductor 160d and the conductor 160e.
  • a gap is formed between the conductor 160d and the conductor 160g.
  • the conductor 160d and the conductor 160e are connected magnetically or capacitively.
  • the conductor 160d and the conductor 160g are connected magnetically or capacitively.
  • a gap is formed between the conductor 160e and the conductor 160f.
  • a gap is formed between the conductor 160e and the conductor 160h.
  • the conductor 160e and the conductor 160f are connected magnetically or capacitively.
  • the conductor 160e and the conductor 160h are connected magnetically or capacitively.
  • a gap is formed between the conductor 160f and the first reference conductor 150.
  • a gap is formed between the conductor 160f and the conductor 160i.
  • the conductor 160f and the conductor 160i are connected magnetically or capacitively.
  • a gap is formed between the conductor 160g and the first reference conductor 150.
  • a gap is formed between the conductor 160g and the conductor 160h.
  • the conductor 160g and the conductor 160h are connected magnetically or capacitively.
  • a gap is formed between the conductor 160h and the first reference conductor 150.
  • a gap is formed between the conductor 160h and the conductor 160i.
  • the conductor 160h and the conductor 160i are connected magnetically or capacitively.
  • a gap is formed between the conductor 160i and the first reference conductor 150.
  • the first floating conductor 160 has been described as having a structure in which one square conductor is divided into nine parts, but the present disclosure is not limited to this.
  • the first floating conductor 160 has, for example, a structure in which one square conductor is divided into two, four, or sixteen parts.
  • the first floating conductor 160 may be composed of, for example, one square conductor. That is, the configuration of the first floating conductor 160 can be arbitrarily changed depending on the design.
  • a second dielectric layer 142 is formed one layer below the first reference conductor 150 and the first floating conductor 160.
  • the second dielectric layer 142 extends in the XY plane.
  • Second dielectric layer 142 is part of substrate 12 .
  • the dielectric constant, thickness, etc. of the second dielectric layer 142 can be arbitrarily changed depending on the design.
  • a second reference conductor 152 and a second floating conductor 162 are formed in the layer one below the second dielectric layer 142.
  • the second reference conductor 152 and the second floating conductor 162 may also be referred to as a bonding layer.
  • the second reference conductor 152 extends in the XY plane.
  • the second reference conductor 152 may be formed into a square frame shape, similar to the first reference conductor 150 shown in FIG. 48.
  • the second reference conductor 152 has a frame width narrower than that of the first reference conductor 150, for example.
  • the width of the frame of the second reference conductor 152 can be arbitrarily changed depending on the design.
  • the second reference conductor 152 may also be called a second frame-shaped conductor.
  • the second floating conductor 162 spreads in the XY plane.
  • the second floating conductor 162 may include nine conductors, similar to the first floating conductor 160 shown in FIG.
  • the nine conductors included in the second floating conductor 162 are smaller than, for example, the conductors 160a to 160i shown in FIG. 48.
  • the sizes of the nine conductors included in the second floating conductor 162 can be arbitrarily changed depending on the design.
  • the configuration of the second floating conductor 162 can be arbitrarily changed depending on the design.
  • the first floating conductor 161 and the second floating conductor 162 may be connected magnetically or capacitively.
  • a third dielectric layer 144 is formed one layer below the second reference conductor 152 and the second floating conductor 162.
  • the third dielectric layer 144 extends in the XY plane.
  • Third dielectric layer 144 is part of substrate 12 .
  • the dielectric constant, thickness, etc. of the third dielectric layer 144 can be arbitrarily changed depending on the design.
  • a third reference conductor 154 and a third floating conductor 164 are formed in the layer one layer below the third dielectric layer 144.
  • the third reference conductor 154 and the third floating conductor 164 may also be referred to as a bonding layer.
  • the third reference conductor 154 extends in the XY plane.
  • the third reference conductor 154 has the same configuration as the first reference conductor 150 shown in FIG. 48.
  • the configuration of the third reference conductor 154 can be arbitrarily changed depending on the design.
  • the third reference conductor 154 may also be called a third frame-shaped conductor.
  • the third floating conductor 164 spreads in the XY plane.
  • the third floating conductor 164 has a similar configuration to the first floating conductor 160 shown in FIG. 48.
  • the configuration of the third floating conductor 164 can be arbitrarily changed depending on the design.
  • the second floating conductor 162 and the third floating conductor 166 may be connected magnetically or capacitively.
  • a fourth dielectric layer 146 is formed one layer below the third reference conductor 154 and the third floating conductor 164.
  • the fourth dielectric layer 146 extends in the XY plane.
  • Fourth dielectric layer 146 is part of substrate 12 .
  • the dielectric constant, thickness, etc. of the fourth dielectric layer 146 can be arbitrarily changed depending on the design.
  • the unit structure 10r includes four dielectric layers and three bonding layers.
  • the first dielectric layer 140, the second dielectric layer 142, the third dielectric layer 144, and the fourth dielectric layer 146 can be used as a resonator. can.
  • FIG. 49 is a graph showing the frequency characteristics of the unit structure according to the fourteenth embodiment.
  • FIG. 49 shows a graph G15 and a graph G16.
  • Graph G15 shows the transmission coefficient.
  • Graph G16 shows the reflection coefficient.
  • FIG. 49 shows the reflection characteristics and reflection characteristics when electromagnetic waves are incident on the fourth dielectric layer 146 along the Z-axis direction and exit from the first dielectric layer 140.
  • the insertion loss in the region from around 14.00 GHz to around 27.00 GHz is -3 dB or more, indicating good transmission characteristics.
  • Graph G16 shows good reflection characteristics with a reflection coefficient of ⁇ 10 dB or less in the region from around 14.00 GHz to around 27.00 GHz. That is, the unit structure 10r shown in FIG. 47 has good transmission characteristics and reflection characteristics in the region from around 14.00 GHz to around 27.00 GHz.
  • FIG. 50 is a graph showing the amount of phase change of the unit structure according to the fourteenth embodiment.
  • FIG. 50 shows a graph G17.
  • FIG. 50 shows the amount of phase change when an electromagnetic wave enters the fourth dielectric layer 146 along the Z-axis direction and exits from the first dielectric layer 140.
  • the unit structure 10r can change the phase of the electromagnetic wave incident on the fourth dielectric layer 146 by 360 degrees within the range from near 15.00 GHz to near 26.00 GHz.
  • the fourteenth embodiment uses a dielectric layer as a resonator. Accordingly, in the fourteenth embodiment, a unit structure can be formed using three conductor layers, so that the influence of misalignment between the conductor layers can be reduced. Further, in the fourteenth embodiment, since the unit structure can be formed with three conductor layers, the thickness of the unit structure can be reduced. As a result, in the fourteenth embodiment, for example, the conductor layer and the like are configured with transparent electrodes, and the radio wave refraction plate is attached to a transparent plate such as glass to allow visible light to pass through. It is possible to prevent deterioration of the properties and aesthetic appearance of the product.
  • FIG. 51 is a diagram showing a configuration example of a unit structure according to the fourteenth embodiment.
  • the unit structure 10s includes a first dielectric layer 140A, a second dielectric layer 142A, a first reference conductor 150A, and a first floating conductor 160A.
  • the first reference conductor 150A and the first floating conductor 160A are formed in the same layer.
  • the unit structure 10s includes a third dielectric layer 144 and a fourth dielectric layer 146. It differs from the unit structure 10r shown in FIG. 47 in that it does not include a second reference conductor 152, a third reference conductor 154, a second floating conductor 162, and a third floating conductor 164. That is, the unit structure 10s includes two dielectric layers and one bonding layer.
  • the dielectric constant, thickness, etc. of the first dielectric layer 140A and the second dielectric layer 142A can be arbitrarily changed depending on the design.
  • the configuration of the first reference conductor 150A can be arbitrarily changed depending on the design.
  • the configuration of the first floating conductor 160A can be arbitrarily changed depending on the design.
  • FIG. 52 is a graph showing the frequency characteristics of a unit structure according to a modification of the fourteenth embodiment.
  • FIG. 52 shows a graph G18 and a graph G19.
  • Graph G18 shows the transmission coefficient.
  • Graph G19 shows the reflection coefficient.
  • FIG. 52 shows the reflection characteristics and reflection characteristics when electromagnetic waves are incident on the second dielectric layer 142A along the Z-axis direction and exit from the first dielectric layer 140A.
  • Graph G18 shows that the insertion loss in the region is -3 dB or more over a wide range from around 10.00 GHz to around 30.00 GHz, indicating good transmission characteristics.
  • Graph G19 shows good reflection characteristics with a reflection coefficient of ⁇ 10 dB or less in the region from around 14.00 GHz to around 27.00 GHz. That is, the unit structure 10r shown in FIG. 47 has good transmission characteristics and reflection characteristics in the region from around 14.00 GHz to around 27.00 GHz.
  • the unit structure can be formed with one conductor layer, so the thickness can be made thinner, and the influence of misalignment of the conductor layer can be further reduced. be able to.
  • the conductor layer and the like are configured with transparent electrodes, and the radio wave refraction plate is attached to a transparent plate such as glass. It is possible to further prevent deterioration of the permeability and deterioration of the appearance.
  • the embodiments of the present disclosure have been described above, and the elements of the embodiments have a function as a spatial filter. As a result, it can be easily designed by controlling the phase by frequency shifting the spatial filter. Further, it is no longer necessary to use similar shapes as the elements of the transmission plate, and even if elements of various embodiments are mixed together, it can function as the transmission plate.
  • the phase as a normalized filter is also determined. In other words, the initial phase of the filter can be changed depending on whether the inter-resonator coupling is inductive or capacitive.
  • design can be facilitated by making the low-phase side of the element of the transmission plate capacitive and the high-phase side inductive.
  • design can be facilitated by making the low phase side of the elements of the transmission plate inductive and the high phase side capacitive.
  • the boundary between the low phase side and the high phase side is not limited to 180°, and various angles such as 120°, 135°, 150°, 210°, 225°, and 240° can be adopted. If the phase range in one supercell of the spatial filter is from 0° to 360° ⁇ n, it may include multiple phase boundaries. The boundaries between these multiple phases are not limited to a single angle, and may be independent.
  • Radio wave refraction plate 10 Unit structure 12 Substrate 14 First resonator 16 Second resonator 18, 60, 62, 64, 66, 68, 70 Reference conductor 20, 120, 122, 124, 126 Connection line 22, 110 Third Resonator 24 First auxiliary reference conductor 26 Second auxiliary reference conductor 30,112 Fourth resonator 40,100,150 First reference conductor 42,102,152 Second reference conductor 44,154 Third reference conductor 80,82 Connection Conductor 90, 92, 94, 96, 98 Variable capacitance element 140 First dielectric layer 142 Second dielectric layer 144 Third dielectric layer 146 Fourth dielectric layer 160 First floating conductor 162 Second floating conductor 164 Third floating conductor

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  • Aerials With Secondary Devices (AREA)

Abstract

Une plaque de réfraction d'ondes radio selon la présente invention comprend une pluralité de structures unitaires agencées dans une première direction de surface, et un conducteur de référence qui sert de potentiel de référence pour la pluralité de structures unitaires. La pluralité de structures unitaires sont représentées par un circuit équivalent comprenant au moins trois circuits de résonance.
PCT/JP2023/014446 2022-04-11 2023-04-07 Plaque de réfraction d'ondes radio WO2023199870A1 (fr)

Applications Claiming Priority (8)

Application Number Priority Date Filing Date Title
JP2022-065351 2022-04-11
JP2022065351A JP2022165403A (ja) 2021-04-19 2022-04-11 電波屈折板
JP2022118945 2022-07-26
JP2022-118945 2022-07-26
JP2022-134495 2022-08-25
JP2022134495 2022-08-25
JP2022-136368 2022-08-29
JP2022136368 2022-08-29

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Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20190044244A1 (en) * 2016-02-17 2019-02-07 Commissariat a I'Energie Atomique et Aux Energies Altematives Electromagnetically reflective plate with a metamaterial structure and miniature antenna device including such a plate
JP2021057722A (ja) * 2019-09-30 2021-04-08 Kddi株式会社 電波透過板および電波透過システム
JP2022039867A (ja) * 2020-08-28 2022-03-10 株式会社Ｋｄｄｉ総合研究所 メタ表面

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20190044244A1 (en) * 2016-02-17 2019-02-07 Commissariat a I'Energie Atomique et Aux Energies Altematives Electromagnetically reflective plate with a metamaterial structure and miniature antenna device including such a plate
JP2021057722A (ja) * 2019-09-30 2021-04-08 Kddi株式会社 電波透過板および電波透過システム
JP2022039867A (ja) * 2020-08-28 2022-03-10 株式会社Ｋｄｄｉ総合研究所 メタ表面

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
MASAMICHI YONEHARA ET AL.: "B-1-29 Transmissive metasurface refracting plate that can refract radio waves in a specific direction", IEICE 2022 GENERAL CONFERENCE PROCEEDINGS COMMUNICATION; ONLINE; MARCH 15-18, 2022, IEICE, JP, vol. 2022, no. 1, 1 March 2022 (2022-03-01) - 18 March 2022 (2022-03-18), JP, pages 136, XP009550027 *

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